SlideShare a Scribd company logo
1 of 25
Download to read offline
Atmel AT42QT1010
Single-key QTouch® Touch Sensor IC
DATASHEET

Features
 Number of Keys:


One – configurable as either a single key or a proximity sensor

 Technology:


Patented spread-spectrum charge-transfer (direct mode)

 Key outline sizes:




















6 mm × 6 mm or larger (panel thickness dependent); widely different sizes and
shapes possible
Electrode design:
 Solid or ring electrode shapes
PCB Layers required:
 One
Electrode materials:
 Etched copper, silver, carbon, Indium Tin Oxide (ITO)
Electrode substrates:
 PCB, FPCB, plastic films, glass
Panel materials:
 Plastic, glass, composites, painted surfaces (low particle density metallic
paints possible)
Panel thickness:
 Up to 12 mm glass, 6 mm plastic (electrode size and Cs dependent)
Key sensitivity:
 Settable via capacitor (Cs)
Interface:
 Digital output, active high
Moisture tolerance:
 Increased moisture tolerance based on hardware design and firmware tuning
Operating Voltage:
 1.8 V – 5.5 V; 17 µA at 1.8 V typical
Package:
 6-pin SOT23-6 RoHS compliant
 8-pin UDFN/USON RoHS compliant
Signal processing:
 Self-calibration, auto drift compensation, noise filtering
Applications:
 Control panels, consumer appliances, proximity sensor applications, toys,
lighting controls, mechanical switch or button,
Patents:
 QTouch® (patented charge-transfer method)
 HeartBeat (monitors health of device)

9541I–AT42–05/2013
1.

Pinout and Schematic

1.1

Pinout Configurations

1.1.1

6-pin SOT23-6

Pin 1 ID
OUT

6

SYNC/
MODE

VSS

2

5

VDD

SNSK

1.1.2

1

3

4

SNS

8-pin UDFN/USON
Pin 1 ID

SNSK

1

8

SNS

N/C

2

7

VDD

N/C

3

6

SYNC/MODE

VSS

4

5

OUT

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

2
1.2

Pin Descriptions

1.2.1

6-pin SOT23-6

Table 1-1.

Pin Listing

Name

Pin

Type

OUT

1

O

Output state

–

VSS

2

P

Supply ground

–

SNSK

3

I/O

Sense pin

Cs + Key

SNS

4

I/O

Sense pin

Cs

VDD

5

P

Power

–

SYNC

6

I

SYNC and Mode Input

Pin is either SYNC/Slow/Fast Mode, depending on logic
level applied (see Section 3.1 on page 7)

I
OD

Input only
Open drain output

1.2.2

O
P

Comments

If Unused, Connect To...

Output only, push-pull
Ground or power

I/O

Input/output

8-pin UDFN/USON

Table 1-2.

Pin Listing

Name

Pin

Type

SNSK

1

I/O

N/C

2

N/C

Comments

If Unused, Connect To...

Sense pin

Cs + Key

–

No connection

–

3

–

No connection

–

VSS

4

P

Supply ground

–

OUT

5

O

Output state

–

SYNC/
MODE

6

I

SYNC and Mode Input

Pin is either SYNC/Slow/Fast Mode, depending on logic
level applied (see Section 3.1 on page 7)

VDD

7

P

Power

–

SNS

8

I/O

Sense pin

Cs

I
OD

Input only
Open drain output

O
P

Output only, push-pull
Ground or power

I/O

Input/output

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

3
1.3

Schematics

1.3.1

6-pin SOT23-6
Figure 1-1. Basic Circuit Configuration

VDD

SENSE
ELECTRODE

5

VDD
1

OUT

SNSK

Rs

3

Cs
SNS

4

Cx

SYNC/MODE 6
VSS
2

Note: A bypass capacitor should be tightly wired
between Vdd and Vss and kept close to pin 5.

1.3.2

8-pin UDFN/USON
Figure 1-2. Basic Circuit Configuration

Vdd

SENSE
ELECTRODE

7

VDD
5

SNSK

OUT

Rs

1

Cs
2

3

NC

SNS

NC

SYNC/MODE

8

6

Cx

VSS
4

Note: A bypass capacitor should be tightly wired
between Vdd and Vss and kept close to pin 5.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

4
2.

Overview of the AT42QT1010

2.1

Introduction
The AT42QT1010 (QT1010) is a digital burst mode charge-transfer (QT™) sensor that is capable of detecting nearproximity or touch, making it ideal for implementing touch controls.
With the proper electrode and circuit design, the self-contained digital IC will project a touch or proximity field to
several centimeters through any dielectric like glass, plastic, stone, ceramic, and even most kinds of wood. It can
also turn small metal-bearing objects into intrinsic sensors, making them responsive to proximity or touch. This
capability, coupled with its ability to self-calibrate, can lead to entirely new product concepts.
The QT1010 is designed specifically for human interfaces, like control panels, appliances, toys, lighting controls, or
anywhere a mechanical switch or button may be found. It includes all hardware and signal processing functions
necessary to provide stable sensing under a wide variety of changing conditions. Only a single low-cost capacitor is
required for operation.

2.2

Basic Operation
Figure 1-1 on page 4 and Figure 1-2 on page 4 show basic circuits.
The QT1010 employs bursts of charge-transfer cycles to acquire its signal. Burst mode permits power consumption
in the microamp range, dramatically reduces RF emissions, lowers susceptibility to EMI, and yet permits excellent
response time. Internally the signals are digitally processed to reject impulse noise, using a “consensus” filter which
requires four consecutive confirmations of a detection before the output is activated.
The QT switches and charge measurement hardware functions are all internal to the QT1010.

2.3

Electrode Drive
For optimum noise immunity, the electrode should only be connected to SNSK.
In all cases the rule Cs >> Cx must be observed for proper operation; a typical load capacitance (Cx) ranges from
5 – 20 pF while Cs is usually about 2 – 50 nF.
Increasing amounts of Cx destroy gain, therefore it is important to limit the amount of stray capacitance on both SNS
terminals. This can be done, for example, by minimizing trace lengths and widths and keeping these traces away
from power or ground traces or copper pours.
The traces and any components associated with SNS and SNSK will become touch sensitive and should be treated
with caution to limit the touch area to the desired location.
A series resistor, Rs, should be placed in line with SNSK to the electrode to suppress ESD and EMC effects.

2.4

Sensitivity

2.4.1

Introduction
The sensitivity on the QT1010 is a function of things like the value of Cs, electrode size and capacitance, electrode
shape and orientation, the composition and aspect of the object to be sensed, the thickness and composition of any
overlaying panel material, and the degree of ground coupling of both sensor and object.

2.4.2

Increasing Sensitivity
In some cases it may be desirable to increase sensitivity; for example, when using the sensor with very thick panels
having a low dielectric constant, or when the device is used as a proximity sensor. Sensitivity can often be increased
by using a larger electrode or reducing panel thickness. Increasing electrode size can have diminishing returns, as
high values of Cx will reduce sensor gain.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

5
The value of Cs also has a dramatic effect on sensitivity, and this can be increased in value with the trade-off of
slower response time and more power. Increasing the electrode's surface area will not substantially increase touch
sensitivity if its diameter is already much larger in surface area than the object being detected. Panel material can
also be changed to one having a higher dielectric constant, which will better help to propagate the field.
In the case of proximity detection, usually the object being detected is on an approaching hand, so a larger surface
area can be effective.
Ground planes around and under the electrode and its SNSK trace will cause high Cx loading and destroy gain. The
possible signal-to-noise ratio benefits of ground area are more than negated by the decreased gain from the circuit,
and so ground areas around electrodes are discouraged. Metal areas near the electrode will reduce the field strength
and increase Cx loading and should be avoided, if possible. Keep ground away from the electrodes and traces.

2.4.3

Decreasing Sensitivity
In some cases the QT1010 may be too sensitive. In this case gain can be easily lowered further by decreasing Cs.

2.4.4

Proximity Sensing
By increasing the sensitivity, the QT1010 can be used as a very effective proximity sensor, allowing the presence of
a nearby object (typically a hand) to be detected.
In this scenario, as the object being sensed is typically a hand, very large electrode sizes can be used, which is
extremely effective in increasing the sensitivity of the detector. In this case, the value of Cs will also need to be
increased to ensure improved sensitivity, as mentioned in Section 2.4.2. Note that, although this affects the
responsiveness of the sensor, it is less of an issue in proximity sensing applications; in such applications it is
necessary to detect simply the presence of a large object, rather than a small, precise touch.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

6
3.

Operation Specifics

3.1

Run Modes

3.1.1

Introduction
The QT1010 has three running modes which depend on the state of the SYNC pin (high or low).

3.1.2

Fast Mode
The QT1010 runs in Fast mode if the SYNC pin is permanently high. In this mode the QT1010 runs at maximum
speed at the expense of increased current consumption. Fast mode is useful when speed of response is the prime
design requirement. The delay between bursts in Fast mode is approximately 1 ms, as shown in Figure 3-1.
Figure 3-1. Fast Mode Bursts (SYNC Held High)

SNSK
~1 ms

SYNC

Low Power Mode
The QT1010 runs in Low Power (LP) mode if the SYNC pin is held low. In this mode it sleeps for approximately
80 ms at the end of each burst, saving power but slowing response. On detecting a possible key touch, it temporarily
switches to Fast mode until either the key touch is confirmed or found to be spurious (via the detect integration
process). It then returns to LP mode after the key touch is resolved, as shown in Figure 3-2.

~80 ms

SNSK

sleep

touch

Figure 3-2. Low Power Mode (SYNC Held Low)

Key

3.1.3

sleep

fast detect
integrator

sleep

SYNC

OUT

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

7
3.1.4

SYNC Mode
It is possible to synchronize the device to an external clock source by placing an appropriate waveform on the SYNC
pin. SYNC mode can synchronize multiple QT1010 devices to each other to prevent cross-interference, or it can be
used to enhance noise immunity from low frequency sources such as 50Hz or 60Hz mains signals.
The SYNC pin is sampled at the end of each burst. If the device is in Fast mode and the SYNC pin is sampled high,
then the device continues to operate in Fast mode (Figure 3-1 on page 7). If SYNC is sampled low, then the device
goes to sleep. From then on, it will operate in SYNC mode (Figure 3-2). Therefore, to guarantee entry into SYNC
mode the low period of the SYNC signal should be longer than the burst length (Figure 3-3).
Figure 3-3. SYNC Mode (Triggered by SYNC Edges)

SNSK

sleep

sleep

sleep

SYNC

SNSK

Revert to Fast Mode

slow mode sleep period

sleep

sleep

sleep

Revert to Slow Mode

slow mode sleep period
SYNC

However, once SYNC mode has been entered, if the SYNC signal consists of a series of short pulses (>10 µs) then
a burst will only occur on the falling edge of each pulse (Figure 3-4) instead of on each change of SYNC signal, as
normal (Figure 3-3).
In SYNC mode, the device will sleep after each measurement burst (just as in LP mode) but will be awakened by a
change in the SYNC signal in either direction, resulting in a new measurement burst. If SYNC remains unchanged
for a period longer than the LP mode sleep period (about 80 ms), the device will resume operation in either Fast or
LP mode depending on the level of the SYNC pin (Figure 3-3).
There is no detect integrator (DI) in SYNC mode (each touch is a detection) but the Max On-duration will depend on
the time between SYNC pulses; see Section 3.3 and Section 3.4 on page 9. Recalibration timeout is a fixed number
of measurements so will vary with the SYNC period.
Figure 3-4. SYNC Mode (Short Pulses)

SNSK
>10 μs

>10 μs

>10 μs

SYNC

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

8
3.2

Threshold
The internal signal threshold level is fixed at 10 counts of change with respect to the internal reference level, which in
turn adjusts itself slowly in accordance with the drift compensation mechanism.
The QT1010 employs a hysteresis dropout of two counts of the delta between the reference and threshold levels.

