The document lists extensive certifications, coursework, and training in quality assurance, reliability engineering, testing, failure analysis, and statistical methodologies from various educational institutions and companies. It also covers hardware, tools, and software training for verification, validation, qualification, reliability testing, failure analysis, and diagnostic evaluation of electronic, mechanical, and manufacturing systems. The broad training background provides skills in quality control, data analytics, product testing and troubleshooting.

1. CERTIFICATIONS COURSES CREDITS LICENSURES & PROFESSIONAL-SKILLS TRAINING
QA / RELIABILITY / TEST / FAILURE-ANALYSIS, STATISTICS, METHODOLOGIES, SPECIFICATIONS & TECHNICAL TRAINING
♦ 5s: Organizing Shared Workspace: Seiri, Seiton, Seisō, Seiketsu & Shitsuke [LM Trained]
♦ Advanced Probability / Statistics; Analysis of Variance (ANOVA) [NJIT Edu]
♦ Analysis/Design of Dynamic Nano/MEMS Systems [NJIT Edu, HP Trained]
♦ Analysis/Design of Electromechanical Assembles/Systems/Networks [NJIT Edu, HP Trained]
♦ ANSI Y14.5M: Geometric Dimensioning & Tolerancing (GD&T) [HP Trained]
♦ DATA-ANALYTICS / DATA-MINING: Correlation Techniques; Factorial & Time Series Analysis; Excel, JMP, MathCAD, Mathematica, MS-Access / Info-Access, Tableau [NJIT, IBM, HP,
Agilent, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ DMAIC(R): Define, Measure, Analyze, Implement & Control (Realize) [NJIT Edu]
♦ DOE: Design of Experiments; Statistical Sampling Theory; Accelerated LIFE Test [NJIT Edu, HP, MicroJet Trained]
♦ FAILURE-ANALYSIS: QA / ReliabilityTests; Instruments; Inspection;Characterization& Diagnostics Equipment for Failure-Analysisof Products: Sample Preparation; Cross-Sectioning; Dye & Pry;
Red-Dye PenetrationTest; Air/BubbleHe+ LeakTest; Battery Analyzer;Characterization; Chemical Detection & Surface ChemistryAnalysis; Environmental Chambers; IR & Thermal Cameras;
Microscopes; Oscilloscopes;Power Analyzer; ProbingStation;SolderingStation; SpectrumAnalyzer; Thermal Couples; etc.; … Triage / Debug / Troubleshoot / Root-Cause / Reproduce /
Autopsy / Forensic-Analysis / Reports with Corrective-Actions & Conclusions [Agilent, HP, MicroJet, Pro-Data Trained]
♦ FISHBONE ANALYSIS: Cause & Effect Analysis (Ishikawa Diagram) [NJIT Edu]
♦ FIT: Failure in Time Rate – (FIT to MIL-HDBK-217F) [Agilent, HP & Lockheed Trained]
♦ GAGE R&R (“Repeatability & Reproducibility” = “Precision & Accuracy”) [NJIT Edu]
♦ LM21: Lockheed Martin’s Quality Assurance Program [Lockheed-Martin Trained]
♦ MTBF: Mean Time Between Failures; Failure Rate; Bathtub Curve [Agilent, HP & LM Trained]
♦ PATENTS: Creation, Filing & Prosecution activities [HP; NJIT Edu]
♦ PDCA: Plan, Do, Check, Act; Kaizen Methods; Taguchi Methods [NJIT Edu]
♦ PROCESS CONTROL: Gage R&R; X-Bar; R-Bar; Cp / Cpk; ±3σ(6 -sigma) [NJIT Edu, HP, MicroJet Trained]
♦ PROJECT MANAGEMENT CHARTS: Gantt; PERT (Network Diagram); WBS: Work Breakdown Structure; Pareto; Process Control; Cause & Effect (Ishikawa); Stakeholder Analysis Matrix;
