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1 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
A New Method for Testing
Electrolytic Capacitors to Compare
Life Expectancy
2013 IMAPS Device Packaging Conference
March 11-13, 2014
Stephani Gulbrandsen1, Ken Cartmill2, Joelle Arnold1,
Nicholas Kirsch1, Greg Caswell1
1 DfR Solutions, LLC – Beltsville, MD USA
301-474-0607
2LED Roadway Lighting – Halifax, NS Canada
877-533-5755
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001759
2 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001760
3 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001761
4 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Introduction
Al ECap 1
Al ECap 2
Datasheet lifetime
Test lifetime
Datasheet lifetime
Test lifetime
Time (hours)
Traditional life testing of Al ECaps indicates test lifetime can be slightly less
than or 2-3x greater than datasheet lifetime.
Industrial customer
communication interface
PCBA from Monico Inc.
Digital media player PCBA
from Shenzhen Sinetech
Electronic Co Ltd.
Automotive asset tracking PCBA
from Theta Engineering Inc.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001762
5 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Construction
Internal construction of an Al ECap with
equivalent circuit from Nippon Chemi-Con.
Different lead lengths distinguish
the anode (long) and the cathode
(short) leads.
The body consists
of an Al can
encased with a
plastic sleeve.
CT scan showing the
internal windings.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001763
6 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Construction
Non-hermetic seal between
bung and can allows for
evaporation of electrolyte
during operation.
A rubber bung
seals the Al can.
CT scan showing the
crimped seal
between the can
and the bung.
Smaller capacitors have
etched vents at can top.
These are designed so that
in the event of a failure,
leaking electrolyte is
directed away from the PCB.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001764
7 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Failure Criteria
Capacitance Change Within +/- 20% of initial value
Dissipation Factor Not more than 200% of the specified value
Leakage Current Initial specific value or less
Failure criteria defined in manufacturer datasheets.
Dissipation factor is proportional to equivalent
series resistance (ESR), so >200% increase in ESR is
classified as failed.
Increase in
leakage current
Increase in dissipation
factor (ESR);
Decrease in
capacitance
Detailed internal construction
of an Al ECap from EPCOS.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001765
8 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Failure Criteria
Capacitance Change Within +/- 20% of initial value
Dissipation Factor Not more than 200% of the specified value
Leakage Current Initial specific value or less
Failure criteria defined in manufacturer datasheets.
Dissipation factor is proportional to equivalent
series resistance (ESR), so >200% increase in ESR is
classified as failed.
Increase in
leakage current
Increase in dissipation
factor (ESR);
Decrease in
capacitance
Detailed internal construction
of an Al ECap from EPCOS.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001766
9 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Ripple Current
RippleCurrent Lower Frequency
RippleCurrent
Lower frequencies allow the
capacitor to fully charge and
discharge.
Higher frequencies do not
allow the capacitor to fully
charge and discharge.
Larger amplitude and larger applied ripple currents
induce greater internal temperature rise.
Ripple Current
Temperature
Higher Frequency
RippleCurrent
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001767
10 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Wear-Out
Apply ripple
and bias
e-
e-
e-
e-
Heating of the capacitor
from applied ripple
current causes
evaporation of the
electrolyte.
Internal pressure increase
from electrolyte
evaporation facilitates
electrolyte egress
between the rubber bung
and Al case.
PCB PCB
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001768
11 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001769
12 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Apply rated
ripple and bias
at rated
temperature.
Oven and
ripple current
heating causes
electrolyte
evaporation.
Turn off
electricity and
cool to room
temperature.
Life Test – Traditional (& Accelerated: Rate of Weight Loss)
e-
e-
Did ESR have a
>200%
increase from
the initial
value?
No. Continue
testing.
Yes. Testing
is complete.
e-
e-
Weight: 1.432 g
Weigh.
Electrical
characterization.
PCB PCB PCB
Measure ESR
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001770
13 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Life Test – Trends in Traditional Data
WeightLoss
Time (hours)
40002000 30001000
Time (hours)
40002000 30001000
%IncreaseESR
200%
400%
600%
800%
Variable
Impact on Rate
of Weight Loss
Ambient temperature
Applied ripple current
Heat dissipation
Crimp between bung and can
Linear throughout entire test
lifetime of an Al ECap population.