3.3

Max On-duration
If an object or material obstructs the sense pad the signal may rise enough to create a detection, preventing further
operation. To prevent this, the sensor includes a timer which monitors detections. If a detection exceeds the timer
setting the sensor performs a full recalibration. This is known as the Max On-duration feature and is set to ~60s (at
3V in LP mode). This will vary slightly with Cs and if SYNC mode is used. As the internal timebase for Max Onduration is determined by the burst rate, the use of SYNC can cause dramatic changes in this parameter depending
on the SYNC pulse spacing. For example, at 60Hz SYNC mode the Max On-duration will be ~6s at 3V.

3.4

Detect Integrator
It is desirable to suppress detections generated by electrical noise or from quick brushes with an object. To
accomplish this, the QT1010 incorporates a detect integration (DI) counter that increments with each detection until
a limit is reached, after which the output is activated. If no detection is sensed prior to the final count, the counter is
reset immediately to zero. In the QT1010, the required count is four. In LP mode the device will switch to Fast mode
temporarily in order to resolve the detection more quickly; after a touch is either confirmed or denied the device will
revert back to normal LP mode operation automatically.
The DI can also be viewed as a “consensus filter” that requires four successive detections to create an output.

3.5

Forced Sensor Recalibration
The QT1010 has no recalibration pin; a forced recalibration is accomplished when the device is powered up or after
the recalibration timeout. However, supply drain is low so it is a simple matter to treat the entire IC as a controllable
load; driving the QT1010's Vdd pin directly from another logic gate or a microcontroller port will serve as both power
and “forced recalibration”. The source resistance of most CMOS gates and microcontrollers is low enough to provide
direct power without problem.

3.6

Drift Compensation
Signal drift can occur because of changes in Cx and Cs over time. It is crucial that drift be compensated for,
otherwise false detections, non-detections, and sensitivity shifts will follow.
Drift compensation (Figure 3-5) is performed by making the reference level track the raw signal at a slow rate, but
only while there is no detection in effect. The rate of adjustment must be performed slowly, otherwise legitimate
detections could be ignored. The QT1010 drift compensates using a slew-rate limited change to the reference level;
the threshold and hysteresis values are slaved to this reference.
Once an object is sensed, the drift compensation mechanism ceases since the signal is legitimately high, and
therefore should not cause the reference level to change.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

9
Figure 3-5. Drift Compensation
Signal

Threshold
Hysteresis
Reference
Output

The QT1010 drift compensation is asymmetric; the reference level drift-compensates in one direction faster than it
does in the other. Specifically, it compensates faster for decreasing signals than for increasing signals. Increasing
signals should not be compensated for quickly, since an approaching finger could be compensated for partially or
entirely before even approaching the sense electrode. However, an obstruction over the sense pad, for which the
sensor has already made full allowance, could suddenly be removed leaving the sensor with an artificially elevated
reference level and thus become insensitive to touch. In this latter case, the sensor will compensate for the object's
removal very quickly, usually in only a few seconds.
With large values of Cs and small values of Cx, drift compensation will appear to operate more slowly than with the
converse. Note that the positive and negative drift compensation rates are different.

3.7

Response Time
The QT1010's response time is highly dependent on run mode and burst length, which in turn is dependent on Cs
and Cx. With increasing Cs, response time slows, while increasing levels of Cx reduce response time. The response
time will also be a lot slower in LP or SYNC mode due to a longer time between burst measurements.

3.8

Spread Spectrum
The QT1010 modulates its internal oscillator by ±7.5% during the measurement burst. This spreads the generated
noise over a wider band, reducing emission levels. This also reduces susceptibility since there is no longer a single
fundamental burst frequency.

3.9

Output Features

3.9.1

Output
The output of the QT1010 is active-high upon detection. The output will remain active-high for the duration of the
detection, or until the Max On-duration expires, whichever occurs first. If a Max On-duration timeout occurs first, the
sensor performs a full recalibration and the output becomes inactive (low) until the next detection.

3.9.2

HeartBeat Output
The QT1010 output has a HeartBeat “health” indicator superimposed on it in all modes. This operates by taking the
output pin into a three-state mode for 15 µs, once before every QT burst. This output state can be used to determine
that the sensor is operating properly, using one of several simple methods, or it can be ignored.
The HeartBeat indicator can be sampled by using a pull-up resistor on the OUT pin (Figure 3-6), and feeding the
resulting positive-going pulse into a counter, flip flop, one-shot, or other circuit. The pulses will only be visible when
the chip is not detecting a touch.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

10
Figure 3-6. Obtaining HeartBeat Pulses with a Pull-up Resistor (SOT23-6)

VDD
5
HeartBeat" Pulse

VDD

Ro
1

OUT

SNSK
SNS

3

4

SYNC/MODE 6
VSS
2

If the sensor is wired to a microcontroller as shown in Figure 3-7 on page 11, the microcontroller can reconfigure the
load resistor to either Vss or Vdd depending on the output state of the QT1010, so that the pulses are evident in
either state.
Figure 3-7.

Using a Microcontroller to Obtain HeartBeat Pulses in Either Output State (SOT23-6)

Port_M.x

Ro

1

OUT

SNSK
SNS

Microcontroller

3

4

Port_M.y

SYNC/MODE 6

Electromechanical devices like relays will usually ignore the short HeartBeat pulse. The pulse also has too low a duty
cycle to visibly affect LEDs. It can be filtered completely if desired, by adding an RC filter to the output, or if
interfacing directly and only to a high-impedance CMOS input, by doing nothing or at most adding a small noncritical
capacitor from OUT to Vss.

3.9.3

Output Drive
The OUT pin is active high and can sink or source up to 2 mA. When a large value of Cs (>20 nF) is used the OUT
current should be limited to <1 mA to prevent gain-shifting side effects, which happen when the load current creates
voltage drops on the die and bonding wires; these small shifts can materially influence the signal level to cause
detection instability.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

11
4.

Circuit Guidelines

4.1

More Information
Refer to Application Note QTAN0002, Secrets of a Successful QTouch Design and the Touch Sensors Design Guide
(both downloadable from the Atmel website), for more information on construction and design methods.

4.2

Sample Capacitor
Cs is the charge sensing sample capacitor. The required Cs value depends on the thickness of the panel and its
dielectric constant. Thicker panels require larger values of Cs. Typical values are 2 nF to 50 nF depending on the
sensitivity required; larger values of Cs demand higher stability and better dielectric to ensure reliable sensing.
The Cs capacitor should be a stable type, such as X7R ceramic or PPS film. For more consistent sensing from unit
to unit, 5% tolerance capacitors are recommended. X7R ceramic types can be obtained in 5% tolerance at little or no
extra cost. In applications where high sensitivity (long burst length) is required the use of PPS capacitors is
recommended.
For battery powered operation a higher value sample capacitor is recommended (typical value 8.2 nF).

4.3

UDFN/USON Package Restrictions
The central pad on the underside of the UDFN/USON chip is connected to ground. Do not run any tracks underneath
the body of the chip, only ground.

4.4

Power Supply and PCB Layout
See Section 5.2 on page 14 for the power supply range. At 3 V current drain averages less than 500 µA in Fast
mode.
If the power supply is shared with another electronic system, care should be taken to ensure that the supply is free of
digital spikes, sags, and surges which can adversely affect the QT1010. The QT1010 will track slow changes in Vdd,
but it can be badly affected by rapid voltage fluctuations. It is highly recommended that a separate voltage regulator
be used just for the QT1010 to isolate it from power supply shifts caused by other components.
If desired, the supply can be regulated using a Low Dropout (LDO) regulator, although such regulators often have
poor transient line and load stability. See Application Note QTAN0002, Secrets of a Successful QTouch™ Design for
further information.
Parts placement: The chip should be placed to minimize the SNSK trace length to reduce low frequency pickup,
and to reduce stray Cx which degrades gain. The Cs and Rs resistors (see Figure 1-1 on page 4) should be placed
as close to the body of the chip as possible so that the trace between Rs and the SNSK pin is very short, thereby
reducing the antenna-like ability of this trace to pick up high frequency signals and feed them directly into the chip. A
ground plane can be used under the chip and the associated discrete components, but the trace from the Rs resistor
and the electrode should not run near ground, to reduce loading.
For best EMC performance the circuit should be made entirely with SMT components.
Electrode trace routing: Keep the electrode trace (and the electrode itself) away from other signal, power, and
ground traces including over or next to ground planes. Adjacent switching signals can induce noise onto the sensing
signal; any adjacent trace or ground plane next to, or under, the electrode trace will cause an increase in Cx load and
desensitize the device.
Note:

For proper operation a 100 nF (0.1 µF) ceramic bypass capacitor must be used directly between Vdd and
Vss, to prevent latch-up if there are substantial Vdd transients; for example, during an ESD event. The
bypass capacitor should be placed very close to the Vss and Vdd pins.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

12
4.5

Power On
On initial power up, the QT1010 requires approximately 100 ms to power on to allow power supplies to stabilize.
During this time the OUT pin state is not valid and should be ignored.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

13
5.