Responsibility Assignment Matrix (RACI) [Pro-Data Trained]
♦ QUALITY: Verify Validate Qualify Commission; URS: User Requirement Specs: DQ IQ OQ PQ MQ CQ [HP, Agilent Trained]
♦ REGULATORY LABS: UL NIST NRTL NSF-Intl. [HP, Agilent, Lockheed & Pro-Data Trained]
♦ RELIABILITY: Weibull, Pareto, Gaussian, Trend / Control Charts, Cp / Cpk Charts, 6M, 5Y, etc. [NJIT Edu. HP, Agilent, MicroJet, Pro-Data Trained]
♦ Root-Cause (Fall Out) Analyses / Fault Tree Analyses / Post-Partum Analyses [NJIT Edu]
♦ Stage-Gate: Product Development Cycle [HP Trained]
♦ STANDARDS: ANSI ASTM CE EN IEC IEEE ISO JEDEC MIL-SPEC MIL-STD [HP, Agilent, LM, Pro-Data Trained]
♦ Statistical Principals in Experimental Design: Statistical Models, Test Plans,Test Designs, Test Execution/Management, Data Collection/Analysis [HP, Agilent, Lockheed-Martin, MicroJet,
Pro-Data Trained]
HARDWARE / TOOLS FOR: “VERIFICATION / VALIDATION / QUALIFICATION” VIA “RELIABILITY / QUALITY / TEST / ROOT-
CAUSE ANALYSIS / FAILURE-ANALYSIS / FORENSIC-ANALYSIS & ANALYTICAL-DIAGNOSTICS” TRAINING
General & special purpose: manufacturing, electronic, electro-mechanical, mechanical & environmental test equipment & solutions for analysis, characterization, inspection, measurement,
monitoring, simulation, powering, certifying & commissioning of electro-mechanical, data center, smart mobile, wearable devices, aerospace flight hardware & semi-conductor products &
infrastructure . . . . .
♦ Chemical Detection / Surface Chemistry Analysis (of Organictrace compound molecules & thin-film materials): AES: Aüger Electron Spectroscopy; AFM: AtomicForce Microscopy; CT-
Scan: ComputedTomographyScan; EDS(EDX):Energy-Dispersive X-RaySpectroscopy; ERD: ElasticRecoil Detection; ESCA=XPS: X-Ray Photoelectron/ PhotoemissionSpectroscopy; FTIR:
Fourier Transform InfraRedSpectroscopy; MRI: MagneticResonanceImaging; OP:Optical Profilometry; OES: Optical EmissionSpectrometry; OSM: Optical ShearingMicroscopy; RAMAN:
Raman micro-Spectroscopy; RBS:Rutherford Backscattering Spectroscopy; SEM:Scanning ElectronMicroscopy; SIMS:Secondary IonMassSpectrometry; SONOSCAN:Scanning Acoustic
Microscopy; TEM:TransmissionElectron-Microscopy; ULP:UniScanLaser Profileometry; UV-Vis:Ultraviolet-VisibleSpectroscopy& VisibleSpectrophotometry; XMA: Electron-probe X-Ray
Micro-Analysis; X-RayImagingScan; Alpha Stepper Stylus Profileometer; Contact Angle Meter (measures surface energy& surface tension); Ellipsometer; Ellipsometry; Standard Optical
Microscopes & Digital Microscopes; etc. [IBM, NJIT Edu, HP , Agilent, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ HARDWARE MECHANICAL TESTS, ENVIRONMENTAL TESTS & WEATHER / CLIMATIC TESTS: Abrasion / Shock / Drop / Tumble / 3-axis Vibration; Accelerated LIFE Test (using the Temperature-
Humidity Model & Arrhenius Model); Acoustic / Tomography / Emission/ Ultrasonic (NDT) Non-Destructive / ball-chain impact Tests of Plastics / Ceramics / Metal-Chassis-Frames /
Enclosures; Air/Bubble Helium(He+) Leak Test; Archival Aging Test; Burn-In of PCB boards Test; Calibration Procedures; Corrosion / Dust / Rain / Salt-Fog Test Chamber; Data
