This document provides information about the APDS-9301 ambient light photo sensor, including:
- It has digital output capable of direct I2C interface and consists of one broadband and one infrared photodiode.
- Application support is available to assist with design involving the sensor module.
- Key features include approximating human-eye response, programmable interrupt function, and miniature chip package.
- It provides typical operating characteristics like ADC count values and illuminance/irradiance responsivity under various lighting conditions.
- Electrical characteristics, register information, timing diagrams, and principles of operation involving the analog-to-digital converters and digital interface are also described.
Liquid Sensing: Visible light absorption spectroscopy and colorimetry are two fundamental tools used in chemical analysis. Most of these light-based systems use photodiodes as the light sensor, and require similar high input impedance signal chains. This session examines the different components of a photodiode amplifier signal chain, including a programmable gain transimpedance amplifier, a hardware lock-in amplifier, and a Σ-Δ ADC that can measure a sample and reference channel to greatly reduce any measurement error due to variations in intensity of the light source.
Gas Sensing: Many industrial processes involve toxic compounds, and it is important to know when dangerous concentrations exist. Electrochemical sensors offer several advantages for instruments that detect or measure the concentration of toxic gases. This session will describe a portable toxic gas detector using an electrochemical sensor. The system presented here includes a potentiostat circuit to drive the sensor, as well as a transimpedance amplifier to take the very small output current from the sensor and translate it to a voltage that can take advantage of the full-scale input of an ADC.
Instrumentation: Test and Measurement Methods and Solutions - VE2013Analog Devices, Inc.
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Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
Liquid Sensing: Visible light absorption spectroscopy and colorimetry are two fundamental tools used in chemical analysis. Most of these light-based systems use photodiodes as the light sensor, and require similar high input impedance signal chains. This session examines the different components of a photodiode amplifier signal chain, including a programmable gain transimpedance amplifier, a hardware lock-in amplifier, and a Σ-Δ ADC that can measure a sample and reference channel to greatly reduce any measurement error due to variations in intensity of the light source.
Gas Sensing: Many industrial processes involve toxic compounds, and it is important to know when dangerous concentrations exist. Electrochemical sensors offer several advantages for instruments that detect or measure the concentration of toxic gases. This session will describe a portable toxic gas detector using an electrochemical sensor. The system presented here includes a potentiostat circuit to drive the sensor, as well as a transimpedance amplifier to take the very small output current from the sensor and translate it to a voltage that can take advantage of the full-scale input of an ADC.
Instrumentation: Test and Measurement Methods and Solutions - VE2013Analog Devices, Inc.
Tilt Measurement: Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication, and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMS accelerometers are better suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMS accelerometer including measurement resolution, signal conditioning, single- vs. dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
Sigma-Delta Analog to Digital ConvertersSatish Patil
In recent years Sigma-Delta ADCs became one of the most popular types of Analog-to-Digital converters. The key features of these are high-speed, high resolution and low operating voltages. These are commonly used in variety of applications like digital audio CDs, CODEC, biomedical sensor applications and wireless transmitters/receivers. The basic principles involved in this technique are oversampling and noise shaping. This report reviews different techniques proposed for high resolution, low power Sigma-Delta ADC. Conventional design of SDM was dominated by discrete time architecture but in modern designs continuous types are also becoming famous because of their low power attributes. Continuous efforts have been taken to reduce the supply voltages of SDM and recently, lowest reported is 250mv.
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This session focuses on liquid and gas sensing in instrumentation applications.
Liquid Sensing:
Visible light absorption spectroscopy and colorimetry are two fundamental tools used in chemical analysis. Most of these light-based systems use photodiodes as the light sensor, and require similar high input impedance signal chains. This session examines the different components of a photodiode amplifier signal chain, including a programmable gain transimpedance amplifier, a hardware lock-in amplifier, and a Σ-Δ ADC that can measure a sample and reference channel to greatly reduce any measurement error due to variations in intensity of the light source.
Gas Sensing:
Many industrial processes involve toxic compounds, and it is important to know when dangerous concentrations exist. Electrochemical sensors offer several advantages for instruments that detect or measure the concentration of toxic gases. This session will describe a portable toxic gas detector using an electrochemical sensor. The system presented here includes a potentiostat circuit to drive the sensor, as well as a transimpedance amplifier to take the very small output current from the sensor and translate it to a voltage that can take advantage of the full-scale input of an ADC.
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When it comes to high performance signal chains, you need high performance power solutions. Noise sensitive
circuits such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), amplifiers, and phase
lock loops (PLLs)—as well as FPGAs—demand low noise power supplies that require specialized design
techniques. Engineers spend hours trying to figure out how to power these circuits without adding noise.
This presentation will focus on understanding various methods for not only approaching but meeting system
requirements. The session will introduce tested solutions and layout considerations that must be taken into
account when designing with switching regulators and low drop out (LDO) regulators.
Instrumentation: Test and Measurement Methods and Solutions (Design Conferenc...Analog Devices, Inc.
Tilt Measurement:
Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMs accelerometers are ideally suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMs accelerometer including measurement resolution, signal conditioning, single- vs.
dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements, and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
Amplifiers are the workhorses of data acquisition and transmission systems. They capture and amplify the low level signals from sensors and transmitters, and can pull these signals from high noise and high common-mode voltage levels. Amplifiers can also change the signal range and switch from single-ended to differential (or the reverse) to match exactly the input range of an ADC. This session covers the versatility and power of amplifiers in precision systems.
