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S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46
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Structural and Morphological Properties of Mn-Doped Co3O4
ThinFilm Deposited by Spin Coat Method
1
S. M. Jogade, 1
D. S. Sutrave, 2
V.B. Patil
1
D.B. F. Dayanand College of Arts and Science, Solapur, Maharashtra, India-413003
2
Department of Physical Science, Solapur University, Solapur, Maharashtra
ABSTRACT
In this study, a series of manganese (Mn)-doped Cobalt oxide (Co3O4)thin films were deposited on steel
substrate by the sol-gel spin coat method and investigated the influence of doping concentrations of Mn in
Cobalt ranging from 0.001% to 1% on physical, structural and morphological properties of Co3O4 thin films.
Cobalt acetate[(CH3COO)2Co.4H2O], Mn acetate [C4H6MnO4.4H2O] and Isopropyl alcohol were used as
starting material, dopant source and reagent respectively.X-ray diffraction analysis indicated that pureCo3O4
thin film iscrystallinein nature andcubic phase with [400] preferential orientation.For Mn doped films, three new
peaks corresponding to the planes [310], [320] and [420] of orthorhombic MnO2 phase were observed.SEM
micrographs showed that incorporation of Mn in Co site was found to influence the surface morphology of the
films. All the films showed tetragonal shaped grains. TheEDAXanalysis revealedthe amount of Mn element in
the sample increased with increasing dopant concentration.
Keywords: Co3O4, MnO2, Doping, XRD, SEM, EDAX, Spin Coat
I INTRODUCTION
Cobalt oxide is an important p-type
semiconductor with direct optical band gaps at 1.48
and 2.19 eV[1]
, Co3O4has a stable normal spinel
structure, where Co2
+
ions occupy the tetrahedral
8a sites and Co3
+
occupy the octahedral 16d sites[2]
.
Cobalt oxides have attracted much attention for
their interesting fundamental properties and many
technical applications such as promising material in
gas-sensing and solar energy absorption and as an
effective catalyst in environmental purification and
chemical engineering[3,4]
.In addition, Co3O4has
been widely studied for its application as lithium
ion battery electrodes, ceramic pigments, field-
emission materials and magnetic material[5-11]
.
Co3O4hasbeen prepared by a range of methods
including sol-gelsynthesis[12]
, spray pyrolysis[13]
,
electrodeposition[14]
, chemical vapour
deposition(CVD)[15]
, thermal decomposition [16]
,
pulsed laserdeposition (PLD)[17]
and sputtering[18]
.
According to the literature survey, the systematic
investigationson effect of doping on structural, and
morphological properties of crystallineCo3O4 thin
films by sol-gel spin coating methodhas been
sparsely studied[19].
Literature study also revealed
that, the properties of transition metal oxides can be
enhanced by doping, and also attempts are made to
modify the physical, chemical and optical
properties of thin films by doping with other
transition metal oxides. The structural and optical
properties have been enhanced by impurity doping
and heat treatment[20-23]
. Many researchers used Mn
as a doping material[24]
. So in the present work
effect of Mn doping on structural, morphological
and compositional properties of cobalt oxide thin
films is presented.
II EXPERIMENTAL
2.1 Synthesis
Co3O4 was synthesized by using Cobalt acetate
tetrahydrate[(CH3COO)2Co.4H2O], isopropyl
alcohol as a starting material and reagent
respectively. A 0.02 M solution was prepared by
mixing 0.249gm cobalt acetate tetrahydrate and
50ml double distilled water and it was stirred well
using magnetic stirrer until it became optically
transparent, then isopropyl alcohol was added
slowly. The prepared solution was stirred again for
6 hours at temperature 500
C and then aged for
48.00 hours to get viscous solution in the form of
gel. The doped solution was prepared by adding to
the precedent solution Manganese acetate
[C4H6MnO4.4H2O] as a dopant source. The weight
percentages of Mn were 0.001%, 0.005%, 0.01%,
0.05%, 0.1%, 0.5% and 1%. After doping with
different concentrations, the above process was
repeated to prepare the sol-gel.
