This document discusses three standard ASTM methods for measuring grain size: the comparison method, planimetric/Jeffries' method, and intercept method. The comparison method involves comparing a grain structure to graded images or overlays at 10x magnification, with a repeatability of ±1 grain size number. The planimetric method counts grains within a known area at higher magnifications from 100-500x, achieving ±0.25 grain size units precision. The intercept method counts the number of grains intercepted by a test line, allowing measurement of elongated grains faster than the planimetric method at the same precision of ±0.5 grain size units.