Here is a presentation about all the technologies that I have used so far in production of my music magazine and others that I will use later on in the task:)
For modern day operators, working in connected automation environments, usability of the HMI/UI of the systems should resemble the interface of consumer hand held devices.
Such HMI/UI designs not only ensure ease of operation but also deliver desired operational efficiency. Also these cloud-based HMI frameworks that can be easily deployed across desktop (web), mobile and embedded devices ensure best RoI for your businesses
Our expert team of HMI designers and developers has collaborated with our global customers in delivering cloud-based HMI software solutions that are Human/Operator centric.
This has helped our customers to – 1.) Focus on process training of the operators
2.) Reap the benefits of migrating to modern HMI that can be accessed through multiple platforms (web/desktop, mobile, embedded devices)
Know more about our HMI/UI development services and solutions
The New Innovative muti-platform unique hybrid dynamic franchise model from Sedar Global.
6 platform state of the art unique model to shift the industry of window fashion to a new Era in global business.
Sedar Global is adding the new model of the future franchise models.
Un formato variado e inclusivo de Grupos Pequenos para hacer transversalmente la aplicación a todo el ministerio de una iglesia un pastoreo efectivo y extensión de alcances. Ps. Rodolfo A. Martinez Ochoa
Contacto. ministeriosalcancevida@gmail.com
www.themissionmartinez.com
A Survey Analysis on CMOS Integrated Circuits with Clock-Gated Logic StructureIJERA Editor
Various circuit design techniques has been presented to improve noise tolerance of the proposed CGS logic families. Noise in deep submicron technology limits the reliability and performance of ICs. The ANTE (Average Noise Threshold Energy) metric is used for the analysis of noise tolerance of proposed CGS. A 2-input NAND and NOR gate is designed by the proposed technique. Simulation results for a 2-input NAND gate at clock gated logic show that the proposed noise tolerant circuit achieves 1.79X ANTE improvement along with the reduction in leakage power. Continuous scaling of technology towards the manometer range significantly increases leakage current level and the effect of noise. This research can be further extended for performance optimization in terms of power, speed, area and noise immunity.
DELAY ERROR WITH META-STABILITY DETECTION AND CORRECTION USING CMOS TRANSMISS...VLSICS Design
The new technologies are giving the advance systems which are capable to perform multiple operations simultaneously. This all is possible by the scaling technology where the overall chip size get reduced but due to manufacturing and fabrication defects, certain design uncertainty arises thereby affecting the transistor performance by timing related effect. The robust circuit where sufficient margins are given sometime is nothing but a wastage of power to overcome this, hybrid technique called Razor was innovated which scaled the voltage dynamically and automatically detect and correct the timing related defects. This paper proposed a new design for the razor flip flop with CMOS transmission logic. The traditional design used the dynamic logic approach which has the drawback of threshold voltage attenuation which is removed by CMOS transmission logic and the transparency of the logic data at input and output is highly achieved. The overall purpose for such design is to reduce the power and delay of the circuit which is reduced by 0.6mW and 12.11ns respectively and thus increased the overall performance. The complexity of
the circuit is also reduced. The analyses of the circuit is done using Cadence virtuoso tool with 45n technology.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
Here is a presentation about all the technologies that I have used so far in production of my music magazine and others that I will use later on in the task:)
For modern day operators, working in connected automation environments, usability of the HMI/UI of the systems should resemble the interface of consumer hand held devices.
Such HMI/UI designs not only ensure ease of operation but also deliver desired operational efficiency. Also these cloud-based HMI frameworks that can be easily deployed across desktop (web), mobile and embedded devices ensure best RoI for your businesses
Our expert team of HMI designers and developers has collaborated with our global customers in delivering cloud-based HMI software solutions that are Human/Operator centric.
This has helped our customers to – 1.) Focus on process training of the operators
2.) Reap the benefits of migrating to modern HMI that can be accessed through multiple platforms (web/desktop, mobile, embedded devices)
Know more about our HMI/UI development services and solutions
The New Innovative muti-platform unique hybrid dynamic franchise model from Sedar Global.
6 platform state of the art unique model to shift the industry of window fashion to a new Era in global business.
Sedar Global is adding the new model of the future franchise models.