1.2 Deposition
For the deposition of thin films, Milman
Spin Coat unit was used. Co3O4 and Mn doped
Co3O4thin film electrodes with different doping
concentrations of Mnsuch as 0.001%, 0.005%,
0.01%, 0.05%, 0.1%, 0.5% and 1% is done by Sol-
gel spin coat technique and the deposition samples
were denoted as A1, A2, A3, A4, A5, A6, A7 and
A8throughout the paper. In this technique, at first a
RESEARCH ARTICLE OPEN ACCESS
S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46
www.ijera.com 42|P a g e
drop of 0.1ml of prepared sol was placed on the
substrate using a syringe. Which is then rotated at
high speed on spin coater unit in order to spread the
sol-gel by centrifugal force. The spin coating
process can be broken down into the four stages
such as deposition, rotating, drying and repeating
the same process for multilayers. To dry the film,
the film was kept under furnace for 10minutes and
temperature of the furnace was set to 9000
C. The
steps are repeated to get five layers of the film.
III RESULT AND DISCUSSION
3.1 Physical Properties
The spin coat deposited thin films of
Co3O4 and Mn doped Co3O4 are well adherent to
the steel substrate and uniformly distributed
throughout the surface area. The pure Co3O4 film is
dark brown in colour whereas the colour becomes
light as Mn doping concentration goes on
increased. For maximum Mn doping concentration
1%, light brown colour is observed as compared to
0.001% Mn doping. The thicknesses of the samples
were calculated by weight difference method by
using the relation,
𝑡 =
m
Aρ
Where, „m‟ is the mass of the film
deposited on area „A‟ of the substrate and „ρ‟ is the
density of the material in the bulk form. The mass
„m‟ is the difference between weight of the
substrate measured before deposition and weight of
the substrate measured after deposition. The weight
measurements of films have been taken using a
single pan microbalance.Figure 1shows the
variation of film thickness with different Mn
concentrations from 0.001% to 1%.
Fig. 1 Variation of film thickness with Mn concentration in cobalt
The density of the deposited material is
same as that of the bulk material i.e.,  = 6.11
g/cm3
for Co3O4 and  = 5.026 g/cm3
for MnO2.
From the figure it is found that increasing
percentage of Mn film thickness goes on increase
up to 13μm at 0.01 % Mn then after it decreases
and for maximum 1% Mn concentration sample
shows minimum film thickness of 8.3μm. It may
found that at lower Mn% shows easy
decomposition and at high Mn % incorporation
material shows improper decomposition due to
resistive nature and different oxidation states.
3.1 Structural Analysis
The X-ray diffractometer (XRD 6000)
with CuKα line radiation (λ = 1.5406 Å) operating
at 40KV, 30mA for angles between 2θ = 100
to 900
in steps 0.02 was used for determining the
crystallite phase and orientation. The X-ray
diffractograms of series of Mn doped Co3O4 thin
films is shown in figure 2.The characteristic peaks
corresponding to the planes [220], [422], [620] and
[441] respectively are of Co3O4cubic phase. The
peak corresponding to plane [400] is dominating in
all the samples. These diffraction peaks can be
indexed to the crystalline cubic phase Co3O4 with
lattice constants of a = 8.085 Åand a space group of
Fd3 m, which are in good agreement with the
reported values in JCPDS card no. 78–1969.In
addition, three diffraction peaks corresponding to
the planes [310], [320] and [420] observed in all
doped XRD patterns, these peaks were matched for
MnO2 phase with orthorhombic structure which
were matched with JCPDS card no. 82-2169 which
is an indication of secondary phase or clusters,
confirming that the samples are of mixed phase.
Peaks corresponding to steel substrate are indicated
by „*‟. In addition, the width of the [400], [620]
and [310] peaks increases with increasing doping
concentration, which indicates the decrease of the
particle size. But for the maximum doping
concentration the intensity of peaks corresponding
to plane [400] and [320] is less than that observed
for minimum doping concentration. This indicates
that dopant incorporation deteriorates the
crystallinity of films, which may be due to the ion
S1 S2 S3 S4 S5 S6 S7 S8
8
9
10
11
12
13
Thickness(micrometer)
Mn Concentration in Cobalt (at %)
S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46
www.ijera.com 43|P a g e
size difference between Cobalt and Manganese.
