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Device Modeling Report



    COMPONENTS: MOSFET (Model Parameter)
    PART NUMBER: 2SJ537
    MANUFACTURER: TOSHIBA
    Body Diode (Standard) / ESD Protection




                        Bee Technologies Inc.

.

          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL PARAMETERS

  PSpice
  model                            Model description
parameters
  LEVEL
     L       Channel Length
    W        Channel Width
    KP       Transconductance
    RS       Source Ohmic Resistance
    RD       Ohmic Drain Resistance
   VTO       Zero-bias Threshold Voltage
   RDS       Drain-Source Shunt Resistance
   TOX       Gate Oxide Thickness
  CGSO       Zero-bias Gate-Source Capacitance
  CGDO       Zero-bias Gate-Drain Capacitance
   CBD       Zero-bias Bulk-Drain Junction Capacitance
    MJ       Bulk Junction Grading Coefficient
    PB       Bulk Junction Potential
    FC       Bulk Junction Forward-bias Capacitance Coefficient
    RG       Gate Ohmic Resistance
    IS       Bulk Junction Saturation Current
     N       Bulk Junction Emission Coefficient
    RB       Bulk Series Resistance
   PHI       Surface Inversion Potential
 GAMMA       Body-effect Parameter
  DELTA      Width effect on Threshold Voltage
   ETA       Static Feedback on Threshold Voltage
  THETA      Mobility Modulation
  KAPPA      Saturation Field Factor
  VMAX       Maximum Drift Velocity of Carriers
    XJ       Metallurgical Junction Depth
    UO       Surface Mobility




        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result



             10
                                Measurement
                                Simulation

              8




              6
   GFS(s)




              4




              2




              0
                  0         1       2       3          4            5        6
                                   DRIAN CURRENT - ID (A)




Comparison table

                                        Gfs(S)
            Id(A)                                                       Error(%)
                          Measurement            Simulation
             -0.200                   0.950                 0.989          4.105
             -0.500                   1.600                 1.556         -2.750
             -1.000                   2.250                 2.180         -3.111
             -2.000                   3.200                 3.059         -4.406
             -5.000                   4.800                 4.746         -1.125




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

    -10A




      -8A




      -6A




      -4A




      -2A




       0A
         0V               -2V        -4V            -6V          -8V           -10V
              I(Vsense)
                                           V_VGS

Evaluation circuit


                                                Vsense




                                           U3
                                           2SJ537




                                                                VDS
                      VGS                                       -10Vdc
              0Vdc




                                      0




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result


                                10
                                           Measurement
                                           Simulation


                                8
       Drain Current - Id (A)




                                6




                                4




                                2




                                0
                                     0        2            4        6          8         10


                                               Gate-Source Voltage - Vgs (V)


Simulation Result


                                                           VGS(V)
                                ID(A)                                              Error (%)
                                           Measurement           Simulation
                                 -0.200                 -2.300          -2.316         0.687
                                 -0.500                 -2.500          -2.552         2.080
                                 -1.000                 -2.800          -2.824         0.857
                                 -2.000                 -3.200          -3.213         0.406
                                 -5.000                 -4.000          -3.996        -0.100
                                -10.000                 -5.020          -4.900        -2.390




                                All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result

   -2.5A




   -2.0A




   -1.0A




      0A
        0V               -100mV            -200mV         -300mV          -400mV
             I(Vsense)
                                           V_VDS



Evaluation circuit

                                                     Vsense



                                  U3




                                  2SJ537
                                                                   VDS
                                                                   0Vdc
             -10Vdc      VGS




                                           0


Simulation Result

           ID=-2.5A, VGS=-10V Measurement               Simulation          Error (%)
                 R DS (on)                 0.160             0.160               0.000
                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation Result

       20V




       15V




       10V




         5V




         0V
              0                         10n                20n                    30n
                   -V(W1:4)
                                              Time*1mA

Evaluation Circuit

                                               U14
                              ION = 0uA
                              IOFF = 1mA

                              W
                                   -                                  D2         I2
                                  +
     I1 = 0         I1                                                          5Adc
     I2 = 1m                  W1                                     Dbreak
     TD = 0
                                               2SJ537
     TR = 10n
     TF = 10n                                                                     VDD
     PW = 600u
     PER = 1000u                                                                  -40Vdc




                                         0



Simulation Result

              VDD=-40V,
                ID= -5A               Measurement       Simulation      Error (%)
              ,VGS=-10V
                  Qgs                    2.500 nC         2.556 nC              2.240
                  Qgd                    5.000 nC         4.962 nC             -0.760
                  Qg                    18.000 nC        13.325 nC            -25.972
                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic



                                                      Measurement
                                                      Simulation




Simulation Result


                            Cbd(pF)
       VDS(V)                                          Error(%)
                    Measurement Simulation
         0.100          400.000           405.000             1.250
         0.200          390.000           392.000             0.513
         0.500          370.000           370.000             0.000
         1.000          310.000           310.000             0.000
         2.000          250.000           250.000             0.000
         5.000          180.000           184.000             2.222
        10.000          140.000           138.000            -1.429
        20.000          112.000           110.000            -1.786
        50.000           73.000            70.000            -4.110




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation Result


      -14V


      -12V


      -10V


       -8V


       -6V


       -4V


       -2V


        0V
    1.923us                  2.000us                   2.100us                2.200us
               V(L3:2)      V(L2:1)/2.5
                                                Time


Evaluation Circuit

                                                       Vsense   L2            RL
                                                                          3

                                                                  50nH        10

                                                       U6


                      R1        L3
                                          2                                              VD
                      4.7       30nH
   V1 = 0                                                                                -25Vdc
   V2 = 20
   TD = 2u                                             2SJ537
   TF = 10n     V1            R2
   TR = 10n
   PW = 10u                    4.7
   PER = 10m


                                                       0




Simulation Result

         ID=-2.5A,
         VDD= -25V,                Measurement              Simulation        Error(%)
         VGS=0/4V
              Td(on)                   35.000   ns           34.869      ns        -0.374

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation Result

  -10A


                            -6
   -8A                      -8

                            -10

   -6A




   -4A
                                                         -4V


   -2A                                                   VGS = - 3 V

                                                             - 2.5V

    0A
      0V            -2V              -4V           -6V         -8V      -10V
           I(Vsense)
                                           V_VDS


Evaluation Circuit


                                              Vsense



                            U3




                                                               VDS
                                                               -10Vdc

                            2SJ537
                   VGS

                  0Vdc




                                      0




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result

100A




 10A




1.0A




100mA
     0V                0.4V             0.8V             1.2V          1.6V
          I(R1)
                                        V_V1


Evaluation Circuit


                                        R1

                                        0.01m
                                                    U6




                              V1
                    0Vdc


                                                    2SJ537




                                                             0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result
                                        100
                                                                                                Measurement
                                                                                                Simulation
        DRAIN REVERSE CURRENT IDR (A)




                                         10




                                          1




                                        0.1
                                              0             0.4              0.8            1.2               1.6
                                                           SOURCE-DRAINE VOLTAGE VSD (V)

Simulation Result

                                                                        VSD(V)
                                              IDR(A)                                               %Error
                                                           Measurement             Simulation
                                                   0.100             0.660               0.665         0.758
                                                   0.200             0.700               0.694        -0.857
                                                   0.500             0.740               0.735        -0.676
                                                   1.000             0.770               0.773         0.390
                                                   2.000             0.830               0.825        -0.602
                                                   5.000             0.930               0.939         0.968
                                                  10.000             1.100               1.099        -0.091




                                              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic (Body Diode)

Circuit Simulation Result

    400mA




       0A




   -400mA
       0.88us     0.96us              1.04us          1.12us      1.20us    1.28us
            I(R1)
                                               Time

Evaluation Circuit


                                         R1


                                               50

                                                                  U8
                   V1 = -9.3V
                   V2 = 10.6V
                   TD = 9n       V1
                   TR = 10ns
                   TF = 5.7ns
                   PW = 1us
                   PER = 50us
                                                                  2SJ537




                                                                  0



Compare Measurement vs. Simulation

                                Measurement                    Simulation            Error (%)
             trj                       33.600         ns               33.939 ns         1.009
            trb                        24.500         ns               23.276 ns        -4.996
            trr                        58.400         ns               57.215 ns        -2.029



               All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic (Body Diode)                                Reference




Trj= (33.6ns)
Trb= (58.4ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                      Example




                                Relation between trj and trb




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL

Zener Voltage Characteristic
Circuit Simulation Result


 10mA

  9mA

  8mA

  7mA

  6mA

  5mA

  4mA

  3mA

  2mA

  1mA

   0A
     0V      5V      10V        15V        20V       25V      30V        35V   40V   45V 50V
          I(R1)
                                                     V_V1


Evaluation Circuit


                                      R1


                                      0.01m

                                                       U20




                                                       2SJ537
                           V1
                    0Vdc

                                                                    I1
                                                           0Adc




                                                 0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                         Reference