Specifications

5.1

Absolute Maximum Specifications

Operating temperature

–40°C to +85°C

Storage temperature

–55°C to +125°C

VDD

0 to +6.5 V

Max continuous pin current, any control or drive pin

±20 mA

Short circuit duration to Vss, any pin

Infinite

Short circuit duration to Vdd, any pin

Infinite

Voltage forced onto any pin

–0.6V to (Vdd + 0.6) V

CAUTION: Stresses beyond those listed under Absolute Maximum Specifications may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or other conditions beyond those
indicated in the operational sections of this specification is not implied. Exposure to absolute maximum specification
conditions for extended periods may affect device reliability

5.2

Recommended Operating Conditions

VDD

+1.8 to 5.5 V

Short-term supply ripple + noise

±20 mV

Long-term supply stability

±100 mV

Cs value

2 to 50 nF

Cx value

5 to 50 pF

5.3

AC Specifications

Vdd = 3.0 V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted
Parameter

Description

Min

Typ

Max

Units

Notes

TRC

Recalibration time

–

200

–

ms

Cs, Cx dependent

TPC

Charge duration

–

3.05

–

µs

±7.5% spread spectrum variation

TPT

Transfer duration

–

9.0

–

µs

±7.5% spread spectrum variation

TG1

Time between end of burst and
start of the next (Fast mode)

–

1.2

–

ms

TG2

Time between end of burst and
start of the next (LP mode)

–

80

–

ms

Increases with decreasing VDD
See Figure 5-1 on page 15

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

14
Vdd = 3.0 V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted
Parameter

Description

Min

Typ

Max

Units

TBL

Burst length

–

2.45

–

ms

TR

Response time

–

–

100

HeartBeat pulse width

–

15

–

VDD, Cs and Cx dependent. See
Section 4.2 for capacitor
selection.

ms

THB

Notes

µs

Figure 5-1. TG2 – Time Between Bursts (LP Mode)

Figure 5-2. TBL – Burst Length

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

15
5.4

Signal Processing

Vdd = 3.0V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted
Description

Min

Typ

Max

Units

Threshold differential

10

counts

Hysteresis

2

counts

Consensus filter length

4

samples

Max on-duration

60

seconds

Notes

5.5

(At 3 V in LP mode) Will vary
in SYNC mode and with Vdd

DC Specifications

Vdd = 3.0V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted
Parameter
VDD

IDD

Description
Supply voltage

Supply current, Fast mode

Min

Typ

–

203.0
246.0
378.5
542.5
729.0

Units

5.5

1.8

Max

Notes

V

µA

1.8 V
2.0 V
3.0 V
4.0 V
5.0 V

–

µA

1.8 V
2.0 V
3.0 V
4.0 V
5.0 V
Required for proper start-up

–

IDDI

Supply current, LP mode

–

16.5
19.5
34.0
51.5
73.5

VDDS

Supply turn-on slope

10

–

–

V/s

VIL

Low input logic level

–

–

0.2 × Vdd
0.3 × Vdd

V

Vdd = 1.8 V – 2.4 V
Vdd = 2.4 V – 5.5 V

VHL

High input logic level

0.7 × Vdd
0.6 × Vdd

–

–

V

Vdd = 1.8 V – 2.4 V
Vdd = 2.4 V – 5.5 V

VOL

Low output voltage

–

–

0.5

V

OUT, 4 mA sink

VOH

High output voltage

2.3

–

–

V

OUT, 1 mA source

IIL

Input leakage current

–

<0.05

1

µA

CX

Load capacitance range

2

–

50

pF

AR

Acquisition resolution

–

9

14

bits

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

16
5.6

Mechanical Dimensions

5.6.1

6-pin SOT23-6

'




(

(

$



$

3LQ  ,'

$





E

 
6($7,1* 3/$1(

$


$



6LGH 9LHZ

H

7RS 9LHZ

$

$

 
6($7,1* 3/$1(

F



2



$



9LHZ $$

6($7,1* 3/$1(

6(( 9,(: %

/

9LHZ %
20021 ',0(16,216
8QLW RI 0HDVXUH PP
60%2/

0,1

$

±

±



$



±



0$;

120

$
1RWHV  7KLV SDFNDJH LV FRPSOLDQW ZLWK -('( VSHFLILFDWLRQ
02 9DULDWLRQ $%
 'LPHQVLRQ ' GRHV QRW LQFOXGH PROG )ODVK SURWUXVLRQV RU
JDWH EXUUV 0ROG )ODVK SURWUXVWLRQ RU JDWH EXUUV VKDOO QRW
H[FHHG  PP SHU HQG
 'LPHQVLRQ E GRHV QRW LQFOXGH GDPEDU SURWUXVLRQ
$OORZDEOH GDPEDU SURWUXVLRQ VKDOO QRW FDXVH WKH OHDG ZLGWK
WR H[FHHG WKH PD[LPXP E GLPHQVLRQ E PRUH WKDQ  PP
 'LH LV IDFLQJ GRZQ DIWHU WULPIRUP



±



'







127(

(







(







/









H

 %6

E



±



F
T



±



ƒ

±



ƒ


7,7/(
3DFNDJH 'UDZLQJ RQWDFW
SDFNDJHGUDZLQJV#DWPHOFRP

*3

67 OHDG  [  PP 3ODVWLF 6PDOO 2XWOLQH
3DFNDJH 627
'5$:,1* 12

5(9

7$4

67

%

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

17
5.6.2

8-pin UDFN/USON

6LGH YLHZ







%RWWRP YLHZ

$

7RS YLHZ

'
H







N
(



(
3,1  ,'

/










'
I

$

 

$

;
G



E

 



6LGH YLHZ

20021 ',0(16,216
8QLW RI 0HDVXUH PP
$

0,1

120

0$;

$







$







60%2/

E
 $OO GLPHQVLRQV DUH LQ PP $QJOHV LQ GHJUHHV
 RSODQDULW DSSOLHV WR WKH H[SRVHG SDG DV ZHOO DV WKH WHUPLQDOV
RSODQDULW VKDOO QRW H[FHHG  PP
 :DUSDJH VKDOO QRW H[FHHG  PP
 5HIHU WR -('( 0202







'

127(6







'













127(



(
(



H



 %6

/







N









3DFNDJH 'UDZLQJ RQWDFW
SDFNDJHGUDZLQJV#DWPHOFRP

7,7/(
0$ SDG [[ PP %RG  PP SLWFK
[ PP ([SRVHG H3DG 8OWUD7KLQ 'XDO )ODW
1R /HDG 3DFNDJH 8')18621
*3

'5$:,1* 12

5(9

$*

0$

%

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

18
5.7

Part Marking

5.7.1

AT42QT1010– 6-pin SOT23-6
Note:

Samples of the AT42QT1010 may also be marked T10E.

1010

Pin 1 ID

5.7.2

AT42QT1010 – 8-pin UDFN/USON
Note:

Samples of the AT42QT1010 may also be marked T10.

Abbreviated
Part Number:

1010

AT42QT1010
Class code
(H = Industrial,
green NiPdAu)

Die Revision
(Example: “E” shown)

HEC
YZZ

Pin 1 ID

Pin 1

5.8

Abbreviated
Part Number:
AT42QT1010

Assembly Location
Code
(Example: “C” shown)

Lot Number Trace
code (Variable text)

Last Digit of Year
(Variable text)

Part Number
Part Number
AT42QT1010-TSHR

6-pin SOT23 RoHS compliant IC

AT42QT1010-MAH

5.9

Description

8-pin UDFN/USON RoHS compliant IC

Moisture Sensitivity Level (MSL)
MSL Rating

Peak Body Temperature

Specifications

MSL1

260oC

IPC/JEDEC J-STD-020

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

19
Appendix A.
Note:

A.1

Migrating from QT100A

This appendix applies to the use of the SOT23-6 package only.

Introduction
This appendix describes the issues that should be considered when migrating designs from the QT100A to the
QT1010.

A.2

Cs Capacitor
The Cs Capacitor should be increased in value, assuming that other factors, such as the voltage level and electrode
size, remain the same. For example, at 3 V, a Cs value of 4.7 nF should be increased to 8.2 nF.

A.3

PCB Layout
There are no PCB layout issues. The 6-pin WSON package used by the QT100A shares a common footprint with the
6-pin SOT23-6 package used by the QT1010. Both packages share the same pinouts.

A.4

Power Consumption
The QT1010 has a range of 1.8 – 5.5 V for Vdd, compared with 2.0 – 5.5 V on the QT100A.
Notice should also be taken of the differences in power consumption in both Fast and LP operation modes.

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

20
Associated Documents
For additional information, refer to the following document (downloadable from the Touch Technology area of the
Atmel website, www.atmel.com):


Touch Sensors Design Guide



QTAN0002 – Secrets of a Successful QTouch Design

Revision History
Revision No.

History

Revision A – May 2009



Initial release

Revision B – August 2009



Update for chip revision 2.2

Revision C – August 2009



Minor update for clarity

Revision D – January 2010



Power specifications updated for revision 2.4.1

Revision E – January 2010



Part markings updated



MSL specification revised



Other minor updates



Update for chip revision 2.6



Migration advice added

Revision H – May 2010



UDFN/USON package added

Revision I – May 2013



Applied new template

Revision F – February 2010

Revision G – March 2010

AT42QT1010 [DATASHEET]
9541I–AT42–05/2013

21

More Related Content

What's hot

ComNet FDC10M1A Data Sheet
ComNet FDC10M1A Data SheetComNet FDC10M1A Data Sheet
ComNet FDC10M1A Data SheetJMAC Supply
 
SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...
SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...
SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...Thorne & Derrick International
 
Catalog ELCB Mitsubishi-Beeteco.com
Catalog ELCB Mitsubishi-Beeteco.comCatalog ELCB Mitsubishi-Beeteco.com
Catalog ELCB Mitsubishi-Beeteco.comBeeteco
 
Rsf electronik ms45_series_catalog
Rsf electronik ms45_series_catalogRsf electronik ms45_series_catalog
Rsf electronik ms45_series_catalogElectromate
 
Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...
Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...
Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...Thorne & Derrick International
 
Trumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in India
Trumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in IndiaTrumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in India
Trumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in IndiaTrumen Technologies Pvt. Ltd. India
 
Essential Guide Detection 2010
Essential Guide Detection 2010Essential Guide Detection 2010
Essential Guide Detection 2010Gilbert Brault
 
Cable Fault Location Instrument - Street Lighting - SEBA KMT Digiflex
Cable Fault Location Instrument - Street Lighting - SEBA KMT DigiflexCable Fault Location Instrument - Street Lighting - SEBA KMT Digiflex
Cable Fault Location Instrument - Street Lighting - SEBA KMT DigiflexThorne & Derrick International
 
Catalog thiết bị báo mức Kansai Automation
Catalog thiết bị báo mức Kansai AutomationCatalog thiết bị báo mức Kansai Automation
Catalog thiết bị báo mức Kansai AutomationBeeteco
 
11.low power schmitt trigger
11.low power schmitt trigger11.low power schmitt trigger
11.low power schmitt triggerAlexander Decker
 
Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...
Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...
Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...Thorne & Derrick International
 

What's hot (18)

ComNet FDC10M1A Data Sheet
ComNet FDC10M1A Data SheetComNet FDC10M1A Data Sheet
ComNet FDC10M1A Data Sheet
 
Datasheet of TPS62230
Datasheet of TPS62230Datasheet of TPS62230
Datasheet of TPS62230
 
SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...
SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...
SEBA KMT Cable Fault Locators, Surge Generators (Thumpers) - SEBA KMT Cable F...
 
SebKMT Cable Sheath testers & Fault Locators
SebKMT Cable Sheath testers & Fault LocatorsSebKMT Cable Sheath testers & Fault Locators
SebKMT Cable Sheath testers & Fault Locators
 
Catalog ELCB Mitsubishi-Beeteco.com
Catalog ELCB Mitsubishi-Beeteco.comCatalog ELCB Mitsubishi-Beeteco.com
Catalog ELCB Mitsubishi-Beeteco.com
 
Rsf electronik ms45_series_catalog
Rsf electronik ms45_series_catalogRsf electronik ms45_series_catalog
Rsf electronik ms45_series_catalog
 
Cylinder Sensor Brochure
Cylinder Sensor BrochureCylinder Sensor Brochure
Cylinder Sensor Brochure
 
Banner sensors fiber
Banner sensors fiberBanner sensors fiber
Banner sensors fiber
 
Gsm
GsmGsm
Gsm
 
Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...
Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...
Martindale Electric Metrohm MET7A501C Safety Insulation Tester - Martindale E...
 
Trumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in India
Trumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in IndiaTrumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in India
Trumen Vibrating Rod Point Level Switch Supplier Manufacturer Exporter in India
 
Essential Guide Detection 2010
Essential Guide Detection 2010Essential Guide Detection 2010
Essential Guide Detection 2010
 
Cable Fault Location Instrument - Street Lighting - SEBA KMT Digiflex
Cable Fault Location Instrument - Street Lighting - SEBA KMT DigiflexCable Fault Location Instrument - Street Lighting - SEBA KMT Digiflex
Cable Fault Location Instrument - Street Lighting - SEBA KMT Digiflex
 
Catalog thiết bị báo mức Kansai Automation
Catalog thiết bị báo mức Kansai AutomationCatalog thiết bị báo mức Kansai Automation
Catalog thiết bị báo mức Kansai Automation
 
11.low power schmitt trigger
11.low power schmitt trigger11.low power schmitt trigger
11.low power schmitt trigger
 
Low power schmitt trigger
Low power schmitt triggerLow power schmitt trigger
Low power schmitt trigger
 
Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...
Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...
Megger Cable Fault Locators - Power Cable Fault Locators, Van mountable Solut...
 
Seaward Catalogue
Seaward CatalogueSeaward Catalogue
Seaward Catalogue
 

Viewers also liked

センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門
センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門
センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門Koichiro Sasaki
 
Sentiment Analysis with Azure Machine Learning
Sentiment Analysis with Azure Machine LearningSentiment Analysis with Azure Machine Learning
Sentiment Analysis with Azure Machine LearningStefano Tempesta
 
Microsoft Azureで 女子力を生成する
Microsoft Azureで 女子力を生成するMicrosoft Azureで 女子力を生成する
Microsoft Azureで 女子力を生成するShuto Suzuki
 
[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう
[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう
[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めようNaoki (Neo) SATO
 
Azure Machine Learningを触ってみた!
Azure Machine Learningを触ってみた!Azure Machine Learningを触ってみた!
Azure Machine Learningを触ってみた!Takuya Tachibana
 
推薦システムを構築する手順書 with Azure Machine Learning
推薦システムを構築する手順書 with Azure Machine Learning推薦システムを構築する手順書 with Azure Machine Learning
推薦システムを構築する手順書 with Azure Machine LearningMasayuki Ota
 
Intro to Azure Machine Learning
Intro to Azure Machine LearningIntro to Azure Machine Learning
Intro to Azure Machine LearningDeepak Shevani
 
【2017年】ディープラーニングのフレームワーク比較
【2017年】ディープラーニングのフレームワーク比較【2017年】ディープラーニングのフレームワーク比較
【2017年】ディープラーニングのフレームワーク比較Ryota Suzuki
 
Azure MLで機械学習をやってみよう
Azure MLで機械学習をやってみようAzure MLで機械学習をやってみよう
Azure MLで機械学習をやってみようRyuichi Tokugami
 
第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する
第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する
第17回Machine Learning 15 minutes!:ビジネスの出会いを科学するKanji Takahashi
 
AlphaGo Zero 解説
AlphaGo Zero 解説AlphaGo Zero 解説
AlphaGo Zero 解説suckgeun lee
 
[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習
[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習
[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習de:code 2017
 
「サーバレスの薄い本」からの1年 #serverlesstokyo
「サーバレスの薄い本」からの1年 #serverlesstokyo「サーバレスの薄い本」からの1年 #serverlesstokyo
「サーバレスの薄い本」からの1年 #serverlesstokyoMasahiro NAKAYAMA
 

Viewers also liked (13)

センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門
センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門
センサーデバイスのデータを使った Microsoft Azure Machine Learning 実装入門
 
Sentiment Analysis with Azure Machine Learning
Sentiment Analysis with Azure Machine LearningSentiment Analysis with Azure Machine Learning
Sentiment Analysis with Azure Machine Learning
 
Microsoft Azureで 女子力を生成する
Microsoft Azureで 女子力を生成するMicrosoft Azureで 女子力を生成する
Microsoft Azureで 女子力を生成する
 
[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう
[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう
[Developers Festa Sapporo 2015] Azure Machine Learningで機械学習を始めよう
 
Azure Machine Learningを触ってみた!
Azure Machine Learningを触ってみた!Azure Machine Learningを触ってみた!
Azure Machine Learningを触ってみた!
 
推薦システムを構築する手順書 with Azure Machine Learning
推薦システムを構築する手順書 with Azure Machine Learning推薦システムを構築する手順書 with Azure Machine Learning
推薦システムを構築する手順書 with Azure Machine Learning
 
Intro to Azure Machine Learning
Intro to Azure Machine LearningIntro to Azure Machine Learning
Intro to Azure Machine Learning
 
【2017年】ディープラーニングのフレームワーク比較
【2017年】ディープラーニングのフレームワーク比較【2017年】ディープラーニングのフレームワーク比較
【2017年】ディープラーニングのフレームワーク比較
 
Azure MLで機械学習をやってみよう
Azure MLで機械学習をやってみようAzure MLで機械学習をやってみよう
Azure MLで機械学習をやってみよう
 
第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する
第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する
第17回Machine Learning 15 minutes!:ビジネスの出会いを科学する
 
AlphaGo Zero 解説
AlphaGo Zero 解説AlphaGo Zero 解説
AlphaGo Zero 解説
 
[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習
[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習
[AI02] こんなに敷居が低いのならば、Azure でやってみようか機械学習
 
「サーバレスの薄い本」からの1年 #serverlesstokyo
「サーバレスの薄い本」からの1年 #serverlesstokyo「サーバレスの薄い本」からの1年 #serverlesstokyo
「サーバレスの薄い本」からの1年 #serverlesstokyo
 

Similar to AT42QT1010 Single-key QTouch® Touch Sensor IC Datasheet

ANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGY
ANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGYANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGY
ANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGYcscpconf
 
Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology
Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology
Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology csandit
 
Ultrasonic level meter
Ultrasonic level meterUltrasonic level meter
Ultrasonic level meterhandson28
 
Multiband Transceivers - [Chapter 6] Multi-mode and Multi-band Transceivers
Multiband Transceivers - [Chapter 6] Multi-mode and Multi-band TransceiversMultiband Transceivers - [Chapter 6] Multi-mode and Multi-band Transceivers
Multiband Transceivers - [Chapter 6] Multi-mode and Multi-band TransceiversSimen Li
 
Pc to pc optical fiber communication
Pc to pc optical fiber communicationPc to pc optical fiber communication
Pc to pc optical fiber communicationPadmakar Mangrule
 
ECE 6030 Device Electronics.docx
ECE 6030 Device Electronics.docxECE 6030 Device Electronics.docx
ECE 6030 Device Electronics.docxwrite31
 
DWDM-SFP10G-40-C21-T02#141067.pdf
DWDM-SFP10G-40-C21-T02#141067.pdfDWDM-SFP10G-40-C21-T02#141067.pdf
DWDM-SFP10G-40-C21-T02#141067.pdfGLsun Mall
 
dwdm-sfp10g-40km-c56-optical-module-141102.doc
dwdm-sfp10g-40km-c56-optical-module-141102.docdwdm-sfp10g-40km-c56-optical-module-141102.doc
dwdm-sfp10g-40km-c56-optical-module-141102.docGLsun Mall
 
dwdm-sfp10g-40km-c57-optical-module-141103.doc
dwdm-sfp10g-40km-c57-optical-module-141103.docdwdm-sfp10g-40km-c57-optical-module-141103.doc
dwdm-sfp10g-40km-c57-optical-module-141103.docGLsun Mall
 
dwdm-sfp10g-40km-c61-optical-module-141107.doc
dwdm-sfp10g-40km-c61-optical-module-141107.docdwdm-sfp10g-40km-c61-optical-module-141107.doc
dwdm-sfp10g-40km-c61-optical-module-141107.docGLsun Mall
 
dwdm-sfp10g-40km-c60-optical-module-141106.doc
dwdm-sfp10g-40km-c60-optical-module-141106.docdwdm-sfp10g-40km-c60-optical-module-141106.doc
dwdm-sfp10g-40km-c60-optical-module-141106.docGLsun Mall
 
Datasheet humidity-sensor-sht21
Datasheet humidity-sensor-sht21Datasheet humidity-sensor-sht21
Datasheet humidity-sensor-sht21jeblanco81
 
dwdm-sfp10g-40km-c53-optical-module-141099.doc
dwdm-sfp10g-40km-c53-optical-module-141099.docdwdm-sfp10g-40km-c53-optical-module-141099.doc
dwdm-sfp10g-40km-c53-optical-module-141099.docGLsun Mall
 
spf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdf
spf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdfspf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdf
spf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdfGLsun Mall
 
dwdm-sfp10g-40km-c59-optical-module-141105.doc
dwdm-sfp10g-40km-c59-optical-module-141105.docdwdm-sfp10g-40km-c59-optical-module-141105.doc
dwdm-sfp10g-40km-c59-optical-module-141105.docGLsun Mall
 
dwdm-sfp10g-40km-c58-optical-module-141104.doc
dwdm-sfp10g-40km-c58-optical-module-141104.docdwdm-sfp10g-40km-c58-optical-module-141104.doc
dwdm-sfp10g-40km-c58-optical-module-141104.docGLsun Mall
 
DWDM-SFP10G-40-C23-T02#141069.pdf
DWDM-SFP10G-40-C23-T02#141069.pdfDWDM-SFP10G-40-C23-T02#141069.pdf
DWDM-SFP10G-40-C23-T02#141069.pdfGLsun Mall
 
DWDM-SFP10G-40-C20-T02#141066.pdf
DWDM-SFP10G-40-C20-T02#141066.pdfDWDM-SFP10G-40-C20-T02#141066.pdf
DWDM-SFP10G-40-C20-T02#141066.pdfGLsun Mall
 

Similar to AT42QT1010 Single-key QTouch® Touch Sensor IC Datasheet (20)

ANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGY
ANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGYANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGY
ANALYSIS OF CMOS AND MTCMOS CIRCUITS USING 250 NANO METER TECHNOLOGY
 
Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology
Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology
Analysis of CMOS and MTCMOS Circuits Using 250 Nano Meter Technology
 
Tyco a1029a
Tyco a1029aTyco a1029a
Tyco a1029a
 
Ultrasonic level meter
Ultrasonic level meterUltrasonic level meter
Ultrasonic level meter
 
