Electromagnetic Field Visualization System
EPS is a EMC/EMI debugging tool enabling designers to rapidly perform
pre-measurement, failure point identification, and improvement efficiency
confirmation in EMC/EMI countermeasure process of product design.
How does it work? The software detects locations of probes by color
discrimination through camera’s image sensors*, real time analysis measured signal frequency,
shows a heat map by overlapping electromagnetic field strength and real images of measured objects.
● A real-time diagnostic tool supports EMC/EMI debugging.
● Fast visualize EMC/EMI problems.
● Enables easy comparison of countermeasures before and after.
● Capable of measurement from entire products to single components.
● Factor-editor function provides correction of antenna characteristics, cable loss and pre-amplifier.
● User friendly compact design.
● Customer supplied spectrum and probes acceptable
https://www.n-denkei.com/singapore/inquiry/
Nityanand gopalika digital detectors for industrial applicationsNityanand Gopalika
This is a presentation by Nityanand Gopalika on Digital Radiograpgy. The presentation we given @ Digital Radiography workshop organized by GE at JFWTC, Bangalore.
PerkinElmer Spotlight™ FT-IR, NIR Microscopy and Imaging Systems are built to the highest ISO-9001 manufacturing standards.
This document presents technical information and typical performance specifications based on factory tests.
The Spotlight systems take the proven and popular IR microscopy technique and add a new level of speed and applications capability. Spotlight systems incorporate high performance detectors, which deliver the ultimate in sensitivity, out-performing competitive top-of-the line IR microscopy systems. The revolutionary imaging capabilities enable previously time-consuming and difficult chemical composition studies to be performed without compromising data quality.
The document describes the OmniScan MX2 phased array flaw detector from Olympus. The MX2 offers improvements over the previous MX model including a brighter, larger touchscreen, faster setup and testing speeds, more data storage capacity, and new analysis software. It is a modular and customizable instrument that can accommodate current and future phased array technologies to meet a user's evolving needs.
Demo request dan pemesanan produk, hubungi PT Siwali Swantika. Jakarta : 021-45850618 | Surabaya : 031-842124. Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
Indatech Beyond Spectroscopy is an innovative company, with expertise in optical measurements for on-line monitoring and controlling industrial processes. Raman NIR UV Spectroscopy; Hyperspectral imaging; Spatialy Resolved Spectroscopy
PerkinElmer Spotlight™ FT-IR Microscopy Systems are built to the highest ISO-9001 manufacturing standards. This document presents technical information and typical performance specifications based on factory tests.
The Spotlight systems take the proven and popular IR microscopy technique and add a new level of performance, automation and add applications capability. Spotlight 150i and 200i systems can be configured from a range of FT-IR, detector and microscope stage options to best suit the application requirement.
The Spotlight150i and 200i systems can be configured with either Spectrum Two or Frontier FT-IR instruments; in addition
Spectrum 100, 400 and Spectrum One FT-IR systems are upgradeable to Spotlight 150i/200i systems.
Development of industrial ct system for 2 d 3d tomographic images of concrete...Walmor Godoi
The document summarizes the development of an industrial CT system by a research group in Brazil to perform 2D and 3D tomographic imaging of concrete cores and polymeric insulators. It describes the motivation to analyze concrete dams and power distribution components, outlines the system components developed over multiple iterations, and provides examples of applications in concrete analysis, insulator defect detection, and other materials testing.
Nityanand gopalika digital detectors for industrial applicationsNityanand Gopalika
This is a presentation by Nityanand Gopalika on Digital Radiograpgy. The presentation we given @ Digital Radiography workshop organized by GE at JFWTC, Bangalore.
PerkinElmer Spotlight™ FT-IR, NIR Microscopy and Imaging Systems are built to the highest ISO-9001 manufacturing standards.
This document presents technical information and typical performance specifications based on factory tests.
The Spotlight systems take the proven and popular IR microscopy technique and add a new level of speed and applications capability. Spotlight systems incorporate high performance detectors, which deliver the ultimate in sensitivity, out-performing competitive top-of-the line IR microscopy systems. The revolutionary imaging capabilities enable previously time-consuming and difficult chemical composition studies to be performed without compromising data quality.
The document describes the OmniScan MX2 phased array flaw detector from Olympus. The MX2 offers improvements over the previous MX model including a brighter, larger touchscreen, faster setup and testing speeds, more data storage capacity, and new analysis software. It is a modular and customizable instrument that can accommodate current and future phased array technologies to meet a user's evolving needs.
Demo request dan pemesanan produk, hubungi PT Siwali Swantika. Jakarta : 021-45850618 | Surabaya : 031-842124. Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
Indatech Beyond Spectroscopy is an innovative company, with expertise in optical measurements for on-line monitoring and controlling industrial processes. Raman NIR UV Spectroscopy; Hyperspectral imaging; Spatialy Resolved Spectroscopy
PerkinElmer Spotlight™ FT-IR Microscopy Systems are built to the highest ISO-9001 manufacturing standards. This document presents technical information and typical performance specifications based on factory tests.
The Spotlight systems take the proven and popular IR microscopy technique and add a new level of performance, automation and add applications capability. Spotlight 150i and 200i systems can be configured from a range of FT-IR, detector and microscope stage options to best suit the application requirement.
The Spotlight150i and 200i systems can be configured with either Spectrum Two or Frontier FT-IR instruments; in addition
Spectrum 100, 400 and Spectrum One FT-IR systems are upgradeable to Spotlight 150i/200i systems.
Development of industrial ct system for 2 d 3d tomographic images of concrete...Walmor Godoi
The document summarizes the development of an industrial CT system by a research group in Brazil to perform 2D and 3D tomographic imaging of concrete cores and polymeric insulators. It describes the motivation to analyze concrete dams and power distribution components, outlines the system components developed over multiple iterations, and provides examples of applications in concrete analysis, insulator defect detection, and other materials testing.
Demo request dan pemesanan produk, hubungi PT. Siwali Swantika. Jakarta : 021-45850618 / Surabaya : 031-8421264.
Kunjungi website kami di www.siwali.com untuk spesifikasi produk dan varian lainnya dari Fluke.
Profilograph-profilometr is capable to provide measurement of parameters of surfaces in three-dimensional (3D) the image of their condition to within 1нм on height of a relief. This device allows to receive qualitatively new information which, in turn, will lead to development and creation of the newest technologies in mechanical engineering
It is adopts the theory of spectrophotometer. It used for plastic, printing, paint, ink, textile, dyeing and other industries for color management. It measure L*a*b, L*c*h and the sample △E and △Lab value
Phased Array Ultrasonic Testing in lieu of RadiographyMike Belcher
Phased array ultrasonic testing (PAUT) offers several advantages over conventional ultrasonic testing for pipeline inspection. It uses multi-element transducer arrays to provide increased beam steering and focusing capabilities. This allows for accurate multi-dimensional sizing of defects and generation of ultrasonic images of welds in various 2D orientations. PAUT inspection is more efficient and cost-effective compared to conventional UT, while providing higher quality ultrasonic data and images that can facilitate engineering critical assessments and fracture mechanics acceptance criteria. Its use is gaining acceptance in pipeline codes and standards due to benefits like increased production, improved safety by eliminating ionizing radiation, and potential for lower repair rates.
This document summarizes the features and specifications of several spectral colorimeter models produced by Lisun Electronics Inc. The colorimeters can measure color parameters such as L*a*b, L*c*h, and ΔE values. They utilize CLED light sources for illumination and feature an integrating sphere, automatic gloss compensation, and an SCS optical engine to provide accurate and repeatable measurements. The models vary in light sources supported, display capabilities, data storage, and inclusion of features like cameras and Bluetooth. All are portable, battery-powered devices suitable for applications in industries like plastics, paint, printing, food, textiles, and automotive.
Brosur Total Station Sokkia IM 100 Versi IndonesiaRega Surveyor
Rega
SALES
WA/TLP 085211828148
E. infoindosurta@yahoo.co.id
PT. Alat Ukur Indosurta bergerak di bidang penjualan, penyewaan dan service kalibrasi alat-alat survey. Kami hadir lebih luas dan lebih dekat untuk melayani kebutuhan pengukuran anda di bidang konstruksi, telekomunikasi, kehutanan, pertambangan, kelautan, dll.
Kantor Pusat :
Tangerang Selatan
Nusaloka Sektor XIV,5
Jln. Bangka Blok N2 No 03
BSD City – Serpong
Kantor Cabang :
-Surabaya
-Makassar
-Balikpapan
- Batam
-Palembang
-Cikarang
-Semarang
-Manado
-Jakarta
-Tangerang Selatan
“BAGI ANDA YANG BERADA DI DEKAT KANTOR PUSAT MAUPUN CABANG KAMI, KAMI MELAYANI SYSTEM ANTAR JEMPUT, DAN JANGAN KHAWATIR BAGI ANDA YANG BERADA DILUAR KOTA, KAMI SIAP MELAYANI VIA EXPEDISI SESUAI DENGAN YANG ANDA INGINKAN”
The iM-100 Series intelligence Measurement Station from Topcon provides:
1) Construction and survey application software onboard for tasks like cross-sectional surveys, topographic surveys, and stakeouts.
2) A reliable and accurate EDM with a measuring range of up to 1,000 meters reflectorless and 6,000 meters with a prism, and distance measurement accuracy of 1.5mm+2ppm.