Crystallite size for different peaks have been
calculated by the Scherrer‟s formula[25]
and are
represented in figure 3. It can be observed that
crystallite size varies with the variation in dopant
concentration. The presence of Mn dopant limited
the crystal growth, as suggested by the observed
difference in crystallite size with respect to increase
in Mn concentration in Co3O4. As ionic radii of Co
is larger than Mn[26,27]
, Mn2+
ions systematically
substituted for the Co2+
in the sample reducing the
average crystallite size.
Fig. 2 XRD patterns of Pure Co3O4 and Mn doped Co3O4 Thin Films
Fig. 3 Variation of Crystallite size with Mn dopant concentration.
Fig. 4 Variation in Lattice parameter “a” with doping concentration for Co3O4 peaks
10 20 30 40 50 60 70 80 90 100
Intensity(arb.unit)
A8
*
[320]Mn
[444]Co
[440]Co
[422]Co
[400]Co
[310]Mn
[220]Co
A1
[420]Mn
*
[620]Co
*
*
A2
A3
Angle 2 Theta (degree)
A4
A5
A6
A7
A1 A2 A3 A4 A5 A6 A7 A8
2.1
2.8
3.5
4.2
4.9
CrystelliteSize(micrometer)
Mn Concentration in Cobalt (at %)
[400]
[620]
A1 A2 A3 A4 A5 A6 A7 A8
8.1
8.2
8.3
8.4
8.5
LatticeConstant'a'
Mn Concentration in Cobalt (at%)
S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46
www.ijera.com 44|P a g e
Lattice constants „a‟, „b‟ and „c‟ are
calculated from the XRD data and it shows
goodagreement with the standard values (a=8.085
Å)[JCPDS-78-1969] for the different peaks of
Co3O4and (a=9.3229, b=4.4533 and c=2.8482
Å)[JCPDS-82-2169]forMnO2peaks. Variation in
lattice constants with Mn doping are shown in
figure 4 and 5 respectively. As observed from the
graphs, there is negligible variation in lattice
constant „a‟ of Co3O4. But lattice constants „a‟ and
„b‟ of MnO2 increases with increase in Mn
concentration whereas „c‟is almost constant.
Fig. 5 Variation in Lattice parameter „a‟, „b‟ and „c‟ with doping concentration for MnO2 peaks peaks
3.2 Surface analysis
The morphological features of the samples
were investigated by Scanning Electron
Microscopy (SEM) using a JEOL JSM-6360
instrument.The incorporation of Mn at Co site was
found to influence the surface morphology of the
films. The Mn-doped Co3O4film showed the
formation of many tetragonal particles all over the
surfacewith smooth, well adherent and porous
surface morphology. Incorporation of Mn ions
changed the surface morphology of films in terms
of decreased grain size with more equated grains
and continuous grain boundary with increase in Mn
concentration as seen from figure 6.Due to the
enhancement of the dopant concentration more
impurities were included into theCo3O4 crystal,
resulting in more deviance in the crystal structure
so that the crystallinity of the films was affected as
seen in the XRD. The graphical analysis of average
grain size for all films is shown in figure 7, which
sowsat maximum doping concentration 1wt% of
Mn there is an increase in grain to surface ratio,
which may favourable for accumulation of large
number of charges over the surface of electrode .