LightWave: Using Compact Fluorescent Lamps as SensorssidhantguptaUW
LightWave is a novel sensing technique that can convert ordinary CFLs into sensors of human proximity. This requires no modification of the bulb or instrumentation on the human body. A single sensor installed anywhere in the home converts all CFL lamps in a home into sensors. LightWave can detect human proximity, touches on the lamp shade or the metal base and on the bulb itself. In addition, it can also detect changes in ambient temperature, all with off-the-shelf unmodified CFLs.
this presentation has been designed for understanding of ADC function, Continuous and Discrete signal, Nyquist criterian for sampling, quantization error and advantage disadvantage of different type of ADC
Sigma-Delta Analog to Digital ConvertersSatish Patil
In recent years Sigma-Delta ADCs became one of the most popular types of Analog-to-Digital converters. The key features of these are high-speed, high resolution and low operating voltages. These are commonly used in variety of applications like digital audio CDs, CODEC, biomedical sensor applications and wireless transmitters/receivers. The basic principles involved in this technique are oversampling and noise shaping. This report reviews different techniques proposed for high resolution, low power Sigma-Delta ADC. Conventional design of SDM was dominated by discrete time architecture but in modern designs continuous types are also becoming famous because of their low power attributes. Continuous efforts have been taken to reduce the supply voltages of SDM and recently, lowest reported is 250mv.
Instrumentation: Liquid and Gas Sensing (Design Conference 2013)Analog Devices, Inc.
This session focuses on liquid and gas sensing in instrumentation applications.
Liquid Sensing:
Visible light absorption spectroscopy and colorimetry are two fundamental tools used in chemical analysis. Most of these light-based systems use photodiodes as the light sensor, and require similar high input impedance signal chains. This session examines the different components of a photodiode amplifier signal chain, including a programmable gain transimpedance amplifier, a hardware lock-in amplifier, and a Σ-Δ ADC that can measure a sample and reference channel to greatly reduce any measurement error due to variations in intensity of the light source.
Gas Sensing:
Many industrial processes involve toxic compounds, and it is important to know when dangerous concentrations exist. Electrochemical sensors offer several advantages for instruments that detect or measure the concentration of toxic gases. This session will describe a portable toxic gas detector using an electrochemical sensor. The system presented here includes a potentiostat circuit to drive the sensor, as well as a transimpedance amplifier to take the very small output current from the sensor and translate it to a voltage that can take advantage of the full-scale input of an ADC.
10Gb/s Tunable SFP+ Transceiver Hot Pluggable, Duplex LC, +3.3V, 100GHz, Mono...Allen He
SHPP-10G-Tun tunable SFP+ Optical Transceiver provides a high-speed serial link at 9.95 to 11.3 Gbps data rates. It
complies with SFP+ Multi-Source Agreement (MSA) Specification. It provides Digital diagnostics functions via a 2-wire serial
interface as specified in SFF-8472. It fulfills the tunable via the monolithically Mach-Zehnder Modulators (MZM) laser. It support optical link up to 80km for SONET/SDH, 10G FC and Ethernet applications.
When it comes to high performance signal chains, you need high performance power solutions. Noise sensitive
circuits such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), amplifiers, and phase
lock loops (PLLs)—as well as FPGAs—demand low noise power supplies that require specialized design
techniques. Engineers spend hours trying to figure out how to power these circuits without adding noise.
This presentation will focus on understanding various methods for not only approaching but meeting system
requirements. The session will introduce tested solutions and layout considerations that must be taken into
account when designing with switching regulators and low drop out (LDO) regulators.
Instrumentation: Test and Measurement Methods and Solutions (Design Conferenc...Analog Devices, Inc.
Tilt Measurement:
Tilt measurement is fast becoming a fundamental analysis tool in many fields including automotive, industrial, and healthcare. Navigation, vehicle dynamic control, building sway indication and motion detection systems all rely on this simple, cheap, and precise way of angle monitoring. MEMs accelerometers are ideally suited to inclination measurement than other methodologies. This session will address the challenges encountered when designing a dual-axis tilt sensor using a MEMs accelerometer including measurement resolution, signal conditioning, single- vs.
dual-axis, angle computation, and calibration.
Impedance Measurement: The measurement of complex impedance is widely used across industrial, commercial, automotive, healthcare, and consumer markets, and can include applications such as proximity sensing, inductive transducers, metallurgy and corrosion detection, loudspeaker impedance, biomedical, virus detection, blood coagulation factor, and network impedance analysis. This session will cover the concepts, approaches, and challenges of performing complex impedance measurements, and will present a system-level solution for impedance conversion.
Weigh Scale Measurement: Most common industrial weigh scale applications use a bridge-type load-cell sensor, with a voltage output that is directly proportional to the load weight placed on it. This session examines the basic parameters of a bridge-type load-cell sensor, such as the number of varying elements, impedance, excitation, sensitivity (mV/V), errors, and drift. It will also discuss the various components of the signal conditioning chain and present solutions with high dynamic range.
Amplifiers are the workhorses of data acquisition and transmission systems. They capture and amplify the low level signals from sensors and transmitters, and can pull these signals from high noise and high common-mode voltage levels. Amplifiers can also change the signal range and switch from single-ended to differential (or the reverse) to match exactly the input range of an ADC. This session covers the versatility and power of amplifiers in precision systems.
