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 1998-2011 Microchip Technology Inc. DS21290F-page 1
MCP3201
Features
• 12-Bit Resolution
• ±1 LSB max DNL
• ±1 LSB max INL (MCP3201-B)
• ±2 LSB max INL (MCP3201-C)
• On-chip Sample and Hold
• SPI Serial Interface (modes 0,0 and 1,1)
• Single Supply Operation: 2.7V - 5.5V
• 100 ksps Maximum Sampling Rate at VDD = 5V
• 50 ksps Maximum Sampling Rate at VDD = 2.7V
• Low-Power CMOS Technology
• 500 nA Typical Standby Current, 2 µA Maximum
• 400 µA Maximum Active Current at 5V
• Industrial Temp Range: -40°C to +85°C
• 8-pin MSOP, PDIP, SOIC and TSSOP Packages
Applications
• Sensor Interface
• Process Control
• Data Acquisition
• Battery Operated Systems
Functional Block Diagram
Description
The Microchip Technology Inc. MCP3201 device is a
successive approximation 12-bit Analog-to-Digital
(A/D) Converter with on-board sample and hold
circuitry. The device provides a single pseudo-differen-
tial input. Differential Nonlinearity (DNL) is specified at
±1 LSB, and Integral Nonlinearity (INL) is offered in
±1 LSB (MCP3201-B) and ±2 LSB (MCP3201-C)
versions. Communication with the device is done using
a simple serial interface compatible with the SPI
protocol. The device is capable of sample rates of up to
100 ksps at a clock rate of 1.6 MHz. The MCP3201
device operates over a broad voltage range (2.7V-
5.5V). Low-current design permits operation with
typical standby and active currents of only 500 nA and
300 µA, respectively. The device is offered in 8-pin
MSOP, PDIP, TSSOP and 150 mil SOIC packages.
Package Types
Comparator
Sample
and
Hold
12-Bit SAR
DAC
Control Logic
CS/SHDN
VREF
IN+
IN-
VSSVDD
CLK DOUT
Shift
Register
VREF
IN+
IN–
VSS
VDD
CLK
DOUT
CS/SHDN
1
2
3
4
8
7
6
5
MSOP, PDIP, SOIC, TSSOP
MCP3201
2.7V 12-Bit A/D Converter with SPI Serial Interface
MCP3201
DS21290F-page 2  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 3
MCP3201
1.0 ELECTRICAL
CHARACTERISTICS
1.1 Maximum Ratings†
VDD...................................................................................7.0V
All inputs and outputs w.r.t. VSS ................ -0.6V to VDD +0.6V
Storage temperature .....................................-65°C to +150°C
Ambient temp. with power applied ................-65°C to +125°C
ESD protection on all pins (HBM) .................................> 4 kV
†Notice: Stresses above those listed under “Maximum
ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied.
Exposure to maximum rating conditions for extended periods
may affect device reliability.
ELECTRICAL CHARACTERISTICS
Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and
fCLK = 16*fSAMPLE, unless otherwise noted.
Parameter Sym Min Typ Max Units Conditions
Conversion Rate:
Conversion Time tCONV — — 12 clock
cycles
Analog Input Sample Time tSAMPLE 1.5 clock
cycles
Throughput Rate fSAMPLE — — 100
50
ksps
ksps
VDD = VREF = 5V
VDD = VREF = 2.7V
DC Accuracy:
Resolution 12 bits
Integral Nonlinearity INL —
—
±0.75
±1
±1
±2
LSB
LSB
MCP3201-B
MCP3201-C
Differential Nonlinearity DNL — ±0.5 ±1 LSB No missing codes over
temperature
Offset Error — ±1.25 ±3 LSB
Gain Error — ±1.25 ±5 LSB
Dynamic Performance:
Total Harmonic Distortion THD — -82 — dB VIN = 0.1V to 4.9V@1 kHz
Signal to Noise and Distortion
(SINAD)
SINAD — 72 — dB VIN = 0.1V to 4.9V@1 kHz
Spurious Free Dynamic Range SFDR — 86 — dB VIN = 0.1V to 4.9V@1 kHz
Reference Input:
Voltage Range 0.25 — VDD V Note 2
Current Drain —
—
100
.001
150
3
µA
µA CS = VDD = 5V
Analog Inputs:
Input Voltage Range (IN+) IN+ IN- — VREF+IN- V
Input Voltage Range (IN-) IN- VSS-100 VSS+100 mV
Leakage Current — 0.001 ±1 µA
Switch Resistance RSS — 1K — W See Figure 4-1
Sample Capacitor CSAMPLE — 20 — pF See Figure 4-1
Digital Input/Output:
Data Coding Format Straight Binary
High Level Input Voltage VIH 0.7 VDD — — V
Low Level Input Voltage VIL — — 0.3 VDD V
Note 1: This parameter is established by characterization and not 100% tested.
2: See graph that relates linearity performance to VREF level.
3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance,
especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.
MCP3201
DS21290F-page 4  1998-2011 Microchip Technology Inc.
TEMPERATURE CHARACTERISTICS
High Level Output Voltage VOH 4.1 — — V IOH = -1 mA, VDD = 4.5V
Low Level Output Voltage VOL — — 0.4 V IOL = 1 mA, VDD = 4.5V
Input Leakage Current ILI -10 — 10 µA VIN = VSS or VDD
Output Leakage Current ILO -10 — 10 µA VOUT = VSS or VDD
Pin Capacitance
(all inputs/outputs)
CIN, COUT — — 10 pF VDD = 5.0V (Note 1)
TA = +25°C, f = 1 MHz
Timing Parameters:
Clock Frequency fCLK —
—
—
—
1.6
0.8
MHz
MHz
VDD = 5V (Note 3)
VDD = 2.7V (Note 3)
Clock High Time tHI 312 — — ns
Clock Low Time tLO 312 — — ns
CS Fall To First Rising CLK Edge tSUCS 100 — — ns
CLK Fall To Output Data Valid tDO — — 200 ns See Test Circuits, Figure 1-2
CLK Fall To Output Enable tEN — — 200 ns See Test Circuits, Figure 1-2
CS Rise To Output Disable tDIS — — 100 ns See Test Circuits, Figure 1-2
(Note 1)
CS Disable Time tCSH 625 — — ns
DOUT Rise Time tR — — 100 ns See Test Circuits, Figure 1-2
(Note 1)
DOUT Fall Time tF — — 100 ns See Test Circuits, Figure 1-2
(Note 1)
Power Requirements:
Operating Voltage VDD 2.7 — 5.5 V
Operating Current IDD —
—
300
210
400
—
µA
µA
VDD = 5.0V, DOUT unloaded
VDD = 2.7V, DOUT unloaded
Standby Current IDDS — 0.5 2 µA CS = VDD = 5.0V
Electrical Specifications: Unless otherwise indicated, VDD = +2.7V to +5.5V, VSS = GND.
Parameters Sym Min Typ Max Units Conditions
Temperature Ranges
Specified Temperature Range TA -40 — +85 °C
Operating Temperature Range TA -40 — +85 °C
Storage Temperature Range TA -65 — +150 °C
Thermal Package Resistances
Thermal Resistance, 8L-MSOP JA — 211 — °C/W
Thermal Resistance, 8L-PDIP JA — 89.5 — °C/W
Thermal Resistance, 8L-SOIC JA — 149.5 — °C/W
Thermal Resistance, 8L-TSSOP JA — 139 — °C/W
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and
fCLK = 16*fSAMPLE, unless otherwise noted.
Parameter Sym Min Typ Max Units Conditions
Note 1: This parameter is established by characterization and not 100% tested.
2: See graph that relates linearity performance to VREF level.
3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance,
especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.
 1998-2011 Microchip Technology Inc. DS21290F-page 5
MCP3201
FIGURE 1-1: Serial Timing.
FIGURE 1-2: Test Circuits.
CS
CLK
tSUCS
tCSH
tHI tLO
DOUT
tEN tDO
tR tF
LSBMSB OUT
tDIS
NULL BIT
HI-Z HI-Z
VIH
tDIS
CS
DOUT
Waveform 1*
DOUT
Waveform 2†
90%
10%
* Waveform 1 is for an output with internal condi-
tions such that the output is high, unless disabled
by the output control.
† Waveform 2 is for an output with internal condi-
tions such that the output is low, unless disabled
by the output control.
Voltage Waveforms for tDIS
Test Point
1.4V
DOUT
Load circuit for tR, tF, tDO
3 kΩ
CL = 30 pF
Test Point
DOUT
Load circuit for tDIS and tEN
3 kΩ
30 pF
tDIS Waveform 2
tDIS Waveform 1
CS
CLK
DOUT
tEN
1 2
B9
Voltage Waveforms for tEN
tEN Waveform
VDD
VDD/2
VSS
3 4
DOUT
tR
Voltage Waveforms for tR, tF
CLK
DOUT
tDO
Voltage Waveforms for tDO
tF
VOH
VOL
MCP3201
DS21290F-page 6  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 7
MCP3201
2.0 TYPICAL PERFORMANCE CHARACTERISTICS
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-1: Integral Nonlinearity (INL)
vs. Sample Rate.
FIGURE 2-2: Integral Nonlinearity (INL)
vs. VREF.
FIGURE 2-3: Integral Nonlinearity (INL)
vs. Code (Representative Part).
FIGURE 2-4: Integral Nonlinearity (INL)
vs. Sample Rate (VDD = 2.7V).
FIGURE 2-5: Integral Nonlinearity (INL)
vs. VREF (VDD = 2.7V).
FIGURE 2-6: Integral Nonlinearity (INL)
vs. Code (Representative Part, VDD = 2.7V).