Fig. 6 SEM images of pure Co3O4 and Mn doped Co3O4Thin Films
A2 A3 A4 A5 A6 A7 A8
2.8
3.0
3.2
9.0
9.1
9.2
4.50
4.55
4.60
Mn Concentration in Cobalt (at %)
c
a
LatticeConstants'a','b'and'c'
b
S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46
www.ijera.com 45|P a g e
Fig.7 Variation in grain size with Mn Concentration in Cobalt
3.3 Compositional Analysis
The EDAX spectroscopy was used to
know the percentage of the element present in the
sample. EDAX analysis is carried out using Quanta
200 ESEM instrument. Figure 8 shows the ratio of
Co:Mn:O elemental composition. From the
obtained data we found that the Co, Mn and O was
present in the 33:5:62 percentages. The EDAX
spectrum of pure Cobalt Oxide and Mn doped
Cobalt Oxide thin films are shown in figure 9.
EDAX analysis showed that the atomic percentage
of Mn increased in the sample depending on the
increasing doping concentration in the solution. As
a result Mn incorporation has a strong effect on
structural and morphological properties of
Co3O4thin films.
Fig. 8 Variation in atomic % with Mn Concentration in Cobalt
Fig.9 EDAX patterns ofpure Co3O4 and Mn doped Co3O4Thin Films
A1 A2 A3 A4 A5 A6 A7 A8
200
220
240
260
280
300
320
340
360
GrainSize(nm)
Mn Concentration in Cobalt (at %)
A1 A2 A3 A4 A5 A6 A7 A8
0
5
10
15
20
25
30
35
40
45
50
55
60
65
Atomic%
Mn Concentration in Cobalt (at %)
Mn
Co
O
S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46
www.ijera.com 46|P a g e
IV CONCLUSION
Pure and Mn doped Co3O4 thin films were
prepared with different values of Mn content by the
sol-gel spin-coating method. The crystalline
structure and morphological properties were
investigated.The diffraction patternsreveal a good
crystalline behaviour with the cubicphase of cobalt
oxide. The doped XRD patterns indicated the
secondary phase of MnO2. The presence of Mn
dopant limited the crystal growth as calculated by
sherrer‟s formula.SEM micrographs showed that
incorporation of Mn dopants changed the surface
morphology of Co3O4 and enhanced pore density
and grain densityobserved for highest doping
concentration (1%).From the EDAX data we found
that the Co, Mn and O was present in the sample in
33:5:62 percentages.
ACKNOWLEDGEMENT
Authors are grateful to the U.G.C New
Delhi for financial support through the Major
Research Project F No. 42-123/2013(SR).
REFERENCES
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[5] X. W. Lou, D. Deng. J, J. Feng and L. A.
Archer, Advanced Materials, 20, 258-262,
(2008)
[6] S. Lian, E. Wang, L. Gao and L. Xu, J.
Materials Letters, 61, 3893-3896,(2007)
[7] D. Zou, C. Xu, H. Luo, L. Wang and T. I.
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1978,(2008)
[8] P. Poizot, S. Laruelle, L. Dupont and J. M.
Tarascon, J. Nature, 407, 496-499, (2000)
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Structural and Morphological Properties of Mn-Doped Co3O4 ThinFilm Deposited by Spin Coat Method

  • 1. S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46 www.ijera.com 41|P a g e Structural and Morphological Properties of Mn-Doped Co3O4 ThinFilm Deposited by Spin Coat Method 1 S. M. Jogade, 1 D. S. Sutrave, 2 V.B. Patil 1 D.B. F. Dayanand College of Arts and Science, Solapur, Maharashtra, India-413003 2 Department of Physical Science, Solapur University, Solapur, Maharashtra ABSTRACT In this study, a series of manganese (Mn)-doped Cobalt oxide (Co3O4)thin films were deposited on steel substrate by the sol-gel spin coat method and investigated the influence of doping concentrations of Mn in Cobalt ranging from 0.001% to 1% on physical, structural and morphological properties of Co3O4 thin films. Cobalt acetate[(CH3COO)2Co.4H2O], Mn acetate [C4H6MnO4.4H2O] and Isopropyl alcohol were used as starting material, dopant source and reagent respectively.X-ray diffraction analysis indicated