Un formato variado e inclusivo de Grupos Pequenos para hacer transversalmente la aplicación a todo el ministerio de una iglesia un pastoreo efectivo y extensión de alcances. Ps. Rodolfo A. Martinez Ochoa
Contacto. ministeriosalcancevida@gmail.com
www.themissionmartinez.com
A Survey Analysis on CMOS Integrated Circuits with Clock-Gated Logic StructureIJERA Editor
Various circuit design techniques has been presented to improve noise tolerance of the proposed CGS logic families. Noise in deep submicron technology limits the reliability and performance of ICs. The ANTE (Average Noise Threshold Energy) metric is used for the analysis of noise tolerance of proposed CGS. A 2-input NAND and NOR gate is designed by the proposed technique. Simulation results for a 2-input NAND gate at clock gated logic show that the proposed noise tolerant circuit achieves 1.79X ANTE improvement along with the reduction in leakage power. Continuous scaling of technology towards the manometer range significantly increases leakage current level and the effect of noise. This research can be further extended for performance optimization in terms of power, speed, area and noise immunity.
DELAY ERROR WITH META-STABILITY DETECTION AND CORRECTION USING CMOS TRANSMISS...VLSICS Design
The new technologies are giving the advance systems which are capable to perform multiple operations simultaneously. This all is possible by the scaling technology where the overall chip size get reduced but due to manufacturing and fabrication defects, certain design uncertainty arises thereby affecting the transistor performance by timing related effect. The robust circuit where sufficient margins are given sometime is nothing but a wastage of power to overcome this, hybrid technique called Razor was innovated which scaled the voltage dynamically and automatically detect and correct the timing related defects. This paper proposed a new design for the razor flip flop with CMOS transmission logic. The traditional design used the dynamic logic approach which has the drawback of threshold voltage attenuation which is removed by CMOS transmission logic and the transparency of the logic data at input and output is highly achieved. The overall purpose for such design is to reduce the power and delay of the circuit which is reduced by 0.6mW and 12.11ns respectively and thus increased the overall performance. The complexity of
the circuit is also reduced. The analyses of the circuit is done using Cadence virtuoso tool with 45n technology.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
High Speed Low Power CMOS Domino or Gate Design in 16nm Technologycsandit
Dynamic logic circuits provide more compact designs with faster switching speeds and low power consumption compared with the other CMOS design styles. This paper proposes a wide
fan-in circuit with increased switching speed and noise immunity. Speed is achieved by quickly removing the charge on the dynamic node during evaluation phase, compared to the other
circuits. The design also offers very less Power Delay Product (PDP). The design is exercised for 20% variation in supply voltage.
High Speed and Low Pedestal Error Bootstrapped CMOS Sample and Hold CircuitIJECEIAES
A new high speed, low pedestal error bootstrapped CMOS sample and hold (S/H) circuit is proposed for high speed analog-to-digital converter (ADC). The proposed circuit is made up of CMOS transmission gate (TG) switch and two new bootstrap circuits for each transistor in TG switch. Both TG switch and bootstrap circuits are used to decrease channel charge injection and on-resistance input signal dependency. In result, distortion can be reduced. The decrease of channel charge injection input signal dependency also makes the minimizing of pedestal error by adjusting the width of NMOS and PMOS of TG switch possible. The performance of the proposed circuit was evaluated using HSPICE 0.18-m CMOS process. For 50 MHz sinusoidal 1 V peak-to-peak differential input signal with a 1 GHz sampling clock, the proposed circuit achieves 2.75 mV maximum pedestal error, 0.542 mW power consumption, 90.87 dB SNR, 73.50 SINAD which is equal to 11.92 bits ENOB, -73.58 dB THD, and 73.95 dB SFDR.
