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Device Modeling Report




COMPONENTS: Insulated Gate Bipolar Transistor (IGBT)
PART NUMBER: GT25Q101
MANUFACTURER: TOSHIBA




                      Bee Technologies Inc.



        All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
PSpice model
                                      Model description
 parameter
    TAU          Ambipolar Recombination Lifetime
     KP          MOS Transconductance
   AREA          Area of the Device
    AGD          Gate-Drain Overlap Area
    WB           Metallurgical Base Width
     VT          Threshold Voltage
     KF          Triode Region Factor
    CGS          Gate-Source Capacitance per Unit Area
   COXD          Gate-Drain Oxide Capacitance per Unit Area
    VTD          Gate-Drain Overlap Depletion Threshold




         All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Transfer Characteristics

Circuit Simulation result




Evaluation circuit




                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result


  Test condition : Vce = 5 V
                                      Vge(V)
     Ic(A)                                                                 Error (%)
                    Measurement                   Simulation
       2                5.5                         5.7480                      4.50909
       5                6.3                         6.2677                     -0.51270
      10                6.9                         6.8661                     -0.49130
      20                7.7                         7.7165                      0.21429
      25                 8                          8.0787                      0.98375




                All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Fall Time Characteristics

Circuit Simulation result




Evaluation circuit




Test condition Ic=25(A) ,Vce=600(V)
                Measurement                    Simulation                  Error
    tf
                 0.3        us               0.301233            us       0.4110
                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Gate Charge Characteristics

Circuit Simulation result




Evaluation circuit


                                                   V2


                                                         0Vdc


                                               U6
                                              GT25Q101            I1       D1
                                                                          Dbreak
                   W1
                       +                                        25Adc
                       -
  TD = 0           W
  TF = 10n    I2
  PW = 500u        IOFF = 100uA
  PER = 1m         ION = 0A                              400Vdc         Vce
  I1 = 0
  I2 = 2m
  TR = 10n



                                              0



Test condition : Vce=400(V) ,Ic=25(A) ,Vge=12.5(V)
                           Measurement                     Simulation                   Error(%)
    Qge                      34             nc            34.506                   nc    1.48824
    Qgc                      82             nc            82.857                   nc    1.04512
    Qg                       174            nc            170.550                  nc   -1.98276
                        All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Saturation Characteristics

Circuit Simulation result




Evaluation circuit




                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                    Vce(sat)(V)
     Ic(A)                                                                 Error (%)
                    Measurement                   Simulation
       1                1.3                         1.2467                 -4.10000
       2                1.4                         1.4488                  3.48571
       5                1.7                         1.7247                  1.45294
      10                 2                          1.9604                 -1.98000
      20                2.4                         2.4204                  0.85000
      25                2.6                         2.5920                 -0.30769




                All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

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SPICE MODEL of GT25Q101 (Standard Without Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Insulated Gate Bipolar Transistor (IGBT) PART NUMBER: GT25Q101 MANUFACTURER: TOSHIBA Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 2. PSpice model Model description parameter TAU Ambipolar Recombination Lifetime KP MOS Transconductance AREA Area of the Device AGD Gate-Drain Overlap Area WB Metallurgical Base Width VT Threshold Voltage KF Triode Region Factor CGS Gate-Source Capacitance per Unit Area COXD Gate-Drain Oxide Capacitance per Unit Area VTD Gate-Drain Overlap Depletion Threshold All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 3. Transfer Characteristics Circuit Simulation result Evaluation circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 4. Comparison Graph Circuit Simulation Result Simulation Result Test condition : Vce = 5 V Vge(V) Ic(A) Error (%) Measurement Simulation 2 5.5 5.7480 4.50909 5 6.3 6.2677 -0.51270 10 6.9 6.8661 -0.49130 20 7.7 7.7165 0.21429 25 8 8.0787 0.98375 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 5. Fall Time Characteristics Circuit Simulation result Evaluation circuit Test condition Ic=25(A) ,Vce=600(V) Measurement Simulation Error tf 0.3 us 0.301233 us 0.4110 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 6. Gate Charge Characteristics Circuit Simulation result Evaluation circuit V2 0Vdc U6 GT25Q101 I1 D1 Dbreak W1 + 25Adc - TD = 0 W TF = 10n I2 PW = 500u IOFF = 100uA PER = 1m ION = 0A 400Vdc Vce I1 = 0 I2 = 2m TR = 10n 0 Test condition : Vce=400(V) ,Ic=25(A) ,Vge=12.5(V) Measurement Simulation Error(%) Qge 34 nc 34.506 nc 1.48824 Qgc 82 nc 82.857 nc 1.04512 Qg 174 nc 170.550 nc -1.98276 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 7. Saturation Characteristics Circuit Simulation result Evaluation circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 8. Comparison Graph Circuit Simulation Result Simulation Result Vce(sat)(V) Ic(A) Error (%) Measurement Simulation 1 1.3 1.2467 -4.10000 2 1.4 1.4488 3.48571 5 1.7 1.7247 1.45294 10 2 1.9604 -1.98000 20 2.4 2.4204 0.85000 25 2.6 2.5920 -0.30769 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005