This document summarizes research on developing autonomous experimental systems for materials characterization and phase diagram mapping. Key points discussed include: - Using active clustering algorithms and Gaussian process classification to analyze x-ray diffraction data and autonomously map phase diagrams without human labeling or supervision. - Developing infrastructure for autonomous experiments involving autonomous data analysis, selection of new experimental conditions based on analysis, and control of experimental equipment to acquire new data. - Demonstrating this approach on systems like VNbO2 and VWO2 to map phase diagrams and metal-insulator transition temperatures as a function of composition and temperature.