Note: The graphs provided following this note are a statistical summary based on a limited number of samples
and are provided for informational purposes only. The performance characteristics listed herein are not
tested or guaranteed. In some graphs, the data presented may be outside the specified operating range
(e.g., outside specified power supply range) and therefore outside the warranted range.
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 25 50 75 100 125 150
Sample Rate (ksps)
INL(LSB)
Positive INL
Negative INL
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
0 1 2 3 4 5
VREF (V)
INL(LSB)
Positive INL
Negative INL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
INL(LSB)
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
0 20 40 60 80 100
Sample Rate (ksps)
INL(LSB)
VDD = VREF = 2.7V
Positive INL
Negative INL
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
0.0 0.5 1.0 1.5 2.0 2.5 3.0
VREF (V)
INL(LSB)
Positive INL
Negative INL
VDD = 2.7V
FSAMPLE = 50 ksps
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
INL(LSB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
MCP3201
DS21290F-page 8  1998-2011 Microchip Technology Inc.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-7: Integral Nonlinearity (INL)
vs. Temperature.
FIGURE 2-8: Differential Nonlinearity
(DNL) vs. Sample Rate.
FIGURE 2-9: Differential Nonlinearity
(DNL) vs. VREF.
FIGURE 2-10: Integral Nonlinearity (INL)
vs. Temperature (VDD = 2.7V).
FIGURE 2-11: Differential Nonlinearity
(DNL) vs. Sample Rate (VDD = 2.7V).
FIGURE 2-12: Differential Nonlinearity
(DNL) vs. VREF (VDD = 2.7V).
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temperature (°C)
INL(LSB)
Positive INL
Negative INL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 25 50 75 100 125 150
Sample Rate (ksps)
DNL(LSB)
Positive DNL
Negative DNL
-2.0
-1.0
0.0
1.0
2.0
3.0
0 1 2 3 4 5
VREF (V)
DNL(LSB)
Negative DNL
Positive DNL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temperature (°C)
INL(LSB)
Positive INL
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
Negative INL
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
0 20 40 60 80 100
Sample Rate (ksps)
DNL(LSB)
VDD = VREF = 2.7V
Positive DNL
Negative DNL
-3.0
-2.0
-1.0
0.0
1.0
2.0
3.0
0.0 0.5 1.0 1.5 2.0 2.5 3.0
VREF(V)
DNL(LSB)
Positive DNL
Negative DNL
VDD = 2.7V
FSAMPLE = 50 ksps
 1998-2011 Microchip Technology Inc. DS21290F-page 9
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-13: Differential Nonlinearity
(DNL) vs. Code (Representative Part).
FIGURE 2-14: Differential Nonlinearity
(DNL) vs. Temperature.
FIGURE 2-15: Gain Error vs. VREF.
FIGURE 2-16: Differential Nonlinearity
(DNL) vs. Code (Representative Part,
VDD = 2.7V).
FIGURE 2-17: Differential Nonlinearity
(DNL) vs. Temperature (VDD = 2.7V).
FIGURE 2-18: Offset Error vs. VREF.
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
DNL(LSB)
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temperature (°C)
DNL(LSB)
Positive DNL
Negative DNL
-2
-1
0
1
2
3
4
5
0 1 2 3 4 5
VREF(V)
GainError(LSB)
VDD = 2.7V
FSAMPLE = 50 ksps
VDD = 5V
FSAMPLE = 100 ksps
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
DNL(LSB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temperature (°C)
DNL(LSB)
Positive DNL
VDD = 2.7V
FSAMPLE = 50ksps
Negative DNL
0
2
4
6
8
10
12
14
16
18
20
0 1 2 3 4 5
VREF (V)
OffsetError(LSB)
VDD = 5V
FSAMPLE = 100 ksps
VDD = 2.7V
FSAMPLE = 50ksps
MCP3201
DS21290F-page 10  1998-2011 Microchip Technology Inc.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-19: Gain Error vs. Temperature.
FIGURE 2-20: Signal-to-Noise Ratio (SNR)
vs. Input Frequency.
FIGURE 2-21: Total Harmonic Distortion
(THD) vs. Input Frequency.
FIGURE 2-22: Offset Error vs.
Temperature.
FIGURE 2-23: Signal-to-Noise and
Distortion (SINAD) vs. Input Frequency.
FIGURE 2-24: Signal-to-Noise and
Distortion (SINAD) vs. Input Signal Level.
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temperature (°C)
GainError(LSB)
VDD = VREF = 5V
FSAMPLE = 100 ksps
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
0
10
20
30
40
50
60
70
80
90
100
1 10 100
Input Frequency (kHz)
SNR(dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V
FSAMPLE = 100 ksps
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1 10 100
Input Frequency (kHz)
THD(dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V, FSAMPLE = 100 ksps
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
-50 -25 0 25 50 75 100
Temperature (°C)
OffsetError(LSB)
VDD = VREF = 5V
FSAMPLE = 100 ksps
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
0
10
20
30
40
50
60
70
80
90
100
1 10 100
Input Frequency (kHz)
SINAD(dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V
FSAMPLE = 100 ksps
0
10
20
30
40
50
60
70
80
-40 -35 -30 -25 -20 -15 -10 -5 0
Input Signal Level (dB)
SINAD(dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V
FSAMPLE = 100 ksps
 1998-2011 Microchip Technology Inc. DS21290F-page 11
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-25: Effective Number of Bits
(ENOB) vs. VREF.
FIGURE 2-26: Spurious Free Dynamic
Range (SFDR) vs. Input Frequency.
FIGURE 2-27: Frequency Spectrum of
10 kHz input (Representative Part).
FIGURE 2-28: Effective Number of Bits
(ENOB) vs. Input Frequency.
FIGURE 2-29: Power Supply Rejection
(PSR) vs. Ripple Frequency.
FIGURE 2-30: Frequency Spectrum of
1 kHz input (Representative Part, VDD = 2.7V).
9.00
9.25
9.50
9.75
10.00
10.25
10.50
10.75
11.00
11.25
11.50
11.75
12.00
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
VREF (V)
ENOB(rms)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V
FSAMPLE =100 ksps
0
10
20
30
40
50
60
70
80
90
100
1 10 100
Input Frequency (kHz)
SFDR(dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V, FSAMPLE = 100 ksps
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0 10000 20000 30000 40000 50000
Frequency (Hz)
Amplitude(dB)
VDD = VREF = 5V
FSAMPLE = 100 ksps
FINPUT = 9.985kHz
4096 points
8.0
8.5
9.0
9.5
10.0
10.5
11.0
11.5
12.0
1 10 100
Input Frequency (kHz)
ENOB(rms)
VDD = 2.7V
FSAMPLE = 50 ksps
VDD = 5V
FSAMPLE = 100 ksps
-80
-70
-60
-50
-40
-30
-20
-10
0
1 10 100 1000 10000
Ripple Frequency (kHz)
PowerSupplyRejection(dB)
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0 5000 10000 15000 20000 25000
Frequency (Hz)
Amplitude(dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
FINPUT = 998.76 Hz
4096 points
MCP3201
DS21290F-page 12  1998-2011 Microchip Technology Inc.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-31: IDD vs. VDD.
FIGURE 2-32: IDD vs. Clock Frequency.
FIGURE 2-33: IDD vs. Temperature.
FIGURE 2-34: IREF vs. VDD.
FIGURE 2-35: IREF vs. Clock Frequency.
FIGURE 2-36: IREF vs. Temperature.
0
50
100
150
200
250
300
350
400
450
500
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
IDD(µA)
VREF = VDD
All points at FCLK = 1.6 MHz, except
at VREF = VDD = 2.5V, FCLK = 800 kHz
0
50
100
150
200
250
300
350
400
10 100 1000 10000
Clock Frequency (kHz)
IDD(µA)
VDD = VREF = 5V
VDD = VREF = 2.7V
0
50
100
150
200
250
300
350
400
-50 -25 0 25 50 75 100
Temperature (°C)
IDD(µA)
VDD = VREF = 5V
FCLK = 1.6 MHz
VDD = VREF = 2.7V
FCLK = 800 kHz
0
10
20
30
40
50
60
70
80
90
100
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
IREF(µA)
VREF = VDD
All points at FCLK = 1.6 MHz, except
at VREF = VDD = 2.5V, FCLK = 800 kHz
0
10
20
30
40
50
60
70
80
90
100
10 100 1000 10000
Clock Frequency (kHz)
IREF(µA)
VDD = VREF = 5V
VDD = VREF = 2.7V
0
10
20
30
40
50
60
70
80
90
100
-50 -25 0 25 50 75 100
Temperature (°C)
IREF(µA)
VDD = VREF = 5V
FCLK = 1.6 MHz
VDD = VREF = 2.7V
FCLK = 800 kHz
 1998-2011 Microchip Technology Inc. DS21290F-page 13
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-37: IDDS vs. VDD.
FIGURE 2-38: IDDS vs. Temperature.
FIGURE 2-39: Analog Input Leakage
Current vs. Temperature.
0
10
20
30
40
50
60
70
80
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
IDDS(pA)
VREF = CS = VDD
0.01
0.10
1.00
10.00
100.00
-50 -25 0 25 50 75 100
Temperature (°C)
IDDS(nA)
VDD = VREF = CS = 5V
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
-50 -25 0 25 50 75 100
Temperature (°C)
AnalogInputLeakage(nA)
VDD = VREF = 5V
FCLK = 1.6 MHz
MCP3201
DS21290F-page 14  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 15
MCP3201
3.0 PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 3-1.
Additional descriptions of the device pins follows.
TABLE 3-1: PIN FUNCTION TABLE
3.1 Positive Analog Input (IN+)
Positive analog input. This input can vary from IN- to
VREF + IN-.
