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Device Modeling Report




COMPONENTS: Insulated Gate Bipolar Transistor (IGBT)
PART NUMBER: GT15M321
MANUFACTURER: TOSHIBA




                    Bee Technologies Inc.

       All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                      1
Circuit Configuration




             All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                            2
Transfer Characteristics

Circuit Simulation result




Evaluation circuit




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                    3
Comparison Graph

Simulation result




Comparison table


Test condition: VCE =5 (V)


                                             VGE (V)
               IC (A)                                                       %Error
                              Measurement             Simulation
                         1                4.700                 4.755              1.18
                         2                4.900                 4.951              1.05
                         5                5.350                 5.353              0.06
                        10                5.850                 5.828              -0.38
                        15                6.250                 6.207              -0.68
                        20                6.600                 6.538              -0.94
                        25                6.950                 6.838              -1.62
                        30                7.250                 7.115              -1.86


                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                           4
Fall Time Characteristics

Circuit Simulation result




                                                Time


Evaluation circuit




Test condition: IC=15 (A), VCC=600 (V), VGE=±15 (V), RG=100(Ω)


       Parameter        Unit     Measurement               Simulation               %Error
            tf           us                   0.200                  0.207             3.391
           toff          us                   0.500                  0.498             -0.414



                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                                5
Gate Charge Characteristics

Circuit Simulation result




Evaluation circuit




Test condition: VCC=150 (V), IC=15 (A), VGE=15 (V)


       Parameter        Unit     Measurement               Simulation               %Error
           Qge           nc                  11.000                 10.957             -0.391
           Qgc           nc                 27.000                  26.783             -0.804
           Qg            nc                 71.000                  73.324             3.273

                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                                6
Saturation Characteristics

Circuit Simulation result




Evaluation circuit




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                    7
Comparison Graph

Simulation result




Comparison table


Test condition: VGE =15 (V)


                                             VCE (V)
               Ic(A)                                                        %Error
                              Measurement             Simulation
                         1                1.350                 1.360              0.71
                         2                1.430                 1.425              -0.37
                         5                1.580                 1.570              -0.61
                        10                1.750                 1.750              0.00
                        15                1.880                 1.890              0.52
                        20                2.010                 2.013              0.13
                        25                2.150                 2.138              -0.55
                        30                2.280                 2.285              0.21




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                           8
Output Characteristics

Circuit Simulation result




                                              20V    15V

                                                      10V    8V
                                                                         VGE=7V




Evaluation circuit




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                    9
FWD Forward Current Characteristics

Circuit Simulation result




Evaluation circuit




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                    10
Comparison Graph

Simulation result




Comparison table


                                              VF (V)
               IF(A)                                                        %Error
                              Measurement              Simulation
                         1                0.800                 0.799              -0.11
                         2                0.850                 0.852              0.27
                         5                0.940                 0.942              0.22
                        10                1.040                 1.034              -0.54
                        20                1.170                 1.169              -0.06
                        50                1.485                 1.490              0.32
                       100                1.965                 1.963              -0.09




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                           11
Reverse Recovery Characteristics

Circuit Simulation result




                                                Time


Evaluation circuit




Test condition: VCC=600 (V), IF=15 (A) –di/dt=20 A/usec

       Parameter        Unit     Measurement               Simulation               %Error
            trr          us                   0.700                  1.250            78.541
            Irr             A                 9.500                  9.442             -0.612



                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
                                                                                                12

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SPICE MODEL of GT15M321 (Professional+FWDS LTspice Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Insulated Gate Bipolar Transistor (IGBT) PART NUMBER: GT15M321 MANUFACTURER: TOSHIBA Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 1
  • 2. Circuit Configuration All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 2
  • 3. Transfer Characteristics Circuit Simulation result Evaluation circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 3
  • 4. Comparison Graph Simulation result Comparison table Test condition: VCE =5 (V) VGE (V) IC (A) %Error Measurement Simulation 1 4.700 4.755 1.18 2 4.900 4.951 1.05 5 5.350 5.353 0.06 10 5.850 5.828 -0.38 15 6.250 6.207 -0.68 20 6.600 6.538 -0.94 25 6.950 6.838 -1.62 30 7.250 7.115 -1.86 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 4
  • 5. Fall Time Characteristics Circuit Simulation result Time Evaluation circuit Test condition: IC=15 (A), VCC=600 (V), VGE=±15 (V), RG=100(Ω) Parameter Unit Measurement Simulation %Error tf us 0.200 0.207 3.391 toff us 0.500 0.498 -0.414 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 5
  • 6. Gate Charge Characteristics Circuit Simulation result Evaluation circuit Test condition: VCC=150 (V), IC=15 (A), VGE=15 (V) Parameter Unit Measurement Simulation %Error Qge nc 11.000 10.957 -0.391 Qgc nc 27.000 26.783 -0.804 Qg nc 71.000 73.324 3.273 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 6
  • 7. Saturation Characteristics Circuit Simulation result Evaluation circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 7
  • 8. Comparison Graph Simulation result Comparison table Test condition: VGE =15 (V) VCE (V) Ic(A) %Error Measurement Simulation 1 1.350 1.360 0.71 2 1.430 1.425 -0.37 5 1.580 1.570 -0.61 10 1.750 1.750 0.00 15 1.880 1.890 0.52 20 2.010 2.013 0.13 25 2.150 2.138 -0.55 30 2.280 2.285 0.21 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 8
  • 9. Output Characteristics Circuit Simulation result 20V 15V 10V 8V VGE=7V Evaluation circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 9
  • 10. FWD Forward Current Characteristics Circuit Simulation result Evaluation circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 10
  • 11. Comparison Graph Simulation result Comparison table VF (V) IF(A) %Error Measurement Simulation 1 0.800 0.799 -0.11 2 0.850 0.852 0.27 5 0.940 0.942 0.22 10 1.040 1.034 -0.54 20 1.170 1.169 -0.06 50 1.485 1.490 0.32 100 1.965 1.963 -0.09 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 11
  • 12. Reverse Recovery Characteristics Circuit Simulation result Time Evaluation circuit Test condition: VCC=600 (V), IF=15 (A) –di/dt=20 A/usec Parameter Unit Measurement Simulation %Error trr us 0.700 1.250 78.541 Irr A 9.500 9.442 -0.612 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 12