This document outlines an automation test setup for wafer level testing of digital and analog devices. The setup includes a PC computer connected via GPIB to components like a switch matrix, signal sources, measurements devices, a probe station, and probe card. The PC controls the components to perform automated measurements on multiple wafers, dies, and devices for data collection and analysis. The overall setup is intended to be economical, reliable, fast and productive for testing engineers while requiring experienced engineers with software and GPIB technical skills.

1. Automation Test (I)Automation Test (I)
OverviewOverview
By Zhida LanBy Zhida Lan
(zhida@yahoo.com)(zhida@yahoo.com)
Copy right 2017Copy right 2017

2. OverviewOverview
 ScopeScope
 ArchitectArchitect
 ComponentsComponents
 NotesNotes

3. ScopeScope
 This document is forThis document is for
• device engineerdevice engineer
• product engineerproduct engineer
• test engineertest engineer
• design engineerdesign engineer
• QC/QA engineerQC/QA engineer
 Wafer level test for digital or analogWafer level test for digital or analog
• Multi waferMulti wafer
• Multi dieMulti die
• Multi deviceMulti device
 AutomationAutomation
• GPIB basedGPIB based
• PC basedPC based
• Auto measurement for data collectionAuto measurement for data collection
• Auto data analysisAuto data analysis

4. ArchitectArchitect
PC computer
Connection
Component
Probe station
Signal source Measurement
wafer
DB GPIB connection
Probe card

5. ComponentsComponents
 PC computer:PC computer:
• Equipped with GPIB connectionEquipped with GPIB connection
• Software controls components through GPIBSoftware controls components through GPIB
 Connection components:Connection components:
• Switch matrixSwitch matrix
• Connect with signal outConnect with signal out
• Connect with measurement componentsConnect with measurement components
• Connect with dots on waferConnect with dots on wafer
 Signal sourceSignal source
• DC such as HP parameter analyzerDC such as HP parameter analyzer
• AC pulse generatorAC pulse generator
 MeasurementMeasurement
• DC: measurement such as HP parameter analyzerDC: measurement such as HP parameter analyzer
• AC: oscilloscopeAC: oscilloscope
 Probe stationProbe station
• Hold probe cardHold probe card
• Hold wafer and control wafer movementHold wafer and control wafer movement
 Probe cardProbe card
• Contact dots (device) to testContact dots (device) to test
 DBDB
• Data base to store all measurementData base to store all measurement
• Data provider for automation data analysisData provider for automation data analysis

6. NotesNotes
 Whole setupWhole setup
• EconomicalEconomical
• ReliableReliable
• FastFast
• ProductiveProductive
 RequiresRequires
• Experienced engineerExperienced engineer
• Software development skillSoftware development skill
• GPIB commandsGPIB commands
• Understand devices and layoutUnderstand devices and layout
Next session: probe card
Copy right Zhida Lan (zhida@yahoo.com)

7. NotesNotes
 Whole setupWhole setup
• EconomicalEconomical
• ReliableReliable
• FastFast
• ProductiveProductive
 RequiresRequires
• Experienced engineerExperienced engineer
• Software development skillSoftware development skill
• GPIB commandsGPIB commands
• Understand devices and layoutUnderstand devices and layout
Next session: probe card
Copy right Zhida Lan (zhida@yahoo.com)