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Design & implementation of 3 bit flash adc in 0.18µm cmos
- 1. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
308
DESIGN & IMPLEMENTATION OF 3-BIT FLASH ADC IN 0.18µM
CMOS
Md Noorullah Khan
Assistant professor, ECED
Muffakham Jah college of engineering and technology
Hyderabad, A.P.
Dr Kaleem Fatima
Professor and Head ECED
Muffakham Jah College of engineering and technology
Hyderabad, A.P.
Khaja Mujeebuddin Quadry
Professor & Head Dept. of ECE
Royal Institute of Technology and Science
Chevella, R.R.Dist, A.P.
ABSTRACT
This paper describes the design and implementation of a 3-bit flash Analog to Digital
converter (ADC). It includes 7 comparators and one thermometer to binary encoder. It is implemented
in 0.18um CMOS Technology. The simulation result of ADC is done in Cadence environment.
Index Terms: CMOS, Comparator, Thermometer code, Flash ADC, cadence
I. INTRODUCTION
Applications such as wireless communications and digital audio and video have created need
for cost-effective data converters that will achieve higher speed and resolution. The needs required by
digital signal processors continually challenge analog designers to improve and develop new ADC
and DAC architectures. There are many different types of arc-hitectures, each with unique
characteristics and different limitations. Figure.1 shows the general block diagram of ADC.
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ISSN 0976 - 6480 (Print)
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- 2. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
309
Fig. 1.Block diagram for 3-bit Flash ADC
Flash analog-to-digital converters, also known as parallel ADCs, are the fastest way to convert an
analog signal to a digital signal. Flash ADCs are ideal for applications requiring very large bandwidth;
however, they typically consume more power than other ADC architectures and are generally limited
to 8-bits resolution.
II ADC ARCHITECTURE
III The 3-bit Flash ADC architecture is shown in Fig. 2. The entire ADC consists of three
components: the resistive ladder, the comparators, and the binary encoder.
Each comparator compares the voltage difference between its positive input from VIN and its negative
input from the Resistive ladder and then generates a digital output. The binary encoder generates
corresponding 3-bit binary codes based on the comparator outputs. As shown in figure 2.
Fig. 2.Simple 3-bit Flash ADC
The encoder converts the thermometer code produced by the comparators to a binary code as shown in
the truth table in table II. As seen from the figure, the comparators all operate in parallel. Thus, the
conversion speed is limited only by the speed of the comparator or the sampler. For this reason, the
flash ADC is capable of high speed.
- 3. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
A) COMPARATOR CIRCUIT &
Comparator
A comparator is used to detect whether
of one signal to another. It is in fact the second most widely used electronic components after amplifiers.
A simple op-amp can be used as a comparator but this approach is too slow for practical
The circuit that has been used as a comparator is a CMOS circuit, which consists of two stages. The first
stage is a differential amplifier circuit and the second stage consists of a buffer formed by using two
inverter circuits. The output of the differential stage will neither rise exactly to vdd nor fall exactly to
zero, hence this output is given to second stage consisting of two inverters which gives final output
which will be either vdd or zero depending on whether the input voltage is g
reference voltage respectively.
Fig.3.
Fig 3 shows the comparator circuit where two matched input transistors whose sources are joined
together and biased by a transistor which should always be maintained in saturation region. The MOS
differential pair formed by the input transistors is loaded
transistors at the top. The input voltage is applied to the gate of the input transistor in the left leg of
the circuit and reference voltage is applied at the gate of the input transistor in the right leg. If the
input voltage exceeds the reference voltage then the input transistor in the right leg goes into cutoff
and the entire current from the source flows only into the left leg and thus the voltage at the output
node will be nearly equal to vdd, which is then given
finally makes output equal to vdd.
Table 1: transistor sizes of
Transistor
PM0
PM1
PM2
PM3
NM0
NM1
NM2
NM3
NM4
International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
6499(Online) Volume 4, Issue 3, April (2013), © IAEME
310
& DESIGN SPECIFICATIONS
A comparator is used to detect whether a signal is greater or smaller than zero, or to compare size
of one signal to another. It is in fact the second most widely used electronic components after amplifiers.
amp can be used as a comparator but this approach is too slow for practical
The circuit that has been used as a comparator is a CMOS circuit, which consists of two stages. The first
stage is a differential amplifier circuit and the second stage consists of a buffer formed by using two
f the differential stage will neither rise exactly to vdd nor fall exactly to
zero, hence this output is given to second stage consisting of two inverters which gives final output
which will be either vdd or zero depending on whether the input voltage is greater or less than the
Fig.3. Circuit Diagram of the Comparator
Fig 3 shows the comparator circuit where two matched input transistors whose sources are joined
together and biased by a transistor which should always be maintained in saturation region. The MOS
differential pair formed by the input transistors is loaded by a current mirror formed by two MOS
transistors at the top. The input voltage is applied to the gate of the input transistor in the left leg of
the circuit and reference voltage is applied at the gate of the input transistor in the right leg. If the
t voltage exceeds the reference voltage then the input transistor in the right leg goes into cutoff
and the entire current from the source flows only into the left leg and thus the voltage at the output
node will be nearly equal to vdd, which is then given to the stage consisting of two inverters which
transistor sizes of the proposed comparator
Transistor W (um) L (nm)
PM0 10 180
PM1 10 180
PM2 2 180
PM3 2 180
NM0 6 180
NM1 6 180
NM2 1 180
NM3 1 180
NM4 10 180
International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
6499(Online) Volume 4, Issue 3, April (2013), © IAEME
a signal is greater or smaller than zero, or to compare size
of one signal to another. It is in fact the second most widely used electronic components after amplifiers.
amp can be used as a comparator but this approach is too slow for practical applications.