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of 2SJ537 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: MOSFET (Model Parameter) PART NUMBER: 2SJ537 MANUFACTURER: TOSHIBA Body Diode (Standard) / ESD Protection Bee Technologies Inc. . All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PARAMETERS PSpice model Model description parameters LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic Circuit Simulation Result 10 Measurement Simulation 8 6 GFS(s) 4 2 0 0 1 2 3 4 5 6 DRIAN CURRENT - ID (A) Comparison table Gfs(S) Id(A) Error(%) Measurement Simulation -0.200 0.950 0.989 4.105 -0.500 1.600 1.556 -2.750 -1.000 2.250 2.180 -3.111 -2.000 3.200 3.059 -4.406 -5.000 4.800 4.746 -1.125 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristic Circuit Simulation result -10A -8A -6A -4A -2A 0A 0V -2V -4V -6V -8V -10V I(Vsense) V_VGS Evaluation circuit Vsense U3 2SJ537 VDS VGS -10Vdc 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 10 Measurement Simulation 8 Drain Current - Id (A) 6 4 2 0 0 2 4 6 8 10 Gate-Source Voltage - Vgs (V) Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation -0.200 -2.300 -2.316 0.687 -0.500 -2.500 -2.552 2.080 -1.000 -2.800 -2.824 0.857 -2.000 -3.200 -3.213 0.406 -5.000 -4.000 -3.996 -0.100 -10.000 -5.020 -4.900 -2.390 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Rds(on) Characteristic Circuit Simulation result -2.5A -2.0A -1.0A 0A 0V -100mV -200mV -300mV -400mV I(Vsense) V_VDS Evaluation circuit Vsense U3 2SJ537 VDS 0Vdc -10Vdc VGS 0 Simulation Result ID=-2.5A, VGS=-10V Measurement Simulation Error (%) R DS (on) 0.160  0.160  0.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation Result 20V 15V 10V 5V 0V 0 10n 20n 30n -V(W1:4) Time*1mA Evaluation Circuit U14 ION = 0uA IOFF = 1mA W - D2 I2 + I1 = 0 I1 5Adc I2 = 1m W1 Dbreak TD = 0 2SJ537 TR = 10n TF = 10n VDD PW = 600u PER = 1000u -40Vdc 0 Simulation Result VDD=-40V, ID= -5A Measurement Simulation Error (%) ,VGS=-10V Qgs 2.500 nC 2.556 nC 2.240 Qgd 5.000 nC 4.962 nC -0.760 Qg 18.000 nC 13.325 nC -25.972 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.100 400.000 405.000 1.250 0.200 390.000 392.000 0.513 0.500 370.000 370.000 0.000 1.000 310.000 310.000 0.000 2.000 250.000 250.000 0.000 5.000 180.000 184.000 2.222 10.000 140.000 138.000 -1.429 20.000 112.000 110.000 -1.786 50.000 73.000 70.000 -4.110 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation Result -14V -12V -10V -8V -6V -4V -2V 0V 1.923us 2.000us 2.100us 2.200us V(L3:2) V(L2:1)/2.5 Time Evaluation Circuit Vsense L2 RL 3 50nH 10 U6 R1 L3 2 VD 4.7 30nH V1 = 0 -25Vdc V2 = 20 TD = 2u 2SJ537 TF = 10n V1 R2 TR = 10n PW = 10u 4.7 PER = 10m 0 Simulation Result ID=-2.5A, VDD= -25V, Measurement Simulation Error(%) VGS=0/4V Td(on) 35.000 ns 34.869 ns -0.374 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation Result -10A -6 -8A -8 -10 -6A -4A -4V -2A VGS = - 3 V - 2.5V 0A 0V -2V -4V -6V -8V -10V I(Vsense) V_VDS Evaluation Circuit Vsense U3 VDS -10Vdc 2SJ537 VGS 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 0V 0.4V 0.8V 1.2V 1.6V I(R1) V_V1 Evaluation Circuit R1 0.01m U6 V1 0Vdc 2SJ537 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 100 Measurement Simulation DRAIN REVERSE CURRENT IDR (A) 10 1 0.1 0 0.4 0.8 1.2 1.6 SOURCE-DRAINE VOLTAGE VSD (V) Simulation Result VSD(V) IDR(A) %Error Measurement Simulation 0.100 0.660 0.665 0.758 0.200 0.700 0.694 -0.857 0.500 0.740 0.735 -0.676 1.000 0.770 0.773 0.390 2.000 0.830 0.825 -0.602 5.000 0.930 0.939 0.968 10.000 1.100 1.099 -0.091 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Reverse Recovery Characteristic (Body Diode) Circuit Simulation Result 400mA 0A -400mA 0.88us 0.96us 1.04us 1.12us 1.20us 1.28us I(R1) Time Evaluation Circuit R1 50 U8 V1 = -9.3V V2 = 10.6V TD = 9n V1 TR = 10ns TF = 5.7ns PW = 1us PER = 50us 2SJ537 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj 33.600 ns 33.939 ns 1.009 trb 24.500 ns 23.276 ns -4.996 trr 58.400 ns 57.215 ns -2.029 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic (Body Diode) Reference Trj= (33.6ns) Trb= (58.4ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m U20 2SJ537 V1 0Vdc I1 0Adc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006