Optimal and Power Aware BIST for Delay Testing of System-On-ChipIDES Editor
Test engineering for fault tolerant VLSI systems is
encumbered with optimization requisites for hardware
overhead, test power and test time. The high level quality of
these complex high-speed VLSI circuits can be assured only
through delay testing, which involves checking for accurate
temporal behavior. In the present paper, a data-path based
built-in test pattern generator (TPG) that generates iterative
pseudo-exhaustive two-patterns (IPET) for parallel delay
testing of modules with different input cone capacities is
implemented. Further, in the present study a CMOS
implementation of low power architecture (LPA) for scan based
built-in self test (BIST) for delay testing and combinational
testing is carried out. This reduces test power dissipation in
the circuit under test (CUT). Experimental results and
comparisons with pre-existing methods prove the reduction
in hardware overhead and test-time.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
IJERA (International journal of Engineering Research and Applications) is International online, ... peer reviewed journal. For more detail or submit your article, please visit www.ijera.com
A Novel Flipflop Topology for High Speed and Area Efficient Logic Structure D...IOSR Journals
In high speed data path network flop is one of the major functional elements to store intermediate
results and data at different stages. But the most important problem is huge power utilization due to switching
activity and increase in clock period that is Timing Latency; causes the performance of data path in digital
design is decreased. The existing works implement various Flipflop topology in data path structure design such
as conventional Transmission Gate Based Master Slave Filpflop (TGMS FF), Write Port Master Slave Flip-flop
(WPMS) and Clocked Complementary Metal Oxide Semiconductor (C2MOS). In WPMS method, area is
minimized but delay is increased. In C2MOS technique Power consumption and delay is reduced, but there is a
definite scope to reduce Power, area and delay. In this paper a Modified Clocked Complementary Metal Oxide
Semiconductor Latch (mC2MOS Latch) is proposed and delay, power is again reduced up to 60% and the area
of the circuit is also reduced while comparing with previous methods.
A Novel Flipflop Topology for High Speed and Area Efficient Logic Structure D...IOSR Journals
Abstract: In high speed data path network flop is one of the major functional elements to store intermediate results and data at different stages. But the most important problem is huge power utilization due to switching activity and increase in clock period that is Timing Latency; causes the performance of data path in digital design is decreased. The existing works implement various Flipflop topology in data path structure design such as conventional Transmission Gate Based Master Slave Filpflop (TGMS FF), Write Port Master Slave Flip-flop (WPMS) and Clocked Complementary Metal Oxide Semiconductor (C2MOS). In WPMS method, area is minimized but delay is increased. In C2MOS technique Power consumption and delay is reduced, but there is a definite scope to reduce Power, area and delay. In this paper a Modified Clocked Complementary Metal Oxide Semiconductor Latch (mC2MOS Latch) is proposed and delay, power is again reduced up to 60% and the area of the circuit is also reduced while comparing with previous methods. Index Terms: Circuit enhancement, flip-flops (FFs), high-speed, logical effort, master–slave, transmission-gate.
A Fault Dictionary-Based Fault Diagnosis Approach for CMOS Analog Integrated ...VLSICS Design
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the use of a fault dictionary approach. This technique allows the detection and localization of the most likely defects of open-circuit type occurring in Complementary Metal–Oxide–Semiconductor (CMOS) analog integrated circuits (ICs) interconnects. The fault dictionary is built by simulating the most likely defects causing the faults to be detected at the layout level. Then, for each injected fault, the spectre’s frequency responses and the power consumption obtained by simulation are stored in a table which constitutes the fault dictionary. In fact, each line in the fault dictionary constitutes a fault signature used to identify and locate a considered defect. When testing, the circuit under test is excited with the same stimulus, and the responses obtained are compared to the stored ones. To prove the efficiency of the proposed technique, a full custom CMOS operational amplifier is implemented in 0.25 µm technology and the most likely faults of opencircuit type are deliberately injected and simulated at the layout level.
A Fault Dictionary-Based Fault Diagnosis Approach for CMOS Analog Integrated ...VLSICS Design
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the use of a fault dictionary approach. This technique allows the detection and localization of the most likely defects of open-circuit type occurring in Complementary Metal–Oxide–Semiconductor (CMOS) analog integrated circuits (ICs) interconnects. The fault dictionary is built by simulating the most likely defects causing the faults to be detected at the layout level. Then, for each injected fault, the spectre’s frequency responses and the power consumption obtained by simulation are stored in a table which constitutes the fault dictionary. In fact, each line in the fault dictionary constitutes a fault signature used to identify and locate a considered defect. When testing, the circuit under test is excited with the same stimulus, and the responses obtained are compared to the stored ones. To prove the efficiency of the proposed technique, a full custom CMOS operational amplifier is implemented in 0.25 µm technology and the most likely faults of opencircuit type are deliberately injected and simulated at the layout level.
one of the famous Silicon Valley golden rules which state “Higher the clock frequency, Greater the power consumption”. Digging deep into deep submicron CMOS technology, there are design and power management challenges present for Analog and Mixed Signal devices such as PLL and it is very much important to optimize PLL to create a successful and power optimized system. Here, ALF CP PLL is designed in a way that it can operate on low supply voltage but with a 20% reduction in the overall power consumption. The PLL output frequency can be tuned from 80 MHz to 330 MHz and at 350 MHz PLL consumes 190μW at 1V of supply.
