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Design and Analysis of Low Power Double Tail
Comparator for 2-bit Fast ADC
A. Anitha, M.Balaji , Ravishankar Kandasamy & S.K.Ragul Vijayan
Assistant Professor, ECE,
Sri Shanmugha College of Engineering and Technology
Erode, Tamil Nadu
Abstract— Comparator holds a dominant place in fast ADC
circuit for the conversion of analog to digital signal. In this
modernized digital world every utilization circuits requires an
ADC’s with low power to consumption. This in turn reflects in
the design of comparators during the design process of the fast
ADC circuits, scope is due to the higher number of comparator
usage. As the technologies are scaling down, the number of
transistor per unit area increases, so that the sub threshold
leakage current increases which leads to power consumption in
any circuit. This sources the project idea to design a comparator.
It is presumed during the design that, it consumes low power in
its double tail configuration which when replaces an inverter
circuit in latch stage of the double tail comparator by a sleepy
inverter. This presumption is validated through the analysis of
the simulation results. The power consumption of the designed
proposed double tail comparator is 30µw when compared to 35
µw in the conventional type. 2-bit flash ADC circuit is designed
and analyzed under two different configurations of the double
tail comparator. From the results, it is clear that the power
consumption of the ADC circuit designed with proposed sleepy
inverter based double tail comparator is observed to be 45mw.
Keywords—sleepy inverter; double tail comparator;analog to
digital comparator,leakage current
I. INTRODUCTION
In an open loop configuration, the operational Amplifier
finds number of nonlinear applications. e.g. comparators,
detectors, limiters and digital interfacing devices namely
converter. The comparator is a circuit which compares a signal
voltage and the reference voltage. The regenerative comparator
consists of the positive feedback and is normally used to
provide the high gain and the speed. The dynamic comparator
is the regenerative comparator and in which the positive
feedback can be obtained by connecting the back to back
connected inverter circuit and will act as a latch or the memory
element. The Dynamic comparator depends on the clock signal
and makes the decision based on whether the applied input
signal is higher or lower at the applied clock cycle. It finds
more application in the modern world such as analog to digital
converter, memory bit line detectors and receivers.
The threshold voltage and gate oxide thickness are scaled
down by reducing the channel length of the device. Because of
the reduction in threshold voltage the leakage current in the
device gets increases exponentially [13]. Theoretically the
device will starts conducting when gate source voltage is
greater than the threshold voltage (Vgs > Vt). But it will not be
applicable for the device at practical condition. When the
transistor is in off state the shorter channel length due to the
technology scaling causes the sub threshold current to increase.
This current causes the power dissipation during the inactive
mode of the transistor. This leakage current is the limiting
factor in the transistor scaling, as it gets increases when the
number of transistor increases per unit area. The leakage
current for the MOSFET is given by
 

















 



TV
DSV
eTnV
TVGSV
eDSIDSI 10
 












 
5.0
5.0
0 sSB
VsDS
V
T
V
T
V 
In which the IDSO is current at threshold, VTO is the zero bias
threshold voltage, is linearised body effect coefficient,
represents the effect of VDS on threshold voltage, n is the sub-
threshold swing coefficient, VT is threshold voltage, VSB
source to bulk voltage and VGS is gate source voltage
respectively. By increasing the threshold voltage the leakage
current decreases. This can be achieved by increasing the
source to bulk voltage or by decreasing the gate source
voltage, drain source voltage. The literature shows that there
are number of comparator available such as Conventional
Dynamic Comparator, Conventional Double Tail Dynamic
Comparator, and Double Tail Comparator. In which this
project focuses on the reduction of power in the double tail
comparator.
II. DOUBLE TAIL COMPARATOR
The double tail comparator consists of back to back connected
inverter circuit as latch and the preamplifier stage in which the
two inputs are given. This circuit operates in two modes one is
at reset phase and the other is at decision making phase. The
circuit produces the output only at decision making phase and
at reset phase the output is at zero values. When clock is zero
the circuit works in the reset phase, at which both the tail
transistors are OFF and both the fn and fp nodes gets charged
by the transistor M9 and M12. These two nodes turn ON the
M7 and M8 transistor and this makes both the output nodes
outp and outn to zero. When clock is at one condition the
circuit operates in the decision making phase. During which
both fn and fp nodes discharges depending on the given input
signal inp and inn. When input inn is higher, then the node fp
discharges faster when compared to fp and this fn node
charges the fp node again by turning ON the transistor M11.