3) A rugged design with an IP66 rating for withstanding tough job sites and a long-lasting battery that provides up to 28 hours of operation on a single charge.
The document discusses optical time domain reflectometry (OTDR) which is used to locate faults in optical fibers. An OTDR works by launching light pulses into a fiber and analyzing the backscattered light to map the fiber's characteristics. It can detect events like connections, bends, and breaks by analyzing reflections and loss in the returned optical signal over time. The document covers OTDR operating principles, the factors that determine its measurement resolution and event location ability, and how it is used in the industry to test fiber links and networks.
MASK: Robust Local Features for Audio FingerprintingXavier Anguera
The document proposes a new audio fingerprinting technique called MASK. It begins by outlining audio fingerprinting and prior techniques. MASK extracts salient spectral points from mel-frequency bands and applies spectral masking around these points. It encodes the masked regions into a binary fingerprint. Experiments on the NIST TRECVID database with 1400 queries and 7 transformations show MASK achieves excellent results for video copy detection, outperforming a similar prior fingerprinting technique. In conclusions, MASK is presented as an improved audio fingerprinting method.
CE6404 ANNA UNIVERSITY Unit iii total station surveyingDr Gopikrishnan T
This document discusses total station surveying, which uses total stations to measure angles and distances to determine coordinates and elevations of points on the ground. It describes the working principles of total stations, including electro-optical and electronic systems, and discusses potential sources of errors in measurements from each system. Methods of total station surveying include trilateration and traversing.
The tV-laser mandrel provides pipeline inspections using both laser profiling and CCTV camera technologies in a single pass. It is a battery-powered, autonomous device that does not require an inspection truck or power/signal cables. Operators can obtain on-site deflection results from the integrated laser profiler and software, or request a professionally processed report. The tV-laser mandrel allows for efficient and cost-effective inspections of water and wastewater pipelines.
Digital radiography systems have replaced analog film-based systems. There are several types of digital radiography including computed radiography, scanned projection radiography, and indirect and direct digital radiography. Computed radiography uses a photostimulable phosphor plate to capture x-rays and a laser scanner to read the plate digitally. Scanned projection radiography functions similar to a CT scanner to produce digital radiographic images. Indirect and direct digital radiography use detectors like CCDs or photodiodes coupled with scintillators to directly convert x-rays to digital signals. Digital radiography allows for post-processing of images and reduces need for film and processing.
This document summarizes Ramesh Raskar's work on coded computational photography. It describes using coded exposure to enable motion deblurring from a single photo in 2006. It also describes using a coded aperture to enable full resolution digital refocusing from a single photo in 2007 and using it for glare reduction in 2008. Additionally, it discusses using optical heterodyning to capture a 4D light field from a 2D sensor and single photo in 2007, as well as coding illumination and spectrum for applications like motion capture and acquiring an agile wavelength profile. The document outlines a progression from epsilon to coded to essence photography.
The document provides an overview and description of the key features of the MT9083 Series OTDR from Anritsu for testing optical fibers. The MT9083 offers OTDR testing of both singlemode and multimode fibers using multiple wavelengths in a compact, portable device. It has high resolution and dynamic range for testing short fibers and complex PON networks. The MT9083 also simplifies operation through dedicated testing modes and automated functions.
This document provides a summary of multitone testing techniques for electronic devices. It begins with an overview of how multitone testing allows acquiring measurement results from multiple frequencies simultaneously, unlike traditional single-tone and two-tone testing which require changing the input frequency each time. It then discusses some key problems that necessitate multitone testing such as reducing time and cost. Finally, it provides motivations for carrying out multitone testing research such as gaining experience in technical writing and learning newer testing methods used in manufacturing. The document contains figures illustrating multitone signals and how they are used to test devices.
Benchmark Magee Brochure - AE33 Next GenJason Potts
The AE33 Aethalometer offers enhanced performance including full-spectrum 7-wavelength operation from UV to IR at 1 Hz, real-time dual-spot technology to compensate for loading effects and provide composition information, and dynamic active zero for performance checks. It is network ready, rack mountable, and has low power consumption.
The document discusses challenges in probing memory systems and introduces tools like PrecisionProbe fixtures and de-embedding software to maximize probe performance and provide accurate measurements by removing probing effects. It covers probing DDR memory at different design phases, how to trigger and measure signals, and techniques for analyzing measurements against JEDEC specifications.
Digital radiography has evolved significantly since the 1970s. Computed radiography (CR) was developed in the 1980s using storage phosphor plates to capture latent images, which are then read by a scanner. Direct radiography (DR) systems developed later, directly producing digital images without needing to remove plates from cassettes. DR uses indirect conversion with scintillator layers or direct conversion using photoconductive materials. Both produce digital images but DR allows more rapid viewing and higher throughput.
This document provides an overview of key considerations for choosing image sensors for vision applications. It discusses factors like pixel size, sensor size, lens focal length and field of view, aperture, shutter type, quantum efficiency, and more. The document aims to help readers understand tradeoffs between these various design elements and how to select appropriate sensors and lenses for their specific application and objectives.
Unruk demo request dan pemesanan produk, dapat menghubungi Siwali Jakarta : 021-45850618 / Siwali Surabaya : 031-8421278.
Distributor Fluke di Indonesia - PT. Siwali Swantika (www.siwali.com)
55 w 60126-0-tech-brief_keys-to-coherent-acq-successCao Xuân Trình
As demand for data increases, network operators are searching for ways to increase throughput in optical networks beyond 100Gb/s. This requires complex modulation formats that present new challenges for test equipment designers. This document examines key aspects of coherent optical acquisition systems that impact their effectiveness for testing at high data rates, including optimal error vector magnitude (EVM) floor, future-proofing for next generation technologies, and analysis techniques. The digitizer's effective number of bits (ENOB) and use of asynchronous time interleaving are highlighted as important factors for achieving the lowest possible EVM.
55 w 60126-0-tech-brief_keys-to-coherent-acq-successCao Xuân Trình
This document discusses key aspects to consider when choosing a coherent optical acquisition system for testing high-speed fiber optic networks. It covers optimal error vector magnitude (EVM) performance, future-proofing the system for next generation technologies, and analysis techniques for thorough evaluation. Specifically, it emphasizes the importance of oscilloscope bandwidth, sample rate, and effective number of bits for achieving the lowest possible EVM. It also highlights the benefits of a modular oscilloscope system that can be reconfigured to test both current and emerging 100G, 400G, and 1Tb/s networks.
Demo request dan pemesanan produk, hubungi PT. Siwali Swantika. Jakarta : 021-45850618 / Surabaya : 031-8421264.
Kunjungi website kami di www.siwali.com untuk spesifikasi produk dan varian lainnya dari Fluke.
Profilograph-profilometr is capable to provide measurement of parameters of surfaces in three-dimensional (3D) the image of their condition to within 1нм on height of a relief. This device allows to receive qualitatively new information which, in turn, will lead to development and creation of the newest technologies in mechanical engineering
It is adopts the theory of spectrophotometer. It used for plastic, printing, paint, ink, textile, dyeing and other industries for color management. It measure L*a*b, L*c*h and the sample △E and △Lab value
Phased Array Ultrasonic Testing in lieu of RadiographyMike Belcher
Phased array ultrasonic testing (PAUT) offers several advantages over conventional ultrasonic testing for pipeline inspection. It uses multi-element transducer arrays to provide increased beam steering and focusing capabilities. This allows for accurate multi-dimensional sizing of defects and generation of ultrasonic images of welds in various 2D orientations. PAUT inspection is more efficient and cost-effective compared to conventional UT, while providing higher quality ultrasonic data and images that can facilitate engineering critical assessments and fracture mechanics acceptance criteria. Its use is gaining acceptance in pipeline codes and standards due to benefits like increased production, improved safety by eliminating ionizing radiation, and potential for lower repair rates.
This document summarizes the features and specifications of several spectral colorimeter models produced by Lisun Electronics Inc. The colorimeters can measure color parameters such as L*a*b, L*c*h, and ΔE values. They utilize CLED light sources for illumination and feature an integrating sphere, automatic gloss compensation, and an SCS optical engine to provide accurate and repeatable measurements. The models vary in light sources supported, display capabilities, data storage, and inclusion of features like cameras and Bluetooth. All are portable, battery-powered devices suitable for applications in industries like plastics, paint, printing, food, textiles, and automotive.
Brosur Total Station Sokkia IM 100 Versi IndonesiaRega Surveyor
Rega
SALES
WA/TLP 085211828148
E. infoindosurta@yahoo.co.id
PT. Alat Ukur Indosurta bergerak di bidang penjualan, penyewaan dan service kalibrasi alat-alat survey. Kami hadir lebih luas dan lebih dekat untuk melayani kebutuhan pengukuran anda di bidang konstruksi, telekomunikasi, kehutanan, pertambangan, kelautan, dll.