LightWave: Using Compact Fluorescent Lamps as SensorssidhantguptaUW
LightWave is a novel sensing technique that can convert ordinary CFLs into sensors of human proximity. This requires no modification of the bulb or instrumentation on the human body. A single sensor installed anywhere in the home converts all CFL lamps in a home into sensors. LightWave can detect human proximity, touches on the lamp shade or the metal base and on the bulb itself. In addition, it can also detect changes in ambient temperature, all with off-the-shelf unmodified CFLs.
this presentation has been designed for understanding of ADC function, Continuous and Discrete signal, Nyquist criterian for sampling, quantization error and advantage disadvantage of different type of ADC
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Av02 2315en datasheet
1. APDS-9301
Miniature Ambient Light Photo Sensor
with Digital (I2C) Output
Data Sheet
Description
The APDS-9301 is Light-to-Digital Ambient Light Photo
Sensor that converts light intensity to digital signal output
capable of direct I2C interface. Each device consists of one
broadband photodiode (visible plus infrared) and one
infrared photodiode. Two integrating ADCs convert the
photodiodecurrentstoadigitaloutputthatrepresentsthe
irradiance measured on each channel. This digital output
can be input to a microprocessor where illuminance
(ambient light level) in lux is derived using an empirical
formula to approximate the human-eye response.
Application Support Information
The Application Engineering Group is available to
assist you with the application design associated with
APDS-9301 ambient light photo sensor module. You can
contact them through your local sales representatives for
additional details.
Features
• Approximate the human-eye response
• Precise Illuminance measurement under diverse light-
ing conditions
• Programmable Interrupt Function with User-Defined
Upper and Lower Threshold Settings
• 16-Bit Digital Output with I2C Fast-Mode at 400 kHz
• Programmable Analog Gain and Integration Time
• Miniature ChipLED Package
– Height – 0.55mm
– Length – 2.60mm
– Width – 2.20mm
• 50/60-Hz Lighting Ripple Rejection
• Typical 3.0V Input Voltage
• Low Active Power (0.6 mW Typical) with Power Down
Mode
• RoHS Compliant
Applications
• Detection of ambient light to control display
backlighting
– Mobile devices – Cell phones, PDAs, PMP
– Computing devices – Notebooks, Tablet PC, Key
board
– Consumer devices – LCD Monitor, Flat-panel TVs,
Video Cameras, Digital Still Camera
• Automatic Residential and Commercial Lighting
Management
• Automotive instrumentation clusters
• Electronic Signs and Signals
Ordering Information
Part Number PackagingType Package Quantity
APDS-9301-020 Tape and Reel 6-pins Chipled package 2500
2. 2
Functional Block Diagram
I/O Pins ConfigurationTable
Pin Symbol Type
1 VDD Voltage Supply
2 GND Ground
3 ADDR SEL Address Select
4 SCL Serial Clock
5 SDA Serial Data
6 INT Interrupt
Absolute Maximum Ratings
Parameter Symbol Min Max Unit
Supply voltage VDD – 3.8 V
Digital output voltage range VO -0.5 3.8 V
Digital output current IO -1 20 mA
Storage temperature range Tstg -40 85 ºC
ESD tolerance human body model – 2000 V
Recommended Operating Conditions
Parameter Symbol Min Typ Max Unit Condition
Supply Voltage VDD 2.7 3.0 3.6 V
Operating Temperature Ta -30 – 85 ºC
SCL, SDA input low voltage VIL -0.5 – 0.8 V
SCL, SDA input high voltage VIH 2.1 – 3.6 V
Electrical Characteristics
Parameter Symbol Min Typ Max Unit Conditions
Supply current IDD – 0.24 0.6 mA Active
– 3.2 15 μA Power down
INT, SDA output low voltage VOL 0 – 0.4 V 3 mA sink current
0 – 0.6 V 6 mA sink current
Leakage current ILEAK -5 – 5 μA
Ch0 (Visible + IR)
Ch1 (IR)
SCL
SDA
VDD = 2.7 V
to 3.6 V
INT
GND
ADDR SEL
I2C
Interrupt
ADC Register
Address Select
Command
Register
ADC
ADC
3. 3
Operating Characteristics, High Gain (16x),VDD = 3.0V,Ta = 25°C, (unless otherwise noted) (see Notes 2, 3, 4, 5)
Parameter Symbol Channel Min Typ Max Unit Conditions
Oscillator frequency fosc 690 735 780 kHz
Dark ADC count value Ch0 0 4 counts Ee = 0, Tint = 402 ms
Ch1 0 4
Full scale ADC count value
(Note 6)
Ch0 65535 counts Tint > 178 ms
Ch1 65535
Ch0 37177 Tint = 101 ms
Ch1 37177
Ch0 5047 Tint = 13.7 ms
Ch1 5047
ADC count value Ch0 750 1000 1250 counts λp = 640 nm, Tint = 101 ms
Ch1 200 Ee = 36.3 µW/cm2
Ch0 700 1000 1300 λp = 940 nm, Tint = 101 ms
Ch1 820 Ee = 119 µW/cm2
ADC count value ratio:
Ch1/Ch0
0.15 0.2 0.25 λp = 640 nm, Tint = 101 ms
0.69 0.82 0.95 λp = 940 nm, Tint = 101 ms
Irradiance responsivity Re Ch0 27.5 counts/
(µW/cm2)
λp = 640 nm, Tint = 101 ms
Ch1 5.5
Ch0 8.4 λp = 940 nm, Tint = 101 ms
Ch1 6.9
Illuminance responsivity Rv Ch0 36 counts/
lux
Fluorescent light source:
Tint = 402 msCh1 4
Ch0 144 Incandescent light source:
Tint = 402 msCh1 72
ADC count value ratio:
Ch1/Ch0
0.11 Fluorescent light source:
Tint = 402 ms
0.5 Incandescent light source:
Tint = 402 ms
Illuminance responsivity,
low gain mode (Note 7)
Rv Ch0 2.3 counts/
lux
Fluorescent light source:
Tint = 402 msCh1 0.25
Ch0 9 Incandescent light source:
Tint = 402 msCh1 4.5
(Sensor Lux) /(actual Lux),
high gain mode (Note 8)
0.65 1 1.35 Fluorescent light source:
Tint = 402 ms
0.60 1 1.40 Incandescent light source:
Tint = 402 ms
4. 4
NOTES:
2. Optical measurements are made using small–angle incident radiation from light–emitting diode optical sources. Visible 640 nm LEDs and infrared
940 nm LEDs are used for final product testing for compatibility with high–volume production.