Multiband Transceivers - [Chapter 6] Multi-mode and Multi-band Transceivers
Multiband Transceivers - [Chapter 6] Multi-mode and Multi-band TransceiversMultiband Transceivers - [Chapter 6] Multi-mode and Multi-band Transceivers
Multiband Transceivers - [Chapter 6] Multi-mode and Multi-band Transceivers
 
Pc to pc optical fiber communication
Pc to pc optical fiber communicationPc to pc optical fiber communication
Pc to pc optical fiber communication
 
HTU21D humidity and temperature sensor
HTU21D humidity and temperature sensorHTU21D humidity and temperature sensor
HTU21D humidity and temperature sensor
 
ECE 6030 Device Electronics.docx
ECE 6030 Device Electronics.docxECE 6030 Device Electronics.docx
ECE 6030 Device Electronics.docx
 
DWDM-SFP10G-40-C21-T02#141067.pdf
DWDM-SFP10G-40-C21-T02#141067.pdfDWDM-SFP10G-40-C21-T02#141067.pdf
DWDM-SFP10G-40-C21-T02#141067.pdf
 
dwdm-sfp10g-40km-c56-optical-module-141102.doc
dwdm-sfp10g-40km-c56-optical-module-141102.docdwdm-sfp10g-40km-c56-optical-module-141102.doc
dwdm-sfp10g-40km-c56-optical-module-141102.doc
 
dwdm-sfp10g-40km-c57-optical-module-141103.doc
dwdm-sfp10g-40km-c57-optical-module-141103.docdwdm-sfp10g-40km-c57-optical-module-141103.doc
dwdm-sfp10g-40km-c57-optical-module-141103.doc
 
dwdm-sfp10g-40km-c61-optical-module-141107.doc
dwdm-sfp10g-40km-c61-optical-module-141107.docdwdm-sfp10g-40km-c61-optical-module-141107.doc
dwdm-sfp10g-40km-c61-optical-module-141107.doc
 
dwdm-sfp10g-40km-c60-optical-module-141106.doc
dwdm-sfp10g-40km-c60-optical-module-141106.docdwdm-sfp10g-40km-c60-optical-module-141106.doc
dwdm-sfp10g-40km-c60-optical-module-141106.doc
 
Datasheet humidity-sensor-sht21
Datasheet humidity-sensor-sht21Datasheet humidity-sensor-sht21
Datasheet humidity-sensor-sht21
 
dwdm-sfp10g-40km-c53-optical-module-141099.doc
dwdm-sfp10g-40km-c53-optical-module-141099.docdwdm-sfp10g-40km-c53-optical-module-141099.doc
dwdm-sfp10g-40km-c53-optical-module-141099.doc
 
spf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdf
spf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdfspf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdf
spf-2.5g-bx40d-1550nm-1310nm-40km-bidi-fiber-optical-module-151067.pdf
 
dwdm-sfp10g-40km-c59-optical-module-141105.doc
dwdm-sfp10g-40km-c59-optical-module-141105.docdwdm-sfp10g-40km-c59-optical-module-141105.doc
dwdm-sfp10g-40km-c59-optical-module-141105.doc
 
dwdm-sfp10g-40km-c58-optical-module-141104.doc
dwdm-sfp10g-40km-c58-optical-module-141104.docdwdm-sfp10g-40km-c58-optical-module-141104.doc
dwdm-sfp10g-40km-c58-optical-module-141104.doc
 
DWDM-SFP10G-40-C23-T02#141069.pdf
DWDM-SFP10G-40-C23-T02#141069.pdfDWDM-SFP10G-40-C23-T02#141069.pdf
DWDM-SFP10G-40-C23-T02#141069.pdf
 
DWDM-SFP10G-40-C20-T02#141066.pdf
DWDM-SFP10G-40-C20-T02#141066.pdfDWDM-SFP10G-40-C20-T02#141066.pdf
DWDM-SFP10G-40-C20-T02#141066.pdf
 

More from Brutcat

Duurzaamheidsrapport ozg
Duurzaamheidsrapport ozg Duurzaamheidsrapport ozg
Duurzaamheidsrapport ozg Brutcat
 
Chipmatedossier
ChipmatedossierChipmatedossier
ChipmatedossierBrutcat
 
Caars dossier sofieh_stephanievh_Correctie
Caars dossier sofieh_stephanievh_CorrectieCaars dossier sofieh_stephanievh_Correctie
Caars dossier sofieh_stephanievh_CorrectieBrutcat
 
Eindpresentatie caars Correctie
Eindpresentatie caars CorrectieEindpresentatie caars Correctie
Eindpresentatie caars CorrectieBrutcat
 
Eindpresentatie caars
Eindpresentatie caarsEindpresentatie caars
Eindpresentatie caarsBrutcat
 
Dossier 'Caars', by Sofie H and Stephanie VH
Dossier 'Caars', by Sofie H and Stephanie VHDossier 'Caars', by Sofie H and Stephanie VH
Dossier 'Caars', by Sofie H and Stephanie VHBrutcat
 
Capacitive sensor 1 weerstandstesting
Capacitive sensor 1 weerstandstestingCapacitive sensor 1 weerstandstesting
Capacitive sensor 1 weerstandstestingBrutcat
 
Follow me sofie&stephanie
Follow me sofie&stephanieFollow me sofie&stephanie
Follow me sofie&stephanieBrutcat
 
3 concepten sofie&stephanie
3 concepten sofie&stephanie3 concepten sofie&stephanie
3 concepten sofie&stephanieBrutcat
 
Montageplan kookhulp
Montageplan kookhulpMontageplan kookhulp
Montageplan kookhulpBrutcat
 
Kookhulp ontwerpdossier
Kookhulp ontwerpdossierKookhulp ontwerpdossier
Kookhulp ontwerpdossierBrutcat
 

More from Brutcat (11)

Duurzaamheidsrapport ozg
Duurzaamheidsrapport ozg Duurzaamheidsrapport ozg
Duurzaamheidsrapport ozg
 
Chipmatedossier
ChipmatedossierChipmatedossier
Chipmatedossier
 
Caars dossier sofieh_stephanievh_Correctie
Caars dossier sofieh_stephanievh_CorrectieCaars dossier sofieh_stephanievh_Correctie
Caars dossier sofieh_stephanievh_Correctie
 
Eindpresentatie caars Correctie
Eindpresentatie caars CorrectieEindpresentatie caars Correctie
Eindpresentatie caars Correctie
 
Eindpresentatie caars
Eindpresentatie caarsEindpresentatie caars
Eindpresentatie caars
 
Dossier 'Caars', by Sofie H and Stephanie VH
Dossier 'Caars', by Sofie H and Stephanie VHDossier 'Caars', by Sofie H and Stephanie VH
Dossier 'Caars', by Sofie H and Stephanie VH
 
Capacitive sensor 1 weerstandstesting
Capacitive sensor 1 weerstandstestingCapacitive sensor 1 weerstandstesting
Capacitive sensor 1 weerstandstesting
 
Follow me sofie&stephanie
Follow me sofie&stephanieFollow me sofie&stephanie
Follow me sofie&stephanie
 
3 concepten sofie&stephanie
3 concepten sofie&stephanie3 concepten sofie&stephanie
3 concepten sofie&stephanie
 
Montageplan kookhulp
Montageplan kookhulpMontageplan kookhulp
Montageplan kookhulp
 
Kookhulp ontwerpdossier
Kookhulp ontwerpdossierKookhulp ontwerpdossier
Kookhulp ontwerpdossier
 

Recently uploaded

Unleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding ClubUnleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding ClubKalema Edgar
 
"Federated learning: out of reach no matter how close",Oleksandr Lapshyn
"Federated learning: out of reach no matter how close",Oleksandr Lapshyn"Federated learning: out of reach no matter how close",Oleksandr Lapshyn
"Federated learning: out of reach no matter how close",Oleksandr LapshynFwdays
 
Story boards and shot lists for my a level piece
Story boards and shot lists for my a level pieceStory boards and shot lists for my a level piece
Story boards and shot lists for my a level piececharlottematthew16
 
Designing IA for AI - Information Architecture Conference 2024
Designing IA for AI - Information Architecture Conference 2024Designing IA for AI - Information Architecture Conference 2024
Designing IA for AI - Information Architecture Conference 2024Enterprise Knowledge
 
My INSURER PTE LTD - Insurtech Innovation Award 2024
My INSURER PTE LTD - Insurtech Innovation Award 2024My INSURER PTE LTD - Insurtech Innovation Award 2024
My INSURER PTE LTD - Insurtech Innovation Award 2024The Digital Insurer
 
DevEX - reference for building teams, processes, and platforms
DevEX - reference for building teams, processes, and platformsDevEX - reference for building teams, processes, and platforms
DevEX - reference for building teams, processes, and platformsSergiu Bodiu
 
"LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks...
"LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks..."LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks...
"LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks...Fwdays
 
Developer Data Modeling Mistakes: From Postgres to NoSQL
Developer Data Modeling Mistakes: From Postgres to NoSQLDeveloper Data Modeling Mistakes: From Postgres to NoSQL
Developer Data Modeling Mistakes: From Postgres to NoSQLScyllaDB
 
Leverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage Cost
Leverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage CostLeverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage Cost
Leverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage CostZilliz
 
Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024Scott Keck-Warren
 
Human Factors of XR: Using Human Factors to Design XR Systems
Human Factors of XR: Using Human Factors to Design XR SystemsHuman Factors of XR: Using Human Factors to Design XR Systems
Human Factors of XR: Using Human Factors to Design XR SystemsMark Billinghurst
 
Powerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time ClashPowerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time Clashcharlottematthew16
 
DevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache MavenDevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache MavenHervé Boutemy
 
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmaticsKotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmaticscarlostorres15106
 
Unraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfUnraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfAlex Barbosa Coqueiro
 
Bun (KitWorks Team Study 노별마루 발표 2024.4.22)
Bun (KitWorks Team Study 노별마루 발표 2024.4.22)Bun (KitWorks Team Study 노별마루 발표 2024.4.22)
Bun (KitWorks Team Study 노별마루 발표 2024.4.22)Wonjun Hwang
 
What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024Stephanie Beckett
 
Gen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdfGen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdfAddepto
 
AI as an Interface for Commercial Buildings
AI as an Interface for Commercial BuildingsAI as an Interface for Commercial Buildings
AI as an Interface for Commercial BuildingsMemoori
 

Recently uploaded (20)

Unleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding ClubUnleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding Club
 
"Federated learning: out of reach no matter how close",Oleksandr Lapshyn
"Federated learning: out of reach no matter how close",Oleksandr Lapshyn"Federated learning: out of reach no matter how close",Oleksandr Lapshyn
"Federated learning: out of reach no matter how close",Oleksandr Lapshyn
 
Story boards and shot lists for my a level piece
Story boards and shot lists for my a level pieceStory boards and shot lists for my a level piece
Story boards and shot lists for my a level piece
 
Designing IA for AI - Information Architecture Conference 2024
Designing IA for AI - Information Architecture Conference 2024Designing IA for AI - Information Architecture Conference 2024
Designing IA for AI - Information Architecture Conference 2024
 
My INSURER PTE LTD - Insurtech Innovation Award 2024
My INSURER PTE LTD - Insurtech Innovation Award 2024My INSURER PTE LTD - Insurtech Innovation Award 2024
My INSURER PTE LTD - Insurtech Innovation Award 2024
 
DevEX - reference for building teams, processes, and platforms
DevEX - reference for building teams, processes, and platformsDevEX - reference for building teams, processes, and platforms
DevEX - reference for building teams, processes, and platforms
 
"LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks...
"LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks..."LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks...
"LLMs for Python Engineers: Advanced Data Analysis and Semantic Kernel",Oleks...
 
