The XD010-42S-D4F 10W power module passed all reliability qualification testing including high temperature operational life testing at 175°C for 1000 hours with 15 devices and high temperature storage testing at 100°C for 1000 hours with 10 devices. Testing was also performed on the XeMOS II 0.8um fabrication process used to manufacture the device. The device is qualified for reliable operation.
This presentation is about the following points -
GPIO Driver development,
LED Interfacing (blinking pattern),
LCD Interfacing (8 bit mode,4 bit mode),
Seven Segment Interfacing(single and multiple seven segment),
Keypad Interfacing (Integration with LCD),
Timer Driver Development,
Timer (all functionality with polling and Interrupt),
Counter (all functionality with polling and Interrupt),
UART Serial communication(polling and interrupt),
Watch dog Timer programming,
External interrupt,
Motor/Relay Interfacing,
ADC Interfacing(8 bit resolution),
I2C communication protocol(Bit bang Implementation),
(EEPROM/RTC Interfacing ),
The document discusses Maxwell's equations and their applications. It begins by listing Maxwell's equations and the constitutive relations. It then provides several examples of using Maxwell's equations, including deriving the diffusion equation from Maxwell's equations, solving the diffusion equation for magnetic flux density near a vacuum-copper interface, deriving the continuity equation from Maxwell's equations, and explaining Poynting's theorem. The document also discusses representing Maxwell's equations in integral and phasor forms and provides examples of calculating power, frequency, and Poynting vectors using these representations.
This lecture is all about the recognition of an abnormal EEG, its characteristics, its appearance and all about how to differentiate the abnormal activity with normal EEG background.
The document discusses forced vibrations of damped, single degree of freedom linear spring mass systems. It derives the equations of motion for three types of forcing - external forcing, base excitation, and rotor excitation. It presents the steady state solutions and discusses key features, including that the response frequency matches the forcing frequency. The maximum response occurs at resonance when the forcing frequency matches the natural frequency. Engineering applications include designing systems to minimize vibrations by increasing stiffness/natural frequency and damping.
Normal EEG patterns, frequencies, as well as patterns that may simulate diseaseRahul Kumar
This presentation discusses the vast range of traces that show the variations in normal EEG patterns, as well as discussing the frequency and amplitudes of various normal waveforms.
1) The document describes several benign EEG variants that can occur but are not associated with epilepsy. These include wicket waves, benign sporadic sleep spikes, 6 per second spike-waves, 14 & 6 Hz positive spikes, and more.
2) The variants are described in terms of their frequency, location, morphology, when they typically occur, and other characteristics. For example, wicket waves occur in the alpha frequency range and are seen unilaterally in the temporal region.
3) Many of the variants are considered normal variants seen in relaxed wakefulness, drowsiness, or different stages of sleep. They are commonly seen in different age groups but are not clinically significant or associated with epilepsy.
This document provides an overview of normal and sleep EEG patterns. It defines EEG and describes normal wakeful adult EEG patterns such as alpha rhythm and sleep stages. It also discusses EEG patterns in different age groups from premature infants to elderly adults. Descriptors of EEG activity and various activation procedures are explained. Common artifacts and benign variants are also summarized. The document aims to familiarize readers with the basic components of normal EEG for clinical interpretation and diagnosis.
This presentation is about the following points -
GPIO Driver development,
LED Interfacing (blinking pattern),
LCD Interfacing (8 bit mode,4 bit mode),
Seven Segment Interfacing(single and multiple seven segment),
Keypad Interfacing (Integration with LCD),
Timer Driver Development,
Timer (all functionality with polling and Interrupt),
Counter (all functionality with polling and Interrupt),
UART Serial communication(polling and interrupt),
Watch dog Timer programming,
External interrupt,
Motor/Relay Interfacing,
ADC Interfacing(8 bit resolution),
I2C communication protocol(Bit bang Implementation),
(EEPROM/RTC Interfacing ),
The document discusses Maxwell's equations and their applications. It begins by listing Maxwell's equations and the constitutive relations. It then provides several examples of using Maxwell's equations, including deriving the diffusion equation from Maxwell's equations, solving the diffusion equation for magnetic flux density near a vacuum-copper interface, deriving the continuity equation from Maxwell's equations, and explaining Poynting's theorem. The document also discusses representing Maxwell's equations in integral and phasor forms and provides examples of calculating power, frequency, and Poynting vectors using these representations.
This lecture is all about the recognition of an abnormal EEG, its characteristics, its appearance and all about how to differentiate the abnormal activity with normal EEG background.
The document discusses forced vibrations of damped, single degree of freedom linear spring mass systems. It derives the equations of motion for three types of forcing - external forcing, base excitation, and rotor excitation. It presents the steady state solutions and discusses key features, including that the response frequency matches the forcing frequency. The maximum response occurs at resonance when the forcing frequency matches the natural frequency. Engineering applications include designing systems to minimize vibrations by increasing stiffness/natural frequency and damping.
Normal EEG patterns, frequencies, as well as patterns that may simulate diseaseRahul Kumar
This presentation discusses the vast range of traces that show the variations in normal EEG patterns, as well as discussing the frequency and amplitudes of various normal waveforms.
1) The document describes several benign EEG variants that can occur but are not associated with epilepsy. These include wicket waves, benign sporadic sleep spikes, 6 per second spike-waves, 14 & 6 Hz positive spikes, and more.
2) The variants are described in terms of their frequency, location, morphology, when they typically occur, and other characteristics. For example, wicket waves occur in the alpha frequency range and are seen unilaterally in the temporal region.