International Journal of Computer Science and Information Security (IJCSIS),
Vol. 16, No. 4, April 2018
10 https://sites.google.com/site/ijcsis/
ISSN 1947-5500
Fig.1 Double Tail Comparator
This makes the outp to zero by switching ON the transistor
M8. When this outp is given to the inverter formed by pair of
M3 and M4 transistor the outn becomes one. The static power
consumption is less in this circuit. The power consumed by this
comparator circuit is 35µw .
III. SLEEPY INVERTER
The inverter circuit in the latch stage of the double tail
comparator is replaced by the sleepy inverter circuit. In the
sleepy inverter circuit the PMOS is placed below the supply
and the NMOS is placed above the ground terminal. This
sleepy inverter is operating in two modes such as active mode
and sleepy mode.
Fig.2 Sleepy Inverter
During the active mode the circuit act as a normal inverter
and in sleepy mode there is no current flow in the circuit. When
the applied clk is one and clkb is zero, then the circuit operates
in the active mode. During which the transistor M1 and M4
conducts and the node Vp is at high potential and the node Vg
at ground potential. So the circuit operates as normal inverter.
When the applied clk is zero and clkb is one, then the circuit
operates in sleepy mode. During which the transistor M1 and
M4 turns OFF and the node Vg and Vp is at virtual power
potential and virtual ground potential. The potential at Vg
increases and the potential at Vp decreases due to the cut off
transistors M1 and M4. The source to body potential of
transistor M1 increases, so the threshold voltage increases and
hence the leakage current and the power consumption get
decreases. The main drawback of the sleepy inverter concept is
that, it losses the state information during the sleep mode of
operation.
IV. PROPOSED DOUBLE TAIL COMPARATOR
The proposed double Tail Comparator is shown in be fig. 3.
In which the inverter in the latch circuits is replaced by the
sleepy inverter. The operation of the proposed double tail
comparator remains same as the double tail comparator.
Fig. 3 Proposed Double Tail Comparator( with Sleepy
inverter)
During normal mode the drain of M5 and M6 is at high
potential and drain of M11 and M12 at ground potential. At
sleep mode all the M5,M6,M11 and M12 are cut off. By
incorporating the sleepy inverter in the proposed double tail
comparator the overall power consumption of the circuit is
reduced.
V. BLOCK DIAGRAM OF FLASH ADC CIRCUIT
Flash analog to digital converters, also known as
parallel ADCs, are the fastest circuit for the conversion of the
analog to a digital signal. The Flash type ADC has the least
conversion time and is used in time critical applications such as
a sample and hold circuit of a digital oscilloscope. The flash
type ADC consists of an array of parallel comparators, the
potential divider and the priority encoder. In which the analog
signal is applied to the non inverting terminal of the
comparator and reference voltage is given to the inverting input
terminal of the comparator through the potential divider
network.
Fig. 4 Block Diagram of Flash ADC circuit
International Journal of Computer Science and Information Security (IJCSIS),
Vol. 16, No. 4, April 2018
11 https://sites.google.com/site/ijcsis/
ISSN 1947-5500
If the n bit digital output is required then (2n
-1)
comparators are used. The priority encoder accepts a 2n
line
input and gives out an n bit binary output. Each of the input
line has a progressively increasing priority
Fig. 5 Block Diagram of Two bit Flash ADC circuit
The two bit flash ADC circuit requires three comparators
and priority encoders. This ADC circuit is designed with the
designed double tail comparator. When the analog input is
between 0 and 1/4 of Vref all comparator produce zero output.