Acquisition Systems; Electric-Magnetic Fields Test; EMI/EMC Test Chamber; Environmental Stress Screening (ESS) Chamber for Pressure / Altitude / Temperature / %R.H.;
Environmental Test Chambers; FaradayCage; Hardware Testers: Schlumberger Analog / Digital / MixedSignal (PCB) Tester & Teradyne L321 / L323 UUT (PCB) Tester; HP / Agilent /
DITMCO: COTS / GOTS / STE Test Consoles; IR & UV Aging Test Chamber & HALT / HASS Chamber … for HALT (Highly Accelerated Life Tests) Testing & HASSTM (Highly Accelerated
Stress Screens) Tests; Liquid Ingress Test; Mass Properties Test; Red-Dye Penetration Test; Space Simulation Test; Static / Dynamic Load Test; Strain Guages; Thermal Couples;
Thermal-Vacuum / Thermal-Cycle / Thermal-Shock Tests; etc. [NJIT Edu, IBM, HP, Agilent, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ HP 3D STRUCTURED-LIGHT™ LASER-SCANNING: with the HP 3D Z-Camera-Light / Structured Light™ Laser Scanner Pro-S3. [HP & Agilent Trained]
♦ HP MULTI-JET-FUSION™AND METALJET™ 3DPRINTING: Rapid Prototyping via Digital Additive Mfg. using ThermoPlastic Polyurethane (TPU) copolymer powders, CarbonFiber (CF), Glass Fiber
(GF), Polyamide (PA), PolyEthylene Terephthalate (PET); or, Rapid Prototyping via Digital Additive Mfg. using anHP BindingAgent to a Metal Injection Molding (MIM) powdered metal
bed [HP, Agilent, MicroJet, Pro-Data Trained]
♦ MACHINE TOOLS FOR INDUSTRIAL FABRICATION, ADVANCED MANUFACTURING &MACHINING FOR PROTOTYPING &TESTING: CNC Lathe; Drill & Tap press; Gear shaper; Grinding; Hobbing; Hone;
Laser-Ablation & Laser-Cutting; Milling; Planer; Saws; Screw; Shaper; Shear; etc. [NJIT Edu, IBM, HP, Agilent, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ MANUFACTURING HARDWARE CAPITAL EQUIPMENT: 6-axis Robots; Altino intelligence Robot Car (SAEON); Arduino-IDE/C/C++/Python coding of Robots; Automated Mfg. Tester Robots;
Cold rolling of Al / Cu / Steel; Curing Equipment; Diamond Saw; Dispensing; ESD Control; Excimer Laser-Ablation & Laser-Cutting; Extreme High-Volume Mfg.; He+ Leak Check;
Lamination; Manual Assembly Mfg.; Packaging; Pick-&-Place Surface-Mount PCB Mfg. Robots; Plastic Injection Molding; PLCs; Raspberry-Pi; Reflow/Rework/Repair equipment;
Rotating Machinery (gear boxes, actuators, pneumatics, hydraulic sensors); SCARA Robots; Surface Finish/Coating; T.A.B. Assembly; Walking Beam Assembly; Wave-Solder & Thru-
Hole Mfg.; etc. [IBM, HP, Agilent, MicroJet, Lockheed-Martin, Pro Data Trained]
♦ MECHANICAL METROLOGY / METALLURGICAL / MATERIALS /MACHINING TECHNIQUES: Curve Tracer; Cross-sectioning; Hardness, Tensile & Bend testing; HP-Agilent Linear Interferometers; HP
Dynamic Light-based& HeNe gas Optical Laser measurement-calibration system; HP-Agilent Linear Retroreflector & Optics for opto-mechanical aligning; OES: Optical Emission
Spectrometry; Optical Microscopy; PoDFA: Inclusion Measurement and Quantification Analysis; Sputter Depth Profiling; etc. [NJIT Edu, IBM, HP, Agilent, MicroJet, Pro-Data
Trained]