3) Many of the variants are considered normal variants seen in relaxed wakefulness, drowsiness, or different stages of sleep. They are commonly seen in different age groups but are not clinically significant or associated with epilepsy.
This document provides an overview of normal and sleep EEG patterns. It defines EEG and describes normal wakeful adult EEG patterns such as alpha rhythm and sleep stages. It also discusses EEG patterns in different age groups from premature infants to elderly adults. Descriptors of EEG activity and various activation procedures are explained. Common artifacts and benign variants are also summarized. The document aims to familiarize readers with the basic components of normal EEG for clinical interpretation and diagnosis.
Unbalance vibration occurs when the center of mass of a rotating object does not align with its axis of rotation. There are three main types of unbalance: static, couple, and dynamic. Static unbalance can be corrected by adding or removing weight in a single plane. Couple unbalance exists when there are two unbalances 180 degrees apart in different planes and can be corrected by adding weights on opposite sides. Dynamic unbalance requires measurements to be taken while rotating and corrected with weights in two planes. Unbalance causes excess vibration that can damage bearings if not addressed.
The document discusses the mu rhythm, which is a central rhythm seen on EEG with an alpha frequency band of 8-10 Hz. It has an arciform configuration and occurs in less than 5% of children under age 4 and 18-20% of children ages 8-16. The mu rhythm is not blocked by eye opening but is blocked by touch, limb movement, or thought of movement. It is usually asymmetric and independent between hemispheres. The mu rhythm is believed to originate from the sensorimotor cortex at rest and can be prominent in patients with skull defects.
This presentation describes the common conditions, anatomy and the ideal ways to do and perform nerve conduction studies in lower limbs. It is nicely depicted with self explanatory pictures.
This presentation is an introduction to the principles of Nerve Conduction Study and is entirely sourced from the book by David C Preston and Barbara E Shapiro: Electromyography and Neuromuscular disorders, 3rd Edition
1. PLEDs (Periodic Lateralized Epileptiform Discharges) are a pattern seen on EEG characterized by periodic discharges that are lateralized to one hemisphere.
2. They are commonly seen in conditions involving acute brain injury or inflammation such as stroke, encephalitis, tumors, or hypoxic ischemic encephalopathy.
3. PLEDs are associated with a risk of seizures but generally indicate an unstable brain state that will improve over time as the underlying condition resolves. Prognosis depends on the specific cause.
Random vibration analysis is a technique used to analyze systems subjected to random loads whose time histories are non-deterministic. It involves converting the random load time history into a power spectral density (PSD) function, which is a statistical representation of the load. A random vibration analysis then computes the probability distributions of response quantities like displacement and stress. It follows a modal analysis and uses mode superposition to combine responses from each mode. Random vibrations can be broadband, narrowband, stationary or nonstationary. Common characteristics include non-periodic and unpredictable motions that vary randomly with time.
This document provides information on a course about programmable logic controllers (PLCs). The course aims to build understanding of PLC basics, including operations, programming, and engineering. It covers topics like PLC components, programming languages, instructions, applications, installation, and troubleshooting. The target audience includes engineers and maintenance staff interested in PLC automation. Training involves lectures, demonstrations, and hands-on exercises to prepare participants for work with PLC-based systems.
This document describes several benign EEG variants that can have an epileptiform appearance but are not epileptogenic. It discusses characteristics of alpha variants, mu rhythm, lambda waves, rhythmic mid-temporal theta discharges, wicket spikes, subclinical rhythmic electroencephalographic discharges of adults, phantom spike-wave discharges, and small sharp spikes. These benign variants can occur during drowsiness and light sleep and are seen in specific electrode sites, with features like attenuation with eye opening or movement in the case of mu rhythm. Accurate identification requires training to distinguish them from true epileptiform discharges.
This document provides examples of finding Taylor and Maclaurin series expansions for various functions. It gives the step-by-step workings for finding the first few terms of series expansions centered at different points for functions like ln(x), 1/x, sin(x), x^4 + x^2, (x-1)e^x, and others. It also discusses using these expansions to approximate integrals and find sums of infinite series.
The document discusses impedance matching in microwave engineering. It covers:
1. The conditions required for maximum power transfer between a transmission line and load, which is when their impedances are equal.
2. Various matching network topologies that can be used including L-networks, T-networks, and pi-networks using lumped elements, as well as single-stub, double-stub, and quarter-wave transformer matching networks.
3. Design procedures and examples for L-network, single-stub shunt tuning, and double-stub matching networks using the Smith Chart. Transitions with broader bandwidth than quarter-wave transformers like binomial and Chebyshev multisection lines are also covered.
The document appears to be an exam question paper that covers various topics related to advanced mathematics, digital VLSI design, embedded systems, ASIC design, VLSI process technology, and related subjects. It contains 10 questions with varying point values and instructs students to answer any 5 full questions. The questions cover technical topics such as matrix operations, MOS transistor modeling, logic design, processor architecture, ASIC design flows, silicon crystal growth, and more.
Solving Laplace differential equation using finite element methodPedram Parchebafieh
This document discusses solving Laplace's equation using the finite element method. It provides an overview of the basic steps which include discretization of the domain, selection of interpolation functions, and formulation and solution of system equations. It then describes the variational method and Galerkin's method for formulation. It discusses one-dimensional and two-dimensional finite element implementations including discretization, interpolation, assembly of system equations, and examples of two-dimensional problems like boxes and spheres.
