This document discusses characterization techniques for nanoparticles. It explains that to fully study nanoparticles, their size, crystal structure, composition, and properties must be characterized. It then summarizes and compares several common techniques used for nanoparticle characterization, including their pros and cons. These techniques include transmission electron microscopy, scanning electron microscopy, atomic force microscopy, X-ray diffraction, small-angle X-ray scattering, and others.