The circuit that has been used as a comparator is a CMOS circuit, which consists of two stages. The first
stage is a differential amplifier circuit and the second stage consists of a buffer formed by using two
f the differential stage will neither rise exactly to vdd nor fall exactly to
zero, hence this output is given to second stage consisting of two inverters which gives final output
reater or less than the
Fig 3 shows the comparator circuit where two matched input transistors whose sources are joined
together and biased by a transistor which should always be maintained in saturation region. The MOS
by a current mirror formed by two MOS
transistors at the top. The input voltage is applied to the gate of the input transistor in the left leg of
the circuit and reference voltage is applied at the gate of the input transistor in the right leg. If the
t voltage exceeds the reference voltage then the input transistor in the right leg goes into cutoff
and the entire current from the source flows only into the left leg and thus the voltage at the output
to the stage consisting of two inverters which
- 4. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
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On the other hand when the input voltage is less than the reference voltage the input transistor in the
left leg of the circuit goes into cutoff and the entire current from the source flows only into the right
leg and thus the voltage at the output node will be nearly equal to zero and the next stage will make it
exactly zero. W/Ls of the transistors used in the comparator are shown in Table 1, The above
proposed comparator circuit consists of total 9 (4 pmos and 5 nmos) transistors. The widths and
lengths of each of these transistors are shown in table I.
Fig 4 shows the transient responses of the comparator. In the transient response it can be seen
that whenever the input sinusoidal signal voltage is above the reference voltage (which is 1volt in this
case) the comparator output is logic-1 and whenever it is below the reference voltage the comparator
output is logic-0.
Fig.4. Comparator Output
The ac response in fig 5 shows that the comparator can work efficiently up to 4G-HZ since
this comparator circuit can provide sufficient gain up to this frequency after which the response
degrades and circuit cannot be used as a comparator beyond this frequency.
Fig.5. AC response of the comparator
B) THERMOMETER TO BINARY ENCODER DESIGN
The outputs of comparators form a thermometer code (TC) which is a combination of a series
of zeros and a series of ones, e.g., 000…011…111 and are given to Thermometer to binary encoder
circuit.
- 5. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
Fig .6
Because binary code is usually needed for digital signal processing, a thermometer code is then
transformed to a binary code through a (2k
of ADCs. Truth table for thermometer to binary encoder is as shown in tab
Table.2
The logic that has been used in implementing the thermometer to binary encoder is that the output
binary code is numerically equal to the number of 1s present in the input thermometer code.
Fig.7.
International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
6499(Online) Volume 4, Issue 3, April (2013), © IAEME
312
Fig .6. Block Diagram of Sub-ADC
code is usually needed for digital signal processing, a thermometer code is then
transformed to a binary code through a (2k-1)-to-k TC-to-BC encoder, where k is the resolution (bits)
of ADCs. Truth table for thermometer to binary encoder is as shown in table2
Table.2. Thermometer to binary code
The logic that has been used in implementing the thermometer to binary encoder is that the output
binary code is numerically equal to the number of 1s present in the input thermometer code.
Fig.7. Thermometer to Binary Encoder
International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
6499(Online) Volume 4, Issue 3, April (2013), © IAEME
code is usually needed for digital signal processing, a thermometer code is then
BC encoder, where k is the resolution (bits)
The logic that has been used in implementing the thermometer to binary encoder is that the output
binary code is numerically equal to the number of 1s present in the input thermometer code.
- 6. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
Hence the output binary code can be obtained by simply adding all the bits of the input
thermometer code. This has been implemented by using the full adder circuits as shown in the fig 7
FIG.8. OUTPUT OF
Figure 8 shows the output of the comparators which are called as thermometer code, the
bottom 3 wave forms are the converted 3 bit binary code. It can be seen from this result that as the
number of input signals having the
circuit also increases by one in value.
C) FINAL 3BIT FLASH ADC
After having designed the comparator and the thermometer to binary converter circuits, the
next step is to arrange the seven comparators in parallel, where the one input to each of the
comparator is the input signal and the other input is the reference vol
figure 9.
Here the comparator used is that of the figure 3 and the reference voltages required are
derived from a series of voltage sources each having a voltage of 250mV. Hence the voltage obtained
as reference for the bottom most comparator is 250mV and that of the top most seventh comparator is
1.75V. Hence the reference voltages for the 3
International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
6499(Online) Volume 4, Issue 3, April (2013), © IAEME
313
Hence the output binary code can be obtained by simply adding all the bits of the input
thermometer code. This has been implemented by using the full adder circuits as shown in the fig 7
OF THERMOMETER TO BINARY CODE CONVERTER
Figure 8 shows the output of the comparators which are called as thermometer code, the
bottom 3 wave forms are the converted 3 bit binary code. It can be seen from this result that as the
number of input signals having the value equal to logic-1 increases by one the binary output of the
circuit also increases by one in value.