EEG - Montages, Equipment and Basic PhysicsRahul Kumar
This presentation discusses the 10-20 system of electrode placement, with its modifications. Also discussed are the Equipment Specifications, basic Physics and sources of interference
This document summarizes higher cortical functions including language, calculations, spatial awareness, memory, executive function, music and creativity. It discusses the cerebral cortex and different types of association cortices. It then examines various neurological functions like sensory processing, attention, motor programming, language, memory, agnosias, apraxia, aphasia and alexia. Key areas discussed include the visual and auditory systems, object recognition networks, spatial attention, praxis, types of agnosia and aphasia, and the neuroanatomy underlying different language functions.
This document discusses the use and interpretation of electroencephalography (EEG) in evaluating patients for possible epilepsy. It makes several key points:
1. EEG alone cannot be used to definitively diagnose or rule out epilepsy, as abnormal EEG patterns can be caused by various neurological conditions, and not all epilepsy cases show EEG abnormalities.
2. Certain EEG findings like interictal epileptiform discharges (IEDs) are strongly associated with epilepsy, while nonspecific findings like slowing are less so.
3. The sensitivity of EEG for detecting epilepsy depends on factors like the number of studies, study duration, seizure frequency, and use of activation procedures.
4. Specific EEG patterns like lateralized periodic
This document provides information about repetitive nerve stimulation (RNS) testing, including:
1) RNS is used to evaluate neuromuscular junction disorders like myasthenia gravis by assessing changes in the compound muscle action potential with repetitive nerve stimulation.
2) In myasthenia gravis, the safety factor is reduced due to fewer acetylcholine receptors, so some endplate potentials may not reach threshold, causing a decremental response on RNS.
3) The protocol for RNS involves stimulating multiple nerves at rest and after exercise to look for an abnormal decremental or incremental response that indicates impaired neuromuscular transmission.
The M4100 is the world's premier power apparatus and insulation test instrument. It has unique test capabilities and AI analysis software making it the most trusted instrument in the power industry. These instruments are used globally thanks to comprehensive testing options, safety features, and measurement accuracy. The latest 4th generation M4100 has improved ruggedness, accuracy, universal controller compatibility, expanded software, and safety features.
Unbalance vibration occurs when the center of mass of a rotating object does not align with its axis of rotation. There are three main types of unbalance: static, couple, and dynamic. Static unbalance can be corrected by adding or removing weight in a single plane. Couple unbalance exists when there are two unbalances 180 degrees apart in different planes and can be corrected by adding weights on opposite sides. Dynamic unbalance requires measurements to be taken while rotating and corrected with weights in two planes. Unbalance causes excess vibration that can damage bearings if not addressed.
The document discusses the mu rhythm, which is a central rhythm seen on EEG with an alpha frequency band of 8-10 Hz. It has an arciform configuration and occurs in less than 5% of children under age 4 and 18-20% of children ages 8-16. The mu rhythm is not blocked by eye opening but is blocked by touch, limb movement, or thought of movement. It is usually asymmetric and independent between hemispheres. The mu rhythm is believed to originate from the sensorimotor cortex at rest and can be prominent in patients with skull defects.
This presentation describes the common conditions, anatomy and the ideal ways to do and perform nerve conduction studies in lower limbs. It is nicely depicted with self explanatory pictures.
This presentation is an introduction to the principles of Nerve Conduction Study and is entirely sourced from the book by David C Preston and Barbara E Shapiro: Electromyography and Neuromuscular disorders, 3rd Edition
1. PLEDs (Periodic Lateralized Epileptiform Discharges) are a pattern seen on EEG characterized by periodic discharges that are lateralized to one hemisphere.
2. They are commonly seen in conditions involving acute brain injury or inflammation such as stroke, encephalitis, tumors, or hypoxic ischemic encephalopathy.
3. PLEDs are associated with a risk of seizures but generally indicate an unstable brain state that will improve over time as the underlying condition resolves. Prognosis depends on the specific cause.
Random vibration analysis is a technique used to analyze systems subjected to random loads whose time histories are non-deterministic. It involves converting the random load time history into a power spectral density (PSD) function, which is a statistical representation of the load. A random vibration analysis then computes the probability distributions of response quantities like displacement and stress. It follows a modal analysis and uses mode superposition to combine responses from each mode. Random vibrations can be broadband, narrowband, stationary or nonstationary. Common characteristics include non-periodic and unpredictable motions that vary randomly with time.
This document provides information on a course about programmable logic controllers (PLCs). The course aims to build understanding of PLC basics, including operations, programming, and engineering. It covers topics like PLC components, programming languages, instructions, applications, installation, and troubleshooting. The target audience includes engineers and maintenance staff interested in PLC automation. Training involves lectures, demonstrations, and hands-on exercises to prepare participants for work with PLC-based systems.
This document describes several benign EEG variants that can have an epileptiform appearance but are not epileptogenic. It discusses characteristics of alpha variants, mu rhythm, lambda waves, rhythmic mid-temporal theta discharges, wicket spikes, subclinical rhythmic electroencephalographic discharges of adults, phantom spike-wave discharges, and small sharp spikes. These benign variants can occur during drowsiness and light sleep and are seen in specific electrode sites, with features like attenuation with eye opening or movement in the case of mu rhythm. Accurate identification requires training to distinguish them from true epileptiform discharges.
This document provides examples of finding Taylor and Maclaurin series expansions for various functions. It gives the step-by-step workings for finding the first few terms of series expansions centered at different points for functions like ln(x), 1/x, sin(x), x^4 + x^2, (x-1)e^x, and others. It also discusses using these expansions to approximate integrals and find sums of infinite series.