3. The 640 nm irradiance Ee is supplied by an AlInGaP light–emitting diode with the following characteristics: peak wavelength λp = 640 nm and
spectral halfwidth ∆λ½ = 17 nm.
4. The 940 nm irradiance Ee is supplied by a GaAs light–emitting diode with the following characteristics: peak wavelength λp = 940 nm and spectral
halfwidth ∆λ½ = 40 nm.
5. Integration timeTint, is dependent on internal oscillator frequency (fosc) and on the integration field value in the timing register as described in the
Register Set section. For nominal fosc = 735 kHz, nominal Tint = (number of clock cycles)/fosc.
Field value 00: Tint = (11 x 918)/fosc = 13.7 ms
Field value 01: Tint = (81 x 918)/fosc = 101 ms
Field value 10: Tint = (322 x 918)/fosc = 402 ms
Scaling between integration times vary proportionally as follows:
11/322 = 0.034 (field value 00), 81/322 = 0.252 (field value 01), and 322/322 = 1 (field value 10).
6. Full scale ADC count value is limited by the fact that there is a maximum of one count per two oscillator frequency periods and also by a 2–count
offset.
Full scale ADC count value = ((number of clock cycles)/2 - 2)
Field value 00: Full scale ADC count value = ((11 x 918)/2 - 2) = 5047
Field value 01: Full scale ADC count value = ((81 x 918)/2 - 2) = 37177
Field value 10: Full scale ADC count value = 65535, which is limited by 16 bit register. This full scale ADC count value is reached for 131074
clock cycles, which occurs for Tint = 178 ms for nominal fosc = 735 kHz.
7. Low gain mode has 16x lower gain than high gain mode: (1/16 = 0.0625).
8. For sensor Lux calculation, please refer to the empirical formula below. It is based on measured Ch0 and Ch1 ADC count values for the light source
specified. Actual Lux is obtained with a commercial luxmeter. The range of the (sensor Lux) / (actual Lux) ratio is estimated based on the variation
of the 640 nm and 940 nm optical parameters. Devices are not 100% tested with fluorescent or incandescent light sources.
CH1/CH0 Sensor Lux Formula
0 < CH1/CH0 ≤ 0.50 Sensor Lux = (0.0304 x CH0) – (0.062 x CH0 x ((CH1/CH0)1.4))
0.50 < CH1/CH0 ≤ 0.61 Sensor Lux = (0.0224 x CH0) – (0.031 x CH1)
0.61 < CH1/CH0 ≤ 0.80 Sensor Lux = (0.0128 x CH0) – (0.0153 x CH1)
0.80 < CH1/CH0 ≤ 1.30 Sensor Lux = (0.00146 x CH0) – (0.00112 x CH1)
CH1/CH0>1.30 Sensor Lux = 0
AC Electrical Characteristics (VDD = 3V,Ta = 25°C)
PARAMETER† MIN TYP MAX UNIT
t(CONV) Conversion time 12 100 400 ms
f(SCL) Clock frequency – – 400 kHz
t(BUF) Bus free time between start and stop condition 1.3 – – μs
t(HDSTA) Hold time after (repeated) start condition. After this period,
the first clock is generated.
0.6 – – μs
t(SUSTA) Repeated start condition setup time 0.6 – – μs
t(SUSTO) Stop condition setup time 0.6 – – μs
t(HDDAT) Data hold time 0 – 0.9 μs
t(SUDAT) Data setup time 100 – – ns
t(LOW) SCL clock low period 1.3 – – μs
t(HIGH) SCL clock high period 0.6 – – μs
tF Clock/data fall time – – 300 ns
tR Clock/data rise time – – 300 ns
Cj Input pin capacitance – – 10 pF
† Specified by design and characterization; not production tested.
5. 5
Parameter Measurement Information
SDA
SCL
StopStart
SCLACK
t(LOWMEXT) t(LOWMEXT)
t(LOWSEXT)
SCLACK
t(LOWMEXT)
P
t(SUSTO)t(SUDAT)t(HDDAT)t(BUF)
VIH
VIL
t(R)t(LOW)
t(HIGH)
t(F)
t(HDSTA)
VIH
VIL
P
Stop
Condition
SS
Start
Condition
t(SUSTA)
SDA
SCL
Figure 1.Timing Diagrams
A0A1A2A3A4A5A6 D1D2D3D4D5D6D7 D0R/W
Start by
Master
ACK by
APDS-9301
Stop by
Master
ACK by
APDS-9301
SDA
Frame 1 I2
C Slave Address Byte Frame 2 Command Byte
SCL
1 9 1 9
Figure 2. ExampleTiming Diagram for I2C Send Byte Format
Figure 3. ExampleTiming Diagram for I2C Receive Byte Format
A0A1A2A3A4A5A6 D1D2D3D4D5D6D7 D0R/W
Start by
Master
ACK by
APDS-9301
Stop by
Master
NACK by
Master
SDA
Frame 1 I2
C Slave Address Byte Frame 2 Data Byte From APDS-9301
SCL
1 9 1 9
6. 6
Typical Characteristics
Figure 4. Normalized Responsitivity vs. Spectral Responsivity Figure 5. Normalized Responsivity vs. Angular Displacement * CL Package
PRINCIPLES OF OPERATION
Analog–to–Digital Converter
The APDS-9301 contains two integrating analog-to-digital
converters (ADC) that integrate the currents from the
channel 0 and channel 1 photodiodes. Integration of both
channels occurs simultaneously, and upon completion of
the conversion cycle the conversion result is transferred to
the channel 0 and channel 1 data registers, respectively.