that pureCo3O4 thin film iscrystallinein nature andcubic phase with [400] preferential orientation.For Mn doped films, three new peaks corresponding to the planes [310], [320] and [420] of orthorhombic MnO2 phase were observed.SEM micrographs showed that incorporation of Mn in Co site was found to influence the surface morphology of the films. All the films showed tetragonal shaped grains. TheEDAXanalysis revealedthe amount of Mn element in the sample increased with increasing dopant concentration. Keywords: Co3O4, MnO2, Doping, XRD, SEM, EDAX, Spin Coat I INTRODUCTION Cobalt oxide is an important p-type semiconductor with direct optical band gaps at 1.48 and 2.19 eV[1] , Co3O4has a stable normal spinel structure, where Co2 + ions occupy the tetrahedral 8a sites and Co3 + occupy the octahedral 16d sites[2] . Cobalt oxides have attracted much attention for their interesting fundamental properties and many technical applications such as promising material in gas-sensing and solar energy absorption and as an effective catalyst in environmental purification and chemical engineering[3,4] .In addition, Co3O4has been widely studied for its application as lithium ion battery electrodes, ceramic pigments, field- emission materials and magnetic material[5-11] . Co3O4hasbeen prepared by a range of methods including sol-gelsynthesis[12] , spray pyrolysis[13] , electrodeposition[14] , chemical vapour deposition(CVD)[15] , thermal decomposition [16] , pulsed laserdeposition (PLD)[17] and sputtering[18] . According to the literature survey, the systematic investigationson effect of doping on structural, and morphological properties of crystallineCo3O4 thin films by sol-gel spin coating methodhas been sparsely studied[19]. Literature study also revealed that, the properties of transition metal oxides can be enhanced by doping, and also attempts are made to modify the physical, chemical and optical properties of thin films by doping with other transition metal oxides. The structural and optical properties have been enhanced by impurity doping and heat treatment[20-23] . Many researchers used Mn as a doping material[24] . So in the present work effect of Mn doping on structural, morphological and compositional properties of cobalt oxide thin films is presented. II EXPERIMENTAL 2.1 Synthesis Co3O4 was synthesized by using Cobalt acetate tetrahydrate[(CH3COO)2Co.4H2O], isopropyl alcohol as a starting material and reagent respectively. A 0.02 M solution was prepared by mixing 0.249gm cobalt acetate tetrahydrate and 50ml double distilled water and it was stirred well using magnetic stirrer until it became optically transparent, then isopropyl alcohol was added slowly. The prepared solution was stirred again for 6 hours at temperature 500 C and then aged for 48.00 hours to get viscous solution in the form of gel. The doped solution was prepared by adding to the precedent solution Manganese acetate [C4H6MnO4.4H2O] as a dopant source. The weight percentages of Mn were 0.001%, 0.005%, 0.01%, 0.05%, 0.1%, 0.5% and 1%. After doping with different concentrations, the above process was repeated to prepare the sol-gel. 1.2 Deposition For the deposition of thin films, Milman Spin Coat unit was used. Co3O4 and Mn doped Co3O4thin film electrodes with different doping concentrations of Mnsuch as 0.001%, 0.005%, 0.01%, 0.05%, 0.1%, 0.5% and 1% is done by Sol- gel spin coat technique and the deposition samples were denoted as A1, A2, A3, A4, A5, A6, A7 and A8throughout the paper. In this technique, at first a RESEARCH ARTICLE OPEN ACCESS