3.2 Negative Analog Input (IN-)
Negative analog input. This input can vary ±100 mV
from VSS.
3.3 Chip Select/Shutdown (CS/SHDN)
The CS/SHDN pin is used to initiate communication
with the device when pulled low and will end a
conversion and put the device in low power standby
when pulled high. The CS/SHDN pin must be pulled
high between conversions.
3.4 Serial Clock (CLK)
The SPI clock pin is used to initiate a conversion and to
clock out each bit of the conversion as it takes place.
See Section 6.2 “Maintaining Minimum Clock
Speed” for constraints on clock speed.
3.5 Serial Data Output (DOUT)
The SPI serial data output pin is used to shift out the
results of the A/D conversion. Data will always change
on the falling edge of each clock as the conversion
takes place.
MCP3201
Symbol DescriptionMSOP, PDIP, SOIC,
TSSOP
1 VREF Reference Voltage Input
2 IN+ Positive Analog Input
3 IN- Negative Analog Input
4 VSS Ground
5 CS/SHDN Chip Select/Shutdown Input
6 DOUT Serial Data Out
7 CLK Serial Clock
8 VDD +2.7V to 5.5V Power Supply
MCP3201
DS21290F-page 16  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 17
MCP3201
4.0 DEVICE OPERATION
The MCP3201 A/D Converter employs a conventional
SAR architecture. With this architecture, a sample is
acquired on an internal sample/hold capacitor for
1.5 clock cycles starting on the first rising edge of the
serial clock after CS has been pulled low. Following this
sample time, the input switch of the converter opens
and the device uses the collected charge on the
internal sample and hold capacitor to produce a serial
12-bit digital output code. Conversion rates of 100 ksps
are possible on the MCP3201 device. See Section 6.2
“Maintaining Minimum Clock Speed” for information
on minimum clock rates. Communication with the
device is done using a 3-wire SPI-compatible interface.
4.1 Analog Inputs
The MCP3201 device provides a single pseudo-differ-
ential input. The IN+ input can range from IN- to VREF
(VREF + IN-). The IN- input is limited to ±100 mV from
the VSS rail. The IN- input can be used to cancel small
signal common-mode noise which is present on both
the IN+ and IN- inputs.
For the A/D Converter to meet specification, the charge
holding capacitor (CSAMPLE) must be given enough
time to acquire a 12-bit accurate voltage level during
the 1.5 clock cycle sampling period. The analog input
model is shown in Figure 4-1.
In this diagram, it is shown that the source impedance
(RS) adds to the internal sampling switch (RSS)
impedance, directly affecting the time that is required to
charge the capacitor (CSAMPLE). Consequently, a
larger source impedance increases the offset, gain,
and integral linearity errors of the conversion.
Ideally, the impedance of the signal source should be
near zero. This is achievable with an operational
amplifier such as the MCP601, which has a closed loop
output impedance of tens of ohms. The adverse affects
of higher source impedances are shown in Figure 4-2.
If the voltage level of IN+ is equal to or less than IN-, the
resultant code will be 000h. If the voltage at IN+ is equal
to or greater than {[VREF + (IN-)] - 1 LSB}, then the
output code will be FFFh. If the voltage level at IN- is
more than 1 LSB below VSS, then the voltage level at
the IN+ input will have to go below VSS to see the 000h
output code. Conversely, if IN- is more than 1 LSB
above VSS, then the FFFh code will not be seen unless
the IN+ input level goes above VREF level.
4.2 Reference Input
The reference input (VREF) determines the analog input
voltage range and the LSB size, as shown below.
EQUATION 4-1:
As the reference input is reduced, the LSB size is
reduced accordingly. The theoretical digital output code
produced by the A/D Converter is a function of the
analog input signal and the reference input as shown
below.
EQUATION 4-2:
When using an external voltage reference device, the
system designer should always refer to the
manufacturer’s recommendations for circuit layout.
Any instability in the operation of the reference device
will have a direct effect on the operation of the
A/D Converter.
LSB Size
VREF
4096
-------------=
Digital Output Code
4096*VIN
VREF
-------------------------=
Where:
VIN = Analog Input Voltage = V(IN+) - V(IN-)
VREF = Reference Voltage
MCP3201
DS21290F-page 18  1998-2011 Microchip Technology Inc.
FIGURE 4-1: Analog Input Model.
FIGURE 4-2: Maximum Clock Frequency
vs. Input Resistance (RS) to maintain less than a
0.1 LSB deviation in INL from nominal
conditions.
CPINVA
RSS
CHx
7 pF
VT = 0.6V
VT = 0.6V
ILEAKAGE
Sampling
Switch
SS RS = 1 k
CSAMPLE
= DAC capacitance
VSS
VDD
= 20 pF±1 nA
Legend:
VA = Signal Source
RSS = Source Impedance
CHx = Input Channel Pad
CPIN = Input Pin Capacitance
VT = Threshold Voltage
ILEAKAGE = Leakage Current At The Pin
Due To Various Junctions
SS = Sampling Switch
RS = Sampling Switch Resistor
CSAMPLE = Sample/hold Capacitance
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
100 1000 10000
Input Resistance (Ohms)
ClockFrequency(MHz)
VDD = VREF = 5V
VDD = VREF = 2.7V
 1998-2011 Microchip Technology Inc. DS21290F-page 19
MCP3201
5.0 SERIAL COMMUNICATIONS
Communication with the device is done using a
standard SPI-compatible serial interface. Initiating
communication with the MCP3201 device begins with
the CS going low. If the device was powered up with the
CS pin low, it must be brought high and back low to
initiate communication. The device will begin to sample
the analog input on the first rising edge after CS goes
low. The sample period will end in the falling edge of the
second clock, at which time the device will output a low
null bit. The next 12 clocks will output the result of the
conversion with MSB first, as shown in Figure 5-1. Data
is always output from the device on the falling edge of
the clock. If all 12 data bits have been transmitted and
the device continues to receive clocks while the CS is
held low, the device will output the conversion result
LSB first, as shown in Figure 5-2. If more clocks are
provided to the device while CS is still low (after the
LSB first data has been transmitted), the device will
clock out zeros indefinitely.
FIGURE 5-1: Communication with MCP3201 device using MSB first Format.
FIGURE 5-2: Communication with MCP3201 device using LSB first Format.
CS
CLK
DOUT
tCYC
POWER
DOWN
TSUCS
TSAMPLE tCONV
tDATA**
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output LSB first data, followed
by zeros indefinitely. See Figure 5-2 below.
** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance
node, leaving the CLK running to clock out the LSB-first data or zeros.
TCSH
NULL
BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0*
HI-Z HI-Z
B11 B10 B9 B8NULL
BIT
CS
CLK
DOUT
tCYC
POWER DOWNtSUCS
tSAMPLE tCONV tDATA**
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely.
** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance
node, leaving the CLK running to clock out the LSB-first data or zeros.
tCSH
NULL
BIT
B11B10B9 B8 B7 B6 B5 B4 B3 B2 B1 B0HI-Z B1 B2 B3 B4 B5 B6 B7 B8 B9 B10B11* HI-Z
MCP3201
DS21290F-page 20  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 21
MCP3201
6.0 APPLICATIONS INFORMATION
6.1 Using the MCP3201 Device with
Microcontroller SPI Ports
With most microcontroller SPI ports, it is required to
clock out eight bits at a time. If this is the case, it will be
necessary to provide more clocks than are required for
the MCP3201. As an example, Figure 6-1 and
Figure 6-2 show how the MCP3201 device can be
interfaced to a microcontroller with a standard SPI port.
Since the MCP3201 always clocks data out on the
falling edge of clock, the MCU SPI port must be
configured to match this operation. SPI Mode 0,0 (clock
idles low) and SPI Mode 1,1 (clock idles high) are both
compatible with the MCP3201. Figure 6-1 depicts the
operation shown in SPI Mode 0,0, which requires that
the CLK from the microcontroller idles in the ‘low’ state.
As shown in the diagram, the MSB is clocked out of the
A/D Converter on the falling edge of the third clock
pulse. After the first eight clocks have been sent to the
device, the microcontroller’s receive buffer will contain
two unknown bits (the output is at high-impedance for
the first two clocks), the null bit and the highest order
five bits of the conversion. After the second eight clocks
have been sent to the device, the MCU receive register
will contain the lowest-order seven bits and the B1 bit
repeated as the A/D Converter has begun to shift out
LSB first data with the extra clock. Typical procedure
would then call for the lower-order byte of data to be
shifted right by one bit to remove the extra B1 bit. The
B7 bit is then transferred from the high-order byte to the
lower-order byte, and then the higher-order byte is
shifted one bit to the right as well. Easier manipulation
of the converted data can be obtained by using this
method.
Figure 6-2 shows the same thing in SPI Mode 1,1
which requires that the clock idles in the high state. As
with mode 0,0, the A/D Converter outputs data on the
falling edge of the clock and the MCU latches data from
the A/D Converter in on the rising edge of the clock.
FIGURE 6-1: SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low).
FIGURE 6-2: SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high).
CS
CLK 9 10 11 12 13 14 15 16
DOUT
NULL
BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
HI-Z
B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B8? ? 0
MCU latches data from A/D
Data is clocked out of A/D
Converter on falling edges
Converter on rising edges of SCLK
1 2 3 4 5 6 7 8
HI-Z
B1
B1
LSB first data begins
to come out
B2
Data stored into MCU receive register
after transmission of first 8 bits
Data stored into MCU receive register
after transmission of second 8 bits
CS
CLK 9 10 11 12 13 14 15 16
DOUT
NULL
BIT
B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
HI-Z
B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B8? ? 0
MCU latches data from A/D
Data is clocked out of A/D
Converter on falling edges
Converter on rising edges of SCLK
1 2 3 4 5 6 7 8
B1
B1
LSB first data begins
to come out
HI-Z
Data stored into MCU receive register
after transmission of first 8 bits
Data stored into MCU receive register
after transmission of second 8 bits
MCP3201
DS21290F-page 22  1998-2011 Microchip Technology Inc.