The transfers are double buffered to ensure that invalid
data is not read during the transfer. After the transfer, the
device automatically begins the next integration cycle.
Digital Interface
Interface and control of the APDS-9301 is accomplished
through a two–wire serial interface to a set of registers
that provide access to device control functions and
output data. The serial interface is compatible to I2C bus
Fast–Mode. The APDS-9301 offers three slave addresses
that are selectable via an external pin (ADDR SEL). The
slave address options are shown in Table 1.
Table 1. Slave Address Selection
ADDR SELTERMINAL LEVEL SLAVE ADDRESS
GND 0101001
Float 0111001
VDD 1001001
NOTE: The Slave Addresses are 7 bits and please note the I2C protocols.
A read/write bit should be appended to the slave address by the master
device to properly communicate with the APDS-9301 device.
I2C Protocols
Each Send and Write protocol is, essentially, a series of
bytes. A byte sent to the APDS-9301 with the most sig-
nificant bit (MSB) equal to 1 will be interpreted as a
COMMAND byte. The lower four bits of the COMMAND
byte form the register select address (seeTable 2), which is
used to select the destination for the subsequent byte(s)
received. The APDS-9301 responds to any Receive Byte
requests with the contents of the register specified by the
stored register select address.
The APDS-9301 implements the following protocols of
the Philips Semiconductor I2C specification:
• I2C Write Protocol
• I2C Read Protocol
For a complete description of I2C protocol, please review
the I2C Specification at http://www.semiconductors.
philips.com
Spectral Responsivity
0
0.2
0.4
0.6
0.8
1
NormalizedResponsivity
400 500 600 700 800 900 1000 1100300
Channel 1
Photodiode
Channel 0
Photodiode
- Angular Displacement - 470 pF
NormalizedResponsivity
0
0.2
0.4
0.6
0.8
1.0
-90 -60 -30 0 30 60 90
OpticalAxis
- Wavelength - nm
7. 7
A Acknowledge (this bit position may be 0 for an ACK or 1 for a NACK)
P Stop Condition
Rd Read (bit value of 1)
S Start Condition
Sr Repeated Start Condition
Wr Write (bit value of 0)
X Shown under a field indicates that that field is required to have a value of X
... Continuation of protocol
Master-to-Slave
Slave-to-Master
1 7 1 1 8 1 1
S Slave Address Wr A Data Byte A P
X X
Figure 6. I2C Packet Protocol Element Key
1 7 1 1 8 1 8 1 1
S Slave Address Wr A Common Code A Data Byte A P
Figure 7. I2CWrite Protocols
Figure 8. I2C Read Protocols
1 7 1 1 8 1 1 7 1 1 8 1 1
S Slave Address Wr A Command Code A Sr Slave Address Rd A Data Byte A P
1
Figure 9. I2CWriteWord Protocols
1 7 1 1 8 1 8 1 8 1 1
S Slave Address Wr A Command Code A Data Byte Low A Data Byte High A P
Figure 10. I2C ReadWord Protocols
1 7 1 1 8 1 1 7 1 1 8 1
S Slave Address Wr A Command Code A Sr Slave Address Rd A Data Byte Low A ...
8 1 1
Data Byte High A P
1
8. 8
Register Set
The APDS-9301 is controlled and monitored by sixteen registers (three are reserved) and a command register accessed
through the serial interface. These registers provide for a variety of control functions and can be read to determine
results of the ADC conversions. The register set is summarized in Table 2.
Table 2. Register Address
ADDRESS RESISTER NAME REGISTER FUNCTION
-- COMMAND Specifies register address
0h CONTROL Control of basic functions
1h TIMING Integration time/gain control
2h THRESHLOWLOW Low byte of low interrupt threshold
3h THRESHLOWHIGH High byte of low interrupt threshold
4h THRESHHIGHLOW Low byte of high interrupt threshold
5h THRESHHIGHHIGH High byte of high interrupt threshold
6h INTERRUPT Interrupt control
7h -- Reserved
8h CRC Factory test — not a user register
9h -- Reserved
Ah ID Part number/ Rev ID
Bh -- Reserved
Ch DATA0LOW Low byte of ADC channel 0
Dh DATA0HIGH High byte of ADC channel 0
Eh DATA1LOW Low byte of ADC channel 1
Fh DATA1HIGH High byte of ADC channel 1
The mechanics of accessing a specific register depends on the specific I2C protocol used. Refer to the section on I2C
protocols. In general, the COMMAND register is written first to specify the specific control/status register for following
read/write operations.
9. 9
7 6 5 4 3 2 1 0
CMD CLEAR WORD Resv ADDRESS COMMAND
Reset Value: 0 0 0 0 0 0 0 0
Command Register
The command register specifies the address of the target register for subsequent read and write operations. The Send
Byte protocol is used to configure the COMMAND register. The command register contains eight bits as described in
Table 3. The command register defaults to 00h at power on.
Table 3. Command Register
FIELD BIT DESCRIPTION
CMD 7 Select command register. Must write as 1.