Exponential behavior that is relatively
constant until approach time to failure.
Variable
Impact on Critical
Weight Loss
Electrolyte stability
Initial ESR measurement
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001771
14 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Puncture a hole
in the
capacitor.
Life Test– Accelerated: Critical Weight Loss
Did ESR have a
>200%
increase from
the initial
value?
No. Continue
testing.
Yes. Testing
is complete.
Weigh.
Electrical
characterization.
Weight: 1.432 g
Oven heating
causes
electrolyte
evaporation.
Turn off heat
and cool to
room
temperature.
Measure ESR
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001772
15 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
1. Critical weight loss at 200% increase in ESR is calculated
using the ESR-Weight Loss curve
2. Rate of weight loss is extrapolated to the critical weight
loss and the corresponding time is recorded as the
accelerated test lifetime
Life Test– Accelerated Calculations
WeightLoss
Time (hours)
40002000 30001000
Weight Loss
%IncreaseESR
200%
400%
600%
800%
Critical weight loss
Critical weight loss
Accelerated test lifetime
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001773
16 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Life Test – Accelerated Wear-Out Failure Mode
As-received
Dried out, off
white paper
indicative of
electrolyte
evaporation.
Grey paper
indicative of
electrolyte
saturation.
Accelerated test
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001774
17 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Life Test – Traditional vs. Accelerated
Accelerated test time
Al ECap 1
Al ECap 2
Traditional test time
Time (hours)
Al ECap 3
Accelerated test time
Traditional test time
Accelerated test time
Traditional test time
Applied Test Conditions*
Traditional (T) Accelerated (A)
Ripple Current (I) IT = IR 0 < IA ≤ IR
Bias Voltage (V) VT = VR 0 < VA ≤ VR
Temperature (T) TT = TR TA = TR
* Datasheet rating (R). All ripple applied at 120 Hz.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001775
18 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001776
19 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o The accelerated test approached was used to compare the
behavior of the following two pairs of Al ECaps.
Accelerated Life Test – Conditions
Supplier
Capacitance
(mF)
Size
(mm)
Rated
Lifetime
(hrs)
Voltage
(V)
Test
Voltage
(V)
Rated
Ripple
Current
(mA RMS)
Test
Ripple
Current*
(mA RMS)
A 68 18 x 31.5 10,000 450 225 1575 300
B 68 18 x 40 >15,000 450 225 1517 300
C 2.2 10 x 20 10,175 450 225 43 20
D 2.2 10 x 20 5,000 450 225 29 15
* Ripple applied at 120 Hz.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001777
20 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o Supplier ARate of Weight Loss ≈ ½ Supplier BRate of Weight Loss
o Supplier A capacitors have a better seal between the can and bung
Accelerated Life Test – Suppliers A & B Rate of Weight Loss
450 V, 68 mF
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001778
21 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Accelerated Life Test – Suppliers A & B Critical Weight Loss
450 V, 68 mF
o Supplier ACritical Weight Loss ≈ Supplier BCritical Weight Loss
o Chemical stability of Supplier A and Supplier B electrolyte is
comparable
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001779
22 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o Accelerated life test results indicate that the Supplier A Al
ECap is more reliable than Supplier B
o This is opposite of what the datasheet lifetimes suggest
Accelerated Life Test – Suppliers A & B Comparison
Supplier
Minimum Accelerated
Lifetime (hours)
Maximum Accelerated
Lifetime (hours)
Datasheet
Lifetime (hours)
A 21,130 29,140 10,000
B 12,540 16,030 >15,000
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001780
23 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Accelerated Life Test – Suppliers C & D Rate of Weight Loss
450 V, 2.2 mF
o Supplier CRate of Weight Loss ≈ 2 Supplier DRate of Weight Loss
o Supplier C capacitors have a worse seal between the Al can and
bung
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001781
24 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Accelerated Life Test – Suppliers C & D Critical Weight Loss
450 V, 2.2 mF
o Supplier CCritical Weight Loss ≈ 2.5 Supplier DCritical Weight Loss
o Supplier C capacitors have a more chemically stable electrolyte
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001782
25 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Supplier
Minimum Accelerated
Lifetime (hours)
Maximum Accelerated
Lifetime (hours)
Datasheet
Lifetime (hours)
C 12,010 17,170 10,175
D 7,910 11,160 5,000
Accelerated Life Test – Suppliers C & D Comparison
o Accelerated life test results indicate that the Supplier C Al
ECap is more reliable than Supplier D
o This supports what the datasheet lifetimes suggest
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001783
26 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001784
27 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o The Al ECap accelerated life test approach is an effective
way to compare the reliability of the same capacitors
from different manufacturers under applied test conditions
o Test results indicated that datasheet lifetime values can be
inaccurate when compared to the reliability test results
Conclusions
Accelerated test time
Al ECap 1
Al ECap 2
Traditional test time
Time (hours)
Al ECap 3
Accelerated test time
Traditional test time
Accelerated test time
Traditional test time
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001785
28 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Many thanks to Steph, who is the primary author, for letting me present her findings.