  • 2. S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46 www.ijera.com 42|P a g e drop of 0.1ml of prepared sol was placed on the substrate using a syringe. Which is then rotated at high speed on spin coater unit in order to spread the sol-gel by centrifugal force. The spin coating process can be broken down into the four stages such as deposition, rotating, drying and repeating the same process for multilayers. To dry the film, the film was kept under furnace for 10minutes and temperature of the furnace was set to 9000 C. The steps are repeated to get five layers of the film. III RESULT AND DISCUSSION 3.1 Physical Properties The spin coat deposited thin films of Co3O4 and Mn doped Co3O4 are well adherent to the steel substrate and uniformly distributed throughout the surface area. The pure Co3O4 film is dark brown in colour whereas the colour becomes light as Mn doping concentration goes on increased. For maximum Mn doping concentration 1%, light brown colour is observed as compared to 0.001% Mn doping. The thicknesses of the samples were calculated by weight difference method by using the relation, 𝑡 = m Aρ Where, „m‟ is the mass of the film deposited on area „A‟ of the substrate and „ρ‟ is the density of the material in the bulk form. The mass „m‟ is the difference between weight of the substrate measured before deposition and weight of the substrate measured after deposition. The weight measurements of films have been taken using a single pan microbalance.Figure 1shows the variation of film thickness with different Mn concentrations from 0.001% to 1%. Fig. 1 Variation of film thickness with Mn concentration in cobalt The density of the deposited material is same as that of the bulk material i.e.,  = 6.11 g/cm3 for Co3O4 and  = 5.026 g/cm3 for MnO2. From the figure it is found that increasing percentage of Mn film thickness goes on increase up to 13μm at 0.01 % Mn then after it decreases and for maximum 1% Mn concentration sample shows minimum film thickness of 8.3μm. It may found that at lower Mn% shows easy decomposition and at high Mn % incorporation material shows improper decomposition due to resistive nature and different oxidation states. 3.1 Structural Analysis The X-ray diffractometer (XRD 6000) with CuKα line radiation (λ = 1.5406 Å) operating at 40KV, 30mA for angles between 2θ = 100 to 900 in steps 0.02 was used for determining the crystallite phase and orientation. The X-ray diffractograms of series of Mn doped Co3O4 thin films is shown in figure 2.The characteristic peaks corresponding to the planes [220], [422], [620] and [441] respectively are of Co3O4cubic phase. The peak corresponding to plane [400] is dominating in all the samples. These diffraction peaks can be indexed to the crystalline cubic phase Co3O4 with lattice constants of a = 8.085 Åand a space group of Fd3 m, which are in good agreement with the reported values in JCPDS card no. 78–1969.In addition, three diffraction peaks corresponding to the planes [310], [320] and [420] observed in all doped XRD patterns, these peaks were matched for MnO2 phase with orthorhombic structure which were matched with JCPDS card no. 82-2169 which is an indication of secondary phase or clusters, confirming that the samples are of mixed phase. Peaks corresponding to steel substrate are indicated by „*‟. In addition, the width of the [400], [620] and [310] peaks increases with increasing doping concentration, which indicates the decrease of the particle size. But for the maximum doping concentration the intensity of peaks corresponding to plane [400] and [320] is less than that observed for minimum doping concentration. This indicates that dopant incorporation deteriorates the crystallinity of films, which may be due to the ion S1 S2 S3 S4 S5 S6 S7 S8 8 9 10 11 12 13 Thickness(micrometer) Mn Concentration in Cobalt (at %)