When the analog input is between 1/4 and 1/2 of Vref the
comparator c only produces 1. When it is between 1/2 and 3/4
of Vref the comparator C and B only produces 1. However, as
comparator for C goes high, all comparator below C go high as
well. So, a priority encoder is used to convert these input lines
form the comparator into binary coded output. The priority
encoder includes the priority function. The operation of the
priority encoder is such that if two or more inputs are equal to 1
at the same time, the input having the highest priority will take
the precedence.
VI. RESULT AND COMPARISON
Both the double tail comparators are simulated with Tanner
tool of V14.1. The two comparator circuit is applied with
different dc input voltage of inn and inp. In the flash ADC
circuit the comparator is fed with the analog signal of
amplitude of 30v and the reference voltage of 10v.
Fig.6 Simulated Double tail comparator
Fig. 7 Output Waveform of Double Tail Comparator
Fig. 8 Simulated Proposed Double Tail comparator
Fig.9 Output waveform of Proposed double tail comparator
International Journal of Computer Science and Information Security (IJCSIS),
Vol. 16, No. 4, April 2018
12 https://sites.google.com/site/ijcsis/
ISSN 1947-5500
Fig.10 Designed Two bit Flash ADC Circuit
Fig.11 Input Waveform of two bit Flash ADC circuit
Fig.12 Output and intermediate node Waveform of the Two
Bit Flash ADC circuit
The comparison chart shows the power consumed and the
delay obtained by the double tail and the proposed double tail
comparator. And the power consumed by the different ADC
circuit.
Table I
Comparison of Two Designed Comparator
PARAMETERS MDTDC PDTC
Technology(nm) 180 180
Power(µw) 35 30
Delay(ns) 1.29 1.50
Transistor Count 18 24
Supply
Voltage(v)
0.8 0.8
Table II
Comparison of Two Bit Flash ADC with Different
Comparators
Circuit Power
consumption
No of
transistor
ADC with
Modified
Double Tail
Dynamic
Comparator
4.6*10^-4 92
ADC with
proposed
Comparator
4.5*10^-4 110
VII. CONCLUSION
All the comparator and the two bit Flash ADC circuit are
designed in 180nm CMOS technology using the tanner tool.
The proposed double tail comparator designed using the
sleepy inverter circuit has the power of 30µw and the two bit
flash ADC circuit that is designed with this comparator
consumes the power of 45mw which is less when compared to
the ADC circuit designed with double tail comparator. So the
proposed double tail comparator is best suitable for the two bit
flash ADC circuit.
REFERENCES
[1] Abhishek Rai and B. Ananda Venkatesan(2014),
“Analysis and Design of High Speed Low Power
Comparator in ADC,” IJEDR | Volume 2, Issue 1 | ISSN:
2321-9939.
International Journal of Computer Science and Information Security (IJCSIS),
Vol. 16, No. 4, April 2018
13 https://sites.google.com/site/ijcsis/
ISSN 1947-5500
[2] Abhishek Singh, Meenu Singh, Ajay Dagar and
Ashish Mishra (2014),”Optimization of Comparator for
High Speed Flash ADC,” International Journal of
Advanced Technology in Engineering and Science
Volume No.02, Issue No. 06.
[3] P. Arunkumar, G. Chavan, Rekha and P.
Narashimaraja(2012), “Design of a 1.5-V, 4-bit Flash
ADC using 90nm Technology,” International Journal of
Engineering and Advanced Technology (IJEAT) ISSN:
2249 – 8958, Volume-2, Issue-2.
[4] B. Goll and H. Zimmermann(2009) “A comparator
with reduced delay time in 65-nm CMOS for supply
voltages down to 0.65,” IEEE Trans. Circuits Syst. II,
Exp. Briefs, vol. 56, no. 11, pp. 810–814, Nov. 2009.
[5] V. Kowsalya(2014),”Design of A Low Power Double
Tail Comparator Using Gated Clock and Power Gating
Techniques,” International Journal of Review in
Electronics & Communication Engineering (IJRECE)
Volume 2 - Issue 1.
[6] B. Prasanthi and P. Pushpalatha (2014), “Design of
Low-Voltage and low-Power inverter based Double Tail
Comparator,” International Journal of Engineering
Research and General Science Volume 2, Issue 5 ISSN
2091-2730.