CLEAR 6 Interrupt clear. Clears any pending interrupt. This bit is a write-one-to-clear bit. It is self clearing.
WORD 5 I2C Write/Read Word Protocol. 1 indicates that this I2C transaction is using either the I2C Write Word or
Read Word protocol.
Resv 4 Reserved. Write as 0.
ADDRESS 3:0 Register Address. This field selects the specific control or status register for following write and read
commands according to Table 2.
7 6 5 4 3 2 1 0
Oh Resv Resv Resv Resv Resv Resv POWER CONTROL
Reset Value: 0 0 0 0 0 0 0 0
Control Register (0h)
The CONTROL register contains two bits and is primarily used to power the APDS-9301 device up and down as shown
in Table 4.
Table 4. Control Re gister
FIELD BIT DESCRIPTION
Resv 7:2 Reserved. Write as 0.
POWER 1:0 Power up/power down. By writing a 03h to this register, the device is powered up. By writing a 00h to
this register, the device is powered down.
NOTE: If a value of 03h is written, the value returned during a read cycle will be 03h. This feature can be used to
verify that the device is communicating properly.
10. 10
7 6 5 4 3 2 1 0
1hr Resv Resv Resv GAIN MANUAL Resv INTEG TIMING
Reset Value: 0 0 0 0 0 0 1 0
Timing Register (1h)
The TIMING register controls both the integration time and the gain of the ADC channels. A common set of control bits
is provided that controls both ADC channels. The TIMING register defaults to 02h at power on.
Table 5.Timing Register
FIELD BIT DESCRIPTION
Resv 7-5 Reserved. Write as 0.
GAIN 4 Switches gain between low gain and high gain modes. Writing a 0 selects low gain (1x); writing a 1
selects high gain (16x).
MANUAL 3 Manual timing control. Writing a 1 begins an integration cycle. Writing a 0 stops an integration cycle.
NOTE: This field only has meaning when INTEG = 11. It is ignored at all other times.
Resv 2 Reserved. Write as 0.
INTEG 1:0 Integrate time. This field selects the integration time for each conversion.
Integration time is dependent on the INTEG FIELD VALUE and the internal clock frequency. Nominal integration times
and respective scaling between integration times scale proportionally as shown in Table 6. See Note 5 and Note 6 on
page 5 for detailed information regarding how the scale values were obtained.
Table 6. IntegrationTime
INTEG FIELDVALUE SCALE NOMINAL INTEGRATIONTIME
00 0.034 13.7 ms
01 0.252 101 ms
10 1 402 ms
11 – N/A
The manual timing control feature is used to manually start and stop the integration time period. If a particular integra-
tion time period is required that is not listed in Table 6, then this feature can be used. For example, the manual timing
control can be used to synchronize the APDS-9301 device with an external light source (e.g. LED). A start command to
begin integration can be initiated by writing a 1 to this bit field. Correspondingly, the integration can be stopped by
simply writing a 0 to the same bit field.
11. 11
Interrupt Threshold Register (2h - 5h)
Theinterruptthresholdregistersstorethevaluestobeusedasthehighandlowtriggerpointsforthecomparisonfunction
for interrupt generation. If the value generated by channel 0 crosses below or is equal to the low threshold specified, an
interrupt is asserted on the interrupt pin. If the value generated by channel 0 crosses above the high threshold specified,
an interrupt is asserted on the interrupt pin. RegistersTHRESHLOWLOW andTHRESHLOWHIGH provide the low byte and
high byte, respectively, of the lower interrupt threshold. Registers THRESHHIGHLOW and THRESHHIGHHIGH provide the
low and high bytes, respectively, of the upper interrupt threshold. The high and low bytes from each set of registers are
combined to form a 16–bit threshold value. The interrupt threshold registers default to 00h on power up.
Table 7. InterruptThreshold Register
REGISTER ADDRESS BITS DESCRIPTION
THRESHLOWLOW 2h 7:0 ADC channel 0 lower byte of the low threshold
THRESHLOWHIGH 3h 7:0 ADC channel 0 upper byte of the low threshold
THRESHHIGHLOW 4h 7:0 ADC channel 0 lower byte of the high threshold
THRESHHIGHHIGH 5h 7:0 ADC channel 0 upper byte of the high threshold
NOTE: Since two 8-bit values are combined for a single 16-bit value for each of the high and low interrupt thresholds, the Send Byte protocol should
not be used to write to these registers. Any values transferred by the Send Byte protocol with the MSB set would be interpreted as the COMMAND field
and stored as an address for subsequent read/write operations and not as the interrupt threshold information as desired. The Write Word protocol
should be used to write byte-paired registers. For example, theTHRESHLOWLOW andTHRESHLOWHIGH registers (as well as theTHRESHHIGHLOW and
THRESHHIGHHIGH registers) can be written together to set the 16–bit ADC value in a single transaction.
7 6 5 4 3 2 1 0
6h Resv Resv INTR PERSIST INTERRUPT
Reset Value: 0 0 0 0 0 0 0 0
Interrupt Control Register (6h)
The INTERRUPT register controls the extensive interrupt capabilities of the APDS-9301. The APDS-9301 permits tradi-
tional level-style interrupts. The interrupt persist bit field (PERSIST) provides control over when interrupts occur. A value
of 0 causes an interrupt to occur after every integration cycle regardless of the threshold settings. A value of 1 results
in an interrupt after one integration time period outside the threshold window. A value of N (where N is 2 through 15)
results in an interrupt only if the value remains outside the threshold window for N consecutive integration cycles. For
example, if N is equal to 10 and the integration time is 402 ms, then the total time is approximately 4 seconds.