Kantor Pusat :
Tangerang Selatan
Nusaloka Sektor XIV,5
Jln. Bangka Blok N2 No 03
BSD City – Serpong
Kantor Cabang :
-Surabaya
-Makassar
-Balikpapan
- Batam
-Palembang
-Cikarang
-Semarang
-Manado
-Jakarta
-Tangerang Selatan
“BAGI ANDA YANG BERADA DI DEKAT KANTOR PUSAT MAUPUN CABANG KAMI, KAMI MELAYANI SYSTEM ANTAR JEMPUT, DAN JANGAN KHAWATIR BAGI ANDA YANG BERADA DILUAR KOTA, KAMI SIAP MELAYANI VIA EXPEDISI SESUAI DENGAN YANG ANDA INGINKAN”
The iM-100 Series intelligence Measurement Station from Topcon provides:
1) Construction and survey application software onboard for tasks like cross-sectional surveys, topographic surveys, and stakeouts.
2) A reliable and accurate EDM with a measuring range of up to 1,000 meters reflectorless and 6,000 meters with a prism, and distance measurement accuracy of 1.5mm+2ppm.
3) A rugged design with an IP66 rating for withstanding tough job sites and a long-lasting battery that provides up to 28 hours of operation on a single charge.
The document discusses optical time domain reflectometry (OTDR) which is used to locate faults in optical fibers. An OTDR works by launching light pulses into a fiber and analyzing the backscattered light to map the fiber's characteristics. It can detect events like connections, bends, and breaks by analyzing reflections and loss in the returned optical signal over time. The document covers OTDR operating principles, the factors that determine its measurement resolution and event location ability, and how it is used in the industry to test fiber links and networks.
MASK: Robust Local Features for Audio FingerprintingXavier Anguera
The document proposes a new audio fingerprinting technique called MASK. It begins by outlining audio fingerprinting and prior techniques. MASK extracts salient spectral points from mel-frequency bands and applies spectral masking around these points. It encodes the masked regions into a binary fingerprint. Experiments on the NIST TRECVID database with 1400 queries and 7 transformations show MASK achieves excellent results for video copy detection, outperforming a similar prior fingerprinting technique. In conclusions, MASK is presented as an improved audio fingerprinting method.
CE6404 ANNA UNIVERSITY Unit iii total station surveyingDr Gopikrishnan T
This document discusses total station surveying, which uses total stations to measure angles and distances to determine coordinates and elevations of points on the ground. It describes the working principles of total stations, including electro-optical and electronic systems, and discusses potential sources of errors in measurements from each system. Methods of total station surveying include trilateration and traversing.
The tV-laser mandrel provides pipeline inspections using both laser profiling and CCTV camera technologies in a single pass. It is a battery-powered, autonomous device that does not require an inspection truck or power/signal cables. Operators can obtain on-site deflection results from the integrated laser profiler and software, or request a professionally processed report. The tV-laser mandrel allows for efficient and cost-effective inspections of water and wastewater pipelines.
Digital radiography systems have replaced analog film-based systems. There are several types of digital radiography including computed radiography, scanned projection radiography, and indirect and direct digital radiography. Computed radiography uses a photostimulable phosphor plate to capture x-rays and a laser scanner to read the plate digitally. Scanned projection radiography functions similar to a CT scanner to produce digital radiographic images. Indirect and direct digital radiography use detectors like CCDs or photodiodes coupled with scintillators to directly convert x-rays to digital signals. Digital radiography allows for post-processing of images and reduces need for film and processing.
This document summarizes Ramesh Raskar's work on coded computational photography. It describes using coded exposure to enable motion deblurring from a single photo in 2006. It also describes using a coded aperture to enable full resolution digital refocusing from a single photo in 2007 and using it for glare reduction in 2008. Additionally, it discusses using optical heterodyning to capture a 4D light field from a 2D sensor and single photo in 2007, as well as coding illumination and spectrum for applications like motion capture and acquiring an agile wavelength profile. The document outlines a progression from epsilon to coded to essence photography.
The document provides an overview and description of the key features of the MT9083 Series OTDR from Anritsu for testing optical fibers. The MT9083 offers OTDR testing of both singlemode and multimode fibers using multiple wavelengths in a compact, portable device. It has high resolution and dynamic range for testing short fibers and complex PON networks. The MT9083 also simplifies operation through dedicated testing modes and automated functions.
This document provides a summary of multitone testing techniques for electronic devices. It begins with an overview of how multitone testing allows acquiring measurement results from multiple frequencies simultaneously, unlike traditional single-tone and two-tone testing which require changing the input frequency each time. It then discusses some key problems that necessitate multitone testing such as reducing time and cost. Finally, it provides motivations for carrying out multitone testing research such as gaining experience in technical writing and learning newer testing methods used in manufacturing. The document contains figures illustrating multitone signals and how they are used to test devices.
Benchmark Magee Brochure - AE33 Next GenJason Potts
The AE33 Aethalometer offers enhanced performance including full-spectrum 7-wavelength operation from UV to IR at 1 Hz, real-time dual-spot technology to compensate for loading effects and provide composition information, and dynamic active zero for performance checks. It is network ready, rack mountable, and has low power consumption.
The document discusses challenges in probing memory systems and introduces tools like PrecisionProbe fixtures and de-embedding software to maximize probe performance and provide accurate measurements by removing probing effects. It covers probing DDR memory at different design phases, how to trigger and measure signals, and techniques for analyzing measurements against JEDEC specifications.
Digital radiography has evolved significantly since the 1970s. Computed radiography (CR) was developed in the 1980s using storage phosphor plates to capture latent images, which are then read by a scanner. Direct radiography (DR) systems developed later, directly producing digital images without needing to remove plates from cassettes. DR uses indirect conversion with scintillator layers or direct conversion using photoconductive materials. Both produce digital images but DR allows more rapid viewing and higher throughput.
This document provides an overview of key considerations for choosing image sensors for vision applications. It discusses factors like pixel size, sensor size, lens focal length and field of view, aperture, shutter type, quantum efficiency, and more. The document aims to help readers understand tradeoffs between these various design elements and how to select appropriate sensors and lenses for their specific application and objectives.
Unruk demo request dan pemesanan produk, dapat menghubungi Siwali Jakarta : 021-45850618 / Siwali Surabaya : 031-8421278.
Distributor Fluke di Indonesia - PT. Siwali Swantika (www.siwali.com)
55 w 60126-0-tech-brief_keys-to-coherent-acq-successCao Xuân Trình
As demand for data increases, network operators are searching for ways to increase throughput in optical networks beyond 100Gb/s. This requires complex modulation formats that present new challenges for test equipment designers. This document examines key aspects of coherent optical acquisition systems that impact their effectiveness for testing at high data rates, including optimal error vector magnitude (EVM) floor, future-proofing for next generation technologies, and analysis techniques. The digitizer's effective number of bits (ENOB) and use of asynchronous time interleaving are highlighted as important factors for achieving the lowest possible EVM.
55 w 60126-0-tech-brief_keys-to-coherent-acq-successCao Xuân Trình
This document discusses key aspects to consider when choosing a coherent optical acquisition system for testing high-speed fiber optic networks. It covers optimal error vector magnitude (EVM) performance, future-proofing the system for next generation technologies, and analysis techniques for thorough evaluation. Specifically, it emphasizes the importance of oscilloscope bandwidth, sample rate, and effective number of bits for achieving the lowest possible EVM. It also highlights the benefits of a modular oscilloscope system that can be reconfigured to test both current and emerging 100G, 400G, and 1Tb/s networks.
HSCD-750 adopts the geometric of D/11 lighting. It can be used for color matching for many industries and widely used in painting industry, textile industry, plastic industry, food industry, and other industries for quality control
The document describes the EMC Spectrum Analyzer SPECTRAN NF Series which provides affordable low-frequency signal analysis. It offers features such as 3D magnetic field measurement, frequency and signal strength display, exposure limit calculation, data logging, and software updates. The analyzers can measure signals from 1Hz to 30MHz with typical accuracy of 3% and come included with a carrying case, battery, charger, and software.
TURCK announces the high speed Q25 inductive linear sensor to the automation market. The internal measuring frequency is user selectable and can be as high as 5 kHz resulting in accurate measuring speeds of 5 meters.
Dual Linear Array Probe for Corrosion ImagingOlympus IMS
More on Olympus DLA Probe: http://bit.ly/1KTxUgi
Olympus introduces the Dual Linear Array™ probe for corrosion inspection that provides advantages over conventional UT transducers used with flaw detectors. This phased array solution improves productivity through features such as larger beam coverage, faster scan speed, and C-scan imaging with increased data-point density. The pitch-catch technique improves near surface resolution and pit detection in corrosion survey applications improving probability of detection of critical wall thinning.
These slides are from the Dual Linear Array Probe for Corrosion Imaging webinar and will provide an overview of the basic OmniScan setup, inspection, and live analysis and reporting of corrosion on piping using OmniPC.
See the webinar recording: http://bit.ly/1AM9UUG
To request more information or for a quote, contact us: http://bit.ly/1wh9SWM
Sign up for our newsletter: http://bit.ly/1j5FOTy
mScope is a low-cost, high-performance automotive scope designed for use by automotive service professionals. It consists of PC software and a USB adapter that functions as a 2-channel digital storage oscilloscope. The software automatically loads settings for the component being tested and provides guidance on waveforms. mScope can test ignition systems, measure voltages and currents, and visualize pressure signals. It records measurements for later analysis and comparison to typical faults.