The document discusses impedance matching in microwave engineering. It covers:
1. The conditions required for maximum power transfer between a transmission line and load, which is when their impedances are equal.
2. Various matching network topologies that can be used including L-networks, T-networks, and pi-networks using lumped elements, as well as single-stub, double-stub, and quarter-wave transformer matching networks.
3. Design procedures and examples for L-network, single-stub shunt tuning, and double-stub matching networks using the Smith Chart. Transitions with broader bandwidth than quarter-wave transformers like binomial and Chebyshev multisection lines are also covered.
The document appears to be an exam question paper that covers various topics related to advanced mathematics, digital VLSI design, embedded systems, ASIC design, VLSI process technology, and related subjects. It contains 10 questions with varying point values and instructs students to answer any 5 full questions. The questions cover technical topics such as matrix operations, MOS transistor modeling, logic design, processor architecture, ASIC design flows, silicon crystal growth, and more.
Solving Laplace differential equation using finite element methodPedram Parchebafieh
This document discusses solving Laplace's equation using the finite element method. It provides an overview of the basic steps which include discretization of the domain, selection of interpolation functions, and formulation and solution of system equations. It then describes the variational method and Galerkin's method for formulation. It discusses one-dimensional and two-dimensional finite element implementations including discretization, interpolation, assembly of system equations, and examples of two-dimensional problems like boxes and spheres.
EEG - Montages, Equipment and Basic PhysicsRahul Kumar
This presentation discusses the 10-20 system of electrode placement, with its modifications. Also discussed are the Equipment Specifications, basic Physics and sources of interference
This document summarizes higher cortical functions including language, calculations, spatial awareness, memory, executive function, music and creativity. It discusses the cerebral cortex and different types of association cortices. It then examines various neurological functions like sensory processing, attention, motor programming, language, memory, agnosias, apraxia, aphasia and alexia. Key areas discussed include the visual and auditory systems, object recognition networks, spatial attention, praxis, types of agnosia and aphasia, and the neuroanatomy underlying different language functions.
This document discusses the use and interpretation of electroencephalography (EEG) in evaluating patients for possible epilepsy. It makes several key points:
1. EEG alone cannot be used to definitively diagnose or rule out epilepsy, as abnormal EEG patterns can be caused by various neurological conditions, and not all epilepsy cases show EEG abnormalities.
2. Certain EEG findings like interictal epileptiform discharges (IEDs) are strongly associated with epilepsy, while nonspecific findings like slowing are less so.
3. The sensitivity of EEG for detecting epilepsy depends on factors like the number of studies, study duration, seizure frequency, and use of activation procedures.
4. Specific EEG patterns like lateralized periodic
This document provides information about repetitive nerve stimulation (RNS) testing, including:
1) RNS is used to evaluate neuromuscular junction disorders like myasthenia gravis by assessing changes in the compound muscle action potential with repetitive nerve stimulation.
2) In myasthenia gravis, the safety factor is reduced due to fewer acetylcholine receptors, so some endplate potentials may not reach threshold, causing a decremental response on RNS.
3) The protocol for RNS involves stimulating multiple nerves at rest and after exercise to look for an abnormal decremental or incremental response that indicates impaired neuromuscular transmission.
The M4100 is the world's premier power apparatus and insulation test instrument. It has unique test capabilities and AI analysis software making it the most trusted instrument in the power industry. These instruments are used globally thanks to comprehensive testing options, safety features, and measurement accuracy. The latest 4th generation M4100 has improved ruggedness, accuracy, universal controller compatibility, expanded software, and safety features.
Electrical test equipment for high and low voltage systems. Phasing rods, ammeter for overhead powerlines on
systems up to 36kV. Hubungi PT. Siwali Swantika, Jakarta Office : 021-45850618 atau Surabaya Office : 031-8421264
This document provides information about electrical test equipment from Seaward Group, including:
- Low voltage and high voltage test tools for electrical installations from distribution cables to plug sockets.
- Multi-function and single-function installation testers, high voltage indicators, proving units, and accessories.
- Details on specific products like the PowerTest 1557 multi-function installation tester, IRT 1557 insulation and continuity tester, ERT 1557 earth resistance tester, and PowerCheck 1557 verification unit.
- Seaward offers over 70 years of experience in electrical test instrumentation and provides a complete testing and measurement solution with service, calibration, and support.
This certificate certifies that the PGR-8800 Series Arc Flash Monitoring System produced by Littelfuse Selco A/S has been found to comply with Det Norske Veritas' classification rules for ships and offshore standards. The system includes an arc fault protection module and sensors to detect arc flashes. It was tested for safety, environment, and electromagnetic compatibility. The certificate is valid until June 30, 2019 and the product must undergo periodic assessment to maintain the type approval.
This document provides information on the Series 6149/2 LED inspection light, including:
- It uses high-power LEDs and has an extremely long service life. It is suitable for both inspection and machine lighting.
- It is available in versions for 12V DC, 24-48V AC/DC, and 110-240V AC/DC power. All have IP66/67 protection.
- Accessories include mounting brackets, wire guards, and plug options. Dimensions and technical specifications are provided.
- The light has anti-roll design, lockable suspension hooks, and delivers over 600 lumens of bright light for inspection needs. It is certified for use in hazardous locations.
United Electric TX200 Pressure TransmitterIves Equipment
The document discusses several models of pressure transmitters:
- The TX200A and TX200B are ASIC models that provide a 4-20 mA output with various pressure ranges from 0-15 psi to 0-25,000 psi.