6.2 Maintaining Minimum Clock Speed
When the MCP3201 initiates the sample period, charge
is stored on the sample capacitor. When the sample
period is complete, the device converts one bit for each
clock that is received. It is important for the user to note
that a slow clock rate will allow charge to bleed off the
sample cap while the conversion is taking place. At
85°C (worst-case condition), the part will maintain
proper charge on the sample capacitor for at least
1.2 ms after the sample period has ended. This means
that the time between the end of the sample period and
the time that all 12 data bits have been clocked out
must not exceed 1.2 ms (effective clock frequency of
10 kHz). Failure to meet this criteria may induce
linearity errors into the conversion outside the rated
specifications. It should be noted that during the entire
conversion cycle, the A/D Converter does not require a
constant clock speed or duty cycle, as long as all timing
specifications are met.
6.3 Buffering/Filtering the Analog
Inputs
If the signal source for the A/D Converter is not a low-
impedance source, it will have to be buffered
or inaccurate conversion results may occur.
See Figure 4-2. It is also recommended that a filter be
used to eliminate any signals that may be aliased back
into the conversion results. This is illustrated in
Figure 6-3 where an op amp is used to drive the analog
input of the MCP3201 device. This amplifier provides a
low-impedance source for the converter input and a
low-pass filter, which eliminates unwanted high-
frequency noise.
Low-pass (anti-aliasing) filters can be designed using
Microchip’s interactive FilterLab®
software. FilterLab
will calculate capacitor and resistor values, as well as
determine the number of poles that are required for the
application. For more information on filtering signals,
see application note AN699 “Anti-Aliasing Analog
Filters for Data Acquisition Systems.”
FIGURE 6-3: The MCP601 Operational
Amplifier is used to implement a 2nd order anti-
aliasing filter for the signal being converted by
the MCP3201 device.
MCP3201
VDD
10 µF
IN-
IN+
-
+VIN
C1
C2
VREF
4.096V
Reference
1 µF
10 µF0.1 µF
MCP601R1
R2
R3
R4
MCP1541
CL
 1998-2011 Microchip Technology Inc. DS21290F-page 23
MCP3201
6.4 Layout Considerations
When laying out a printed circuit board for use with
analog components, care should be taken to reduce
noise wherever possible. A bypass capacitor should
always be used with this device and should be placed
as close as possible to the device pin. A bypass
capacitor value of 1 µF is recommended.
Digital and analog traces should be separated as much
as possible on the board and no traces should run
underneath the device or the bypass capacitor. Extra
precautions should be taken to keep traces with high-
frequency signals (such as clock lines) as far as
possible from analog traces.
Use of an analog ground plane is recommended in
order to keep the ground potential the same for all
devices on the board. Providing VDD connections to
devices in a “star” configuration can also reduce noise
by eliminating current return paths and associated
errors. See Figure 6-4. For more information on layout
tips when using A/D Converter, refer to AN688 “Layout
Tips for 12-Bit A/D Converter Applications”.
FIGURE 6-4: VDD traces arranged in a
‘Star’ configuration in order to reduce errors
caused by current return paths.
VDD
Connection
Device 1
Device 2
Device 3
Device 4
MCP3201
DS21290F-page 24  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 25
MCP3201
7.0 PACKAGING INFORMATION
7.1 Package Marking Information
Legend: XX...X Customer-specific information
Y Year code (last digit of calendar year)
YY Year code (last 2 digits of calendar year)
WW Week code (week of January 1 is week ‘01’)
NNN Alphanumeric traceability code
Pb-free JEDEC designator for Matte Tin (Sn)
* This package is Pb-free. The Pb-free JEDEC designator ( )
can be found on the outer packaging for this package.
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
3e
3e
8-Lead MSOP (3x3 mm) Example
8-Lead PDIP (300 mil) Example
XXXXXXXX
XXXXXNNN
YYWW
8-Lead SOIC (3.90 mm) Example
NNN
8-Lead TSSOP (4.4 mm) Example
3201CI
130256
3201-B
I/P ^^ 256
1130
3e
3201-BI
SN ^^11303e
201C
I130
256
256
MCP3201
DS21290F-page 26  1998-2011 Microchip Technology Inc.
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 1998-2011 Microchip Technology Inc. DS21290F-page 27
MCP3201
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP3201
DS21290F-page 28  1998-2011 Microchip Technology Inc.
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 1998-2011 Microchip Technology Inc. DS21290F-page 29
MCP3201
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP3201
DS21290F-page 30  1998-2011 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
 1998-2011 Microchip Technology Inc. DS21290F-page 31
MCP3201
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DS21290F-page 32  1998-2011 Microchip Technology Inc.
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 1998-2011 Microchip Technology Inc. DS21290F-page 33
MCP3201
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP3201
DS21290F-page 34  1998-2011 Microchip Technology Inc.
NOTES:
 1998-2011 Microchip Technology Inc. DS21290F-page 35
MCP3201
APPENDIX A: REVISION HISTORY
Revision F (August 2011)
• Updated Product Identification System section.
- Corrected marking drawings for MSOP
packages.
- Updated PDIP, SOIC, and TSSOP package
specification drawings.
Revision E (November 2008)
The following is the list of modifications:
1. Updated Section 7.0 “Packaging Informa-
tion”.
2. Updated Product Identification System
section.
Revision D (January 2007)
The following is the list of modifications:
1. This revision includes updates to the packaging
diagrams.
Revision C (August 2001)
The following is the list of modifications:
1. This revision includes undocumented changes.
Revision B (August 1999)
The following is the list of modifications:
1. This revision includes undocumented changes.
Revision A (September 1998)
• Original release of this document.
MCP3201
DS21290F-page 36  1998-2011 Microchip Technology Inc.
NOTES:

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Conversor a d mcp3201

  • 1.  1998-2011 Microchip Technology Inc. DS21290F-page 1 MCP3201 Features • 12-Bit Resolution • ±1 LSB max DNL • ±1 LSB max INL (MCP3201-B) • ±2 LSB max INL (MCP3201-C) • On-chip Sample and Hold • SPI Serial Interface (modes 0,0 and 1,1) • Single Supply Operation: 2.7V - 5.5V • 100 ksps Maximum Sampling Rate at VDD = 5V • 50 ksps Maximum Sampling Rate at VDD = 2.7V • Low-Power CMOS Technology • 500 nA Typical Standby Current, 2 µA Maximum • 400 µA Maximum Active Current at 5V • Industrial Temp Range: -40°C to +85°C • 8-pin MSOP, PDIP, SOIC and TSSOP Packages Applications • Sensor Interface • Process Control • Data Acquisition • Battery Operated Systems Functional Block Diagram Description The Microchip Technology Inc. MCP3201 device is a successive approximation 12-bit Analog-to-Digital (A/D) Converter with on-board sample and hold circuitry. The device provides a single pseudo-differen- tial input. Differential Nonlinearity (DNL) is specified at ±1 LSB, and Integral Nonlinearity (INL) is offered in ±1 LSB (MCP3201-B) and ±2 LSB (MCP3201-C) versions. Communication with the device is done using a simple serial interface compatible with the SPI protocol. The device is capable of sample rates of up to 100 ksps at a clock rate of 1.6 MHz. The MCP3201 device operates over a broad voltage range (2.7V- 5.5V). Low-current design permits operation with typical standby and active currents of only 500 nA and 300 µA, respectively. The device is offered in 8-pin MSOP, PDIP, TSSOP and 150 mil SOIC packages. Package Types Comparator Sample and Hold 12-Bit SAR DAC Control Logic CS/SHDN VREF IN+ IN- VSSVDD CLK DOUT Shift Register VREF IN+ IN– VSS VDD CLK DOUT CS/SHDN 1 2 3 4 8 7 6 5 MSOP, PDIP, SOIC, TSSOP MCP3201 2.7V 12-Bit A/D Converter with SPI Serial Interface
  • 2. MCP3201 DS21290F-page 2  1998-2011 Microchip Technology Inc. NOTES:
  • 3.  1998-2011 Microchip Technology Inc. DS21290F-page 3 MCP3201 1.0 ELECTRICAL CHARACTERISTICS 1.1 Maximum Ratings† VDD...................................................................................7.0V All inputs and outputs w.r.t. VSS ................ -0.6V to VDD +0.6V Storage temperature .....................................-65°C to +150°C Ambient temp. with power applied ................-65°C to +125°C ESD protection on all pins (HBM) .................................> 4 kV †Notice: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. ELECTRICAL CHARACTERISTICS Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and fCLK = 16*fSAMPLE, unless otherwise noted. Parameter Sym Min Typ Max Units Conditions Conversion Rate: Conversion Time tCONV — — 12 clock cycles Analog Input Sample Time tSAMPLE 1.5 clock cycles Throughput Rate fSAMPLE — — 100 50 ksps ksps VDD = VREF = 5V VDD = VREF = 2.7V DC Accuracy: Resolution 12 bits Integral Nonlinearity INL — — ±0.75 ±1 ±1 ±2 LSB LSB MCP3201-B MCP3201-C Differential Nonlinearity DNL — ±0.5 ±1 LSB No missing codes over temperature Offset Error — ±1.25 ±3 LSB Gain Error — ±1.25 ±5 LSB Dynamic Performance: Total Harmonic Distortion THD — -82 — dB VIN = 0.1V to 4.9V@1 kHz Signal to Noise and Distortion (SINAD) SINAD — 72 — dB VIN = 0.1V to 4.9V@1 kHz Spurious Free Dynamic Range SFDR — 86 — dB VIN = 0.1V to 4.9V@1 kHz Reference Input: Voltage Range 0.25 — VDD V Note 2 Current Drain — — 100 .001 150 3 µA µA CS = VDD = 5V Analog Inputs: Input Voltage Range (IN+) IN+ IN- — VREF+IN- V Input Voltage Range (IN-) IN- VSS-100 VSS+100 mV Leakage Current — 0.001 ±1 µA Switch Resistance RSS — 1K — W See Figure 4-1 Sample Capacitor CSAMPLE — 20 — pF See Figure 4-1 Digital Input/Output: Data Coding Format Straight Binary High Level Input Voltage VIH 0.7 VDD — — V Low Level Input Voltage VIL — — 0.3 VDD V Note 1: This parameter is established by characterization and not 100% tested. 2: See graph that relates linearity performance to VREF level. 3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance, especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.