  • 3. S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46 www.ijera.com 43|P a g e size difference between Cobalt and Manganese. Crystallite size for different peaks have been calculated by the Scherrer‟s formula[25] and are represented in figure 3. It can be observed that crystallite size varies with the variation in dopant concentration. The presence of Mn dopant limited the crystal growth, as suggested by the observed difference in crystallite size with respect to increase in Mn concentration in Co3O4. As ionic radii of Co is larger than Mn[26,27] , Mn2+ ions systematically substituted for the Co2+ in the sample reducing the average crystallite size. Fig. 2 XRD patterns of Pure Co3O4 and Mn doped Co3O4 Thin Films Fig. 3 Variation of Crystallite size with Mn dopant concentration. Fig. 4 Variation in Lattice parameter “a” with doping concentration for Co3O4 peaks 10 20 30 40 50 60 70 80 90 100 Intensity(arb.unit) A8 * [320]Mn [444]Co [440]Co [422]Co [400]Co [310]Mn [220]Co A1 [420]Mn * [620]Co * * A2 A3 Angle 2 Theta (degree) A4 A5 A6 A7 A1 A2 A3 A4 A5 A6 A7 A8 2.1 2.8 3.5 4.2 4.9 CrystelliteSize(micrometer) Mn Concentration in Cobalt (at %) [400] [620] A1 A2 A3 A4 A5 A6 A7 A8 8.1 8.2 8.3 8.4 8.5 LatticeConstant'a' Mn Concentration in Cobalt (at%)
  • 4. S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46 www.ijera.com 44|P a g e Lattice constants „a‟, „b‟ and „c‟ are calculated from the XRD data and it shows goodagreement with the standard values (a=8.085 Å)[JCPDS-78-1969] for the different peaks of Co3O4and (a=9.3229, b=4.4533 and c=2.8482 Å)[JCPDS-82-2169]forMnO2peaks. Variation in lattice constants with Mn doping are shown in figure 4 and 5 respectively. As observed from the graphs, there is negligible variation in lattice constant „a‟ of Co3O4. But lattice constants „a‟ and „b‟ of MnO2 increases with increase in Mn concentration whereas „c‟is almost constant. Fig. 5 Variation in Lattice parameter „a‟, „b‟ and „c‟ with doping concentration for MnO2 peaks peaks 3.2 Surface analysis The morphological features of the samples were investigated by Scanning Electron Microscopy (SEM) using a JEOL JSM-6360 instrument.The incorporation of Mn at Co site was found to influence the surface morphology of the films. The Mn-doped Co3O4film showed the formation of many tetragonal particles all over the surfacewith smooth, well adherent and porous surface morphology. Incorporation of Mn ions changed the surface morphology of films in terms of decreased grain size with more equated grains and continuous grain boundary with increase in Mn concentration as seen from figure 6.Due to the enhancement of the dopant concentration more impurities were included into theCo3O4 crystal, resulting in more deviance in the crystal structure so that the crystallinity of the films was affected as seen in the XRD. The graphical analysis of average grain size for all films is shown in figure 7, which sowsat maximum doping concentration 1wt% of Mn there is an increase in grain to surface ratio, which may favourable for accumulation of large number of charges over the surface of electrode . Fig. 6 SEM images of pure Co3O4 and Mn doped Co3O4Thin Films A2 A3 A4 A5 A6 A7 A8 2.8 3.0 3.2 9.0 9.1 9.2 4.50 4.55 4.60 Mn Concentration in Cobalt (at %) c a LatticeConstants'a','b'and'c' b
  • 5. S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46 www.ijera.com 45|P a g e Fig.7 Variation in grain size with Mn Concentration in Cobalt 3.3 Compositional Analysis The EDAX spectroscopy was used to know the percentage of the element present in the sample. EDAX analysis is carried out using Quanta 200 ESEM instrument. Figure 8 shows the ratio of Co:Mn:O elemental composition. From the obtained data we found that the Co, Mn and O was present in the 33:5:62 percentages. The EDAX spectrum of pure Cobalt Oxide and Mn doped Cobalt Oxide thin films are shown in figure 9. EDAX analysis showed that the atomic percentage of Mn increased in the sample depending on the increasing doping concentration in the solution. As a result Mn incorporation has a strong effect on structural and morphological properties of Co3O4thin films. Fig. 8 Variation in atomic % with Mn Concentration in Cobalt Fig.9 EDAX patterns ofpure Co3O4 and Mn doped Co3O4Thin Films A1 A2 A3 A4 A5 A6 A7 A8 200 220 240 260 280 300 320 340 360 GrainSize(nm) Mn Concentration in Cobalt (at %) A1 A2 A3 A4 A5 A6 A7 A8 0 5 10 15 20 25 30 35 40 45 50 55 60 65 Atomic% Mn Concentration in Cobalt (at %) Mn Co O
