This document presents a model for analyzing biaxial and triaxial stresses in polycrystalline anisotropic materials using x-ray diffraction, focusing on orthotropic materials. It discusses the importance of understanding residual stress in various technological applications and develops expressions to calculate stresses and determine elastic constants under small deformations. The proposed model allows the use of the sin2 technique even for textured materials by characterizing texture through pole figures, facilitating the experimental determination of material stress without changing the material volume.