  • 4. MCP3201 DS21290F-page 4  1998-2011 Microchip Technology Inc. TEMPERATURE CHARACTERISTICS High Level Output Voltage VOH 4.1 — — V IOH = -1 mA, VDD = 4.5V Low Level Output Voltage VOL — — 0.4 V IOL = 1 mA, VDD = 4.5V Input Leakage Current ILI -10 — 10 µA VIN = VSS or VDD Output Leakage Current ILO -10 — 10 µA VOUT = VSS or VDD Pin Capacitance (all inputs/outputs) CIN, COUT — — 10 pF VDD = 5.0V (Note 1) TA = +25°C, f = 1 MHz Timing Parameters: Clock Frequency fCLK — — — — 1.6 0.8 MHz MHz VDD = 5V (Note 3) VDD = 2.7V (Note 3) Clock High Time tHI 312 — — ns Clock Low Time tLO 312 — — ns CS Fall To First Rising CLK Edge tSUCS 100 — — ns CLK Fall To Output Data Valid tDO — — 200 ns See Test Circuits, Figure 1-2 CLK Fall To Output Enable tEN — — 200 ns See Test Circuits, Figure 1-2 CS Rise To Output Disable tDIS — — 100 ns See Test Circuits, Figure 1-2 (Note 1) CS Disable Time tCSH 625 — — ns DOUT Rise Time tR — — 100 ns See Test Circuits, Figure 1-2 (Note 1) DOUT Fall Time tF — — 100 ns See Test Circuits, Figure 1-2 (Note 1) Power Requirements: Operating Voltage VDD 2.7 — 5.5 V Operating Current IDD — — 300 210 400 — µA µA VDD = 5.0V, DOUT unloaded VDD = 2.7V, DOUT unloaded Standby Current IDDS — 0.5 2 µA CS = VDD = 5.0V Electrical Specifications: Unless otherwise indicated, VDD = +2.7V to +5.5V, VSS = GND. Parameters Sym Min Typ Max Units Conditions Temperature Ranges Specified Temperature Range TA -40 — +85 °C Operating Temperature Range TA -40 — +85 °C Storage Temperature Range TA -65 — +150 °C Thermal Package Resistances Thermal Resistance, 8L-MSOP JA — 211 — °C/W Thermal Resistance, 8L-PDIP JA — 89.5 — °C/W Thermal Resistance, 8L-SOIC JA — 149.5 — °C/W Thermal Resistance, 8L-TSSOP JA — 139 — °C/W ELECTRICAL CHARACTERISTICS (CONTINUED) Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and fCLK = 16*fSAMPLE, unless otherwise noted. Parameter Sym Min Typ Max Units Conditions Note 1: This parameter is established by characterization and not 100% tested. 2: See graph that relates linearity performance to VREF level. 3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance, especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.
  • 5.  1998-2011 Microchip Technology Inc. DS21290F-page 5 MCP3201 FIGURE 1-1: Serial Timing. FIGURE 1-2: Test Circuits. CS CLK tSUCS tCSH tHI tLO DOUT tEN tDO tR tF LSBMSB OUT tDIS NULL BIT HI-Z HI-Z VIH tDIS CS DOUT Waveform 1* DOUT Waveform 2† 90% 10% * Waveform 1 is for an output with internal condi- tions such that the output is high, unless disabled by the output control. † Waveform 2 is for an output with internal condi- tions such that the output is low, unless disabled by the output control. Voltage Waveforms for tDIS Test Point 1.4V DOUT Load circuit for tR, tF, tDO 3 kΩ CL = 30 pF Test Point DOUT Load circuit for tDIS and tEN 3 kΩ 30 pF tDIS Waveform 2 tDIS Waveform 1 CS CLK DOUT tEN 1 2 B9 Voltage Waveforms for tEN tEN Waveform VDD VDD/2 VSS 3 4 DOUT tR Voltage Waveforms for tR, tF CLK DOUT tDO Voltage Waveforms for tDO tF VOH VOL
  • 6. MCP3201 DS21290F-page 6  1998-2011 Microchip Technology Inc. NOTES:
  • 7.  1998-2011 Microchip Technology Inc. DS21290F-page 7 MCP3201 2.0 TYPICAL PERFORMANCE CHARACTERISTICS Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample Rate. FIGURE 2-2: Integral Nonlinearity (INL) vs. VREF. FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part). FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample Rate (VDD = 2.7V). FIGURE 2-5: Integral Nonlinearity (INL) vs. VREF (VDD = 2.7V). FIGURE 2-6: Integral Nonlinearity (INL) vs. Code (Representative Part, VDD = 2.7V). Note: The graphs provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 0 25 50 75 100 125 150 Sample Rate (ksps) INL(LSB) Positive INL Negative INL -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 0 1 2 3 4 5 VREF (V) INL(LSB) Positive INL Negative INL -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code INL(LSB) -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 0 20 40 60 80 100 Sample Rate (ksps) INL(LSB) VDD = VREF = 2.7V Positive INL Negative INL -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 VREF (V) INL(LSB) Positive INL Negative INL VDD = 2.7V FSAMPLE = 50 ksps -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code INL(LSB) VDD = VREF = 2.7V FSAMPLE = 50 ksps
  • 8. MCP3201 DS21290F-page 8  1998-2011 Microchip Technology Inc. Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-7: Integral Nonlinearity (INL) vs. Temperature. FIGURE 2-8: Differential Nonlinearity (DNL) vs. Sample Rate. FIGURE 2-9: Differential Nonlinearity (DNL) vs. VREF. FIGURE 2-10: Integral Nonlinearity (INL) vs. Temperature (VDD = 2.7V). FIGURE 2-11: Differential Nonlinearity (DNL) vs. Sample Rate (VDD = 2.7V). FIGURE 2-12: Differential Nonlinearity (DNL) vs. VREF (VDD = 2.7V). -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 -50 -25 0 25 50 75 100 Temperature (°C) INL(LSB) Positive INL Negative INL -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 0 25 50 75 100 125 150 Sample Rate (ksps) DNL(LSB) Positive DNL Negative DNL -2.0 -1.0 0.0 1.0 2.0 3.0 0 1 2 3 4 5 VREF (V) DNL(LSB) Negative DNL Positive DNL -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 -50 -25 0 25 50 75 100 Temperature (°C) INL(LSB) Positive INL VDD = VREF = 2.7V FSAMPLE = 50 ksps Negative INL -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 0 20 40 60 80 100 Sample Rate (ksps) DNL(LSB) VDD = VREF = 2.7V Positive DNL Negative DNL -3.0 -2.0 -1.0 0.0 1.0 2.0 3.0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 VREF(V) DNL(LSB) Positive DNL Negative DNL VDD = 2.7V FSAMPLE = 50 ksps
  • 9.  1998-2011 Microchip Technology Inc. DS21290F-page 9 MCP3201 Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-13: Differential Nonlinearity (DNL) vs. Code (Representative Part). FIGURE 2-14: Differential Nonlinearity (DNL) vs. Temperature. FIGURE 2-15: Gain Error vs. VREF. FIGURE 2-16: Differential Nonlinearity (DNL) vs. Code (Representative Part, VDD = 2.7V). FIGURE 2-17: Differential Nonlinearity (DNL) vs. Temperature (VDD = 2.7V). FIGURE 2-18: Offset Error vs. VREF. -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code DNL(LSB) -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 -50 -25 0 25 50 75 100 Temperature (°C) DNL(LSB) Positive DNL Negative DNL -2 -1 0 1 2 3 4 5 0 1 2 3 4 5 VREF(V) GainError(LSB) VDD = 2.7V FSAMPLE = 50 ksps VDD = 5V FSAMPLE = 100 ksps -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 0 512 1024 1536 2048 2560 3072 3584 4096 Digital Code DNL(LSB) VDD = VREF = 2.7V FSAMPLE = 50 ksps -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 -50 -25 0 25 50 75 100 Temperature (°C) DNL(LSB) Positive DNL VDD = 2.7V FSAMPLE = 50ksps Negative DNL 0 2 4 6 8 10 12 14 16 18 20 0 1 2 3 4 5 VREF (V) OffsetError(LSB) VDD = 5V FSAMPLE = 100 ksps VDD = 2.7V FSAMPLE = 50ksps
  • 10. MCP3201 DS21290F-page 10  1998-2011 Microchip Technology Inc. Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-19: Gain Error vs. Temperature. FIGURE 2-20: Signal-to-Noise Ratio (SNR) vs. Input Frequency. FIGURE 2-21: Total Harmonic Distortion (THD) vs. Input Frequency. FIGURE 2-22: Offset Error vs. Temperature. FIGURE 2-23: Signal-to-Noise and Distortion (SINAD) vs. Input Frequency. FIGURE 2-24: Signal-to-Noise and Distortion (SINAD) vs. Input Signal Level. -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0 -50 -25 0 25 50 75 100 Temperature (°C) GainError(LSB) VDD = VREF = 5V FSAMPLE = 100 ksps VDD = VREF = 2.7V FSAMPLE = 50 ksps 0 10 20 30 40 50 60 70 80 90 100 1 10 100 Input Frequency (kHz) SNR(dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V FSAMPLE = 100 ksps -100 -90 -80 -70 -60 -50 -40 -30 -20 -10 0 1 10 100 Input Frequency (kHz) THD(dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V, FSAMPLE = 100 ksps 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 -50 -25 0 25 50 75 100 Temperature (°C) OffsetError(LSB) VDD = VREF = 5V FSAMPLE = 100 ksps VDD = VREF = 2.7V FSAMPLE = 50 ksps 0 10 20 30 40 50 60 70 80 90 100 1 10 100 Input Frequency (kHz) SINAD(dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V FSAMPLE = 100 ksps 0 10 20 30 40 50 60 70 80 -40 -35 -30 -25 -20 -15 -10 -5 0 Input Signal Level (dB) SINAD(dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V FSAMPLE = 100 ksps
  • 11.  1998-2011 Microchip Technology Inc. DS21290F-page 11 MCP3201 Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-25: Effective Number of Bits (ENOB) vs. VREF. FIGURE 2-26: Spurious Free Dynamic Range (SFDR) vs. Input Frequency. FIGURE 2-27: Frequency Spectrum of 10 kHz input (Representative Part). FIGURE 2-28: Effective Number of Bits (ENOB) vs. Input Frequency. FIGURE 2-29: Power Supply Rejection (PSR) vs. Ripple Frequency. FIGURE 2-30: Frequency Spectrum of 1 kHz input (Representative Part, VDD = 2.7V). 9.00 9.25 9.50 9.75 10.00 10.25 10.50 10.75 11.00 11.25 11.50 11.75 12.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 VREF (V) ENOB(rms) VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V FSAMPLE =100 ksps 0 10 20 30 40 50 60 70 80 90 100 1 10 100 Input Frequency (kHz) SFDR(dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps VDD = VREF = 5V, FSAMPLE = 100 ksps -130 -120 -110 -100 -90 -80 -70 -60 -50 -40 -30 -20 -10 0 0 10000 20000 30000 40000 50000 Frequency (Hz) Amplitude(dB) VDD = VREF = 5V FSAMPLE = 100 ksps FINPUT = 9.985kHz 4096 points 8.0 8.5 9.0 9.5 10.0 10.5 11.0 11.5 12.0 1 10 100 Input Frequency (kHz) ENOB(rms) VDD = 2.7V FSAMPLE = 50 ksps VDD = 5V FSAMPLE = 100 ksps -80 -70 -60 -50 -40 -30 -20 -10 0 1 10 100 1000 10000 Ripple Frequency (kHz) PowerSupplyRejection(dB) -130 -120 -110 -100 -90 -80 -70 -60 -50 -40 -30 -20 -10 0 0 5000 10000 15000 20000 25000 Frequency (Hz) Amplitude(dB) VDD = VREF = 2.7V FSAMPLE = 50 ksps FINPUT = 998.76 Hz 4096 points