♦ SEMICONDUCTOR HARDWARE CAPITAL EQUIPMENT: ASML, Applied-Materials, KLA-Tencor, LamResearch, Novellus, Tokyo-Electron, AdvanTest, Perkin-Elmer, Hitachi, Veeco; Nikon, Planar, Dai-
Nippon SCREEN-Semiconductor, Teradyne & Tokyo-Seimitsu… for Semiconductor Processing: (a)Preventionof Contamination & Prevention of Defects; (b) Wafer Preparation; (c)
Wafer Processing: Wet cleans, Photolithography, Gate Oxide,Ionimplantationof Metal layers, Dry Etching; Wet Etching; Plasma Ashing, Thermal treatments , Chemical Vapor Deposition
(CVD), Physical Vapor Deposition (PVD), Molecular Beam Epitaxy(MBE), Electro-Chemical Deposition (ECD)/Electroplating, Chemical-Mechanical Planarization (CMP), Wafer Electrical
Performance Testing, Wafer back-grinding; (d) Wafer Test; (e) Die Preparation: (Wafer mounting; Die DiamondSaw Cutting); (f)Die Interconnect: IC Encapsulation; (g) Device Test;
(h) Device Packaging; (i) I.C. Testing; (j) Hazardous Materials Handling & Disposal. [NJIT Edu, IBM, HP, Agilent, MicroJet, Pro Data Trained]
♦ TEST & MEASUREMENTINSTRUMENTATION –HP/ AGILENT / KEYSIGHT /ANRITSU / AEROFLEX /FLUKE /IFR /JDSU / KEITHLEY / ROHDE-&-SCHWARZ / TEKTRONIX / VIAVI: Arbitrary Waveform Generator;
Battery Analyzer; Break-Out-Box; Cable Tester; Capacitance Meter; Continuous Wave (CW) Counter; Data Acquisition Equipment; Digital & Graphical Strip-Chart Recorders; Digital
Multi-Meter (DMM); Digital Pattern Generator; Digital Volt-Meter (DVM); EMF-Meter; Frequency Analyzer; Frequency Counter; Frequency Synthesizer; Function Generator; Hipot /
Continuity Tester; Infrared (IR) & Thermal ImagingCameras; LCR-Meter; Logic Analyzer; MixedSignal Infinium Oscilloscope; Network Analyzer; Power Analyzer; Power Sensor; Power
Supply; ProbingStation; Pulse / Pattern Generator; RF Power Meter; RF Probe; SamplingScope; Signal Generator; Signal Tracer; SolderingStation; S-Parameter Test Set; Spectrum
Analyzer; Transistor Tester; Wheatstone Bridge; etc. [NJIT Edu, HP, Agilent, MicroJet, Lockheed-Martin, Pro-Data Trained]
SOFTWARE /TOOLS FOR: “DATA-MINING /CODING/SCRIPTING /VERIFICATION/VALIDATION/QUALIFICATION”TRAINING
♦ ADOBE: Acrobat / Editor pro / Creative Suite CS6 [Pro-Data Trained]
♦ APPLE IPHONE: 3GS / 4 / 4S / 5 / 6 / 6S / 7 / 7S / 8 / 8S / 10 / 10S / 11, Apps [NJIT, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ APPLE IWORK: Keynote, Pages, Numbers [NJIT, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ APPLE OS: Mac OSX, iOS, Safari [NJIT, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ AUTOMATED TEST SYSTEMS: HP Quality Center, HP QuickTest Professional, GBIP, VME, cPCI, PXI [NJIT, HP, Agilent, Lockheed-Martin Trained]
♦ CAD 2D/3D: AutoCAD-2000, ANSYS, CADAM / CATIA, Creo Elements/Pro, Creo Parametric, ME30, Pro-Engineer, Solidworks, SDRC I-DEAS, VersaCAD [NJIT edu, IBM, HP,
Agilent, Lockheed-Martin Trained]
♦ CODECS: Audio-Codecs, Video-Codecs
♦ CODING: SQL, Flash, Java, CSS3, PHP, JavaScipt (JQuery), ActionScript, scripts, batch-files & Web-technologies: HTTP, HTML, HTML5, XML, DNS & TCP/IP [NJIT edu, IBM, HP,
Agilent, LM, Pro-Data Trained]