- The TX200H is a HART Smart pressure transmitter that uses the HART 7 communication protocol and provides diagnostics and asset management data.
- All models have a 316 stainless steel enclosure and provide accurate pressure measurement for various industrial process applications.
Original N-Channel Mosfet FDPF33N25 33N25 TO-220 New FairChildAUTHELECTRONIC
This document provides information on the FDPF33N25250VN-Channel MOSFET from Fairchild Semiconductor. It is a 250V N-Channel MOSFET with low on-resistance of 0.094Ω and fast switching capabilities. It uses Fairchild's proprietary planar stripe DMOS technology to minimize resistance and maximize performance for applications such as high efficiency power supplies. Key specifications and performance characteristics are provided.
This document summarizes a 16-channel LED driver chip. It has 12-bit grayscale PWM control and 6-bit dot correction for each channel. It can drive LEDs with currents from 0 to 72mA. It also has features like LED open detection, thermal error flag, EEPROM for storing settings, and a serial interface. It is suitable for applications like LED signs, displays, and general high-current LED driving.
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
This document provides product specifications for a 60V N-Channel AlphaMOS transistor. Key specifications include:
- Maximum continuous drain current of 12A and on-resistance below 11mΩ at a gate-source voltage of 10V.
- Applications include synchronous rectification in DC/DC converters and industrial/motor drive systems.
- Packaged in an SOIC-8 package with a minimum order quantity of 3000 units.
The document summarizes the specifications of various continuity and insulation measurement devices:
- The CP-100C continuity tester measures resistance from 0-120 ohms with currents of 200mA or 20mA, and has programmable conformity thresholds of 1 or 2 ohms. It is IEC 61557-4 compliant.
- The CP-100B insulation measurement unit measures resistance from 10kohms to 999Mohms with configurable voltages from 50-1000VDC and a measuring current of at least 1mA. It has adjustable conformity thresholds and complies with IEC 61557-2.
- When used together, the CP-100C tester can display insulation readings on its screen while housed in
This document provides an overview of intrinsic safety and area classification. It discusses the need for intrinsic safety in hazardous locations where flammable gases or vapors may be present. Intrinsic safety works by limiting the voltage, current, and stored energy in electrical equipment to levels that cannot cause ignition. The document defines intrinsic safety and area classification standards. It examines the basic principles of intrinsic safety design and certification. Key topics covered include explosion triangles, temperature ratings, gas grouping, purging, and grounding requirements for intrinsic safety installations.
digital multimeter dt4280-4250-4220 seriesNanan Ginanjar
This document describes Hioki's DT4200 series of digital multimeters (DMMs). It provides an overview of the various models in the series, their key features and specifications. The series includes high-end, standard and pocket-sized models with different measurement capabilities. Models have fast response times, bright backlights, safety features and memory storage. They are suited for electrical work, laboratories, HVAC and other applications.
This document provides specifications for a 120W DIN rail power supply with the following key details:
- It has a single 120W output with a voltage range of 22-28V and a current of 5A.
- The input voltage range is 85-264VAC. It has protections such as overload, overvoltage, and overtemperature protections.
- Additional features include compact design, easy wire connection, 10 year lifetime, shock/vibration resistance, and convection cooling.
Data Teknis Gossen Metrawatt Insulation Tester METRISO PRIME PLUSPT. Siwali Swantika
Pemesanan produk, hubungi PT Siwali Swantika melalui WhatsApp, Jakarta : 0811-1519-949 (chat only) | Surabaya : 0811-1519-948 (chat only). Kunjungi website kami di www.siwali.com, untuk detail informasi spesifikasi dan model alat.
This document discusses the various types of testing required for protection equipment, including:
- Type tests to prove the relay meets specifications and standards under abnormal power conditions.
- Routine factory production tests to check for defects during manufacturing.
- Commissioning tests to prove correct installation of a protection scheme before use.
- Periodic maintenance tests to identify equipment failures or degradation over time.
Electrical type tests are described in detail, including functional, rating, thermal withstand, burden, input, output, and insulation resistance tests. The purpose is to thoroughly evaluate performance and safety.
UiPath Test Automation using UiPath Test Suite series, part 6DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 6. In this session, we will cover Test Automation with generative AI and Open AI.
UiPath Test Automation with generative AI and Open AI webinar offers an in-depth exploration of leveraging cutting-edge technologies for test automation within the UiPath platform. Attendees will delve into the integration of generative AI, a test automation solution, with Open AI advanced natural language processing capabilities.
Throughout the session, participants will discover how this synergy empowers testers to automate repetitive tasks, enhance testing accuracy, and expedite the software testing life cycle. Topics covered include the seamless integration process, practical use cases, and the benefits of harnessing AI-driven automation for UiPath testing initiatives. By attending this webinar, testers, and automation professionals can gain valuable insights into harnessing the power of AI to optimize their test automation workflows within the UiPath ecosystem, ultimately driving efficiency and quality in software development processes.
What will you get from this session?
1. Insights into integrating generative AI.
2. Understanding how this integration enhances test automation within the UiPath platform
3. Practical demonstrations
4. Exploration of real-world use cases illustrating the benefits of AI-driven test automation for UiPath
Topics covered:
What is generative AI
Test Automation with generative AI and Open AI.
UiPath integration with generative AI
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
How to Get CNIC Information System with Paksim Ga.pptxdanishmna97
Pakdata Cf is a groundbreaking system designed to streamline and facilitate access to CNIC information. This innovative platform leverages advanced technology to provide users with efficient and secure access to their CNIC details.