  • 12. MCP3201 DS21290F-page 12  1998-2011 Microchip Technology Inc. Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-31: IDD vs. VDD. FIGURE 2-32: IDD vs. Clock Frequency. FIGURE 2-33: IDD vs. Temperature. FIGURE 2-34: IREF vs. VDD. FIGURE 2-35: IREF vs. Clock Frequency. FIGURE 2-36: IREF vs. Temperature. 0 50 100 150 200 250 300 350 400 450 500 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VDD (V) IDD(µA) VREF = VDD All points at FCLK = 1.6 MHz, except at VREF = VDD = 2.5V, FCLK = 800 kHz 0 50 100 150 200 250 300 350 400 10 100 1000 10000 Clock Frequency (kHz) IDD(µA) VDD = VREF = 5V VDD = VREF = 2.7V 0 50 100 150 200 250 300 350 400 -50 -25 0 25 50 75 100 Temperature (°C) IDD(µA) VDD = VREF = 5V FCLK = 1.6 MHz VDD = VREF = 2.7V FCLK = 800 kHz 0 10 20 30 40 50 60 70 80 90 100 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VDD (V) IREF(µA) VREF = VDD All points at FCLK = 1.6 MHz, except at VREF = VDD = 2.5V, FCLK = 800 kHz 0 10 20 30 40 50 60 70 80 90 100 10 100 1000 10000 Clock Frequency (kHz) IREF(µA) VDD = VREF = 5V VDD = VREF = 2.7V 0 10 20 30 40 50 60 70 80 90 100 -50 -25 0 25 50 75 100 Temperature (°C) IREF(µA) VDD = VREF = 5V FCLK = 1.6 MHz VDD = VREF = 2.7V FCLK = 800 kHz
  • 13.  1998-2011 Microchip Technology Inc. DS21290F-page 13 MCP3201 Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C. FIGURE 2-37: IDDS vs. VDD. FIGURE 2-38: IDDS vs. Temperature. FIGURE 2-39: Analog Input Leakage Current vs. Temperature. 0 10 20 30 40 50 60 70 80 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VDD (V) IDDS(pA) VREF = CS = VDD 0.01 0.10 1.00 10.00 100.00 -50 -25 0 25 50 75 100 Temperature (°C) IDDS(nA) VDD = VREF = CS = 5V 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 -50 -25 0 25 50 75 100 Temperature (°C) AnalogInputLeakage(nA) VDD = VREF = 5V FCLK = 1.6 MHz
  • 14. MCP3201 DS21290F-page 14  1998-2011 Microchip Technology Inc. NOTES:
  • 15.  1998-2011 Microchip Technology Inc. DS21290F-page 15 MCP3201 3.0 PIN DESCRIPTIONS The descriptions of the pins are listed in Table 3-1. Additional descriptions of the device pins follows. TABLE 3-1: PIN FUNCTION TABLE 3.1 Positive Analog Input (IN+) Positive analog input. This input can vary from IN- to VREF + IN-. 3.2 Negative Analog Input (IN-) Negative analog input. This input can vary ±100 mV from VSS. 3.3 Chip Select/Shutdown (CS/SHDN) The CS/SHDN pin is used to initiate communication with the device when pulled low and will end a conversion and put the device in low power standby when pulled high. The CS/SHDN pin must be pulled high between conversions. 3.4 Serial Clock (CLK) The SPI clock pin is used to initiate a conversion and to clock out each bit of the conversion as it takes place. See Section 6.2 “Maintaining Minimum Clock Speed” for constraints on clock speed. 3.5 Serial Data Output (DOUT) The SPI serial data output pin is used to shift out the results of the A/D conversion. Data will always change on the falling edge of each clock as the conversion takes place. MCP3201 Symbol DescriptionMSOP, PDIP, SOIC, TSSOP 1 VREF Reference Voltage Input 2 IN+ Positive Analog Input 3 IN- Negative Analog Input 4 VSS Ground 5 CS/SHDN Chip Select/Shutdown Input 6 DOUT Serial Data Out 7 CLK Serial Clock 8 VDD +2.7V to 5.5V Power Supply
  • 16. MCP3201 DS21290F-page 16  1998-2011 Microchip Technology Inc. NOTES:
  • 17.  1998-2011 Microchip Technology Inc. DS21290F-page 17 MCP3201 4.0 DEVICE OPERATION The MCP3201 A/D Converter employs a conventional SAR architecture. With this architecture, a sample is acquired on an internal sample/hold capacitor for 1.5 clock cycles starting on the first rising edge of the serial clock after CS has been pulled low. Following this sample time, the input switch of the converter opens and the device uses the collected charge on the internal sample and hold capacitor to produce a serial 12-bit digital output code. Conversion rates of 100 ksps are possible on the MCP3201 device. See Section 6.2 “Maintaining Minimum Clock Speed” for information on minimum clock rates. Communication with the device is done using a 3-wire SPI-compatible interface. 4.1 Analog Inputs The MCP3201 device provides a single pseudo-differ- ential input. The IN+ input can range from IN- to VREF (VREF + IN-). The IN- input is limited to ±100 mV from the VSS rail. The IN- input can be used to cancel small signal common-mode noise which is present on both the IN+ and IN- inputs. For the A/D Converter to meet specification, the charge holding capacitor (CSAMPLE) must be given enough time to acquire a 12-bit accurate voltage level during the 1.5 clock cycle sampling period. The analog input model is shown in Figure 4-1. In this diagram, it is shown that the source impedance (RS) adds to the internal sampling switch (RSS) impedance, directly affecting the time that is required to charge the capacitor (CSAMPLE). Consequently, a larger source impedance increases the offset, gain, and integral linearity errors of the conversion. Ideally, the impedance of the signal source should be near zero. This is achievable with an operational amplifier such as the MCP601, which has a closed loop output impedance of tens of ohms. The adverse affects of higher source impedances are shown in Figure 4-2. If the voltage level of IN+ is equal to or less than IN-, the resultant code will be 000h. If the voltage at IN+ is equal to or greater than {[VREF + (IN-)] - 1 LSB}, then the output code will be FFFh. If the voltage level at IN- is more than 1 LSB below VSS, then the voltage level at the IN+ input will have to go below VSS to see the 000h output code. Conversely, if IN- is more than 1 LSB above VSS, then the FFFh code will not be seen unless the IN+ input level goes above VREF level. 4.2 Reference Input The reference input (VREF) determines the analog input voltage range and the LSB size, as shown below. EQUATION 4-1: As the reference input is reduced, the LSB size is reduced accordingly. The theoretical digital output code produced by the A/D Converter is a function of the analog input signal and the reference input as shown below. EQUATION 4-2: When using an external voltage reference device, the system designer should always refer to the manufacturer’s recommendations for circuit layout. Any instability in the operation of the reference device will have a direct effect on the operation of the A/D Converter. LSB Size VREF 4096 -------------= Digital Output Code 4096*VIN VREF -------------------------= Where: VIN = Analog Input Voltage = V(IN+) - V(IN-) VREF = Reference Voltage
  • 18. MCP3201 DS21290F-page 18  1998-2011 Microchip Technology Inc. FIGURE 4-1: Analog Input Model. FIGURE 4-2: Maximum Clock Frequency vs. Input Resistance (RS) to maintain less than a 0.1 LSB deviation in INL from nominal conditions. CPINVA RSS CHx 7 pF VT = 0.6V VT = 0.6V ILEAKAGE Sampling Switch SS RS = 1 k CSAMPLE = DAC capacitance VSS VDD = 20 pF±1 nA Legend: VA = Signal Source RSS = Source Impedance CHx = Input Channel Pad CPIN = Input Pin Capacitance VT = Threshold Voltage ILEAKAGE = Leakage Current At The Pin Due To Various Junctions SS = Sampling Switch RS = Sampling Switch Resistor CSAMPLE = Sample/hold Capacitance 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 100 1000 10000 Input Resistance (Ohms) ClockFrequency(MHz) VDD = VREF = 5V VDD = VREF = 2.7V
  • 19.  1998-2011 Microchip Technology Inc. DS21290F-page 19 MCP3201 5.0 SERIAL COMMUNICATIONS Communication with the device is done using a standard SPI-compatible serial interface. Initiating communication with the MCP3201 device begins with the CS going low. If the device was powered up with the CS pin low, it must be brought high and back low to initiate communication. The device will begin to sample the analog input on the first rising edge after CS goes low. The sample period will end in the falling edge of the second clock, at which time the device will output a low null bit. The next 12 clocks will output the result of the conversion with MSB first, as shown in Figure 5-1. Data is always output from the device on the falling edge of the clock. If all 12 data bits have been transmitted and the device continues to receive clocks while the CS is held low, the device will output the conversion result LSB first, as shown in Figure 5-2. If more clocks are provided to the device while CS is still low (after the LSB first data has been transmitted), the device will clock out zeros indefinitely. FIGURE 5-1: Communication with MCP3201 device using MSB first Format. FIGURE 5-2: Communication with MCP3201 device using LSB first Format. CS CLK DOUT tCYC POWER DOWN TSUCS TSAMPLE tCONV tDATA** * After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output LSB first data, followed by zeros indefinitely. See Figure 5-2 below. ** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance node, leaving the CLK running to clock out the LSB-first data or zeros. TCSH NULL BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0* HI-Z HI-Z B11 B10 B9 B8NULL BIT CS CLK DOUT tCYC POWER DOWNtSUCS tSAMPLE tCONV tDATA** * After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely. ** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance node, leaving the CLK running to clock out the LSB-first data or zeros. tCSH NULL BIT B11B10B9 B8 B7 B6 B5 B4 B3 B2 B1 B0HI-Z B1 B2 B3 B4 B5 B6 B7 B8 B9 B10B11* HI-Z
  • 20. MCP3201 DS21290F-page 20  1998-2011 Microchip Technology Inc. NOTES:
  • 21.  1998-2011 Microchip Technology Inc. DS21290F-page 21 MCP3201 6.0 APPLICATIONS INFORMATION 6.1 Using the MCP3201 Device with Microcontroller SPI Ports With most microcontroller SPI ports, it is required to clock out eight bits at a time. If this is the case, it will be necessary to provide more clocks than are required for the MCP3201. As an example, Figure 6-1 and Figure 6-2 show how the MCP3201 device can be interfaced to a microcontroller with a standard SPI port. Since the MCP3201 always clocks data out on the falling edge of clock, the MCU SPI port must be configured to match this operation. SPI Mode 0,0 (clock idles low) and SPI Mode 1,1 (clock idles high) are both compatible with the MCP3201. Figure 6-1 depicts the operation shown in SPI Mode 0,0, which requires that the CLK from the microcontroller idles in the ‘low’ state. As shown in the diagram, the MSB is clocked out of the A/D Converter on the falling edge of the third clock pulse. After the first eight clocks have been sent to the device, the microcontroller’s receive buffer will contain two unknown bits (the output is at high-impedance for the first two clocks), the null bit and the highest order five bits of the conversion. After the second eight clocks have been sent to the device, the MCU receive register will contain the lowest-order seven bits and the B1 bit repeated as the A/D Converter has begun to shift out LSB first data with the extra clock. Typical procedure would then call for the lower-order byte of data to be shifted right by one bit to remove the extra B1 bit. The B7 bit is then transferred from the high-order byte to the lower-order byte, and then the higher-order byte is shifted one bit to the right as well. Easier manipulation of the converted data can be obtained by using this method. Figure 6-2 shows the same thing in SPI Mode 1,1 which requires that the clock idles in the high state. As with mode 0,0, the A/D Converter outputs data on the falling edge of the clock and the MCU latches data from the A/D Converter in on the rising edge of the clock. FIGURE 6-1: SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low). FIGURE 6-2: SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high). CS CLK 9 10 11 12 13 14 15 16 DOUT NULL BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 HI-Z B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B8? ? 0 MCU latches data from A/D Data is clocked out of A/D Converter on falling edges Converter on rising edges of SCLK 1 2 3 4 5 6 7 8 HI-Z B1 B1 LSB first data begins to come out B2 Data stored into MCU receive register after transmission of first 8 bits Data stored into MCU receive register after transmission of second 8 bits CS CLK 9 10 11 12 13 14 15 16 DOUT NULL BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 HI-Z B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B8? ? 0 MCU latches data from A/D Data is clocked out of A/D Converter on falling edges Converter on rising edges of SCLK 1 2 3 4 5 6 7 8 B1 B1 LSB first data begins to come out HI-Z Data stored into MCU receive register after transmission of first 8 bits Data stored into MCU receive register after transmission of second 8 bits
  • 22. MCP3201 DS21290F-page 22  1998-2011 Microchip Technology Inc. 6.2 Maintaining Minimum Clock Speed When the MCP3201 initiates the sample period, charge is stored on the sample capacitor. When the sample period is complete, the device converts one bit for each clock that is received. It is important for the user to note that a slow clock rate will allow charge to bleed off the sample cap while the conversion is taking place. At 85°C (worst-case condition), the part will maintain proper charge on the sample capacitor for at least 1.2 ms after the sample period has ended. This means that the time between the end of the sample period and the time that all 12 data bits have been clocked out must not exceed 1.2 ms (effective clock frequency of 10 kHz). Failure to meet this criteria may induce linearity errors into the conversion outside the rated specifications. It should be noted that during the entire conversion cycle, the A/D Converter does not require a constant clock speed or duty cycle, as long as all timing specifications are met. 6.3 Buffering/Filtering the Analog Inputs If the signal source for the A/D Converter is not a low- impedance source, it will have to be buffered or inaccurate conversion results may occur. See Figure 4-2. It is also recommended that a filter be used to eliminate any signals that may be aliased back into the conversion results. This is illustrated in Figure 6-3 where an op amp is used to drive the analog input of the MCP3201 device. This amplifier provides a low-impedance source for the converter input and a low-pass filter, which eliminates unwanted high- frequency noise. Low-pass (anti-aliasing) filters can be designed using Microchip’s interactive FilterLab® software. FilterLab will calculate capacitor and resistor values, as well as determine the number of poles that are required for the application. For more information on filtering signals, see application note AN699 “Anti-Aliasing Analog Filters for Data Acquisition Systems.” FIGURE 6-3: The MCP601 Operational Amplifier is used to implement a 2nd order anti- aliasing filter for the signal being converted by the MCP3201 device. MCP3201 VDD 10 µF IN- IN+ - +VIN C1 C2 VREF 4.096V Reference 1 µF 10 µF0.1 µF MCP601R1 R2 R3 R4 MCP1541 CL
  • 23.  1998-2011 Microchip Technology Inc. DS21290F-page 23 MCP3201 6.4 Layout Considerations When laying out a printed circuit board for use with analog components, care should be taken to reduce noise wherever possible. A bypass capacitor should always be used with this device and should be placed as close as possible to the device pin. A bypass capacitor value of 1 µF is recommended. Digital and analog traces should be separated as much as possible on the board and no traces should run underneath the device or the bypass capacitor. Extra precautions should be taken to keep traces with high- frequency signals (such as clock lines) as far as possible from analog traces. Use of an analog ground plane is recommended in order to keep the ground potential the same for all devices on the board. Providing VDD connections to devices in a “star” configuration can also reduce noise by eliminating current return paths and associated errors. See Figure 6-4. For more information on layout tips when using A/D Converter, refer to AN688 “Layout Tips for 12-Bit A/D Converter Applications”. FIGURE 6-4: VDD traces arranged in a ‘Star’ configuration in order to reduce errors caused by current return paths. VDD Connection Device 1 Device 2 Device 3 Device 4
  • 24. MCP3201 DS21290F-page 24  1998-2011 Microchip Technology Inc. NOTES:
  • 25.  1998-2011 Microchip Technology Inc. DS21290F-page 25 MCP3201 7.0 PACKAGING INFORMATION 7.1 Package Marking Information Legend: XX...X Customer-specific information Y Year code (last digit of calendar year) YY Year code (last 2 digits of calendar year) WW Week code (week of January 1 is week ‘01’) NNN Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn) * This package is Pb-free. The Pb-free JEDEC designator ( ) can be found on the outer packaging for this package. Note: In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. 3e 3e 8-Lead MSOP (3x3 mm) Example 8-Lead PDIP (300 mil) Example XXXXXXXX XXXXXNNN YYWW 8-Lead SOIC (3.90 mm) Example NNN 8-Lead TSSOP (4.4 mm) Example 3201CI 130256 3201-B I/P ^^ 256 1130 3e 3201-BI SN ^^11303e 201C I130 256 256
  • 26. MCP3201 DS21290F-page 26  1998-2011 Microchip Technology Inc. /HDG 3ODVWLF 0LFUR 6PDOO 2XWOLQH 3DFNDJH 06
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  • 28.  1998-2011 Microchip Technology Inc. DS21290F-page 27 MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
  • 29. MCP3201 DS21290F-page 28  1998-2011 Microchip Technology Inc. /HDG 3ODVWLF 'XDO ,Q/LQH 3
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  • 31.  1998-2011 Microchip Technology Inc. DS21290F-page 29 MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
  • 32. MCP3201 DS21290F-page 30  1998-2011 Microchip Technology Inc. Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
  • 33.  1998-2011 Microchip Technology Inc. DS21290F-page 31 MCP3201 /HDG 3ODVWLF 6PDOO 2XWOLQH 61
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  • 35. MCP3201 DS21290F-page 32  1998-2011 Microchip Technology Inc. /HDG 3ODVWLF 7KLQ 6KULQN 6PDOO 2XWOLQH 67
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  • 37.  1998-2011 Microchip Technology Inc. DS21290F-page 33 MCP3201 Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging
  • 38. MCP3201 DS21290F-page 34  1998-2011 Microchip Technology Inc. NOTES:
  • 39.  1998-2011 Microchip Technology Inc. DS21290F-page 35 MCP3201 APPENDIX A: REVISION HISTORY Revision F (August 2011) • Updated Product Identification System section. - Corrected marking drawings for MSOP packages. - Updated PDIP, SOIC, and TSSOP package specification drawings. Revision E (November 2008) The following is the list of modifications: 1. Updated Section 7.0 “Packaging Informa- tion”. 2. Updated Product Identification System section. Revision D (January 2007) The following is the list of modifications: 1. This revision includes updates to the packaging diagrams. Revision C (August 2001) The following is the list of modifications: 1. This revision includes undocumented changes. Revision B (August 1999) The following is the list of modifications: 1. This revision includes undocumented changes. Revision A (September 1998) • Original release of this document.
