2. UNIT IV MATERIAL CHARACTERIZATION TESTING
1. Macroscopic observations
2. Microscopic observations
3. Optical microscopy
4. Electron microscopy (SEM)
5. Electron microscopy (TEM)
6. Diffraction techniques,
7. Spectroscopic Techniques,
8. Electrical Techniques
9. Magnetic Techniques
Principles, Types, Advantages and Limitations, Applications.
3. X-ray diffraction analysis (XRD) is a technique used in materials
science to determine the crystallographic structure of a
material.
XRD works by irradiating a material with incident X-rays and
then measuring the intensities and scattering angles of the X-
rays that leave the material
A primary use of XRD analysis is the identification of materials
based on their diffraction pattern.
As well as phase identification, XRD also yields information on
how the actual structure deviates from the ideal one, owing to
internal stresses and defects
4. XRD IS A NON-DESTRUCTIVE TECHNIQUE USED TO:
• Determine structural properties:
- Strain
- Phase composition
- Preferred orientation
• Measure thickness of thin films and multi-layers
• Determine atomic arrangement
Measure the average spacings between layers or rows of atoms
Determine the orientation of a single crystal or grain
Find the crystal structure of an unknown material
Measure the size, shape and internal stress of small crystalline
regions