When a level Interrupt is selected, an interrupt is generated whenever the last conversion results in a value outside
of the programmed threshold window. The interrupt is active-low and remains asserted until cleared by writing the
COMMAND register with the CLEAR bit set.
NOTE: Interrupts are based on the value of Channel 0 only.
Table 8. Interrupt Control Register
FIELD BITS DESCRIPTION
Resv 7:6 Reserved. Write as 0.
INTR 5:4 INTR Control Select. This field determines mode of interrupt logic according to Table 9, below.
PERSIST 3:0 Interrupt persistence. Controls rate of interrupts to the host processor as shown in Table 10, below.
12. 12
Table 9. Interrupt Control Select
INTR FIELDVALUE READVALUE
00 Level Interrupt output disabled
01 Level Interrupt output enabled
Table 10. Interrupt Persistence Select
PERSIST FIELDVALUE INTERRUPT PERSIST FUNCTION
0000 Every ADC cycle generates interrupt
0001 Any value outside of threshold range
0010 2 integration time periods out of range
0011 3 integration time periods out of range
0100 4 integration time periods out of range
0101 5 integration time periods out of range
0110 6 integration time periods out of range
0111 7 integration time periods out of range
1000 8 integration time periods out of range
1001 9 integration time periods out of range
1010 10 integration time periods out of range
1011 11 integration time periods out of range
1100 12 integration time periods out of range
1101 13 integration time periods out of range
1110 14 integration time periods out of range
1111 15 integration time periods out of range
7 6 5 4 3 2 1 0
Ah 0 1 0 1 REVNO ID
Reset Value: – – – – – – – –
ID Register (Ah)
The ID register provides the value for both the part number and silicon revision number for that part number. It is a
read-only register, whose value never changes.
Table 11. ID Register
FIELD BITS DESCRIPTION
PARTNO 7:4 Part Number Identification
REVNO 3:0 Revision number identification
13. 13
ADC Channel Data Registers (Ch - Fh)
The ADC channel data are expressed as 16-bit values spread across two registers. The ADC channel 0 data registers,
DATA0LOW and DATA0HIGH provide the lower and upper bytes, respectively, of the ADC value of channel 0. Registers
DATA1LOW and DATA1HIGH provide the lower and upper bytes, respectively, of the ADC value of channel 1. All channel
data registers are read-only and default to 00h on power up.
Table 12. ADC Channel Data Registers
REGISTER ADDRESS BITS DESCRIPTION
DATA0LOW Ch 7:0 ADC channel 0 lower byte
DATA0HIGH Dh 7:0 ADC channel 0 upper byte
DATA1LOW Eh 7:0 ADC channel 1 lower byte
DATA1HIGH Fh 7:0 ADC channel 1 upper byte
The upper byte data registers can only be read following a read to the corresponding lower byte register. When the
lower byte register is read, the upper eight bits are strobed into a shadow register, which is read by a subsequent read
to the upper byte. The upper register will read the correct value even if additional ADC integration cycles end between
the reading of the lower and upper registers.
NOTE: The Read Word protocol can be used to read byte-paired registers. For example, the DATA0LOW and DATA0HIGH registers (as well as the
DATA1LOW and DATA1HIGH registers) may be read together to obtain the 16-bit ADC value in a single transaction
14. 14
APDS-9301 Package Outline
Notes:
All dimensions are in millimeters. Dimension tolerance is ±0.2 mm unless otherwise stated
PCB Pad Layout
The suggested PCB layout is given below:
Notes:
All linear dimensions are in millimeters.
Pin 1 Marker
6
1
3
45
2
Pin 1 : Vdd
Pin 2 : GND
Pin 3 : ADR SEL
Pin 4 : SCL
Pin 5 : SDA
Pin 6 : INT
Coplanarity±0.1
0.55±0.1
2 X 0.6±0.05
4 X 0.35±0.15
0.35±0.15
0.35±0.15
0.70
1.05
6 X 0.65±0.15
0.18 2.60±0.1
0.1
6 X R0.18
3.00°
0.25±0.15 0.25±0.15
2.20±0.1
16. 16
UNITS IN A SEALED
MOISTURE-PROOF PACKAGE
ENVIRONMENT
LESS THAN 30°C
AND LESS THAN
60% RH
PACKAGE IS OPENED
(UNSEALED)
PACKAGE IS
OPENED LESS
THAN 168 HOURS
NO BAKING IS
NECESSARY
PERFORM RECOMMENDED
BAKING CONDITIONS
YES
YES
NO
NO
BAKING CONDITIONS CHART
Moisture Proof Packaging Chart
All APDS-9301 options are shipped in moisture proof package. Once opened, moisture absorption begins.
This part is compliant to JEDEC Level 3.
Recommended Storage Conditions
Storage Temperature 10°C to 30°C
Relative Humidity Below 60% RH
Time from Unsealing to Soldering
After removal from the bag, the parts should be soldered
within seven days if stored at the recommended storage
conditions. When MBB (Moisture Barrier Bag) is opened
and the parts are exposed to the recommended storage
conditions more than seven days the parts must be baked
before reflow to prevent damage to the parts.
Baking Conditions
If the parts are not stored per the recommended storage
conditions they must be baked before reflow to prevent
damage to the parts.
Package Temp. Time
In Reels 60°C 48 hours
In Bulk 100°C 4 hours
Note: Baking should only be done once.