Optical Modulation Analysis (OMA) Present and FutureCPqD
This document discusses optical modulation analyzers (OMAs) and their current and future capabilities. OMAs have evolved from analyzing polarization multiplexed signals to fully characterizing optical fields. Key considerations for OMA performance include sufficient bandwidth to accurately measure rise/fall times and transitions between symbols. While equivalent-time OMAs offer the highest bandwidth, real-time OMAs using coherent detection can provide bit error rate measurements. The future of OMAs may include support for custom modulation formats, integrated digital signal processing, and bit error rate measurements with custom patterns.
IRJET- Compressed Sensing based Modified Orthogonal Matching Pursuit in DTTV ...IRJET Journal
This document discusses a modified orthogonal matching pursuit algorithm used for channel estimation in digital terrestrial television systems. It proposes using compressed sensing based channel estimation at the receiver to eliminate sparse information. Thresholding is used to remove noise from the channel estimation and improve signal quality. Simulation results show that bit error rate decreases when the received signal power from different transmitters is almost equal.
The document summarizes a test signal generator produced by WORK Microwave called the Handheld Satcom Test Source. It can generate signals from 50-180 MHz and 950-2150 MHz with precision and is used as a reference for calibrating equipment and testing high-frequency converters. The generator has two independent synthesizers allowing it to output two signals simultaneously for measuring intermodulation. It also allows adjustable power levels for testing parameters like 1 dB compression point and conversion gain of converters. The generator has a rechargeable battery, rugged aluminum housing, and connects to a PC for control via USB without needing additional drivers.
This document summarizes the WORK Microwave Handheld Satcom Test Source signal generator. It can generate signals from 50-180 MHz and 950-2150 MHz with precision to serve as a reference for measuring complex analog systems. It has two independent synthesizers, allowing it to generate two signals simultaneously for measuring intermodulation of high-frequency converters. Its adjustable output power level from -45 to -5 dBm in 0.5 dB steps enables measuring the 1 dB compression point and conversion gain of converters. The portable generator can operate on its internal battery or via USB, making it a versatile testing device.
This document describes a portable ultrasonic flaw detector with the following key features:
- It has a high-resolution color LCD display and can operate for over 8 hours on a lithium-ion battery.
- It is lightweight and portable, allowing for one-handed operation.
- It has functions for defect localization, sizing, evaluation, and more. It also allows data storage and transfer to a PC.
The document summarizes a test signal generator called the Handheld Satcom Test Source produced by WORK Microwave. It can generate signals from 50-180 MHz and 950-2150 MHz with precision, making it suitable for calibrating test equipment and measuring parameters of high-frequency converters. The generator has two independent synthesizers allowing it to supply two signals simultaneously for measuring intermodulation. It also allows flexible setting of output levels for measurements like compression point and conversion gain. The generator includes rechargeable batteries, software control, and integrates smoothly with Windows operating systems.
The document describes an efector dualis vision sensor that can solve a variety of inspection and error-proofing applications throughout the manufacturing process. It has a compact CMOS image sensor and fast image capture and processing capabilities. The sensor includes integrated lighting, evaluation electronics, and an industrial housing. It can be easily configured via an Ethernet interface and Setup Wizard software. Example applications discussed include part verification, orientation detection, sortation, and detecting part presence or absence. The sensor provides a simpler and more cost-effective solution than traditional vision systems or sensor clusters.
ARM Based Handy and Portable Oscilloscope Using Graphical DisplayIJERA Editor
The need to have a visual perception of signals in order to monitor events in time and value brought about the
development of a measuring instrument referred to as oscilloscope. This is a design of handy and low cost
oscilloscope. The user can start/stop the display, adjust the time division and adjust the voltage division. The
requirements of the oscilloscope were three-fold: 1) low cost design, 2) capture frequencies at the medium range
and 3) construct able with a basic skill of PCB designing.
The document summarizes the results of a demonstration test for the GEO Atmospheric Sounder (GAS) concept. The test met key requirements, including image resolution <10 mrad, beam efficiency >95%, relative temperature accuracy <2K, and polarization isolation >10 dB. It used a rotating interferometer with 21 dual-polarization receivers to image calibration sources and the sun. The results validated the interferometer concept and showed agreement with theoretical models.
This project deals with using frequency selective surfaces (FSS) and multiple-input multiple-output (MIMO) technology to improve wireless coverage and transfer large data files at high speeds in modern offices. The project tested designing and fabricating different FSS structures, and measured their frequency responses. It also measured data transfer speeds between MIMO devices with and without an FSS both inside and in different areas of an anechoic chamber. Results showed the FSS achieved bandwidth stops around 2.2GHz and improved data speeds to 4-5.2Mbps in offices and 2-3Mbps in basements. Future work could involve testing larger FSS sizes and full file transfer protocols to achieve even higher speeds.
Similar to Noiseken electromagnetic field visualization system - denkei (20)
Multi-channel low noise arbitrary waveform generation system
Multi-channel precision low noise DC voltage source
Multi-channel low noise amplification system
The document discusses the benefits of exercise for mental health. Regular physical activity can help reduce anxiety and depression and improve mood and cognitive functioning. Exercise causes chemical changes in the brain that may help protect against mental illness and improve symptoms.
Ono sokki ds3000 Data Station DS-3000 series Sound and Vibration Real-time...NIHON DENKEI SINGAPORE
1. The DS-3000 Series can perform real-time analysis of noise and vibration generated from various industrial products. It features high-speed processing hardware and easy-to-use software.
2. Real-time octave analysis breaks sounds down into frequency bands similar to human hearing, allowing analysis of noise levels over time. FFT analysis separates waveforms into frequency components.
3. Tracking analysis is useful for analyzing rotational machines like engines. It detects resonance between rotational speed and natural frequencies that could cause problems.
This document provides information on various data loggers including the LR8450, LR8450-01, LR8410-20, LR8431-20, and 8423. It compares their key specifications such as number of channels, maximum sampling interval, input types, and wireless communication capabilities. Application examples are also provided for combining the data loggers with other Hioki instruments to measure values like temperature, resistance, current, voltage, power, and strain.
The document discusses Hioki's lineup of current sensors and current probes for various current measurement applications. It provides details on their specifications and suitability for different use cases, such as evaluating power devices, automotive systems, power quality maintenance, power consumption assessment, and more. The sensors and probes are optimized for measuring currents ranging from miniscule to large magnitudes, operating at frequencies from DC to the GHz range. Models are designed for high-accuracy measurement, waveform observation, and grid power quality control across industries including automotive, renewable energy, and electronics.
This document provides an overview of Hioki's field measuring instruments and their applications in various industrial settings. It introduces Hioki as a leader in test and measuring instruments, with integrated R&D and manufacturing allowing for sustainable product innovation. Various Hioki instruments are then mapped to common applications in factories, including measuring motor insulation, supply voltage, load current, grounding, temperature, and more. Similar mappings are provided for applications in data centers and PV systems.
The document provides an overview of various electrical measuring instruments and testing equipment offered by Hioki, including:
- Battery testers for measuring the internal resistance and open-circuit voltage of batteries used in applications like electric vehicles, power tools, smartphones, and more.
- Motor measurement solutions for performance analysis and quality testing, including power analyzers, clamp sensors, and data loggers.
- Equipment for designing, developing, and testing motors and inverters, such as power analyzers for evaluating efficiency, temperature sensors, and insulation testers.
- Production testing devices like winding testers, breakdown voltage testers, resistance meters, and LCR meters.
- Additional product categories like data loggers, safety test
The DIFFERENTIAL PROBE 9322 provides 3 measurement functions with a single probe: 1) floating measurement of high voltage waveforms up to 1000V AC/DC, 2) detection of surge noise on power supply lines, and 3) true RMS rectified output of high voltage AC. It can be powered by an AC adapter or Hioki’s Probe Power Unit and measures signals up to 2000V DC or 1000V AC with a 1/1000 output.
This document summarizes the features of the KG Load Station Series 300W/1000W electronic loads. It has a revolutionary UI like an oscilloscope for easy operation. It realizes less 35% weight than previous models. It can operate just like a resistor with no minimum voltage requirement. It has high speed current control and 4 models from 300W to 1000W in 125V and 500V ranges.
The document describes the features and capabilities of the Hioki PW8001 power analyzer. It can measure up to 8 power channels with the highest accuracy from DC to high frequencies. It accurately captures power fluctuations from high-speed switching converters. It also provides full compatibility with various current sensors and can automatically perform phase correction for accurate measurement of high-frequency, low power factor power.
PBZ Series Intelligent Bi-Polar Power Supplies
The PBZ series is a bipolar type DC regulated power source that can continuously change both + and – polarities passing through 0 without changing the output terminal.
By adopting a “Switching + Linear” system, the PBZ is able to realize both drastic weight reduction as well as high speed and low noise operation. Since operation covers 4 quadrants, power can be both supplied (source) and absorbed (sink). The PBZ can also drive inductive or capacitive loads. The unit also equips a signal generator function which enables waveform and sequence creation. The PBZ is also capable of synchronized operation which is required for voltage variation tests, and it can also be expanded for large current applications through master-slave parallel operation.
This document provides information on various measurement solutions for the automotive industry, including:
1) Systems for measuring engine-related parameters like combustion chamber volume, analyzing engine noise and vibrations, and inspecting transmission components.
2) Solutions for testing vehicle bodies, including analyzing vibration modes and locating sound sources.
3) Methods for evaluating interior comfort, such as measuring sound absorption and performing psychoacoustic assessments.
4) A system for testing muffler acoustic performance.
The document also provides information on related products like multi-channel analyzers, sensors, and anechoic chambers.