Generating privacy-protected synthetic data using Secludy and MilvusZilliz
During this demo, the founders of Secludy will demonstrate how their system utilizes Milvus to store and manipulate embeddings for generating privacy-protected synthetic data. Their approach not only maintains the confidentiality of the original data but also enhances the utility and scalability of LLMs under privacy constraints. Attendees, including machine learning engineers, data scientists, and data managers, will witness first-hand how Secludy's integration with Milvus empowers organizations to harness the power of LLMs securely and efficiently.
In the rapidly evolving landscape of technologies, XML continues to play a vital role in structuring, storing, and transporting data across diverse systems. The recent advancements in artificial intelligence (AI) present new methodologies for enhancing XML development workflows, introducing efficiency, automation, and intelligent capabilities. This presentation will outline the scope and perspective of utilizing AI in XML development. The potential benefits and the possible pitfalls will be highlighted, providing a balanced view of the subject.
We will explore the capabilities of AI in understanding XML markup languages and autonomously creating structured XML content. Additionally, we will examine the capacity of AI to enrich plain text with appropriate XML markup. Practical examples and methodological guidelines will be provided to elucidate how AI can be effectively prompted to interpret and generate accurate XML markup.
Further emphasis will be placed on the role of AI in developing XSLT, or schemas such as XSD and Schematron. We will address the techniques and strategies adopted to create prompts for generating code, explaining code, or refactoring the code, and the results achieved.
The discussion will extend to how AI can be used to transform XML content. In particular, the focus will be on the use of AI XPath extension functions in XSLT, Schematron, Schematron Quick Fixes, or for XML content refactoring.
The presentation aims to deliver a comprehensive overview of AI usage in XML development, providing attendees with the necessary knowledge to make informed decisions. Whether you’re at the early stages of adopting AI or considering integrating it in advanced XML development, this presentation will cover all levels of expertise.
By highlighting the potential advantages and challenges of integrating AI with XML development tools and languages, the presentation seeks to inspire thoughtful conversation around the future of XML development. We’ll not only delve into the technical aspects of AI-powered XML development but also discuss practical implications and possible future directions.
Taking AI to the Next Level in Manufacturing.pdfssuserfac0301
Read Taking AI to the Next Level in Manufacturing to gain insights on AI adoption in the manufacturing industry, such as:
1. How quickly AI is being implemented in manufacturing.
2. Which barriers stand in the way of AI adoption.
3. How data quality and governance form the backbone of AI.
4. Organizational processes and structures that may inhibit effective AI adoption.
6. Ideas and approaches to help build your organization's AI strategy.
Fueling AI with Great Data with Airbyte WebinarZilliz
This talk will focus on how to collect data from a variety of sources, leveraging this data for RAG and other GenAI use cases, and finally charting your course to productionalization.
Building Production Ready Search Pipelines with Spark and MilvusZilliz
Spark is the widely used ETL tool for processing, indexing and ingesting data to serving stack for search. Milvus is the production-ready open-source vector database. In this talk we will show how to use Spark to process unstructured data to extract vector representations, and push the vectors to Milvus vector database for search serving.
HCL Notes und Domino Lizenzkostenreduzierung in der Welt von DLAUpanagenda
Webinar Recording: https://www.panagenda.com/webinars/hcl-notes-und-domino-lizenzkostenreduzierung-in-der-welt-von-dlau/
DLAU und die Lizenzen nach dem CCB- und CCX-Modell sind für viele in der HCL-Community seit letztem Jahr ein heißes Thema. Als Notes- oder Domino-Kunde haben Sie vielleicht mit unerwartet hohen Benutzerzahlen und Lizenzgebühren zu kämpfen. Sie fragen sich vielleicht, wie diese neue Art der Lizenzierung funktioniert und welchen Nutzen sie Ihnen bringt. Vor allem wollen Sie sicherlich Ihr Budget einhalten und Kosten sparen, wo immer möglich. Das verstehen wir und wir möchten Ihnen dabei helfen!
Wir erklären Ihnen, wie Sie häufige Konfigurationsprobleme lösen können, die dazu führen können, dass mehr Benutzer gezählt werden als nötig, und wie Sie überflüssige oder ungenutzte Konten identifizieren und entfernen können, um Geld zu sparen. Es gibt auch einige Ansätze, die zu unnötigen Ausgaben führen können, z. B. wenn ein Personendokument anstelle eines Mail-Ins für geteilte Mailboxen verwendet wird. Wir zeigen Ihnen solche Fälle und deren Lösungen. Und natürlich erklären wir Ihnen das neue Lizenzmodell.
Nehmen Sie an diesem Webinar teil, bei dem HCL-Ambassador Marc Thomas und Gastredner Franz Walder Ihnen diese neue Welt näherbringen. Es vermittelt Ihnen die Tools und das Know-how, um den Überblick zu bewahren. Sie werden in der Lage sein, Ihre Kosten durch eine optimierte Domino-Konfiguration zu reduzieren und auch in Zukunft gering zu halten.
Diese Themen werden behandelt
- Reduzierung der Lizenzkosten durch Auffinden und Beheben von Fehlkonfigurationen und überflüssigen Konten
- Wie funktionieren CCB- und CCX-Lizenzen wirklich?
- Verstehen des DLAU-Tools und wie man es am besten nutzt
- Tipps für häufige Problembereiche, wie z. B. Team-Postfächer, Funktions-/Testbenutzer usw.
