The document reports on curve fitting results from weak inversion and square root of drain current measurements of two chips across different temperatures. It finds that threshold voltage increases with temperature for both chips. Mobility degradation with increasing temperature is observed to be more severe for Chip 1 compared to Chip 2. However, when considering velocity saturation effects, mobility degradation is reduced, calling into question the assumptions made in interpreting the mobility ratio fitting results. Understanding the underlying physics is needed to determine which phenomenon, mobility degradation or velocity saturation, is observed in the measurements.