[7] S. Madhumathi and J. Ramesh Kumar (2014), “Design
And Analysis Of Low Power And High Speed Double
Tail Comparator,” International Journal of Technology
Enhancements And Emerging Engineering Research, Vol
2, Issue 5 76 Issn 2347-4289.
[8] Mayank Nema and Rachna Thakur (2012),”Design of
Low-Offset Voltage Dynamic Latched Comparator,”
IOSR Journal of Engineering Apr. 2012, Vol. 2(4) pp:
585-590.
[9] Neil H. E. Weste and David Money Harris
(2011),”CMOS VLSI Design”.
[10] Pedro M. Figueiredo and Joao C. Vital (2006),
“Kickback Noise Reduction Techniques for CMOS
Latched Comparators,” IEEE Transactions on Circuits
And Systems-Ii: Express Briefs, Vol. 53, NO. 7.
[11] Samaneh Babayan Mashhadi and Reza Lotfi (2014),
“Analysis and Design of a Low-Voltage, Low-Power
Double-Tail Comparator,” IEEE Transactions on Very
Large Scale Integration (VLSI) Systems, Vol. 22, No. 2.
[12] Sunil Jacob and Deepak Joseph Babu, (2014),
“Design of a Low Voltage low Power Double tail
comparator in 180nm CMOS Technology,” American
Journal of Engineering Research (AJER) e-ISSN : 2320-
0847 p-ISSN : 2320-0936 Volume-3, Issue-9, pp-15-19.
[13] International Technology Roadmap for
Semiconductors, http://public.itrs.net
[14] Rajani H.P and Srimannarayan Kulkarni (2012)
‘Novel sleep transistor techniques for Low leakage power
peripheral circuits’, International Journal of VLSI design
& Communication Systems (VLSICS) Vol.3, No.4.
[15] M. Janaki Rami and S. Malarkann, “Leakage power
Reduction and Analysis of CMOS Sequential Circuits,”
International Journal of VLSI Design & communication
Systems (VLSICS) Vol.3. No.1. February 2012.
[16] S.Kim, S. Kosonocky, D. Knebel, and K. Stawiasz, “
Experimental measurement of a novel power gating
structure with intermedite power saving mode,” in
Proc.Int. Symp. Low Power Electron . Des.,004, pp.20-25
International Journal of Computer Science and Information Security (IJCSIS),
Vol. 16, No. 4, April 2018
14 https://sites.google.com/site/ijcsis/
ISSN 1947-5500

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Design and Analysis of Low Power Double Tail Comparator for 2-bit Fast ADC

  • 1. Design and Analysis of Low Power Double Tail Comparator for 2-bit Fast ADC A. Anitha, M.Balaji , Ravishankar Kandasamy & S.K.Ragul Vijayan Assistant Professor, ECE, Sri Shanmugha College of Engineering and Technology Erode, Tamil Nadu Abstract— Comparator holds a dominant place in fast ADC circuit for the conversion of analog to digital signal. In this modernized digital world every utilization circuits requires an ADC’s with low power to consumption. This in turn reflects in the design of comparators during the design process of the fast ADC circuits, scope is due to the higher number of comparator usage. As the technologies are scaling down, the number of transistor per unit area increases, so that the sub threshold leakage current increases which leads to power consumption in any circuit. This sources the project idea to design a comparator. It is presumed during the design that, it consumes low power in its double tail configuration which when replaces an inverter circuit in latch stage of the double tail comparator by a sleepy inverter. This presumption is validated through the analysis of the simulation results. The power consumption of the designed proposed double tail comparator is 30µw when compared to 35 µw in the conventional type. 2-bit flash ADC circuit is designed and analyzed under two different configurations of the double tail comparator. From the results, it is clear that the power consumption of the ADC circuit designed with proposed sleepy inverter based double tail comparator is observed to be 45mw. Keywords—sleepy inverter; double tail comparator;analog to digital comparator,leakage current I. INTRODUCTION In an open loop configuration, the operational Amplifier finds number of nonlinear applications. e.g. comparators, detectors, limiters and digital interfacing devices namely converter. The comparator is a circuit which compares a signal voltage and the reference voltage. The regenerative comparator consists of the positive feedback and is normally used to provide the high gain and the speed. The dynamic comparator is the regenerative comparator and in which the positive feedback can be