Our appreciation as well goes to our collaborators, LED Roadway, for allowing us to
publish the findings of this study.
Questions?
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001786

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A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy

  • 1. 1 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com A New Method for Testing Electrolytic Capacitors to Compare Life Expectancy 2013 IMAPS Device Packaging Conference March 11-13, 2014 Stephani Gulbrandsen1, Ken Cartmill2, Joelle Arnold1, Nicholas Kirsch1, Greg Caswell1 1 DfR Solutions, LLC – Beltsville, MD USA 301-474-0607 2LED Roadway Lighting – Halifax, NS Canada 877-533-5755 IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001759
  • 2. 2 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Overview o Aluminum Electrolytic Capacitors o Introduction o Construction o Failure Criteria o Ripple Current o Wear-Out o Life Test o Traditional o Trends evident in data o Accelerated o Calculations o Traditional vs. Accelerated o Accelerated Life Test o Conditions o Suppliers A & B o Suppliers C & D o Conclusions IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001760
  • 3. 3 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Overview o Aluminum Electrolytic Capacitors o Introduction o Construction o Failure Criteria o Ripple Current o Wear-Out o Life Test o Traditional o Trends evident in data o Accelerated o Calculations o Traditional vs. Accelerated o Accelerated Life Test o Conditions o Suppliers A & B o Suppliers C & D o Conclusions IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001761
  • 4. 4 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Introduction Al ECap 1 Al ECap 2 Datasheet lifetime Test lifetime Datasheet lifetime Test lifetime Time (hours) Traditional life testing of Al ECaps indicates test lifetime can be slightly less than or 2-3x greater than datasheet lifetime. Industrial customer communication interface PCBA from Monico Inc. Digital media player PCBA from Shenzhen Sinetech Electronic Co Ltd. Automotive asset tracking PCBA from Theta Engineering Inc. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001762
  • 5. 5 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Construction Internal construction of an Al ECap with equivalent circuit from Nippon Chemi-Con. Different lead lengths distinguish the anode (long) and the cathode (short) leads. The body consists of an Al can encased with a plastic sleeve. CT scan showing the internal windings. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001763
  • 6. 6 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Construction Non-hermetic seal between bung and can allows for evaporation of electrolyte during operation. A rubber bung seals the Al can. CT scan showing the crimped seal between the can and the bung. Smaller capacitors have etched vents at can top. These are designed so that in the event of a failure, leaking electrolyte is directed away from the PCB. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001764
  • 7. 7 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Failure Criteria Capacitance Change Within +/- 20% of initial value Dissipation Factor Not more than 200% of the specified value Leakage Current Initial specific value or less Failure criteria defined in manufacturer datasheets. Dissipation factor is proportional to equivalent series resistance (ESR), so >200% increase in ESR is classified as failed. Increase in leakage current Increase in dissipation factor (ESR); Decrease in capacitance Detailed internal construction of an Al ECap from EPCOS. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001765
  • 8. 8 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Failure Criteria Capacitance Change Within +/- 20% of initial value Dissipation Factor Not more than 200% of the specified value Leakage Current Initial specific value or less Failure criteria defined in manufacturer datasheets. Dissipation factor is proportional to equivalent series resistance (ESR), so >200% increase in ESR is classified as failed. Increase in leakage current Increase in dissipation factor (ESR); Decrease in capacitance Detailed internal construction of an Al ECap from EPCOS. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001766