Similar to Timing error tolerance in small core designs for so c applications (20)
Variable length signature for near-duplicatejpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Robust representation and recognition of facialjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Revealing the trace of high quality jpegjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Revealing the trace of high quality jpegjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Pareto depth for multiple-query image retrievaljpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Fractal analysis for reduced referencejpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Face sketch synthesis via sparse representation based greedy searchjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Face recognition across non uniform motionjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Combining left and right palmprint images forjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
A probabilistic approach for color correctionjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
A no reference texture regularity metricjpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
A feature enriched completely blind imagejpstudcorner
To get this project in ONLINE or through TRAINING Sessions,
Contact:JP INFOTECH, Old No.31, New No.86, 1st Floor, 1st Avenue, Ashok Pillar, Chennai -83. Landmark: Next to Kotak Mahendra Bank. Pondicherry Office: JP INFOTECH, #45, Kamaraj Salai, Thattanchavady, Puducherry -9. Landmark: Next to VVP Nagar Arch. Mobile: (0) 9952649690 , Email: jpinfotechprojects@gmail.com, web: www.jpinfotech.org Blog: www.jpinfotech.blogspot.com
Understanding Inductive Bias in Machine LearningSUTEJAS
This presentation explores the concept of inductive bias in machine learning. It explains how algorithms come with built-in assumptions and preferences that guide the learning process. You'll learn about the different types of inductive bias and how they can impact the performance and generalizability of machine learning models.
The presentation also covers the positive and negative aspects of inductive bias, along with strategies for mitigating potential drawbacks. We'll explore examples of how bias manifests in algorithms like neural networks and decision trees.
By understanding inductive bias, you can gain valuable insights into how machine learning models work and make informed decisions when building and deploying them.
Saudi Arabia stands as a titan in the global energy landscape, renowned for its abundant oil and gas resources. It's the largest exporter of petroleum and holds some of the world's most significant reserves. Let's delve into the top 10 oil and gas projects shaping Saudi Arabia's energy future in 2024.
The Internet of Things (IoT) is a revolutionary concept that connects everyday objects and devices to the internet, enabling them to communicate, collect, and exchange data. Imagine a world where your refrigerator notifies you when you’re running low on groceries, or streetlights adjust their brightness based on traffic patterns – that’s the power of IoT. In essence, IoT transforms ordinary objects into smart, interconnected devices, creating a network of endless possibilities.
Here is a blog on the role of electrical and electronics engineers in IOT. Let's dig in!!!!
For more such content visit: https://nttftrg.com/
Water billing management system project report.pdfKamal Acharya
Our project entitled “Water Billing Management System” aims is to generate Water bill with all the charges and penalty. Manual system that is employed is extremely laborious and quite inadequate. It only makes the process more difficult and hard.
The aim of our project is to develop a system that is meant to partially computerize the work performed in the Water Board like generating monthly Water bill, record of consuming unit of water, store record of the customer and previous unpaid record.
We used HTML/PHP as front end and MYSQL as back end for developing our project. HTML is primarily a visual design environment. We can create a android application by designing the form and that make up the user interface. Adding android application code to the form and the objects such as buttons and text boxes on them and adding any required support code in additional modular.
MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software. It is a stable ,reliable and the powerful solution with the advanced features and advantages which are as follows: Data Security.MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software.
Cosmetic shop management system project report.pdfKamal Acharya
Buying new cosmetic products is difficult. It can even be scary for those who have sensitive skin and are prone to skin trouble. The information needed to alleviate this problem is on the back of each product, but it's thought to interpret those ingredient lists unless you have a background in chemistry.
Instead of buying and hoping for the best, we can use data science to help us predict which products may be good fits for us. It includes various function programs to do the above mentioned tasks.
Data file handling has been effectively used in the program.