  • 40. MCP3201 DS21290F-page 36  1998-2011 Microchip Technology Inc. NOTES:
  • 41.  1998-2011 Microchip Technology Inc. DS21290F-page 37 MCP3201 PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. Device: MCP3201: 12-Bit A/D Converter w/SPI Interface MCP3201T: 12-Bit A/D Converter w/SPI Interface (Tape and Reel) Grade: B: = ± LSB max INL (MSOP and TSSOP not available) C: = ± LSB max INL Temperature Range: I = -40°C to+85°C(Industrial) Package: MS = Plastic Micro Small Outline (MSOP), 8-lead P = Plastic DIP (300 mil Body), 8-lead SN = Plastic SOIC (150 mil Body), 8-lead ST = Plastic TSSOP (4.4 mm), 8-lead Examples: a) MCP3201-BI/P: B Grade, Industrial Temperature, 8LD PDIP package. b) MCP3201-BI/SN: B Grade, Industrial Temperature, 8LD SOIC package. c) MCP3201-CI/P: C Grade, Industrial Temperature, 8LD PDIP package. d) MCP3201-CI/MS: C Grade, Industrial Temperature, 8LD MSOP package. e) MCP3201-CI/SN: C Grade, Industrial Temperature, 8LD SOIC package. f) MCP3201-CI/ST: C Grade, Industrial Temperature, 8LD TSSOP package. g) MCP3201T-BI/SN: Tape and Reel, B Grade, Industrial Temperature, 8LD SOIC package. h) MCP3201T-CI/MS: Tape and Reel, C Grade, Industrial Temperature, 8LD MSOP package. i) MCP3201T-CI/SN: Tape and Reel, C Grade, Industrial Temperature, 8LD SOIC package. j) MCP3201T-CI/ST: Tape and Reel, C Grade, Industrial Temperature, 8LD TSSOP package. PART NO. X /XXX Grade PackageTemperature Range Device
  • 42. MCP3201 DS21290F-page 38  1998-2011 Microchip Technology Inc. NOTES:
  • 43.  1998-2011 Microchip Technology Inc. DS21290F-page 39 Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, dsPIC, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PIC32 logo, rfPIC and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor, MXDEV, MXLAB, SEEVAL and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, Application Maestro, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, Total Endurance, TSHARC, UniWinDriver, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. © 1998-2011, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. ISBN: 978-1-61341-572-6 Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified.
  • 44. DS21290F-page 40  1998-2011 Microchip Technology Inc. AMERICAS Corporate Office 2355 West Chandler Blvd. Chandler, AZ 85224-6199 Tel: 480-792-7200 Fax: 480-792-7277 Technical Support: http://www.microchip.com/ support Web Address: www.microchip.com Atlanta Duluth, GA Tel: 678-957-9614 Fax: 678-957-1455 Boston Westborough, MA Tel: 774-760-0087 Fax: 774-760-0088 Chicago Itasca, IL Tel: 630-285-0071 Fax: 630-285-0075 Cleveland Independence, OH Tel: 216-447-0464 Fax: 216-447-0643 Dallas Addison, TX Tel: 972-818-7423 Fax: 972-818-2924 Detroit Farmington Hills, MI Tel: 248-538-2250 Fax: 248-538-2260 Indianapolis Noblesville, IN Tel: 317-773-8323 Fax: 317-773-5453 Los Angeles Mission Viejo, CA Tel: 949-462-9523 Fax: 949-462-9608 Santa Clara Santa Clara, CA Tel: 408-961-6444 Fax: 408-961-6445 Toronto Mississauga, Ontario, Canada Tel: 905-673-0699 Fax: 905-673-6509 ASIA/PACIFIC Asia Pacific Office Suites 3707-14, 37th Floor Tower 6, The Gateway Harbour City, Kowloon Hong Kong Tel: 852-2401-1200 Fax: 852-2401-3431 Australia - Sydney Tel: 61-2-9868-6733 Fax: 61-2-9868-6755 China - Beijing Tel: 86-10-8569-7000 Fax: 86-10-8528-2104 China - Chengdu Tel: 86-28-8665-5511 Fax: 86-28-8665-7889 China - Chongqing Tel: 86-23-8980-9588 Fax: 86-23-8980-9500 China - Hangzhou Tel: 86-571-2819-3187 Fax: 86-571-2819-3189 China - Hong Kong SAR Tel: 852-2401-1200 Fax: 852-2401-3431 China - Nanjing Tel: 86-25-8473-2460 Fax: 86-25-8473-2470 China - Qingdao Tel: 86-532-8502-7355 Fax: 86-532-8502-7205 China - Shanghai Tel: 86-21-5407-5533 Fax: 86-21-5407-5066 China - Shenyang Tel: 86-24-2334-2829 Fax: 86-24-2334-2393 China - Shenzhen Tel: 86-755-8203-2660 Fax: 86-755-8203-1760 China - Wuhan Tel: 86-27-5980-5300 Fax: 86-27-5980-5118 China - Xian Tel: 86-29-8833-7252 Fax: 86-29-8833-7256 China - Xiamen Tel: 86-592-2388138 Fax: 86-592-2388130 China - Zhuhai Tel: 86-756-3210040 Fax: 86-756-3210049 ASIA/PACIFIC India - Bangalore Tel: 91-80-3090-4444 Fax: 91-80-3090-4123 India - New Delhi Tel: 91-11-4160-8631 Fax: 91-11-4160-8632 India - Pune Tel: 91-20-2566-1512 Fax: 91-20-2566-1513 Japan - Yokohama Tel: 81-45-471- 6166 Fax: 81-45-471-6122 Korea - Daegu Tel: 82-53-744-4301 Fax: 82-53-744-4302 Korea - Seoul Tel: 82-2-554-7200 Fax: 82-2-558-5932 or 82-2-558-5934 Malaysia - Kuala Lumpur Tel: 60-3-6201-9857 Fax: 60-3-6201-9859 Malaysia - Penang Tel: 60-4-227-8870 Fax: 60-4-227-4068 Philippines - Manila Tel: 63-2-634-9065 Fax: 63-2-634-9069 Singapore Tel: 65-6334-8870 Fax: 65-6334-8850 Taiwan - Hsin Chu Tel: 886-3-5778-366 Fax: 886-3-5770-955 Taiwan - Kaohsiung Tel: 886-7-536-4818 Fax: 886-7-330-9305 Taiwan - Taipei Tel: 886-2-2500-6610 Fax: 886-2-2508-0102 Thailand - Bangkok Tel: 66-2-694-1351 Fax: 66-2-694-1350 EUROPE Austria - Wels Tel: 43-7242-2244-39 Fax: 43-7242-2244-393 Denmark - Copenhagen Tel: 45-4450-2828 Fax: 45-4485-2829 France - Paris Tel: 33-1-69-53-63-20 Fax: 33-1-69-30-90-79 Germany - Munich Tel: 49-89-627-144-0 Fax: 49-89-627-144-44 Italy - Milan Tel: 39-0331-742611 Fax: 39-0331-466781 Netherlands - Drunen Tel: 31-416-690399 Fax: 31-416-690340 Spain - Madrid Tel: 34-91-708-08-90 Fax: 34-91-708-08-91 UK - Wokingham Tel: 44-118-921-5869 Fax: 44-118-921-5820 Worldwide Sales and Service 08/02/11