Scanning Transmission Electron Microscopy (STEM) is an advanced imaging technique that utilizes a finely focused electron beam scanned across a thin specimen to provide high-resolution images and detailed insights into material structures at the nano to sub-atomic scale. It involves several components including an electron source, electromagnetic lenses, scanners, and various detectors that capture and analyze electron interactions, enabling detailed elemental composition analysis via techniques such as X-ray microanalysis and electron energy loss spectroscopy. Applications of STEM span various fields including biological sciences, semiconductor development, and materials science, allowing for precise imaging and characterization of diverse specimen types.