obtained by connecting the back to back connected inverter circuit and will act as a latch or the memory element. The Dynamic comparator depends on the clock signal and makes the decision based on whether the applied input signal is higher or lower at the applied clock cycle. It finds more application in the modern world such as analog to digital converter, memory bit line detectors and receivers. The threshold voltage and gate oxide thickness are scaled down by reducing the channel length of the device. Because of the reduction in threshold voltage the leakage current in the device gets increases exponentially [13]. Theoretically the device will starts conducting when gate source voltage is greater than the threshold voltage (Vgs > Vt). But it will not be applicable for the device at practical condition. When the transistor is in off state the shorter channel length due to the technology scaling causes the sub threshold current to increase. This current causes the power dissipation during the inactive mode of the transistor. This leakage current is the limiting factor in the transistor scaling, as it gets increases when the number of transistor increases per unit area. The leakage current for the MOSFET is given by                         TV DSV eTnV TVGSV eDSIDSI 10                 5.0 5.0 0 sSB VsDS V T V T V  In which the IDSO is current at threshold, VTO is the zero bias threshold voltage, is linearised body effect coefficient, represents the effect of VDS on threshold voltage, n is the sub- threshold swing coefficient, VT is threshold voltage, VSB source to bulk voltage and VGS is gate source voltage respectively. By increasing the threshold voltage the leakage current decreases. This can be achieved by increasing the source to bulk voltage or by decreasing the gate source voltage, drain source voltage. The literature shows that there are number of comparator available such as Conventional Dynamic Comparator, Conventional Double Tail Dynamic Comparator, and Double Tail Comparator. In which this project focuses on the reduction of power in the double tail comparator. II. DOUBLE TAIL COMPARATOR The double tail comparator consists of back to back connected inverter circuit as latch and the preamplifier stage in which the two inputs are given. This circuit operates in two modes one is at reset phase and the other is at decision making phase. The circuit produces the output only at decision making phase and at reset phase the output is at zero values. When clock is zero the circuit works in the reset phase, at which both the tail transistors are OFF and both the fn and fp nodes gets charged by the transistor M9 and M12. These two nodes turn ON the M7 and M8 transistor and this makes both the output nodes outp and outn to zero. When clock is at one condition the circuit operates in the decision making phase. During which both fn and fp nodes discharges depending on the given input signal inp and inn. When input inn is higher, then the node fp discharges faster when compared to fp and this fn node charges the fp node again by turning ON the transistor M11. International Journal of Computer Science and Information Security (IJCSIS), Vol. 16, No. 4, April 2018 10 https://sites.google.com/site/ijcsis/ ISSN 1947-5500
  • 2. Fig.1 Double Tail Comparator This makes the outp to zero by switching ON the transistor M8. When this outp is given to the inverter formed by pair of M3 and M4 transistor the outn becomes one. The static power consumption is less in this circuit. The power consumed by this comparator circuit is 35µw . III. SLEEPY INVERTER The inverter circuit in the latch stage of the double tail comparator is replaced by the sleepy inverter circuit. In the sleepy inverter circuit the PMOS is placed below the supply and the NMOS is placed above the ground terminal. This sleepy inverter is operating in two modes such as active mode and sleepy mode. Fig.2 Sleepy Inverter During the active mode the circuit act as a normal inverter and in sleepy mode there is no current flow in the circuit. When the applied clk is one and clkb is zero, then the circuit operates in the active mode. During which the transistor M1 and M4 conducts and the node Vp is at high potential and the node Vg at ground potential. So the