2. ♦ DATA-ANALYTICS / DATA-MINING: Correlation Techniques; Factorial & Time Series Analysis; Excel, JMP, MathCAD, Mathematica, MS-Access / Info-Access, Tableau [NJIT, IBM, HP,
Agilent, MicroJet, Lockheed-Martin, Pro-Data Trained]
♦ FINANCIALS: Quickbooks [Pro-Data Trained]
♦ GOOGLE OS: Android OS 2/3/4/4.2 [Pro-Data Trained]
♦ GOOGLE TOOLS: Apps, Analytics, Chrome [Pro-Data Trained]
♦ HP/MAC: PC/Laptop/Workstation; 3D Printers; 3D-Scanners; InkJet-&-LaserJet Printers/Plotters/Scanners [NJIT, IBM, HP, Agilent, Pro-Data Trained]
♦ MS OFFICE SUITE, SHAREPOINT, PROJECT: Word, Powerpoint, Excel, Visual Basic, macros, pivot tables, data-analytics, data mining [NJIT, IBM, HP, Pro-Data Trained]
♦ RELATIONAL DATABASES: Oracle, Informix, SAP, Teamcenter, EPDM, MySQL, LiveLink, VisualSourceSafe [IBM, HP, Agilent, Lockheed-Martin, Pro-Data Trained]
♦ SOFTWARE FOR TEST STAND CONTROL (OF HW PRODUCTS): APIS IQ-RM (FMEA), Arduino, MATLAB, Simulink, MiniTab, Mathematica, JMP, LabView, Tableau, VXWorks, CVI,
C#/C/C++, Python, UNIX, Linux, X-Windows, LMSTAR [NJIT, IBM, HP, Agilent, Lockheed-Martin, Pro-Data Trained]
♦ WINDOWS: 95 / 98 / NT / 2K / XP / Vista / 7 / 8 / 10; UNIX; LINUX [IBM, HP, Agilent, Lockheed-Martin, Pro-Data Trained]
♦ WIRELESS: Bluetooth, Wi-Fi, Wireless-USB, InfraRed, 802.11, 3G, 4G, 5G [Pro-Data Trained]
STANDARDS TRAINING
♦ ANSI/NEMA C18: Safety Standards for Primary, Secondary & Lithium-Ion Batteries [Lockheed-Martin & Pro-Data Trained]
♦ AS5553/AS6081: Counterfeit Electronic Parts: Avoidance, Detection, Mitigation, & Disposition [Lockheed-Martin Trained]
♦ AS 9100/EN 9100 (Rev.D-2016): QMS: Quality Management System standard model for Quality Assurance in Design, Development, Production, Installation & Servicing for the
Aeronautical/Aviation, Space and Defense industries [Lockheed-Martin Trained]
♦ ASNT TC 1A: Practice, Personnel Qualification & Certification in Non-Destructive Testing [HP Trained]
♦ ASTM D256-10(2018): Standard Test Methods for Determining the Izod Pendulum Impact Resistance of Plastics [HP Trained]
♦ ASTM D638-14: Standard Test Method for Tensile Properties of Plastics [HP Trained]
♦ ASTM D648-18: Standard Test Method for Deflection Temperature of Plastics Under Flexural Load in the Edgewise Position [HP Trained]
♦ ASTM D790-17: Standard Test Method for Flexural Properties of Unreinforced and Reinforced Plastics and Electrical Insulating Materials [HP Trained]
♦ ASTM E566: Practice for Electromagnetic (Eddy-Current) Sorting of Ferrous Metals [Lockheed-Martin Trained]
♦ ASTM F2391-05: Test Method Standard for Measuring Package & Seal Integrity with He+ as Tracer Gas in a Helium Mass Spectrometer [HP Trained]
♦ DoD 3235.1-H: Test & Evaluation of System ‘RAMS’ Reliability, Availability, & Maintainability / Serviceability [Lockheed-Martin Trained]
♦ EMI/EMC: International Regulatory Electro-Magnetic Interference/Compliance (Emissions/Immunity) & Safety Standards Testing [HP & Agilent Technologies Trained]
♦ EN 50130 & EN 61000 & IEC 61000: Electromagnetic Compatibility (EMC) & Environmental Test Methods [Lockheed-Martin Trained]