  • 9. 9 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Ripple Current RippleCurrent Lower Frequency RippleCurrent Lower frequencies allow the capacitor to fully charge and discharge. Higher frequencies do not allow the capacitor to fully charge and discharge. Larger amplitude and larger applied ripple currents induce greater internal temperature rise. Ripple Current Temperature Higher Frequency RippleCurrent IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001767
  • 10. 10 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Aluminum Electrolytic Capacitors – Wear-Out Apply ripple and bias e- e- e- e- Heating of the capacitor from applied ripple current causes evaporation of the electrolyte. Internal pressure increase from electrolyte evaporation facilitates electrolyte egress between the rubber bung and Al case. PCB PCB IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001768
  • 11. 11 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Overview o Aluminum Electrolytic Capacitors o Introduction o Construction o Failure Criteria o Ripple Current o Wear-Out o Life Test o Traditional o Trends evident in data o Accelerated o Calculations o Traditional vs. Accelerated o Accelerated Life Test o Conditions o Suppliers A & B o Suppliers C & D o Conclusions IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001769
  • 12. 12 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Apply rated ripple and bias at rated temperature. Oven and ripple current heating causes electrolyte evaporation. Turn off electricity and cool to room temperature. Life Test – Traditional (& Accelerated: Rate of Weight Loss) e- e- Did ESR have a >200% increase from the initial value? No. Continue testing. Yes. Testing is complete. e- e- Weight: 1.432 g Weigh. Electrical characterization. PCB PCB PCB Measure ESR IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001770
  • 13. 13 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Life Test – Trends in Traditional Data WeightLoss Time (hours) 40002000 30001000 Time (hours) 40002000 30001000 %IncreaseESR 200% 400% 600% 800% Variable Impact on Rate of Weight Loss Ambient temperature Applied ripple current Heat dissipation Crimp between bung and can Linear throughout entire test lifetime of an Al ECap population. Exponential behavior that is relatively constant until approach time to failure. Variable Impact on Critical Weight Loss Electrolyte stability Initial ESR measurement IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001771
  • 14. 14 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Puncture a hole in the capacitor. Life Test– Accelerated: Critical Weight Loss Did ESR have a >200% increase from the initial value? No. Continue testing. Yes. Testing is complete. Weigh. Electrical characterization. Weight: 1.432 g Oven heating causes electrolyte evaporation. Turn off heat and cool to room temperature. Measure ESR IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001772
  • 15. 15 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com 1. Critical weight loss at 200% increase in ESR is calculated using the ESR-Weight Loss curve 2. Rate of weight loss is extrapolated to the critical weight loss and the corresponding time is recorded as the accelerated test lifetime Life Test– Accelerated Calculations WeightLoss Time (hours) 40002000 30001000 Weight Loss %IncreaseESR 200% 400% 600% 800% Critical weight loss Critical weight loss Accelerated test lifetime IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001773
  • 16. 16 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Life Test – Accelerated Wear-Out Failure Mode As-received Dried out, off white paper indicative of electrolyte evaporation. Grey paper indicative of electrolyte saturation. Accelerated test IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001774
  • 17. 17 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Life Test – Traditional vs. Accelerated Accelerated test time Al ECap 1 Al ECap 2 Traditional test time Time (hours) Al ECap 3 Accelerated test time Traditional test time Accelerated test time Traditional test time Applied Test Conditions* Traditional (T) Accelerated (A) Ripple Current (I) IT = IR 0 < IA ≤ IR Bias Voltage (V) VT = VR 0 < VA ≤ VR Temperature (T) TT = TR TA = TR * Datasheet rating (R). All ripple applied at 120 Hz. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001775
  • 18. 18 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Overview o Aluminum Electrolytic Capacitors o Introduction o Construction o Failure Criteria o Ripple Current o Wear-Out o Life Test o Traditional o Trends evident in data o Accelerated o Calculations o Traditional vs. Accelerated o Accelerated Life Test o Conditions o Suppliers A & B o Suppliers C & D o Conclusions IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001776