Inspect solar panel bypass diodes for opens and shorts in broad daylight without covering panels
INSPECT SOLAR PANEL BYPASS DIODES FOR OPENS AND SHORTS IN BROAD DAYLIGHT WITHOUT COVERING PANELS
Traditionally, bypass diodes can only be inspected for good working condition at night or when power is not being generated by the solar panels in order to verify that any applied current is guided past the solar cells.
With the FT4310, you can detect for open faults even when the sun is out without covering the panels.
Testing can also be performed at night.
*Testing for short-circuit faults can only be performed during the day.
DP800 series includes single output, two output and three output programmable linear DC power supply. They have pure output, excellent performance indicators, multiple analysis functions, rich interfaces, and can meet the diverse testing needs.
This document lists specifications for 7 load cell models - the RZ-1 through RZ-100. Each model is designed to measure different maximum force ranges from 1kg to 100kg with varying minimum increments between 0.1g and 10g. The document also provides model numbers, maximum ratings, and force ranges for each load cell.
UiPath Test Automation using UiPath Test Suite series, part 6DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 6. In this session, we will cover Test Automation with generative AI and Open AI.
UiPath Test Automation with generative AI and Open AI webinar offers an in-depth exploration of leveraging cutting-edge technologies for test automation within the UiPath platform. Attendees will delve into the integration of generative AI, a test automation solution, with Open AI advanced natural language processing capabilities.
Throughout the session, participants will discover how this synergy empowers testers to automate repetitive tasks, enhance testing accuracy, and expedite the software testing life cycle. Topics covered include the seamless integration process, practical use cases, and the benefits of harnessing AI-driven automation for UiPath testing initiatives. By attending this webinar, testers, and automation professionals can gain valuable insights into harnessing the power of AI to optimize their test automation workflows within the UiPath ecosystem, ultimately driving efficiency and quality in software development processes.
What will you get from this session?
1. Insights into integrating generative AI.
2. Understanding how this integration enhances test automation within the UiPath platform
3. Practical demonstrations
4. Exploration of real-world use cases illustrating the benefits of AI-driven test automation for UiPath
Topics covered:
What is generative AI
Test Automation with generative AI and Open AI.
UiPath integration with generative AI
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Cosa hanno in comune un mattoncino Lego e la backdoor XZ?Speck&Tech
ABSTRACT: A prima vista, un mattoncino Lego e la backdoor XZ potrebbero avere in comune il fatto di essere entrambi blocchi di costruzione, o dipendenze di progetti creativi e software. La realtà è che un mattoncino Lego e il caso della backdoor XZ hanno molto di più di tutto ciò in comune.
Partecipate alla presentazione per immergervi in una storia di interoperabilità, standard e formati aperti, per poi discutere del ruolo importante che i contributori hanno in una comunità open source sostenibile.
BIO: Sostenitrice del software libero e dei formati standard e aperti. È stata un membro attivo dei progetti Fedora e openSUSE e ha co-fondato l'Associazione LibreItalia dove è stata coinvolta in diversi eventi, migrazioni e formazione relativi a LibreOffice. In precedenza ha lavorato a migrazioni e corsi di formazione su LibreOffice per diverse amministrazioni pubbliche e privati. Da gennaio 2020 lavora in SUSE come Software Release Engineer per Uyuni e SUSE Manager e quando non segue la sua passione per i computer e per Geeko coltiva la sua curiosità per l'astronomia (da cui deriva il suo nickname deneb_alpha).
GraphSummit Singapore | The Future of Agility: Supercharging Digital Transfor...Neo4j
Leonard Jayamohan, Partner & Generative AI Lead, Deloitte
This keynote will reveal how Deloitte leverages Neo4j’s graph power for groundbreaking digital twin solutions, achieving a staggering 100x performance boost. Discover the essential role knowledge graphs play in successful generative AI implementations. Plus, get an exclusive look at an innovative Neo4j + Generative AI solution Deloitte is developing in-house.
Removing Uninteresting Bytes in Software FuzzingAftab Hussain
Imagine a world where software fuzzing, the process of mutating bytes in test seeds to uncover hidden and erroneous program behaviors, becomes faster and more effective. A lot depends on the initial seeds, which can significantly dictate the trajectory of a fuzzing campaign, particularly in terms of how long it takes to uncover interesting behaviour in your code. We introduce DIAR, a technique designed to speedup fuzzing campaigns by pinpointing and eliminating those uninteresting bytes in the seeds. Picture this: instead of wasting valuable resources on meaningless mutations in large, bloated seeds, DIAR removes the unnecessary bytes, streamlining the entire process.
In this work, we equipped AFL, a popular fuzzer, with DIAR and examined two critical Linux libraries -- Libxml's xmllint, a tool for parsing xml documents, and Binutil's readelf, an essential debugging and security analysis command-line tool used to display detailed information about ELF (Executable and Linkable Format). Our preliminary results show that AFL+DIAR does not only discover new paths more quickly but also achieves higher coverage overall. This work thus showcases how starting with lean and optimized seeds can lead to faster, more comprehensive fuzzing campaigns -- and DIAR helps you find such seeds.
- These are slides of the talk given at IEEE International Conference on Software Testing Verification and Validation Workshop, ICSTW 2022.
Why You Should Replace Windows 11 with Nitrux Linux 3.5.0 for enhanced perfor...SOFTTECHHUB
The choice of an operating system plays a pivotal role in shaping our computing experience. For decades, Microsoft's Windows has dominated the market, offering a familiar and widely adopted platform for personal and professional use. However, as technological advancements continue to push the boundaries of innovation, alternative operating systems have emerged, challenging the status quo and offering users a fresh perspective on computing.
One such alternative that has garnered significant attention and acclaim is Nitrux Linux 3.5.0, a sleek, powerful, and user-friendly Linux distribution that promises to redefine the way we interact with our devices. With its focus on performance, security, and customization, Nitrux Linux presents a compelling case for those seeking to break free from the constraints of proprietary software and embrace the freedom and flexibility of open-source computing.
Let's Integrate MuleSoft RPA, COMPOSER, APM with AWS IDP along with Slackshyamraj55
Discover the seamless integration of RPA (Robotic Process Automation), COMPOSER, and APM with AWS IDP enhanced with Slack notifications. Explore how these technologies converge to streamline workflows, optimize performance, and ensure secure access, all while leveraging the power of AWS IDP and real-time communication via Slack notifications.
Climate Impact of Software Testing at Nordic Testing DaysKari Kakkonen
My slides at Nordic Testing Days 6.6.2024
Climate impact / sustainability of software testing discussed on the talk. ICT and testing must carry their part of global responsibility to help with the climat warming. We can minimize the carbon footprint but we can also have a carbon handprint, a positive impact on the climate. Quality characteristics can be added with sustainability, and then measured continuously. Test environments can be used less, and in smaller scale and on demand. Test techniques can be used in optimizing or minimizing number of tests. Test automation can be used to speed up testing.
Enchancing adoption of Open Source Libraries. A case study on Albumentations.AIVladimir Iglovikov, Ph.D.
Presented by Vladimir Iglovikov:
- https://www.linkedin.com/in/iglovikov/
- https://x.com/viglovikov
- https://www.instagram.com/ternaus/
This presentation delves into the journey of Albumentations.ai, a highly successful open-source library for data augmentation.
Created out of a necessity for superior performance in Kaggle competitions, Albumentations has grown to become a widely used tool among data scientists and machine learning practitioners.
This case study covers various aspects, including:
People: The contributors and community that have supported Albumentations.
Metrics: The success indicators such as downloads, daily active users, GitHub stars, and financial contributions.
Challenges: The hurdles in monetizing open-source projects and measuring user engagement.
Development Practices: Best practices for creating, maintaining, and scaling open-source libraries, including code hygiene, CI/CD, and fast iteration.
Community Building: Strategies for making adoption easy, iterating quickly, and fostering a vibrant, engaged community.
Marketing: Both online and offline marketing tactics, focusing on real, impactful interactions and collaborations.
Mental Health: Maintaining balance and not feeling pressured by user demands.
Key insights include the importance of automation, making the adoption process seamless, and leveraging offline interactions for marketing. The presentation also emphasizes the need for continuous small improvements and building a friendly, inclusive community that contributes to the project's growth.
Vladimir Iglovikov brings his extensive experience as a Kaggle Grandmaster, ex-Staff ML Engineer at Lyft, sharing valuable lessons and practical advice for anyone looking to enhance the adoption of their open-source projects.
Explore more about Albumentations and join the community at:
GitHub: https://github.com/albumentations-team/albumentations
Website: https://albumentations.ai/
LinkedIn: https://www.linkedin.com/company/100504475
Twitter: https://x.com/albumentations
Unlocking Productivity: Leveraging the Potential of Copilot in Microsoft 365, a presentation by Christoforos Vlachos, Senior Solutions Manager – Modern Workplace, Uni Systems
Unlock the Future of Search with MongoDB Atlas_ Vector Search Unleashed.pdfMalak Abu Hammad
Discover how MongoDB Atlas and vector search technology can revolutionize your application's search capabilities. This comprehensive presentation covers:
* What is Vector Search?