BLOCK
After having designed the comparator and the thermometer to binary converter circuits, the
next step is to arrange the seven comparators in parallel, where the one input to each of the
comparator is the input signal and the other input is the reference voltages, which is shown in the
Fig.9. Final Flash ADC
Here the comparator used is that of the figure 3 and the reference voltages required are
derived from a series of voltage sources each having a voltage of 250mV. Hence the voltage obtained
as reference for the bottom most comparator is 250mV and that of the top most seventh comparator is
1.75V. Hence the reference voltages for the 3-bit flash ADC is according to the table 2.
International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
6499(Online) Volume 4, Issue 3, April (2013), © IAEME
Hence the output binary code can be obtained by simply adding all the bits of the input
thermometer code. This has been implemented by using the full adder circuits as shown in the fig 7
ONVERTER
Figure 8 shows the output of the comparators which are called as thermometer code, the
bottom 3 wave forms are the converted 3 bit binary code. It can be seen from this result that as the
1 increases by one the binary output of the
After having designed the comparator and the thermometer to binary converter circuits, the
next step is to arrange the seven comparators in parallel, where the one input to each of the
tages, which is shown in the
Here the comparator used is that of the figure 3 and the reference voltages required are
derived from a series of voltage sources each having a voltage of 250mV. Hence the voltage obtained
as reference for the bottom most comparator is 250mV and that of the top most seventh comparator is
- 7. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
0976 – 6480(Print), ISSN 0976 – 6499(Online) Volume 4, Issue 3, April (2013), © IAEME
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Fig.10. Layout of Flash ADC
III.ADC OUTPUT WAVEFORMS
For the Flash ADC complete layout is prepared as shown in figure 10 where the most sensitive
parts are the comparators for which common centroid layout is carried out in order to overcome the
errors in the fabrication process.
Fig.11. Final output of 3bit Flash ADC
Figure 11 shows the output of final 3-bit flash ADC designed. It can be observed from this
figure that the input signal applied to the flash ADC is a sinusoidal signal whose input voltage varies
from 0V to 2V which generates a 3-bit binary output which varies from 000 to 111 as the input
sinusoidal voltage increases from 0V to 2V.
- 8. International Journal of Advanced Research in Engineering and Technology (IJARET), ISSN
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III. CONCLUSION
A 3-bit Flash ADC has been designed using the proposed comparator circuit. The implementation
of this circuit has
Been done in cadence environment and output waveforms have been obtained.
IV. REFERENCES
[1] Behzad Razavi, “Design of Analog CMOS Integrated Circuits”, Tata McGraw-Hill Edition,
2002.
[2] R.Jacob Baker, Harry W. Li & David E. Boyce, “CMOS circuit design, layout and simulation”,
IEEE Press Series on Microelectronic Systems, Prentice-Hall of India Private Limited, 2004.
[3] Klass Bult and Govert J. G. M. Geelen, “A Fast Settling CMOS OpAmp for SC Circuits with 90-
dB DC Gain” , IEEE J. Solid-State Circuits, Vol.25, No.6, December 1990.
[4] Thomas Byunghak Cho, Student Member, IEEE, and Paul R. Gray, Fellow, IEEE, “A 10 b, 20
Msample/s, 35 mW Pipeline A/D Converter”, IEEE J. Solid-State Circuits, Vol.30, No.3, March
1995.
[5]. Mark Ferriss, Joshua Kang, “A 10-Bit 100-MHz Pipeline ADC”, University of Michigan, 598
design project, 2004.
[6]. Andrew M. Abo and Paul R. Gray, Fellow, IEEE, “A 1.5-V, 10-bit, 14.3-MS/s CMOS Pipeline
Analog-to-Digital Converter”,
IEEE J. Solid-State Circuits, Vol.34, No.5, March 1999.
[7].Stephen H. Lewis, H.Scott Fetterman, George F. Gross, R. Ramachandran and T. R. Viswanathan,
“A 10-b 20-Msample/s Analog-to-Digital Converter”, IEEE J. Solid-State Circuits, Vol.27, No.3,
March 1992.
[8]. Jan M. Rabaey, Anantha Chandrakasan, Borivoje Nikolic, “Digital Integrated Circuits: A Design
Perspective”, Prentice Hall, 2nd edition
[9] Suhas. S. Khot, Prakash. W. Wani , Mukul. S. Sutaone and Saurabh.K.Bhise, “A 581/781 Msps 3-
Bit Cmos Flash Adc Using Tiq Comparator” International Journal Of Electronics And
Communication Engineering &Technology (IJECET) Volume 3, Issue 2, 2012, PP: 352 – 359
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[10]Rajinder Tiwari, R K Singh, “An Optimized High Speed Dual Mode Cmos Differential Amplifier
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