♦ EN-ISO 9000 & EN 45000: European Quality Assurance Standards [Lockheed-Martin Trained]
♦ ERP: Enterprise Resource Planning / MRP: Materials Requirement Planning / MRP-II: Manufacturing Resource Planning [Pro-Data Trained]
♦ FED STD-209E: Airborne Particulate Cleanliness Classes in Clean Rooms & Clean Zones [HP & Agilent Technologies Trained]
♦ IATA-DGR & ADR: UN3480 – Lithium-Ion battery shipped by themselves (Rechargeable Batteries) [Lockheed-Martin & Pro-Data Trained]
♦ IATA-DGR & ADR: UN3481 – Lithium-Ion battery contained in equipment; or Lithium-Ion batteries packed w/ equipment (Rechargeable Batteries) [LM & Pro-Data Trained]
♦ IEC 60259: Electrotechnology Enclosure Liquid Ingress Testing [HP, Agilent Technologies & Pro-Data Trained]
♦ IEC 60940 & IEC 62132: Electromagnetic Interference (EMI) suppression [Agilent Technologies & Lockheed-Martin Trained]
♦ IEC 61566: Measurement of exposure to radio-frequency Electro-Magnetic Fields – field strength in the frequency range 100 kHz ~ 1 GHz, using the: Biot-Savart law [low
frequency, <106 Hz] & the Hertzian Dipole equations [high frequency, >106 Hz] [Agilent Technologies & Lockheed-Martin Trained]
♦ IEC 62133 / UL 62133: Secondary Cells & Batteries containing Alkaline or other Non-Acid Electrolytes – Safety Requirements for use in Portable Applications [Lockheed-
Martin & Pro-Data Trained]
♦ IEC 62226: Exposure to Electric & Magnetic Fields in the low & intermediate frequency range – Calculating the current density & internal electric field induced in the human body
[Agilent & Lockheed-Martin Trained]
♦ IEC 62233: Measurement methods for Electro-Magnetic Fields with regard to human exposure [Agilent Technologies & Lockheed-Martin Trained]
♦ IEEE 1625-2008: Standard for Rechargeable Batteries in Multi-Cell Mobile Computing Devices [Lockheed-Martin & Pro-Data Trained]
♦ IEEE 1725-2011: Standard for Cellular / Mobile phone Rechargeable Batteries [Lockheed-Martin & Pro-Data Trained]
♦ ISO 05348:1998: Mechanical Vibration & Shock – Mechanical mounting of accelerometers [Lockheed-Martin Trained]
♦ ISO 09000: Quality Mgmt. Systems (Standards) & QA Improvement Plans [HP Trained]
♦ ISO 09001:2015: Quality Management Systems — Requirements (5th Ed.) [Pro-Data Trained]
♦ ISO 10012:2003: Measurement Management Systems -- Requirements for measurement processes & measuring equipment [IBM, Hewlett-Packard, Agilent Technologies,
Lockheed-Martin & Pro-Data Trained]
♦ ISO 14001: Environmental Management Systems (EMS) [Lockheed-Martin Trained]
♦ ISO 14040(2006)/14044(2006): Environmental Management - Life Cycle Assessment - Principles & Framework / Requirements & Guidelines [HP Trained]
♦ ISO 18000 / IEC 18000: Information Technology — Radio Frequency Identification (RFID) for item management
♦ ISO 19011:2011: Guidelines for Auditing Management Systems (AMS) [Lockheed-Martin Trained]
♦ JCGM 100-2008: “Evaluation of Measurement Uncertainty Data” [HP Trained]
♦ MIL Q9858: Quality Program Requirements [Lockheed-Martin Trained]