circuit operates as normal inverter. When the applied clk is zero and clkb is one, then the circuit operates in sleepy mode. During which the transistor M1 and M4 turns OFF and the node Vg and Vp is at virtual power potential and virtual ground potential. The potential at Vg increases and the potential at Vp decreases due to the cut off transistors M1 and M4. The source to body potential of transistor M1 increases, so the threshold voltage increases and hence the leakage current and the power consumption get decreases. The main drawback of the sleepy inverter concept is that, it losses the state information during the sleep mode of operation. IV. PROPOSED DOUBLE TAIL COMPARATOR The proposed double Tail Comparator is shown in be fig. 3. In which the inverter in the latch circuits is replaced by the sleepy inverter. The operation of the proposed double tail comparator remains same as the double tail comparator. Fig. 3 Proposed Double Tail Comparator( with Sleepy inverter) During normal mode the drain of M5 and M6 is at high potential and drain of M11 and M12 at ground potential. At sleep mode all the M5,M6,M11 and M12 are cut off. By incorporating the sleepy inverter in the proposed double tail comparator the overall power consumption of the circuit is reduced. V. BLOCK DIAGRAM OF FLASH ADC CIRCUIT Flash analog to digital converters, also known as parallel ADCs, are the fastest circuit for the conversion of the analog to a digital signal. The Flash type ADC has the least conversion time and is used in time critical applications such as a sample and hold circuit of a digital oscilloscope. The flash type ADC consists of an array of parallel comparators, the potential divider and the priority encoder. In which the analog signal is applied to the non inverting terminal of the comparator and reference voltage is given to the inverting input terminal of the comparator through the potential divider network. Fig. 4 Block Diagram of Flash ADC circuit International Journal of Computer Science and Information Security (IJCSIS), Vol. 16, No. 4, April 2018 11 https://sites.google.com/site/ijcsis/ ISSN 1947-5500
  • 3. If the n bit digital output is required then (2n -1) comparators are used. The priority encoder accepts a 2n line input and gives out an n bit binary output. Each of the input line has a progressively increasing priority Fig. 5 Block Diagram of Two bit Flash ADC circuit The two bit flash ADC circuit requires three comparators and priority encoders. This ADC circuit is designed with the designed double tail comparator. When the analog input is between 0 and 1/4 of Vref all comparator produce zero output. When the analog input is between 1/4 and 1/2 of Vref the comparator c only produces 1. When it is between 1/2 and 3/4 of Vref the comparator C and B only produces 1. However, as comparator for C goes high, all comparator below C go high as well. So, a priority encoder is used to convert these input lines form the comparator into binary coded output. The priority encoder includes the priority function. The operation of the priority encoder is such that if two or more inputs are equal to 1 at the same time, the input having the highest priority will take the precedence. VI. RESULT AND COMPARISON Both the double tail comparators are simulated with Tanner tool of V14.1. The two comparator circuit is applied with different dc input voltage of inn and inp. In the flash ADC circuit the comparator is fed with the analog signal of amplitude of 30v and the reference voltage of 10v. Fig.6 Simulated Double tail comparator Fig. 7 Output Waveform of Double Tail Comparator Fig. 8 Simulated Proposed Double Tail comparator Fig.9 Output waveform of Proposed double tail comparator International Journal of Computer Science and Information Security (IJCSIS), Vol. 16, No. 4, April 2018 12 https://sites.google.com/site/ijcsis/ ISSN 1947-5500
