This document provides a summary of simulation results for the electrical characteristics of a Toshiba TK65E10N1 MOSFET device, including: - Transconductance characteristics showing less than 1% error between measured and simulated values. - Vgs-Id, output, and Rds(on) characteristics with errors under 2%. - Gate charge, switching time, and body diode characteristics within 2% of measurements. - Reverse recovery characteristics of the body diode matching measurements to within 0.5% error.