* Importance and benefits of vector search
* Practical use cases across various industries
* Step-by-step implementation guide
* Live demos with code snippets
* Enhancing LLM capabilities with vector search
* Best practices and optimization strategies
Perfect for developers, AI enthusiasts, and tech leaders. Learn how to leverage MongoDB Atlas to deliver highly relevant, context-aware search results, transforming your data retrieval process. Stay ahead in tech innovation and maximize the potential of your applications.
#MongoDB #VectorSearch #AI #SemanticSearch #TechInnovation #DataScience #LLM #MachineLearning #SearchTechnology
20 Comprehensive Checklist of Designing and Developing a WebsitePixlogix Infotech
Dive into the world of Website Designing and Developing with Pixlogix! Looking to create a stunning online presence? Look no further! Our comprehensive checklist covers everything you need to know to craft a website that stands out. From user-friendly design to seamless functionality, we've got you covered. Don't miss out on this invaluable resource! Check out our checklist now at Pixlogix and start your journey towards a captivating online presence today.
GraphSummit Singapore | The Art of the Possible with Graph - Q2 2024Neo4j
Neha Bajwa, Vice President of Product Marketing, Neo4j
Join us as we explore breakthrough innovations enabled by interconnected data and AI. Discover firsthand how organizations use relationships in data to uncover contextual insights and solve our most pressing challenges – from optimizing supply chains, detecting fraud, and improving customer experiences to accelerating drug discoveries.
Introducing Milvus Lite: Easy-to-Install, Easy-to-Use vector database for you...Zilliz
Join us to introduce Milvus Lite, a vector database that can run on notebooks and laptops, share the same API with Milvus, and integrate with every popular GenAI framework. This webinar is perfect for developers seeking easy-to-use, well-integrated vector databases for their GenAI apps.
In the rapidly evolving landscape of technologies, XML continues to play a vital role in structuring, storing, and transporting data across diverse systems. The recent advancements in artificial intelligence (AI) present new methodologies for enhancing XML development workflows, introducing efficiency, automation, and intelligent capabilities. This presentation will outline the scope and perspective of utilizing AI in XML development. The potential benefits and the possible pitfalls will be highlighted, providing a balanced view of the subject.
We will explore the capabilities of AI in understanding XML markup languages and autonomously creating structured XML content. Additionally, we will examine the capacity of AI to enrich plain text with appropriate XML markup. Practical examples and methodological guidelines will be provided to elucidate how AI can be effectively prompted to interpret and generate accurate XML markup.
Further emphasis will be placed on the role of AI in developing XSLT, or schemas such as XSD and Schematron. We will address the techniques and strategies adopted to create prompts for generating code, explaining code, or refactoring the code, and the results achieved.
The discussion will extend to how AI can be used to transform XML content. In particular, the focus will be on the use of AI XPath extension functions in XSLT, Schematron, Schematron Quick Fixes, or for XML content refactoring.
The presentation aims to deliver a comprehensive overview of AI usage in XML development, providing attendees with the necessary knowledge to make informed decisions. Whether you’re at the early stages of adopting AI or considering integrating it in advanced XML development, this presentation will cover all levels of expertise.
By highlighting the potential advantages and challenges of integrating AI with XML development tools and languages, the presentation seeks to inspire thoughtful conversation around the future of XML development. We’ll not only delve into the technical aspects of AI-powered XML development but also discuss practical implications and possible future directions.
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Tektronix MDO4000 series
Rode Schwartz FSV Rode Schwartz FPL Rode Schwartz ESR
Key sight Technology N9010A Key sight Technology N9010B
Tektronix RSA360B
EPS is a EMC/EMI debugging tool enabling designers to rapidly perform
pre-measurement, failure point identification, and improvement efficiency
confirmation in EMC/EMI countermeasure process of product design.
How does it work? The software detects locations of probes by color
discrimination through camera’s image sensors*, real time analysis measured signal frequency,
shows a heat map by overlapping electromagnetic field strength and real images of measured objects.
● A real-time diagnostic tool supports EMC/EMI debugging.
● Fast visualize EMC/EMI problems.
● Enables easy comparison of countermeasures before and after.
● Capable of measurement from entire products to single components.
● Factor-editor function provides correction of antenna characteristics, cable loss and pre-amplifier.
● User friendly compact design.
● Customer supplied spectrum and probes acceptable (Please consult)
EPS-02Ev3
Electromagnetic Field Visualization System
Easy to carry at a lower price!
The RSA306B spectrum analyzer
makes it easy to carry on-site
measurements. Also, you can
build a system at a lower price.
LAN cable
USB cable
Controller PC and software
Camera
Spectrum analyzer / EMI receiver
Electric & magnetic
field probes
A wide variety of standard-compliant spectrum analyzer drivers
Type of standard spectrum analyzer has included, for that alreadyyou using spectrum analyze use to build became easier.
Three-Dimensional Indication(Time, Frequency, Amplitude)
Simplifies EMC/EMI Debugging
Image recognition (recognized the yellow color at
the tip of the probe)
Large probes measure
large equipment
Small probes measure
small compornents, PCBs
Capable of Measurement of Various product sizes
Various probes applicable
Various probes are applicable regardless of manufactures. Not only small components, but also big equipment are available to measure by
changing probes. Furthermore, even products with complex surface shape are measureable by adjusting camera’s positi
Rode Schwartz
Spectrum analyzer FSV series, FSV3000 series, FPL series
EMI receiver ESR series, ESRP series
Key sight Technology Signal analyzer N9010A, N9010B
Tektronix
Oscilloscope MDO4000 series
Spectrum analyzer RSA306B
Please inquire about other spectrum analyzers.
* Proprietary position detection method to patent application No. 2007-223275 by
Kanazawa University and patent No. 5205547 by Noise Laboratory Co., Ltd.
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EPS-02Ev3
Simplifies EMC/EMI Debugging
Three-Dimensional Indication (Time, Frequency, Amplitude)
Three-Dimensional Indication (Time, Frequency, Amplitude) pinpoint design failure even when the noise is intermittent.
①
②
③
① ② ③
Example of intermittent noise
Example of noise with little change Example of noise with large fluctuation
Easily Check the Noise Occurrence Frequency.
Add density display function.
Added a function to display colors according to the frequency of occurrence (density display function) to the conventional spectrum display
function.This makes it possible to easily check the noise occurrence frequency and the amplitude at the measurement frequency.
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EPS-02Ev3
Measured Window
Same Measurement
Condition New Measurement Window
Easy comparison before and after countermeasures.
Three-Dimensional Indication (Time, Frequency, Amplitude) pinpoint design failure even when the noise is intermittent.
Differences display
Comfirmed the amount of
noise was reduced and the
effect of the
countermeasures.
メインCPU
Operation Mode (2) (During operated)
Operation Mode (1) (During standby) Differences display
Can read the noise has
increased overall.
No change in CPU
Main CPU Main CPU
Before Measurement
Main CPU
After Measurement
Countermeasure points
Countermeasure points
Countermeasure points
Countermeasure points
Countermeasure points
Countermeasure points
Implement measures with ferrite core
Implement measures with ferrite core
Implement measures with ferrite core
Implement measures with ferrite core
Implemented measures
using decaps
Implemented measures
using decaps
Main CPU
Camera image ghost function
Overlaid the previous image for position adjustment.
Example of use ①: To match the camera position with the
previous image before the test
Example of use②: When re-adjusting when the camera position
shifts during the test
Easymeasurementunderthesameconditionsaspastdata
Newly measurement time, before measured option can also use
in this new version. Before measured data if you save, then from
Spectrum analyzer’
s setting menu the range of frequency or
RBW select and use.
Example of actual measurement results displayed on Zuken CR-8000 Design Force
Designated coordinate output function
Measurement results can be imported to external CAD software
and CAD drawings and actual measurement data can be
superimposed and displayed.
Simplify image recognition settings
By clicking on the part of the screen where you want to recognize
the color (tip of the probe), automatically adjusts the hue,
saturation, and brightness optimal for color recognition.
Automatically adjusts hue,
saturation, and brightness
to recognize colors
Click on the color you want
to extract
Others
● Highlighting unmeasured points: Unmeasured area highlights
by flashing black and white. During measurement, it prevents
unmeasured.
● Excess limit detection function: A function to display a message
or stop measurement to protect the measuring instrument due to
excessive input when the set limit value is exceeded.
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Locates possible interference sources for pre- and post-compliance measurements
CPU
Measurement after modification indicated that the
emission level lowered. This makes it easier to establish
the countermeasure strategy for problem areas such as
circuit traces, components, cables and housing
A product failed in a compliance measurement at some frequencies. The frequency of 47.99 MHz is one of the target frequencies to
which a solution is looked for.
EMI suppression
by using a ferrite core
EMI suppression
by using a ferrite core
EMI suppression
by using a ferrite core
EMI suppression
by using a ferrite core
EMI suppression
by using a by-pass capacitor
EMI suppression
by using a by-pass capacitor
CPU
Accumulated measurement data can be the basis of optimized
design and debugging method rules, and improving and sharing
how-hows, which contributes to engineering time and cost
reduction, and reliability and safety improvements.