  • 19. 19 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com o The accelerated test approached was used to compare the behavior of the following two pairs of Al ECaps. Accelerated Life Test – Conditions Supplier Capacitance (mF) Size (mm) Rated Lifetime (hrs) Voltage (V) Test Voltage (V) Rated Ripple Current (mA RMS) Test Ripple Current* (mA RMS) A 68 18 x 31.5 10,000 450 225 1575 300 B 68 18 x 40 >15,000 450 225 1517 300 C 2.2 10 x 20 10,175 450 225 43 20 D 2.2 10 x 20 5,000 450 225 29 15 * Ripple applied at 120 Hz. IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001777
  • 20. 20 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com o Supplier ARate of Weight Loss ≈ ½ Supplier BRate of Weight Loss o Supplier A capacitors have a better seal between the can and bung Accelerated Life Test – Suppliers A & B Rate of Weight Loss 450 V, 68 mF IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001778
  • 21. 21 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Accelerated Life Test – Suppliers A & B Critical Weight Loss 450 V, 68 mF o Supplier ACritical Weight Loss ≈ Supplier BCritical Weight Loss o Chemical stability of Supplier A and Supplier B electrolyte is comparable IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001779
  • 22. 22 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com o Accelerated life test results indicate that the Supplier A Al ECap is more reliable than Supplier B o This is opposite of what the datasheet lifetimes suggest Accelerated Life Test – Suppliers A & B Comparison Supplier Minimum Accelerated Lifetime (hours) Maximum Accelerated Lifetime (hours) Datasheet Lifetime (hours) A 21,130 29,140 10,000 B 12,540 16,030 >15,000 IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001780
  • 23. 23 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Accelerated Life Test – Suppliers C & D Rate of Weight Loss 450 V, 2.2 mF o Supplier CRate of Weight Loss ≈ 2 Supplier DRate of Weight Loss o Supplier C capacitors have a worse seal between the Al can and bung IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001781
  • 24. 24 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Accelerated Life Test – Suppliers C & D Critical Weight Loss 450 V, 2.2 mF o Supplier CCritical Weight Loss ≈ 2.5 Supplier DCritical Weight Loss o Supplier C capacitors have a more chemically stable electrolyte IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001782
  • 25. 25 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Supplier Minimum Accelerated Lifetime (hours) Maximum Accelerated Lifetime (hours) Datasheet Lifetime (hours) C 12,010 17,170 10,175 D 7,910 11,160 5,000 Accelerated Life Test – Suppliers C & D Comparison o Accelerated life test results indicate that the Supplier C Al ECap is more reliable than Supplier D o This supports what the datasheet lifetimes suggest IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001783
  • 26. 26 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Overview o Aluminum Electrolytic Capacitors o Introduction o Construction o Failure Criteria o Ripple Current o Wear-Out o Life Test o Traditional o Trends evident in data o Accelerated o Calculations o Traditional vs. Accelerated o Accelerated Life Test o Conditions o Suppliers A & B o Suppliers C & D o Conclusions IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001784
  • 27. 27 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com o The Al ECap accelerated life test approach is an effective way to compare the reliability of the same capacitors from different manufacturers under applied test conditions o Test results indicated that datasheet lifetime values can be inaccurate when compared to the reliability test results Conclusions Accelerated test time Al ECap 1 Al ECap 2 Traditional test time Time (hours) Al ECap 3 Accelerated test time Traditional test time Accelerated test time Traditional test time IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001785
  • 28. 28 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com Many thanks to Steph, who is the primary author, for letting me present her findings. Our appreciation as well goes to our collaborators, LED Roadway, for allowing us to publish the findings of this study. Questions? IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001786