- Praxisbeispiele und Best Practices zum sofortigen Umsetzen
Climate Impact of Software Testing at Nordic Testing DaysKari Kakkonen
My slides at Nordic Testing Days 6.6.2024
Climate impact / sustainability of software testing discussed on the talk. ICT and testing must carry their part of global responsibility to help with the climat warming. We can minimize the carbon footprint but we can also have a carbon handprint, a positive impact on the climate. Quality characteristics can be added with sustainability, and then measured continuously. Test environments can be used less, and in smaller scale and on demand. Test techniques can be used in optimizing or minimizing number of tests. Test automation can be used to speed up testing.
HCL Notes and Domino License Cost Reduction in the World of DLAUpanagenda
Webinar Recording: https://www.panagenda.com/webinars/hcl-notes-and-domino-license-cost-reduction-in-the-world-of-dlau/
The introduction of DLAU and the CCB & CCX licensing model caused quite a stir in the HCL community. As a Notes and Domino customer, you may have faced challenges with unexpected user counts and license costs. You probably have questions on how this new licensing approach works and how to benefit from it. Most importantly, you likely have budget constraints and want to save money where possible. Don’t worry, we can help with all of this!
We’ll show you how to fix common misconfigurations that cause higher-than-expected user counts, and how to identify accounts which you can deactivate to save money. There are also frequent patterns that can cause unnecessary cost, like using a person document instead of a mail-in for shared mailboxes. We’ll provide examples and solutions for those as well. And naturally we’ll explain the new licensing model.
Join HCL Ambassador Marc Thomas in this webinar with a special guest appearance from Franz Walder. It will give you the tools and know-how to stay on top of what is going on with Domino licensing. You will be able lower your cost through an optimized configuration and keep it low going forward.
These topics will be covered
- Reducing license cost by finding and fixing misconfigurations and superfluous accounts
- How do CCB and CCX licenses really work?
- Understanding the DLAU tool and how to best utilize it
- Tips for common problem areas, like team mailboxes, functional/test users, etc
- Practical examples and best practices to implement right away
In his public lecture, Christian Timmerer provides insights into the fascinating history of video streaming, starting from its humble beginnings before YouTube to the groundbreaking technologies that now dominate platforms like Netflix and ORF ON. Timmerer also presents provocative contributions of his own that have significantly influenced the industry. He concludes by looking at future challenges and invites the audience to join in a discussion.
TrustArc Webinar - 2024 Global Privacy SurveyTrustArc
How does your privacy program stack up against your peers? What challenges are privacy teams tackling and prioritizing in 2024?
In the fifth annual Global Privacy Benchmarks Survey, we asked over 1,800 global privacy professionals and business executives to share their perspectives on the current state of privacy inside and outside of their organizations. This year’s report focused on emerging areas of importance for privacy and compliance professionals, including considerations and implications of Artificial Intelligence (AI) technologies, building brand trust, and different approaches for achieving higher privacy competence scores.
See how organizational priorities and strategic approaches to data security and privacy are evolving around the globe.
This webinar will review:
- The top 10 privacy insights from the fifth annual Global Privacy Benchmarks Survey
- The top challenges for privacy leaders, practitioners, and organizations in 2024
- Key themes to consider in developing and maintaining your privacy program
For the full video of this presentation, please visit: https://www.edge-ai-vision.com/2024/06/building-and-scaling-ai-applications-with-the-nx-ai-manager-a-presentation-from-network-optix/
Robin van Emden, Senior Director of Data Science at Network Optix, presents the “Building and Scaling AI Applications with the Nx AI Manager,” tutorial at the May 2024 Embedded Vision Summit.
In this presentation, van Emden covers the basics of scaling edge AI solutions using the Nx tool kit. He emphasizes the process of developing AI models and deploying them globally. He also showcases the conversion of AI models and the creation of effective edge AI pipelines, with a focus on pre-processing, model conversion, selecting the appropriate inference engine for the target hardware and post-processing.
van Emden shows how Nx can simplify the developer’s life and facilitate a rapid transition from concept to production-ready applications.He provides valuable insights into developing scalable and efficient edge AI solutions, with a strong focus on practical implementation.
CAKE: Sharing Slices of Confidential Data on BlockchainClaudio Di Ciccio
Presented at the CAiSE 2024 Forum, Intelligent Information Systems, June 6th, Limassol, Cyprus.
Synopsis: Cooperative information systems typically involve various entities in a collaborative process within a distributed environment. Blockchain technology offers a mechanism for automating such processes, even when only partial trust exists among participants. The data stored on the blockchain is replicated across all nodes in the network, ensuring accessibility to all participants. While this aspect facilitates traceability, integrity, and persistence, it poses challenges for adopting public blockchains in enterprise settings due to confidentiality issues. In this paper, we present a software tool named Control Access via Key Encryption (CAKE), designed to ensure data confidentiality in scenarios involving public blockchains. After outlining its core components and functionalities, we showcase the application of CAKE in the context of a real-world cyber-security project within the logistics domain.
Paper: https://doi.org/10.1007/978-3-031-61000-4_16
GraphRAG for Life Science to increase LLM accuracyTomaz Bratanic
GraphRAG for life science domain, where you retriever information from biomedical knowledge graphs using LLMs to increase the accuracy and performance of generated answers
Best 20 SEO Techniques To Improve Website Visibility In SERPPixlogix Infotech
Boost your website's visibility with proven SEO techniques! Our latest blog dives into essential strategies to enhance your online presence, increase traffic, and rank higher on search engines. From keyword optimization to quality content creation, learn how to make your site stand out in the crowded digital landscape. Discover actionable tips and expert insights to elevate your SEO game.