17. 17
Recommended Reflow Profile
50 100 300150 200 250
t-TIME
(SECONDS)
25
80
120
150
180
200
230
255
0
T-TEMPERATURE(°C)
R1
R2
R3 R4
R5
217
MAX 260C
60 sec to 90 sec
Above 217 C
P1
HEAT
UP
P2
SOLDER PASTE DRY
P3
SOLDER
REFLOW
P4
COOL DOWN
The reflow profile is a straight-line representation of
a nominal temperature profile for a convective reflow
solder process. The temperature profile is divided into
four process zones, each with different ∆T/∆time tem-
perature change rates or duration. The ∆T/∆time rates or
duration are detailed in the above table.The temperatures
are measured at the component to printed circuit board
connections.
In process zone P1, the PC board and component pins are
heated to a temperature of 150°C to activate the flux in the
solder paste. The temperature ramp up rate, R1, is limited
to 3°C per second to allow for even heating of both the PC
board and component pins.
Process zone P2 should be of sufficient time duration (100
to 180 seconds) to dry the solder paste. The temperature
is raised to a level just below the liquidus point of the
solder.
Process zone P3 is the solder reflow zone. In zone P3, the
temperature is quickly raised above the liquidus point
of solder to 260°C (500°F) for optimum results. The dwell
time above the liquidus point of solder should be between
60 and 90 seconds. This is to assure proper coalescing of
the solder paste into liquid solder and the formation of
good solder connections. Beyond the recommended
dwell time the intermetallic growth within the solder con-
nections becomes excessive, resulting in the formation of
weak and unreliable connections.The temperature is then
rapidly reduced to a point below the solidus temperature
of the solder to allow the solder within the connections to
freeze solid.
Process zone P4 is the cool down after solder freeze. The
cool down rate, R5, from the liquidus point of the solder to
25°C (77°F) should not exceed 6°C per second maximum.
This limitation is necessary to allow the PC board and
component pins to change dimensions evenly, putting
minimal stresses on the component.
It is recommended to perform reflow soldering no more
than twice.
Process Zone Symbol ∆T
Maximum ∆T/∆time
or Duration
Heat Up P1, R1 25°C to 150°C 3°C/s
Solder Paste Dry P2, R2 150°C to 200°C 100s to 180s
Solder Reflow P3, R3
P3, R4
200°C to 260°C
260°C to 200°C
3°C/s
-6°C/s
Cool Down P4, R5 200°C to 25°C -6°C/s
Time maintained above liquidus point, 217°C > 217°C 60s to 120s
Peak Temperature 260°C –
Time within 5°C of actual Peak Temperature – 20s to 40s
Time 25°C to Peak Temperature 25°C to 260°C 8mins
18. 18
Appendix A: Window Design Guide
A1: Optical Window Dimensions
To ensure that the performance of the APDS-9301 will not
be affected by improper window design, there are some
criteria requested on the dimensions and design of the
window. There is a constraint on the minimum size of the
window, which is placed in front of the photo light sensor,
so that it will not affect the angular response of the APDS-
9301. This minimum dimension that is recommended will
ensure at least a ±35° light reception cone.
If a smaller window is required, a light pipe or light guide
can be used. A light pipe or light guide is a cylindrical piece
of transparent plastic, which makes use of total internal
reflection to focus the light.
The thickness of the window should be kept as minimum
as possible because there is a loss of power in every optical
window of about 8% due to reflection (4% on each side)
and an additional loss of energy in the plastic material.
Figure A1 illustrates the two types of window that we
have recommended which could either be a flat window
or a flat window with light pipe.
Figure A1. RecommendedWindow Design
Table A1 and Figure A2 show the recommended dimen-
sions of the window. These dimension values are based
on a window thickness of 1.0mm with a refractive index
1.585.
The window should be placed directly on top of the light
sensitive area of APDS-9301 (see Figure A3) to achieve
better performance. If a flat window with a light pipe is
used, dimension D2 should be 1.55mm to optimize the
performance of APDS-9301.
Figure A2. RecommendedWindow Dimensions
WD: Working Distance between window front panel &
APDS-9301
D1: Window Diameter
T: Thickness
L: Length of Light Pipe
D2: Light Pipe Diameter
Z: Distance between window rear panel and
APDS-9301
All dimensions are in mm
Z
L
T
D1
Top View
APDS-9301
Photo Light Sensor
WD D2 D1
D2
19. 19
Figure A3. APDS-9301 Light Sensitive Area
Notes:
1. All dimensions are in millimeters
2. All package dimension tolerance in ± 0.2mm unless otherwise specified
A2: Optical Window Material
The material of the window is recommended to be poly-
carbonate. The surface finish of the plastic should be
smooth, without any texture.
The recommended plastic material for use as a window is
available from Bayer AG and Bayer Antwerp N. V. (Europe),
Bayer Corp. (USA) and Bayer Polymers Co., Ltd. (Thailand),
as shown in Table A2.
Table A2. Recommended Plastic Materials
Material number
Visible light
transmission Refractive index
Makrolon LQ2647 87% 1.587
Makrolon LQ3147 87% 1.587
Makrolon LQ3187 85% 1.587
Table A1. Recommended dimension for optical window
WD
(T+L+Z)
FlatWindow
(L = 0.0 mm,T = 1.0 mm)
Flat window with Light Pipe
(D2 = 1.55mm, Z = 0.5mm,T = 1.0mm)
Z D1 D1 L
1.5 0.5 2.25 – –
2.0 1.0 3.25 – –
2.5 1.5 4.25 – –
3.0 2.0 5.00 2.5 1.5
6.0 5.0 8.50 2.5 4.5
Pin 1 Marker
6
1
3
45
2
1.0500
1.3001
2.60
1.50
2.20
Active area