  • 6. S. M. Jogade. et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 6, Issue 9, ( Part -4) September 2016, pp.41-46 www.ijera.com 46|P a g e IV CONCLUSION Pure and Mn doped Co3O4 thin films were prepared with different values of Mn content by the sol-gel spin-coating method. The crystalline structure and morphological properties were investigated.The diffraction patternsreveal a good crystalline behaviour with the cubicphase of cobalt oxide. The doped XRD patterns indicated the secondary phase of MnO2. The presence of Mn dopant limited the crystal growth as calculated by sherrer‟s formula.SEM micrographs showed that incorporation of Mn dopants changed the surface morphology of Co3O4 and enhanced pore density and grain densityobserved for highest doping concentration (1%).From the EDAX data we found that the Co, Mn and O was present in the sample in 33:5:62 percentages. ACKNOWLEDGEMENT Authors are grateful to the U.G.C New Delhi for financial support through the Major Research Project F No. 42-123/2013(SR). REFERENCES [1] A. O. Gulino, P. Rossi and I. Fragala, J. Chemistry of Materials, 15, 3748-3752, (2003) [2] S. G. Kandalkar, C. D. Lokhande, R. S. Mane and S. H. Han, J. Applied Surface Science, 254, 5540-5544, (2008) [3] Y. Chen, Y. Zhang and S. Fu, J.Materials Letters, 61, 701-705,(2007) [4] Y. Dong, K. He, L. Yin and A. Zhang, J. Nanotechnology, 18, 435602-435608, (2007) [5] X. W. Lou, D. Deng. J, J. Feng and L. A. Archer, Advanced Materials, 20, 258-262, (2008) [6] S. Lian, E. Wang, L. Gao and L. Xu, J. Materials Letters, 61, 3893-3896,(2007) [7] D. Zou, C. Xu, H. Luo, L. Wang and T. I. Ying, J. Materials Letters, 62, 1976- 1978,(2008) [8] P. Poizot, S. Laruelle, L. Dupont and J. M. Tarascon, J. Nature, 407, 496-499, (2000) [9] B. Varghese, T. C. Hoong, Y. W. Zhu, M. V. Reddy, T. S. Wee, B. C. Vincent, C. T. Lim and C. Sow, J. General & Introductory Materials Science, 17, 1932- 1939,(2007) [10] J. Jiang, L.-C. Li, J, Materials Letters, 61, 4894-4896,(2007) [11] Vikas Patil1, Pradeep, J. Soft Nanoscience Letters, 2, 1-7,(2012) [12] F. Svegl, B. Orel, M.G. Hutchins, K. Kalcher, J. Electrochem. Soc. 134, 1532– 1539, (1996) [13] K. Sinko, G. Szabo, M. Zrinyi, J. Nanosci Nanotechno. 11, 4127–4135, (2011) [14] D. Gallant, M. Pezolet, S, J. Simard Phys. Chem. B, 110, 6871–6880, (2006) [15] D. Barreca, E. Comini, A. Gasparotto, C. Maccato, A. Pozza, C. Sada, G. Sberveglieri, E. Tondello, J. Nanosci. Nanotechno. 10, 8054–8061, (2010) [16] K.M. Nam, J.H. Shim, D.W. Han, H.S. Kwon, Y.M. Kang, Y. Li, H. Song, W.S. Seo, J.T. Park, J. Chem. Mater, 22 4446– 4454, (2010) [17] H.J. Nam, T. Sasaki, N. Koshizaki,J. Phys. Chem. 110, 23081–23084, (2006) [18] H. Yamamoto, T. Naito, M. Terao, T. Shintani, J. Thin Solid Films 411, 289– 297, (2002) [19] (http://www.sciencepublishinggroup.com/j /am) 3, 52-57, (2014) [20] G, Zhao, H. Kozuka, Yoko, J. Thin Solid Films, 277, 147, (1996) [21] D. Mardare, M. Tasca, Delibas, J. Appl. Surf. Sci, 156, 200, (2000) [22] D. Mardare, G. Rusu,J. Appl. Surf. Sci, 75, 68, (2000) [23] S. Subramanian, S. Vijaylaxmi, Venkatraj, J. Science Direct, 515, 3776, (2008) [24] Yao, H. Ming, Springer Open Journal, 7, 100, (2012) [25] J. Suranaree,J.Sci. Technol., 18,(2011) [26] R. D. Shannon. Published in Acta Crystallographica. A32, 751-767, (1976) [27] L. Pauling, Published by Ithaca: Cornell University Press,(1961)