The automated cosmetic shop management system should deal with the automation of general workflow and administration process of the shop. The main processes of the system focus on customer's request where the system is able to search the most appropriate products and deliver it to the customers. It should help the employees to quickly identify the list of cosmetic product that have reached the minimum quantity and also keep a track of expired date for each cosmetic product. It should help the employees to find the rack number in which the product is placed.It is also Faster and more efficient way.
Using recycled concrete aggregates (RCA) for pavements is crucial to achieving sustainability. Implementing RCA for new pavement can minimize carbon footprint, conserve natural resources, reduce harmful emissions, and lower life cycle costs. Compared to natural aggregate (NA), RCA pavement has fewer comprehensive studies and sustainability assessments.
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Timing error tolerance in small core designs for so c applications
1. Timing Error Tolerance in Small Core Designs for SoC
Applications
ABSTRACT:
Timing errors are an increasing reliability concern in nanometer technology, high
complexity and multivoltage/ frequency integrated circuits. A local error detection
and correction technique is presented in this work that is based on a new bit
flipping flip-flop. Whenever a timing error is detected, it is corrected by
complementing the output of the corresponding flip-flop. The proposed solution is
characterized by very low silicon area and power requirements compared to
previous design schemes in the open literature. To validate its efficiency, it has
been applied in the design of a MIPS microprocessor core in a 90nm technology,
while a demonstration version of the same core in an FPGA platform is presented.
EXISTING SYSTEM:
THE CMOS technology scaling, the increase of process variations, the
susceptibility of nanometer devices to various performance degradation
mechanisms, the power supply reduction and the increasing complexity of modern
2. integrated circuits (ICs) affect their reliability and set error rate levels outside
specifications [1], [2]. Various mechanisms like coupling noise, power supply
disturbance, jitter and temperature fluctuations are accused for timing error
generation. Moreover, transistor aging mechanisms significantly impact the
performance of nanometer circuits resulting in the appearance of timing errors
continuously earlier with technology evolution during their normal lifetime [3],
[4]. Such cases are the Negative-Positive Bias Temperature Instability (NBTI-
PBTI) induced aging of PMOS-NMOS transistors respectively and the hot-carrier
injection (HCI) induced aging of NMOS transistors.
These phenomena degrade transistors’ threshold voltage over time
increasing path delays [5]. Furthermore, modern systems running at multiple
frequency and voltage levels (e.g. exploiting dynamic voltage-frequency scaling –
DVFS techniques) may present increased timing error rates due to numerous
environmental and process related as well as data dependent variabilities that affect
circuit performance [6]. Path delay deviations, due to process variations, and
manufacturing defects that affect circuit speed may also result in timing errors that
are not easily detectable (in terms of test cost) in high device count ICs. The
inability of fabrication test procedures to exhaustively exercise the huge number of
paths in nanometer circuit designs and effectively screen out all timing related
defective ICs, increases the probability of test escapes. Additionally, and for the
3. same reasons, timing verification turns to be a hard task escalating the probability
of timing failures in a design.
PROPOSED SYSTEM:
The proposed error detection and correction technique is based on the bit-flipping
flip-flop concept. This is synopsized as follows: in case of error detection at the
output of a flip-flop the corresponding logic value is asynchronously
complemented for error correction. Fig. 1(a) illustrates the new Error Detection /
Correction Flip-Flop (EDC Flip-Flop) that is suitable to confront with timing
errors. Apart from the original flipflop (Main Flip-Flop), it consists of two XOR
gates and a Latch. The first XOR gate compares the D input and the F output of the
Main Flip-Flop and provides the result to the Latch. The Latch feeds the second
XOR gate at the output of the Main Flip-Flop. Depending on the comparison result
within a specified time interval, either the F signal of the Main Flip-Flop or its
complement is propagated to the output Q of the EDC Flip-Flop. The Q signal
feeds the subsequent logic. Briefly, the proposed timing error detection and
correction technique operates as follows. Suppose that a timing error is detected at
one or more inputs of the combinational logic stage Sj+1, due to a delayed
response of the previous stage Sj. Thus, the response of Sj+1 will be erroneous and
must be corrected. To achieve error correction, the output of each flip-flop, at the
4. register between the two stages, where a timing error has been detected is
complemented so that valid values feed the Sj+1 logic stage. Moreover, in case that
this stage is not fast enough (not a shallow stage), the evaluation time of the circuit
is extended by one clock cycle to guarantee its correct computation.