♦ MIL STD 1629A: Performing Failure Mode, Effects & Criticality Analysis (FMECA) [Lockheed-Martin Trained]
♦ MIL STD 45662: Establish/Maintain Calibration/Quality Procedures to control Accuracy of Test/Measuring Equipment [Lockheed-Martin Trained]
♦ NASA GSFC 431-REF-000370: Performing a FMEA [Lockheed-Martin Trained]
♦ NASA JPL D-5703: Reliability Analysis Handbook [Lockheed-Martin Trained]
♦ NASA PD-ED-1255: Preferred Reliability Practice: Problem Reporting & Corrective Action System (PRACAS) [Lockheed-Martin Trained]
♦ NEMA 250: Environmental Operability Testing of Products with Liquid Ingress [HP Trained]
♦ OHSAS 18001: Occupational Health & Safety Management System [HP Trained]
♦ PMP: Project Management Professional & Global Client Management
♦ SAE J-2929: Electric & Hybrid Vehicle Propulsion Battery System Safety Standard – Lithium-Ion-Based Rechargeable Cells [Lockheed-Martin & Pro-Data Trained]
♦ UL 1642-2015: Standard for Safety of Lithium Batteries [Lockheed-Martin & Pro-Data Trained]
♦ UL 2054: Household & Commercial Batteries [Lockheed-Martin & Pro-Data Trained]
♦ UN/DOT 38.3: UN Transportation Testing for Lithium Cells & Batteries (T1 ~ T8) [Lockheed-Martin & Pro-Data Trained]
CERTIFICATIONS TRAINING
♦ ASQ: Reliability Engineer [CERTIFICATION] ♦ ASQ: Quality Engineer [CERTIFICATION]
♦ NILA: National Institute for Leadership Advancement [CERTIFICATION] ♦ PMP: Project Management Professional [CERTIFICATION]
♦ DESIGN FOR “X” EXCELLENCE: Manufacturability / Reliability / Testability [CERT]♦ SIX SIGMA: Reliable System Design, Manufacturing & Test to Six Sigma (±3) [CERT]
♦ KEPNER-TREGOE: Systematic Failure Analysis /Problem Solving to Root Cause [CERT] ♦ CMMI: Capability Maturity Model Integration (Level 5 – Optimizing) [CERT]
♦ CCNA: CISCO Certified Network Associate [CERTIFICATION] ♦ CCIE: CISCO Certified Internetwork Expert [CERTIFICATION]
♦ CTL: Substitute Teaching License, S.T.E.A.M. & K-12 [CERTIFICATION] ♦ SPC:Capability Tools in Cell, FAB,Continuous Flow, LEAN High-Volume &BatchMfg.Processes [CERT]
♦ LIFEGUARD – AMERICAN RED CROSS: [CERTIFICATION] ♦ FIRST-AID & CPR – AMERICAN RED CROSS: Cardiopulmonary Resuscitation [CERTIFICATION]
♦ CM2-P: Configuration Management-2 Professional [CERTIFICATION] ♦
MANAGEMENT & LEADERSHIP TRAINING
♦ EMPLOYEE ASSESSMENT & CAREER DEVELOPMENT [HP Trained] ♦ MANAGING HUMAN CAPITAL: KEEPING MORAL ROBUST [Stanford Education]
♦ MANAGEMENT OF TECHNOLOGICAL ORGANIZATIONS [Stanford Education] ♦ MANAGING INNOVATION & PRODUCT DEVELOPMENT [Stanford Education]
♦ COMMERCIALIZING SCIENCE & HIGH TECHNOLOGY [Stanford Education] ♦ ENTREPRENEURSHIP IN A TECHNOLOGICAL ENVIRONMENT [Stanford Education]
♦ THE CHALLENGE OF LEADERSHIP [HP Trained] ♦ “HP WAY” VALUES [HP & Agilent Technologies Trained]
♦ SHPE CORPORATE RELATIONS OFFICER [SHPE Silicon Valley Chapter] ♦ SWIM TEAM CAPTAIN [Academic High School, NJ ..&.. Moanalua High School, HI]
♦ CROSS-COUNTRY TEAM MANAGER [NJIT Athletics] ♦
♦ LEADERSHIP BY DESIGN: Using “Design Thinking” to Transform Companies and Careers [Stanford Education]