  • 4. Fig.10 Designed Two bit Flash ADC Circuit Fig.11 Input Waveform of two bit Flash ADC circuit Fig.12 Output and intermediate node Waveform of the Two Bit Flash ADC circuit The comparison chart shows the power consumed and the delay obtained by the double tail and the proposed double tail comparator. And the power consumed by the different ADC circuit. Table I Comparison of Two Designed Comparator PARAMETERS MDTDC PDTC Technology(nm) 180 180 Power(µw) 35 30 Delay(ns) 1.29 1.50 Transistor Count 18 24 Supply Voltage(v) 0.8 0.8 Table II Comparison of Two Bit Flash ADC with Different Comparators Circuit Power consumption No of transistor ADC with Modified Double Tail Dynamic Comparator 4.6*10^-4 92 ADC with proposed Comparator 4.5*10^-4 110 VII. CONCLUSION All the comparator and the two bit Flash ADC circuit are designed in 180nm CMOS technology using the tanner tool. The proposed double tail comparator designed using the sleepy inverter circuit has the power of 30µw and the two bit flash ADC circuit that is designed with this comparator consumes the power of 45mw which is less when compared to the ADC circuit designed with double tail comparator. So the proposed double tail comparator is best suitable for the two bit flash ADC circuit. REFERENCES [1] Abhishek Rai and B. Ananda Venkatesan(2014), “Analysis and Design of High Speed Low Power Comparator in ADC,” IJEDR | Volume 2, Issue 1 | ISSN: 2321-9939. International Journal of Computer Science and Information Security (IJCSIS), Vol. 16, No. 4, April 2018 13 https://sites.google.com/site/ijcsis/ ISSN 1947-5500
  • 5. [2] Abhishek Singh, Meenu Singh, Ajay Dagar and Ashish Mishra (2014),”Optimization of Comparator for High Speed Flash ADC,” International Journal of Advanced Technology in Engineering and Science Volume No.02, Issue No. 06. [3] P. Arunkumar, G. Chavan, Rekha and P. Narashimaraja(2012), “Design of a 1.5-V, 4-bit Flash ADC using 90nm Technology,” International Journal of Engineering and Advanced Technology (IJEAT) ISSN: 2249 – 8958, Volume-2, Issue-2. [4] B. Goll and H. Zimmermann(2009) “A comparator with reduced delay time in 65-nm CMOS for supply voltages down to 0.65,” IEEE Trans. Circuits Syst. II, Exp. Briefs, vol. 56, no. 11, pp. 810–814, Nov. 2009. [5] V. Kowsalya(2014),”Design of A Low Power Double Tail Comparator Using Gated Clock and Power Gating Techniques,” International Journal of Review in Electronics & Communication Engineering (IJRECE) Volume 2 - Issue 1. [6] B. Prasanthi and P. Pushpalatha (2014), “Design of Low-Voltage and low-Power inverter based Double Tail Comparator,” International Journal of Engineering Research and General Science Volume 2, Issue 5 ISSN 2091-2730. [7] S. Madhumathi and J. Ramesh Kumar (2014), “Design And Analysis Of Low Power And High Speed Double Tail Comparator,” International Journal of Technology Enhancements And Emerging Engineering Research, Vol 2, Issue 5 76 Issn 2347-4289. [8] Mayank Nema and Rachna Thakur (2012),”Design of Low-Offset Voltage Dynamic Latched Comparator,” IOSR Journal of Engineering Apr. 2012, Vol. 2(4) pp: 585-590. [9] Neil H. E. Weste and David Money Harris (2011),”CMOS VLSI Design”. [10] Pedro M. Figueiredo and Joao C. Vital (2006), “Kickback Noise Reduction Techniques for CMOS Latched Comparators,” IEEE Transactions on Circuits And Systems-Ii: Express Briefs, Vol. 53, NO. 7. [11] Samaneh Babayan Mashhadi and Reza Lotfi (2014), “Analysis and Design of a Low-Voltage, Low-Power Double-Tail Comparator,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 22, No. 2. [12] Sunil Jacob and Deepak Joseph Babu, (2014), “Design of a Low Voltage low Power Double tail comparator in 180nm CMOS Technology,” American Journal of Engineering Research (AJER) e-ISSN : 2320- 0847 p-ISSN : 2320-0936 Volume-3, Issue-9, pp-15-19. [13] International Technology Roadmap for Semiconductors, http://public.itrs.net [14] Rajani H.P and Srimannarayan Kulkarni (2012) ‘Novel sleep transistor techniques for Low leakage power peripheral circuits’, International Journal of VLSI design & Communication Systems (VLSICS) Vol.3, No.4. [15] M. Janaki Rami and S. Malarkann, “Leakage power Reduction and Analysis of CMOS Sequential Circuits,” International Journal of VLSI Design & communication Systems (VLSICS) Vol.3. No.1. February 2012. [16] S.Kim, S. Kosonocky, D. Knebel, and K. Stawiasz, “ Experimental measurement of a novel power gating structure with intermedite power saving mode,” in Proc.Int. Symp. Low Power Electron . Des.,004, pp.20-25 International Journal of Computer Science and Information Security (IJCSIS), Vol. 16, No. 4, April 2018 14 https://sites.google.com/site/ijcsis/ ISSN 1947-5500