① Failed at a measurement
in an anechoic chamber
① Failed at a measurement
in an anechoic chamber
NG
NG
The frequencies at which the
amplitudes are over the limit are
known but far field measurement
cannot identify the sources of
emissions
The frequencies at which the
amplitudes are over the limit are
known but far field measurement
cannot identify the sources of
emissions
47.99MHz
40.67dbμ/m
CISPR 22 Class B
(QP) limit
OK
basis of optimized
OK
47.99MHz
40.67dbμ/m
● Enables the users to evaluate suppression
methodologies
● Enables the users to verify the effectiveness
of the selected methodology
A intensity distribution map shows "hot spots", which are the target
areas. Furthermore, narrowing down to the desired range of
frequencies lets you know the relevant spots of the frequencies in
interest.
Cable
Cable
CPU
LSI
Hot spot
Hot spot
Hot spot
Hot spot
Hot spot
Hot spot
● Incorporating suppression measures and
verifying their effectiveness
● An amplitude versus frequency plot for each
probe position gives the users the power to
evaluate the EMI properties in depth.
② Near-field measurement by EPS-02
② Near-field measurement by EPS-02
③ Incorporating suppression measures and verifying their effectiveness
③ Incorporating suppression measures and verifying their effectiveness
A compliance measurement after debugging verified the
product emission was within the limit. Data can be saved,
accumulated and shared for future occasions.
④ Far-field measurement
④ Far-field measurement
Before
measures
After
measures
EPS-02Ev3
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EPS-02Ev3
Helpful for the users to design good EMI performance circuit boards
and to choose the best suited EMI suppression components
Since all spectrum charts can be saved, the users can evaluate and compare the effectiveness of EMI suppression
measures referring to the stored and accumulated data.
No Effect Effective
When designing a board, a comparison
between the case where the ground
routing is made into a pattern and the
case where it is made a solid ground
(Design of ground wiring)
Measures as ferrite core Measures such as resistance
Customer Credentials
Now EMI debugging is my job
On-site
measurement
On-site
measurement
Locating
hot spots
"The situation was like that before: when a product
failed at a test house,
the person in charge of the product asked for help from
a trained and skillful engineer. Now the situation has
dramatically changed like that: Even untrained or
inexperienced engineers intensively tackle EMI
debugging by using the EPS-02 system providing the
visualization of the EMI properties of the test object.
This can-do attitude is the greatest result of the
introduction of the system."
Quality Assurance Engineer, Quality Assurance Dept,
"A" company
"Our company chamber is used only for a complete finished product testing
stressing there is no meaning for PCB or internal unit testing. PCB and unit basis
measurements were R&D department's objective. As a valuable pre-compliance
tool, this system helps us to visualize quickly and locate problems areas, thus
dramatically improve debugging works. Before the introduction of this system, one
prototype sample failed 4 to 5 times at chamber measurements. Now the number
has dropped to 2."
Design Engineer, R&D Department, "T" company
The frequency of failures at measurements in a chamber
has been reduced
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Frequency range 100kHz ∼ 3GHz *Depends on the electromagnetic field probe specifications (The above is for ETS probes)
Measurement unit dBμV、dBm
Sensor/probe φ60 / 30 / 10mm loop coil (magnetic field), φ36mm ball (electric field), φ6mm tip (electric field) Total 5 types
*Depends on electromagnetic probe specifications (Probe by ETS-Lindgren)
Probe cable length 2m
(N(P)-BNC(P) (Coaxial connector cable)
Data recording method Single / Free Run / Max Hold / Max Peak Data*
Auxiliary function Save / load / export / comment input / factor re-read / camera image retake / Save / load / export / comment input / factor re-read / camera
image retake / up-down & right-left inversion of camera image / ghost display of camera image / Screen enlargement-reduction
Compatible operating system Windows 7 / 10
System configuration Electromagnetic field probe (PN 7405) , BNC (P) -N (P) connector coaxial cable (02-000150A),
Three Color Probe Head Cover (03-00111A), RF preamplifier (00-00019A), Spectrum analyzer, Control PC
accessories LAN cable, NI-GPIB-USB-HS GPIB Controller, Camera, USB cable extension 2 m for camera, Tripod for camera, Software, USB protect key,
Instruction manual
EPS-02Ev3
Specifications
*Peak Hold: Displays the trace data with the largest peak value from the trace data measured at each measurement point.
Electromagnetic Field Probe (PN 7405) Frequency Specialization
Model Type Electric field /
Magnetic field
Construction Recommended
Frequency Band
901 6cm Loop
Magnetic field
Sealed loop 3MHz ∼ 500MHz
902 3cm Loop Sealed loop 5MHz ∼ 1GHz
903 1cm Loop Sealed loop 10MHz ∼ 3GHz
904 3.6cm Ball
Electric field
Spherical dipole 10MHz ∼ 3GHz
905 6mm Stub Tip Short monopole 50MHz ∼ 3GHz
901(6cm Loop) 902(3cm Loop) 903(1cm Loop)
904(3.6cm Ball) 905(6mm Stub Tip)
■ Magnetic field probe
■ Electric field probe
"Our department is a user of the NoiseKen EPS-3000 EMI Board Scanner System. Compared to EPS-3000, this newly
introduced EPS-02E provides a faster result. Portability is also a point. I'm very satisfied with measurement data, which I
think, are more accurate than I expected."
Design Engineer, Electrical Engineering Dept. "N" company
Quick results are very helpful.
An amplitude versus frequency plot for each probe position
is helpful for effective EMI debugging
"The objective is pre-compliance measurement. Only a
combination of near-field probes and a spectrum
analyzer was available before, which I thought was a
time consuming debugging tool, if I can do it anyway.
With the EPS-02, the way the data is stored and
reviewed is much more convenient, as an amplitude
versus frequency plot for each probe position can be
seen. The benefits we are enjoying now are smoother
EMI debugging, and the resultant reduced failures at a compliance measurement.
Design Engineer, Electrical Engineering Dept. "S" company
Drawings are for image only. (Not for actual use)
Drawings are for image only. (Not for actual use)
- Before measures
- After measures
8. 8 w w w. n o i s e k e n . c o m
EPS-02Ev3
Options
-60
-50
-40
-30
-20
-10
0
10
20
㻜㻚㻜㻜 㻜㻚㻡㻜 㻝㻚㻜㻜 㻝㻚㻡㻜 㻞㻚㻜㻜 㻞㻚㻡㻜 㻟㻚㻜㻜
Factor[dB]
Frequency[GHz]
-70
-60
-50
-40
-30
-20
-10
0
10
20
㻜㻚㻜㻜 㻜㻚㻡㻜 㻝㻚㻜㻜 㻝㻚㻡㻜 㻞㻚㻜㻜 㻞㻚㻡㻜 㻟㻚㻜㻜
Factor[dB]
Frequency[GHz]
-80
-70
-60
-50
-40
-30
-20
-10
0
10
㻜㻚㻜㻜 㻜㻚㻡㻜 㻝㻚㻜㻜 㻝㻚㻡㻜 㻞㻚㻜㻜 㻞㻚㻡㻜 㻟㻚㻜㻜
Factor[dB]
Frequency[GHz]
-80
-70
-60
-50
-40
-30
-20
-10
0
10
㻜㻚㻜㻜 㻜㻚㻡㻜 㻝㻚㻜㻜 㻝㻚㻡㻜 㻞㻚㻜㻜 㻞㻚㻡㻜 㻟㻚㻜㻜
Factor[dB]
Frequency[GHz]
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
㻜㻚㻜㻜 㻜㻚㻡㻜 㻝㻚㻜㻜 㻝㻚㻡㻜 㻞㻚㻜㻜 㻞㻚㻡㻜 㻟㻚㻜㻜
Factor[dB]
Frequency[GHz]
-60
-50
-40
-30
-20
-10
0
0.00 20.00 40.00 60.00 80.00 100.00
Factor[dB]
Frequency[MHz]
-70
-60
-50
-40
-30
-20
-10
0
0.00 20.00 40.00 60.00 80.00 100.00
Factor[dB]
Frequency[MHz]
-80
-70
-60
-50
-40
-30
-20
-10
0
0.00 20.00 40.00 60.00 80.00 100.00
Factor[dB]
Frequency[MHz]
-80
-70
-60
-50
-40
-30
-20
-10
0
0.00 20.00 40.00 60.00 80.00 100.00
Factor[dB]
Frequency[MHz]
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0.00 20.00 40.00 60.00 80.00 100.00
Factor[dB]
■100 kHz ∼ 100 MHz
901(6cm Loop) 902(3cm Loop) 903(1cm Loop) 904(3.6cm Ball) 905(6mm Stub Tip)
■100 kHz ∼ 3 GHz
901(6cm Loop) 902(3cm Loop) 903(1cm Loop) 904(3.6cm Ball) 905(6mm Stub Tip)
*The frequency characteristics of the above probes are data using strip lines.
*The gray area is outside the recommended frequency band.
Item Specification
OS Microsoft®
Windows®
7 32 bit / 64 bit (Eng/Jap)
Microsoft®
Windows®
10 32 bit / 64 bit (Eng/Jap)
CPU Intel Core™ i5 or higher
(i7 or higher recommended)
Memory 8 GB or more recommended
Hard Disc min. 20 GB of free space
Display over 1366x768 pixels
● A pointing device such as a mouse must be available.
● Existed DVD Drive.
● There is a free USB port. (Use 2 or 3 ports by using dongle, web camera, mouse etc.) *
*The operation guarantee for using of an external USB-HUB is not covered.