Developer Data Modeling Mistakes: From Postgres to NoSQL
Developer Data Modeling Mistakes: From Postgres to NoSQLDeveloper Data Modeling Mistakes: From Postgres to NoSQL
Developer Data Modeling Mistakes: From Postgres to NoSQL
 
E-Vehicle_Hacking_by_Parul Sharma_null_owasp.pptx
E-Vehicle_Hacking_by_Parul Sharma_null_owasp.pptxE-Vehicle_Hacking_by_Parul Sharma_null_owasp.pptx
E-Vehicle_Hacking_by_Parul Sharma_null_owasp.pptx
 
Leverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage Cost
Leverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage CostLeverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage Cost
Leverage Zilliz Serverless - Up to 50X Saving for Your Vector Storage Cost
 
Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024Advanced Test Driven-Development @ php[tek] 2024
Advanced Test Driven-Development @ php[tek] 2024
 
Human Factors of XR: Using Human Factors to Design XR Systems
Human Factors of XR: Using Human Factors to Design XR SystemsHuman Factors of XR: Using Human Factors to Design XR Systems
Human Factors of XR: Using Human Factors to Design XR Systems
 
Powerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time ClashPowerpoint exploring the locations used in television show Time Clash
Powerpoint exploring the locations used in television show Time Clash
 
DevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache MavenDevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache Maven
 
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmaticsKotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
Kotlin Multiplatform & Compose Multiplatform - Starter kit for pragmatics
 
Unraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfUnraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdf
 
Bun (KitWorks Team Study 노별마루 발표 2024.4.22)
Bun (KitWorks Team Study 노별마루 발표 2024.4.22)Bun (KitWorks Team Study 노별마루 발표 2024.4.22)
Bun (KitWorks Team Study 노별마루 발표 2024.4.22)
 
What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024
 
Gen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdfGen AI in Business - Global Trends Report 2024.pdf
Gen AI in Business - Global Trends Report 2024.pdf
 
AI as an Interface for Commercial Buildings
AI as an Interface for Commercial BuildingsAI as an Interface for Commercial Buildings
AI as an Interface for Commercial Buildings
 