Recommended PC specifications Standard spectrum analyzer
Rode Schwartz
Spectrum analyzer
FSV series、FSV3000 series
FPL series、
EMI receiver ESR series、ESRP series
Key sight Technology Signal analyzer N9010A、N9010B
Tektronix
Oscilloscope MDO4000 series
Spectrum analyzer RSA306B
Please inquire about other spectrum analyzers.
Various type of probe head cover set. Camera
image recognition is better in EPS-02 series
by using probe head cover.
The case accommodates an electromagnetic
field probe (Model: PN7415) with the probe
cover head attached. Also stored unused
probe cover heads.
Replacement probe head cover for "3-color
probe cover head Model: 03-00110A."
Pre-amplifier MODEL:00-00012A/14A/16A/19A
Item Specifications/Performance
Operating Frequency Range 00-00012A:9kHz ∼ 1GHz 00-00014A:500MHz ∼ 8GHz
00-00016A:9kHz ∼ 1GHz 00-00019A:10kHz ∼ 3GHz
GAIN 00-00012A:36dB
(typ) 00-00014A:47dB
(typ)
00-00016A:46dB
(typ) 00-00013A:43dB
(typ)
Input/Output Connector N-Female
Size/Weight W160 × D230 × H94mm /約 3kg
Accessories N(P)-N(P) connector coaxial cable 1m (00-00013A only)
It is a high performance pre-amplifier that can be used for various applications such as the EPS-02 series.
Three Color Probe Head Cover MODEL:03-00110A ReplacementThreeColorProbeHeadCover MODEL:03-00111A
9. E L E C T R O M A G N E T I C F I E L D V I S U A L I Z A T I O N S Y S T E M
9
w w w. n o i s e k e n . c o m
Introduction of LANGER's Near Field Probe
The electromagnetic field probe guiding as standard in the EPS-02Ev3 system is a near-field electromagnetic field probe manufactured by
ETS-LINDGREN (MODEL: PN7405), but in this system, various other types of electromagnetic field probes can be used in combination.
The electromagnetic field probe introduced below is a near-field probe manufactured by LANGER, Germany. A variety of probes;
measurement of large components, single pin level, and assemblies. And also probes for low frequency and higher frequency both can
measurements. Combination with EPS-02Ev3 very easy to use.
Please contact our sales office for detailed specifications of various near-field probes and combinations with EPS-02Ev3.
Near Field Probe Model: LF1 set
The LF1 set is a set of 4 types of shielded probes for measuring
magnetic fields from 100kHz to 50MHz on electronic
assemblies.
The probe head is designed for detection of single pins, larger
components, and electromagnetic interference sources on the
assembly. First, identify the large-scale sources with the LF-R
400 probe, and then use high-resolution probes such as LF-B 3,
LF-U 5 and LF-U 2. 5 The magnetic field probe has a structure
that suppresses the electric field component.
*EPS-02Ev3 to be connect need conversion connector
(MODEL: 02-00050A).
Near Field Probe Model : RF1 set
RF1 set is a set of 4 probes for measuring electric and magnetic
fields from 30 MHz to 3 GHz on electronic assemblies. Each
probe is suitable for measurements very close to the electronic
assembly. Single IC pins, conductive paths, components to
identify electromagnetic interference sources connect the
connector and measure. By using these probes can check the
direction of the magnetic field and the electric field distribution.
The magnetic field probe has a structure that suppresses the
electric field component.
※EPS-02Ev3 to be connect need conversion connector
(MODEL:02-00050A)
.
100kHz-50MHz Magnetic Field
30MHz∼3GH
zElectric Field/ Magnetic Field
Near Field Probe Model : RF2 set
RF2 set is a set of 4 probes for measuring electric and magnetic
fields from 30 MHz to 3 GHz on electronic assemblies.
The probe head can step through the sources of interference
from the RF magnetic field on the assembly. Initially, RF-R 400-1
and RF-R 50-1 probes can be used to detect far-field
electromagnetic interference. Next, the higher resolution RF-B
3-2 and RF-U 5-2 probes allow for more accurate detection of
interferers. By using these probes, can check the direction of
the magnetic field and the electric field distribution. The
magnetic field probe has a structure that suppresses the electric
field component.
*EPS-02Ev3 to be connect need conversion connector
(MODEL:02-00050
30MHz∼3GH
zElectric Field/ Magnetic Field
Near Field Probe Model : RF3 mini set
The RF3 mini set are two probes with a resolution of 1 mm or less to
measure the magnetic field of 30 MHz to 3 GHz on the electronic
assembly at the development stage. The probe head is designed for
measurements. These probes can be used to detect the directivity and
distribution of the magnetic field on the electronic assembly. The probe
has a sheath structure and shields the electric field component. And also
recommend using a 20 dB or 30 dB pre-amplifier when measuring this
probe.
*EPS-02Ev3 to be connect need conversion connector.
(MODEL:02-00050A)
30MHz∼3GH
zMagnetic Field
Near Field Probe Model : RF4-E set
The RF4-E set is a set of two probes for measuring electric fields in the
frequency range 30 MHz to 3 GHz. This probe detects the electric field by
capacitive coupling and the steep rise and falls of the digital pulse of the
signal pin (foot and lead) of the IC, and detects a sharp switching (voltage)
component generated on the power supply pin of the IC. This probe has a
function to suppress detection of current components (magnetic field
components).
*EPS-02Ev3 to be connect need conversion connector.
(MODEL:02-00050A)
30MHz∼3GH
zElectric Field
LF-B3 LF-R400 LF-U2.5 LF-U5
RF-K 7-4 RF-E10 RF-R 3-2 RF-U 2.5-2
RF-R 400-1 RF-R 50-1 RF-U 5-2 RF-B 3-2
RF-E 02 RF-E 05
RF-B 0.3-3 RF-R 0.3-3
10. 10 w w w. n o i s e k e n . c o m
Near Field Probe Model : XF1 set
The XF1set consists of four magnetic field probes and one E field
probe, can measure within magnetic fields from 30 MHz to 6
GHz. The probe head enables step-by-step localization of
magnetic field interference sources on the assembly. First, use
the XF-R 400-1 probe to detect electromagnetic interference
from a distance. Second, you can use a high-resolution probe to
detect interference sources more accurately. E-field probes are
used to detect electrical interference fields near the assembly. By
using these probes, it is possible to detect the direction of the
magnetic field and the electric field distribution on the electronic
assembly. The magnetic field probe has a structure that
suppresses the electric field component.
*EPS-02Ev3 to be connect need conversion connector.
(MODEL:02-00137A)
30MHz∼6GH
zMagnetic Field
Near Field Probe Model : SX1 set
The SX1 set consists of three passive type near-field probes for
measuring magnetic fields and also magnetic fields with high
clock frequencies of 1 GHz to 10 GHz on electronic components
and ICs at development stage. The probe head allows
measurements at distances very close to the electronic
assembly. They can be placed on single IC pins, conductive
paths, components and connectors to identify sources of
interference. By using these probes, the direction of the magnetic
field and the electric field distribution of the electronic assembly
can be detected.
*EPS-02Ev3 to be connect need conversion connector.
(MODEL:02-00137A)
1GHz∼10GH
zElectric Field/ Magnetic Field
Near Field Probe Model : RF6 set
The RF6 set is for the generation of electric and magnetic fields in
the range 30 MHz to 3 GHz of the electronic assembly set of 4
probes for measurement. The probe head enables step-by-step
localization of RF magnetic and RF-E magnetic interference
sources on the assembly. From larger distances, use RF-R50-1 for
magnetic fields and RF-E02 for electric fields to detect
electromagnetic interference. The higher resolution RF-B 3-2 and
RF-E 10 probes can better detect magnetic field and E-field
interferers. By using these probes, it is possible to detect the
direction of the magnetic field and the electric field distribution on
the electronic assembly. The magnetic field probe has a structure
that suppresses the electric field component.
*EPS-02Ev3 to be connect need conversion connector.
(MODEL:02-00050A)
30MHz∼3GH
zElectric Field/ Magnetic Field
Conversion Connector Model:02-00050A/137A
Model Connector Support Model
02-00050A N(P)-BNC(J) LF1 set,
RF1 set,
RF2 set,
RF3 mini set,
RF4-E set,
RF6 set
02-00137A N
(P)-SMA(J) XF1 set,
SX1 set
It is a conversion connector for connecting LANGER near field probe to EPS-02Ev3.
LANGER near-field probes are not using probe cover. At the time of use probe, wrapped with vinyl tape or other on the tip of the probe
that can make color recognition. In addition, a coaxial conversion connector is required to connect to EPS-02Ev3. (See below)
Please contact our sales in charge for details.
RF-R 50-1 RF-B 3-2 RF-E 02 RF-E 10
SX-E 03 SX-B 3-1 SX-R 3-1
XF-B 3-1
XF-R 400-1 XF-U 2.5-2
XF-E 10 XF-R 3-1
Introduction of LANGER's Near Field Probe
● International Sales & Marketing Section
TEL : +81-(0)42-712-2051/FAX : +81-(0)42-712-2050
E-mail : sales@noiseken.com
URL : http://www.noiseken.com
1-4-4 Chiyoda, Chuo-ku, Sagamihara City, Kanagawa Pref. 252-0237 Japan
* Designs, appearances and specifications on the products are subject change without notice.
* Designs, appearances and specifications on the products are subject change without notice.
https://www.n-denkei.com/singapore/inquiry/