AT42QT1010 Single-key QTouch® Touch Sensor IC Datasheet

  • 1. Atmel AT42QT1010 Single-key QTouch® Touch Sensor IC DATASHEET Features  Number of Keys:  One – configurable as either a single key or a proximity sensor  Technology:  Patented spread-spectrum charge-transfer (direct mode)  Key outline sizes:                6 mm × 6 mm or larger (panel thickness dependent); widely different sizes and shapes possible Electrode design:  Solid or ring electrode shapes PCB Layers required:  One Electrode materials:  Etched copper, silver, carbon, Indium Tin Oxide (ITO) Electrode substrates:  PCB, FPCB, plastic films, glass Panel materials:  Plastic, glass, composites, painted surfaces (low particle density metallic paints possible) Panel thickness:  Up to 12 mm glass, 6 mm plastic (electrode size and Cs dependent) Key sensitivity:  Settable via capacitor (Cs) Interface:  Digital output, active high Moisture tolerance:  Increased moisture tolerance based on hardware design and firmware tuning Operating Voltage:  1.8 V – 5.5 V; 17 µA at 1.8 V typical Package:  6-pin SOT23-6 RoHS compliant  8-pin UDFN/USON RoHS compliant Signal processing:  Self-calibration, auto drift compensation, noise filtering Applications:  Control panels, consumer appliances, proximity sensor applications, toys, lighting controls, mechanical switch or button, Patents:  QTouch® (patented charge-transfer method)  HeartBeat (monitors health of device) 9541I–AT42–05/2013
  • 2. 1. Pinout and Schematic 1.1 Pinout Configurations 1.1.1 6-pin SOT23-6 Pin 1 ID OUT 6 SYNC/ MODE VSS 2 5 VDD SNSK 1.1.2 1 3 4 SNS 8-pin UDFN/USON Pin 1 ID SNSK 1 8 SNS N/C 2 7 VDD N/C 3 6 SYNC/MODE VSS 4 5 OUT AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 2
  • 3. 1.2 Pin Descriptions 1.2.1 6-pin SOT23-6 Table 1-1. Pin Listing Name Pin Type OUT 1 O Output state – VSS 2 P Supply ground – SNSK 3 I/O Sense pin Cs + Key SNS 4 I/O Sense pin Cs VDD 5 P Power – SYNC 6 I SYNC and Mode Input Pin is either SYNC/Slow/Fast Mode, depending on logic level applied (see Section 3.1 on page 7) I OD Input only Open drain output 1.2.2 O P Comments If Unused, Connect To... Output only, push-pull Ground or power I/O Input/output 8-pin UDFN/USON Table 1-2. Pin Listing Name Pin Type SNSK 1 I/O N/C 2 N/C Comments If Unused, Connect To... Sense pin Cs + Key – No connection – 3 – No connection – VSS 4 P Supply ground – OUT 5 O Output state – SYNC/ MODE 6 I SYNC and Mode Input Pin is either SYNC/Slow/Fast Mode, depending on logic level applied (see Section 3.1 on page 7) VDD 7 P Power – SNS 8 I/O Sense pin Cs I OD Input only Open drain output O P Output only, push-pull Ground or power I/O Input/output AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 3
  • 4. 1.3 Schematics 1.3.1 6-pin SOT23-6 Figure 1-1. Basic Circuit Configuration VDD SENSE ELECTRODE 5 VDD 1 OUT SNSK Rs 3 Cs SNS 4 Cx SYNC/MODE 6 VSS 2 Note: A bypass capacitor should be tightly wired between Vdd and Vss and kept close to pin 5. 1.3.2 8-pin UDFN/USON Figure 1-2. Basic Circuit Configuration Vdd SENSE ELECTRODE 7 VDD 5 SNSK OUT Rs 1 Cs 2 3 NC SNS NC SYNC/MODE 8 6 Cx VSS 4 Note: A bypass capacitor should be tightly wired between Vdd and Vss and kept close to pin 5. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 4
  • 5. 2. Overview of the AT42QT1010 2.1 Introduction The AT42QT1010 (QT1010) is a digital burst mode charge-transfer (QT™) sensor that is capable of detecting nearproximity or touch, making it ideal for implementing touch controls. With the proper electrode and circuit design, the self-contained digital IC will project a touch or proximity field to several centimeters through any dielectric like glass, plastic, stone, ceramic, and even most kinds of wood. It can also turn small metal-bearing objects into intrinsic sensors, making them responsive to proximity or touch. This capability, coupled with its ability to self-calibrate, can lead to entirely new product concepts. The QT1010 is designed specifically for human interfaces, like control panels, appliances, toys, lighting controls, or anywhere a mechanical switch or button may be found. It includes all hardware and signal processing functions necessary to provide stable sensing under a wide variety of changing conditions. Only a single low-cost capacitor is required for operation. 2.2 Basic Operation Figure 1-1 on page 4 and Figure 1-2 on page 4 show basic circuits. The QT1010 employs bursts of charge-transfer cycles to acquire its signal. Burst mode permits power consumption in the microamp range, dramatically reduces RF emissions, lowers susceptibility to EMI, and yet permits excellent response time. Internally the signals are digitally processed to reject impulse noise, using a “consensus” filter which requires four consecutive confirmations of a detection before the output is activated. The QT switches and charge measurement hardware functions are all internal to the QT1010. 2.3 Electrode Drive For optimum noise immunity, the electrode should only be connected to SNSK. In all cases the rule Cs >> Cx must be observed for proper operation; a typical load capacitance (Cx) ranges from 5 – 20 pF while Cs is usually about 2 – 50 nF. Increasing amounts of Cx destroy gain, therefore it is important to limit the amount of stray capacitance on both SNS terminals. This can be done, for example, by minimizing trace lengths and widths and keeping these traces away from power or ground traces or copper pours. The traces and any components associated with SNS and SNSK will become touch sensitive and should be treated with caution to limit the touch area to the desired location. A series resistor, Rs, should be placed in line with SNSK to the electrode to suppress ESD and EMC effects. 2.4 Sensitivity 2.4.1 Introduction The sensitivity on the QT1010 is a function of things like the value of Cs, electrode size and capacitance, electrode shape and orientation, the composition and aspect of the object to be sensed, the thickness and composition of any overlaying panel material, and the degree of ground coupling of both sensor and object. 2.4.2 Increasing Sensitivity In some cases it may be desirable to increase sensitivity; for example, when using the sensor with very thick panels having a low dielectric constant, or when the device is used as a proximity sensor. Sensitivity can often be increased by using a larger electrode or reducing panel thickness. Increasing electrode size can have diminishing returns, as high values of Cx will reduce sensor gain. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 5
  • 6. The value of Cs also has a dramatic effect on sensitivity, and this can be increased in value with the trade-off of slower response time and more power. Increasing the electrode's surface area will not substantially increase touch sensitivity if its diameter is already much larger in surface area than the object being detected. Panel material can also be changed to one having a higher dielectric constant, which will better help to propagate the field. In the case of proximity detection, usually the object being detected is on an approaching hand, so a larger surface area can be effective. Ground planes around and under the electrode and its SNSK trace will cause high Cx loading and destroy gain. The possible signal-to-noise ratio benefits of ground area are more than negated by the decreased gain from the circuit, and so ground areas around electrodes are discouraged. Metal areas near the electrode will reduce the field strength and increase Cx loading and should be avoided, if possible. Keep ground away from the electrodes and traces. 2.4.3 Decreasing Sensitivity In some cases the QT1010 may be too sensitive. In this case gain can be easily lowered further by decreasing Cs. 2.4.4 Proximity Sensing By increasing the sensitivity, the QT1010 can be used as a very effective proximity sensor, allowing the presence of a nearby object (typically a hand) to be detected. In this scenario, as the object being sensed is typically a hand, very large electrode sizes can be used, which is extremely effective in increasing the sensitivity of the detector. In this case, the value of Cs will also need to be increased to ensure improved sensitivity, as mentioned in Section 2.4.2. Note that, although this affects the responsiveness of the sensor, it is less of an issue in proximity sensing applications; in such applications it is necessary to detect simply the presence of a large object, rather than a small, precise touch. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 6
  • 7. 3. Operation Specifics 3.1 Run Modes 3.1.1 Introduction The QT1010 has three running modes which depend on the state of the SYNC pin (high or low). 3.1.2 Fast Mode The QT1010 runs in Fast mode if the SYNC pin is permanently high. In this mode the QT1010 runs at maximum speed at the expense of increased current consumption. Fast mode is useful when speed of response is the prime design requirement. The delay between bursts in Fast mode is approximately 1 ms, as shown in Figure 3-1. Figure 3-1. Fast Mode Bursts (SYNC Held High) SNSK ~1 ms SYNC Low Power Mode The QT1010 runs in Low Power (LP) mode if the SYNC pin is held low. In this mode it sleeps for approximately 80 ms at the end of each burst, saving power but slowing response. On detecting a possible key touch, it temporarily switches to Fast mode until either the key touch is confirmed or found to be spurious (via the detect integration process). It then returns to LP mode after the key touch is resolved, as shown in Figure 3-2. ~80 ms SNSK sleep touch Figure 3-2. Low Power Mode (SYNC Held Low) Key 3.1.3 sleep fast detect integrator sleep SYNC OUT AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 7
  • 8. 3.1.4 SYNC Mode It is possible to synchronize the device to an external clock source by placing an appropriate waveform on the SYNC pin. SYNC mode can synchronize multiple QT1010 devices to each other to prevent cross-interference, or it can be used to enhance noise immunity from low frequency sources such as 50Hz or 60Hz mains signals. The SYNC pin is sampled at the end of each burst. If the device is in Fast mode and the SYNC pin is sampled high, then the device continues to operate in Fast mode (Figure 3-1 on page 7). If SYNC is sampled low, then the device goes to sleep. From then on, it will operate in SYNC mode (Figure 3-2). Therefore, to guarantee entry into SYNC mode the low period of the SYNC signal should be longer than the burst length (Figure 3-3). Figure 3-3. SYNC Mode (Triggered by SYNC Edges) SNSK sleep sleep sleep SYNC SNSK Revert to Fast Mode slow mode sleep period sleep sleep sleep Revert to Slow Mode slow mode sleep period SYNC However, once SYNC mode has been entered, if the SYNC signal consists of a series of short pulses (>10 µs) then a burst will only occur on the falling edge of each pulse (Figure 3-4) instead of on each change of SYNC signal, as normal (Figure 3-3). In SYNC mode, the device will sleep after each measurement burst (just as in LP mode) but will be awakened by a change in the SYNC signal in either direction, resulting in a new measurement burst. If SYNC remains unchanged for a period longer than the LP mode sleep period (about 80 ms), the device will resume operation in either Fast or LP mode depending on the level of the SYNC pin (Figure 3-3). There is no detect integrator (DI) in SYNC mode (each touch is a detection) but the Max On-duration will depend on the time between SYNC pulses; see Section 3.3 and Section 3.4 on page 9. Recalibration timeout is a fixed number of measurements so will vary with the SYNC period. Figure 3-4. SYNC Mode (Short Pulses) SNSK >10 μs >10 μs >10 μs SYNC AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 8
  • 9. 3.2 Threshold The internal signal threshold level is fixed at 10 counts of change with respect to the internal reference level, which in turn adjusts itself slowly in accordance with the drift compensation mechanism. The QT1010 employs a hysteresis dropout of two counts of the delta between the reference and threshold levels. 3.3 Max On-duration If an object or material obstructs the sense pad the signal may rise enough to create a detection, preventing further operation. To prevent this, the sensor includes a timer which monitors detections. If a detection exceeds the timer setting the sensor performs a full recalibration. This is known as the Max On-duration feature and is set to ~60s (at 3V in LP mode). This will vary slightly with Cs and if SYNC mode is used. As the internal timebase for Max Onduration is determined by the burst rate, the use of SYNC can cause dramatic changes in this parameter depending on the SYNC pulse spacing. For example, at 60Hz SYNC mode the Max On-duration will be ~6s at 3V. 3.4 Detect Integrator It is desirable to suppress detections generated by electrical noise or from quick brushes with an object. To accomplish this, the QT1010 incorporates a detect integration (DI) counter that increments with each detection until a limit is reached, after which the output is activated. If no detection is sensed prior to the final count, the counter is reset immediately to zero. In the QT1010, the required count is four. In LP mode the device will switch to Fast mode temporarily in order to resolve the detection more quickly; after a touch is either confirmed or denied the device will revert back to normal LP mode operation automatically. The DI can also be viewed as a “consensus filter” that requires four successive detections to create an output. 3.5 Forced Sensor Recalibration The QT1010 has no recalibration pin; a forced recalibration is accomplished when the device is powered up or after the recalibration timeout. However, supply drain is low so it is a simple matter to treat the entire IC as a controllable load; driving the QT1010's Vdd pin directly from another logic gate or a microcontroller port will serve as both power and “forced recalibration”. The source resistance of most CMOS gates and microcontrollers is low enough to provide direct power without problem. 3.6 Drift Compensation Signal drift can occur because of changes in Cx and Cs over time. It is crucial that drift be compensated for, otherwise false detections, non-detections, and sensitivity shifts will follow. Drift compensation (Figure 3-5) is performed by making the reference level track the raw signal at a slow rate, but only while there is no detection in effect. The rate of adjustment must be performed slowly, otherwise legitimate detections could be ignored. The QT1010 drift compensates using a slew-rate limited change to the reference level; the threshold and hysteresis values are slaved to this reference. Once an object is sensed, the drift compensation mechanism ceases since the signal is legitimately high, and therefore should not cause the reference level to change. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 9
  • 10. Figure 3-5. Drift Compensation Signal Threshold Hysteresis Reference Output The QT1010 drift compensation is asymmetric; the reference level drift-compensates in one direction faster than it does in the other. Specifically, it compensates faster for decreasing signals than for increasing signals. Increasing signals should not be compensated for quickly, since an approaching finger could be compensated for partially or entirely before even approaching the sense electrode. However, an obstruction over the sense pad, for which the sensor has already made full allowance, could suddenly be removed leaving the sensor with an artificially elevated reference level and thus become insensitive to touch. In this latter case, the sensor will compensate for the object's removal very quickly, usually in only a few seconds. With large values of Cs and small values of Cx, drift compensation will appear to operate more slowly than with the converse. Note that the positive and negative drift compensation rates are different. 3.7 Response Time The QT1010's response time is highly dependent on run mode and burst length, which in turn is dependent on Cs and Cx. With increasing Cs, response time slows, while increasing levels of Cx reduce response time. The response time will also be a lot slower in LP or SYNC mode due to a longer time between burst measurements. 3.8 Spread Spectrum The QT1010 modulates its internal oscillator by ±7.5% during the measurement burst. This spreads the generated noise over a wider band, reducing emission levels. This also reduces susceptibility since there is no longer a single fundamental burst frequency. 3.9 Output Features 3.9.1 Output The output of the QT1010 is active-high upon detection. The output will remain active-high for the duration of the detection, or until the Max On-duration expires, whichever occurs first. If a Max On-duration timeout occurs first, the sensor performs a full recalibration and the output becomes inactive (low) until the next detection. 3.9.2 HeartBeat Output The QT1010 output has a HeartBeat “health” indicator superimposed on it in all modes. This operates by taking the output pin into a three-state mode for 15 µs, once before every QT burst. This output state can be used to determine that the sensor is operating properly, using one of several simple methods, or it can be ignored. The HeartBeat indicator can be sampled by using a pull-up resistor on the OUT pin (Figure 3-6), and feeding the resulting positive-going pulse into a counter, flip flop, one-shot, or other circuit. The pulses will only be visible when the chip is not detecting a touch. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 10
  • 11. Figure 3-6. Obtaining HeartBeat Pulses with a Pull-up Resistor (SOT23-6) VDD 5 HeartBeat" Pulse VDD Ro 1 OUT SNSK SNS 3 4 SYNC/MODE 6 VSS 2 If the sensor is wired to a microcontroller as shown in Figure 3-7 on page 11, the microcontroller can reconfigure the load resistor to either Vss or Vdd depending on the output state of the QT1010, so that the pulses are evident in either state. Figure 3-7. Using a Microcontroller to Obtain HeartBeat Pulses in Either Output State (SOT23-6) Port_M.x Ro 1 OUT SNSK SNS Microcontroller 3 4 Port_M.y SYNC/MODE 6 Electromechanical devices like relays will usually ignore the short HeartBeat pulse. The pulse also has too low a duty cycle to visibly affect LEDs. It can be filtered completely if desired, by adding an RC filter to the output, or if interfacing directly and only to a high-impedance CMOS input, by doing nothing or at most adding a small noncritical capacitor from OUT to Vss. 3.9.3 Output Drive The OUT pin is active high and can sink or source up to 2 mA. When a large value of Cs (>20 nF) is used the OUT current should be limited to <1 mA to prevent gain-shifting side effects, which happen when the load current creates voltage drops on the die and bonding wires; these small shifts can materially influence the signal level to cause detection instability. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 11
  • 12. 4. Circuit Guidelines 4.1 More Information Refer to Application Note QTAN0002, Secrets of a Successful QTouch Design and the Touch Sensors Design Guide (both downloadable from the Atmel website), for more information on construction and design methods. 4.2 Sample Capacitor Cs is the charge sensing sample capacitor. The required Cs value depends on the thickness of the panel and its dielectric constant. Thicker panels require larger values of Cs. Typical values are 2 nF to 50 nF depending on the sensitivity required; larger values of Cs demand higher stability and better dielectric to ensure reliable sensing. The Cs capacitor should be a stable type, such as X7R ceramic or PPS film. For more consistent sensing from unit to unit, 5% tolerance capacitors are recommended. X7R ceramic types can be obtained in 5% tolerance at little or no extra cost. In applications where high sensitivity (long burst length) is required the use of PPS capacitors is recommended. For battery powered operation a higher value sample capacitor is recommended (typical value 8.2 nF). 4.3 UDFN/USON Package Restrictions The central pad on the underside of the UDFN/USON chip is connected to ground. Do not run any tracks underneath the body of the chip, only ground. 4.4 Power Supply and PCB Layout See Section 5.2 on page 14 for the power supply range. At 3 V current drain averages less than 500 µA in Fast mode. If the power supply is shared with another electronic system, care should be taken to ensure that the supply is free of digital spikes, sags, and surges which can adversely affect the QT1010. The QT1010 will track slow changes in Vdd, but it can be badly affected by rapid voltage fluctuations. It is highly recommended that a separate voltage regulator be used just for the QT1010 to isolate it from power supply shifts caused by other components. If desired, the supply can be regulated using a Low Dropout (LDO) regulator, although such regulators often have poor transient line and load stability. See Application Note QTAN0002, Secrets of a Successful QTouch™ Design for further information. Parts placement: The chip should be placed to minimize the SNSK trace length to reduce low frequency pickup, and to reduce stray Cx which degrades gain. The Cs and Rs resistors (see Figure 1-1 on page 4) should be placed as close to the body of the chip as possible so that the trace between Rs and the SNSK pin is very short, thereby reducing the antenna-like ability of this trace to pick up high frequency signals and feed them directly into the chip. A ground plane can be used under the chip and the associated discrete components, but the trace from the Rs resistor and the electrode should not run near ground, to reduce loading. For best EMC performance the circuit should be made entirely with SMT components. Electrode trace routing: Keep the electrode trace (and the electrode itself) away from other signal, power, and ground traces including over or next to ground planes. Adjacent switching signals can induce noise onto the sensing signal; any adjacent trace or ground plane next to, or under, the electrode trace will cause an increase in Cx load and desensitize the device. Note: For proper operation a 100 nF (0.1 µF) ceramic bypass capacitor must be used directly between Vdd and Vss, to prevent latch-up if there are substantial Vdd transients; for example, during an ESD event. The bypass capacitor should be placed very close to the Vss and Vdd pins. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 12
  • 13. 4.5 Power On On initial power up, the QT1010 requires approximately 100 ms to power on to allow power supplies to stabilize. During this time the OUT pin state is not valid and should be ignored. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 13
  • 14. 5. Specifications 5.1 Absolute Maximum Specifications Operating temperature –40°C to +85°C Storage temperature –55°C to +125°C VDD 0 to +6.5 V Max continuous pin current, any control or drive pin ±20 mA Short circuit duration to Vss, any pin Infinite Short circuit duration to Vdd, any pin Infinite Voltage forced onto any pin –0.6V to (Vdd + 0.6) V CAUTION: Stresses beyond those listed under Absolute Maximum Specifications may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum specification conditions for extended periods may affect device reliability 5.2 Recommended Operating Conditions VDD +1.8 to 5.5 V Short-term supply ripple + noise ±20 mV Long-term supply stability ±100 mV Cs value 2 to 50 nF Cx value 5 to 50 pF 5.3 AC Specifications Vdd = 3.0 V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted Parameter Description Min Typ Max Units Notes TRC Recalibration time – 200 – ms Cs, Cx dependent TPC Charge duration – 3.05 – µs ±7.5% spread spectrum variation TPT Transfer duration – 9.0 – µs ±7.5% spread spectrum variation TG1 Time between end of burst and start of the next (Fast mode) – 1.2 – ms TG2 Time between end of burst and start of the next (LP mode) – 80 – ms Increases with decreasing VDD See Figure 5-1 on page 15 AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 14
  • 15. Vdd = 3.0 V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted Parameter Description Min Typ Max Units TBL Burst length – 2.45 – ms TR Response time – – 100 HeartBeat pulse width – 15 – VDD, Cs and Cx dependent. See Section 4.2 for capacitor selection. ms THB Notes µs Figure 5-1. TG2 – Time Between Bursts (LP Mode) Figure 5-2. TBL – Burst Length AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 15
  • 16. 5.4 Signal Processing Vdd = 3.0V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted Description Min Typ Max Units Threshold differential 10 counts Hysteresis 2 counts Consensus filter length 4 samples Max on-duration 60 seconds Notes 5.5 (At 3 V in LP mode) Will vary in SYNC mode and with Vdd DC Specifications Vdd = 3.0V, Cs = 4.7 nF, Cx = 5 pF, Ta = recommended range, unless otherwise noted Parameter VDD IDD Description Supply voltage Supply current, Fast mode Min Typ – 203.0 246.0 378.5 542.5 729.0 Units 5.5 1.8 Max Notes V µA 1.8 V 2.0 V 3.0 V 4.0 V 5.0 V – µA 1.8 V 2.0 V 3.0 V 4.0 V 5.0 V Required for proper start-up – IDDI Supply current, LP mode – 16.5 19.5 34.0 51.5 73.5 VDDS Supply turn-on slope 10 – – V/s VIL Low input logic level – – 0.2 × Vdd 0.3 × Vdd V Vdd = 1.8 V – 2.4 V Vdd = 2.4 V – 5.5 V VHL High input logic level 0.7 × Vdd 0.6 × Vdd – – V Vdd = 1.8 V – 2.4 V Vdd = 2.4 V – 5.5 V VOL Low output voltage – – 0.5 V OUT, 4 mA sink VOH High output voltage 2.3 – – V OUT, 1 mA source IIL Input leakage current – <0.05 1 µA CX Load capacitance range 2 – 50 pF AR Acquisition resolution – 9 14 bits AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 16
  • 17. 5.6 Mechanical Dimensions 5.6.1 6-pin SOT23-6 ' ( ( $ $ 3LQ ,' $ E 6($7,1* 3/$1( $ $ 6LGH 9LHZ H 7RS 9LHZ $ $ 6($7,1* 3/$1( F 2 $ 9LHZ $$ 6($7,1* 3/$1( 6(( 9,(: % / 9LHZ % 20021 ',0(16,216 8QLW RI 0HDVXUH PP
  • 18. 60%2/ 0,1 $ ± ± $ ± 0$; 120 $ 1RWHV 7KLV SDFNDJH LV FRPSOLDQW ZLWK -('( VSHFLILFDWLRQ 02 9DULDWLRQ $% 'LPHQVLRQ ' GRHV QRW LQFOXGH PROG )ODVK SURWUXVLRQV RU JDWH EXUUV 0ROG )ODVK SURWUXVWLRQ RU JDWH EXUUV VKDOO QRW H[FHHG PP SHU HQG 'LPHQVLRQ E GRHV QRW LQFOXGH GDPEDU SURWUXVLRQ $OORZDEOH GDPEDU SURWUXVLRQ VKDOO QRW FDXVH WKH OHDG ZLGWK WR H[FHHG WKH PD[LPXP E GLPHQVLRQ E PRUH WKDQ PP 'LH LV IDFLQJ GRZQ DIWHU WULPIRUP ± ' 127( ( ( / H %6 E ± F T ± ƒ ± ƒ 7,7/( 3DFNDJH 'UDZLQJ RQWDFW SDFNDJHGUDZLQJV#DWPHOFRP *3 67 OHDG [ PP 3ODVWLF 6PDOO 2XWOLQH 3DFNDJH 627
  • 20. 5.6.2 8-pin UDFN/USON 6LGH YLHZ %RWWRP YLHZ $ 7RS YLHZ ' H N ( ( 3,1 ,' / ' I $ $ ; G E 6LGH YLHZ 20021 ',0(16,216 8QLW RI 0HDVXUH PP
  • 21. $ 0,1 120 0$; $ $ 60%2/ E $OO GLPHQVLRQV DUH LQ PP $QJOHV LQ GHJUHHV RSODQDULW DSSOLHV WR WKH H[SRVHG SDG DV ZHOO DV WKH WHUPLQDOV RSODQDULW VKDOO QRW H[FHHG PP :DUSDJH VKDOO QRW H[FHHG PP 5HIHU WR -('( 0202 ' 127(6 ' 127( ( ( H %6 / N 3DFNDJH 'UDZLQJ RQWDFW SDFNDJHGUDZLQJV#DWPHOFRP 7,7/( 0$ SDG [[ PP %RG PP SLWFK [ PP ([SRVHG H3DG 8OWUD7KLQ 'XDO )ODW 1R /HDG 3DFNDJH 8')18621
  • 23. 5.7 Part Marking 5.7.1 AT42QT1010– 6-pin SOT23-6 Note: Samples of the AT42QT1010 may also be marked T10E. 1010 Pin 1 ID 5.7.2 AT42QT1010 – 8-pin UDFN/USON Note: Samples of the AT42QT1010 may also be marked T10. Abbreviated Part Number: 1010 AT42QT1010 Class code (H = Industrial, green NiPdAu) Die Revision (Example: “E” shown) HEC YZZ Pin 1 ID Pin 1 5.8 Abbreviated Part Number: AT42QT1010 Assembly Location Code (Example: “C” shown) Lot Number Trace code (Variable text) Last Digit of Year (Variable text) Part Number Part Number AT42QT1010-TSHR 6-pin SOT23 RoHS compliant IC AT42QT1010-MAH 5.9 Description 8-pin UDFN/USON RoHS compliant IC Moisture Sensitivity Level (MSL) MSL Rating Peak Body Temperature Specifications MSL1 260oC IPC/JEDEC J-STD-020 AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 19
  • 24. Appendix A. Note: A.1 Migrating from QT100A This appendix applies to the use of the SOT23-6 package only. Introduction This appendix describes the issues that should be considered when migrating designs from the QT100A to the QT1010. A.2 Cs Capacitor The Cs Capacitor should be increased in value, assuming that other factors, such as the voltage level and electrode size, remain the same. For example, at 3 V, a Cs value of 4.7 nF should be increased to 8.2 nF. A.3 PCB Layout There are no PCB layout issues. The 6-pin WSON package used by the QT100A shares a common footprint with the 6-pin SOT23-6 package used by the QT1010. Both packages share the same pinouts. A.4 Power Consumption The QT1010 has a range of 1.8 – 5.5 V for Vdd, compared with 2.0 – 5.5 V on the QT100A. Notice should also be taken of the differences in power consumption in both Fast and LP operation modes. AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 20
  • 25. Associated Documents For additional information, refer to the following document (downloadable from the Touch Technology area of the Atmel website, www.atmel.com):  Touch Sensors Design Guide  QTAN0002 – Secrets of a Successful QTouch Design Revision History Revision No. History Revision A – May 2009  Initial release Revision B – August 2009  Update for chip revision 2.2 Revision C – August 2009  Minor update for clarity Revision D – January 2010  Power specifications updated for revision 2.4.1 Revision E – January 2010  Part markings updated  MSL specification revised  Other minor updates  Update for chip revision 2.6  Migration advice added Revision H – May 2010  UDFN/USON package added Revision I – May 2013  Applied new template Revision F – February 2010 Revision G – March 2010 AT42QT1010 [DATASHEET] 9541I–AT42–05/2013 21
  • 29. Atmel Corporation 1600 Technology Drive Atmel Asia Limited Unit 01-5 16, 19F Atmel München GmbH Business Campus Atmel Japan G.K. 16F Shin-Osaki Kangyo Bldg San Jose, CA 95110 BEA Tower, Millennium City 5 Parkring 4 1-6-4 Osaki, Shinagawa-ku USA 418 Kwun Tong Roa D-85748 Garching bei München Tokyo 141-0032 Tel: (+1) (408) 441-0311 Kwun Tong, Kowloon GERMANY JAPAN Fax: (+1) (408) 487-2600 HONG KONG Tel: (+49) 89-31970-0 Tel: (+81) (3) 6417-0300 www.atmel.com Tel: (+852) 2245-6100 Fax: (+49) 89-3194621 Fax: (+81) (3) 6417-0370 Fax: (+852) 2722-1369 © 2013 Atmel Corporation. All rights reserved. / Rev.: 9541I–AT42–05/2013 Atmel®, Atmel logo and combinations thereof, QTouch® and others are registered trademarks,or trademarks of Atmel Corporation or its subsidiaries. Other terms and product names may be registered trademarks or trademarks of others. Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN THE ATMEL TERMS AND CONDITIONS OF SALES LOCATED ON THE ATMEL WEBSITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDENTAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS AND PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications and products descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel products are not intended, authorized, or warranted for use as components in applications intended to support or sustain life.