2. XD010-42S-D4F Reliability
Qualification Report
I. Qualification Overview
The XD010-42S-D4F has demonstrated reliable operation by passing all qualification
testing in our product qualification test plan. It has been subjected to stresses such as
High Temperature Operational Life, High Temperature Storage, Temperature Cycling, as
well as Mechanical Shock and Vibration.
II. Introduction
The XD010-42S-D4F 10W power module is a 2-stage Class A amplifier designed for use
in the driver stages of linear RF power amplifiers for cellular base stations. It operates
from a single voltage and has internal temperature compensation.
III. Fabrication Technology
This amplifier is manufactured using XeMOS® II, a 0.8µm, metal source contact,
aluminum metallization process which utilizes a discrete Laterally Diffused MOSFET
(LDMOS) transistor to achieve RF performance capabilities for the wireless
communications and networking markets. The XeMOS® II process embodies the
conventional NMOS processing techniques with additional features enabling it capable of
high voltage, high power and high frequency operation at power levels of up to 60W at
frequencies up to 2.5 GHz.
IV. Package Type
The XD010-42S-D4F is a hybrid chip and wire assembly. The printed circuit board is
connected to a tin/copper base plate with a eutectic solder attach. The lid is attached to
the PCB with a B stage epoxy.
Figure 1 : Photograph of XD010-42S-D4F
3. XD010-42S-D4F Reliability
Qualification Report
V. Qualification Methodology
The Sirenza Microdevices qualification process consists of a series of tests designed to
stress various potential failure mechanisms. This testing is performed to ensure that
Sirenza Microdevices products are robust against potential failure modes that could arise
from the various die and package failure mechanisms stressed. The qualification testing
is based on JESD test methods common to the semiconductor industry. The
manufacturing test specifications are used as the PASS/FAIL criteria for initial and final
tests.
Qualification tests are performed on the wafer fabrication process to demonstrate
semiconductor reliability. In addition, package testing is also performed. These
qualification results are detailed in Section XII.
VI. Qualification By Similarity
A device can be qualified by similarity to previously qualified products provided that no
new potential failure modes/mechanisms are possible in the new design. The following
products are qualified by similarity:
XD010-04S-D4F XD010-12S-D4F XD010-14S-D4F XD010-22S-D2F
XD010-24S-D2F SDM-08060 SDM-09060
VII. Operational Life Testing
Sirenza Microdevices defines operational life testing as a DC biased elevated tempera-
ture test performed at or near the maximum channel temperature limit. The purpose of
the operational life test is to statistically show that the product operated at its maximum
operational ratings will be reliable. The results for this test are expressed in device hours
that are calculated by multiplying the total number of devices passing the test by the
number of hours tested.
HTOL Completion Test Channel Quantity Device Hours
Date Duration Temperature
August 2004 1000 175°C 15 15,000
hours
4. XD010-42S-D4F Reliability
Qualification Report
IX. Electrostatic Discharge Classification
Sirenza Microdevices classifies Human Body Model (HBM) electrostatic discharge (ESD)
according to the JESD22-A114 convention. All pin pair combinations were tested. Each
pin pair is stressed at one state voltage level using 1 positive and 1 negative pulse
polarity to determine the weakest pin pair combination. The weakest pin pair is tested
with 3 devices below and above the failure voltage level to classify the part. The Pass
Fail status of a part is determined by the manufacturing test specification. The ESD
class quoted indicated that the device passed expose to certain voltage, but does not
pass the next higher level. The following table indicates the ESD sensitivity classification
levels. The XD010-42S-D4F is a class 3B device.
Class Passes Fails Device Class
0 0V <250 V XD010-42S-D4F 3B
1A 250 V 500 V All others 3B
1B 500 V 1000 V
1C 1000 V 2000 V
2 2000 V 4000 V
3A 4000 V 8000 V
3B 8000V
X. Qualification Test Results for XD010-42S-D4F
Group A1 Temperature Cycling Loose Device
(Air to Air Thermal Shock)
Test Conditions Temperature Range -55°C to 125°C, 10 min dwell, 1 minute transition,
200 cycles
Number of 9 Test JESD22-A104 Results PASS
Devices Under Standard
Test
Group A2 High Temperature Operational Life
Test Conditions Channel Temperature = 175°C, Test Duration = 1000 hours
Number of 15 Test JESD22-A108 Results PASS
Devices Under Standard
Test
5. XD010-42S-D4F Reliability
Qualification Report
X. Qualification Test Results for XD010-42S-D4F (con’t)
Group D High Temp Storage
Test Conditions Temperature = 100°C, Test Duration = 1000 hours
Number of 10 Test JESD22-A103 Results PASS
Devices Under Standard
Test
Group H Solderability
Test Conditions Dip & Look; Steam Age Condition C, 8hrs; Solder Dip Condition A, 215C
Number of 10 Test JESD22-B102 Results PASS
Devices Under Standard
Test
Group E Vibration + Mechanical Shock
Number of 5 Test JESD22-B103 Results PASS
Devices Under Standard JESD22-B104
Test
6. XD010-42S-D4F Reliability
Qualification Report
XI. Junction Temperature Determination
One key issue in performing the qualification testing is to accurately determine the
junction temperature of the device. Sirenza Microdevices uses a 3um spot size infrared
camera that allows a device to be measured at its normal operational parameters. The
3um spot size allows for very good resolution compared to the heated area of the
transistor, which in this case is approximately 1-2um. The results for the 1st stage,
running at maximum operational current of 230mA, a device voltage of 28V, and a base
plate lead temperature of 90oC are as follows:
Figure 2: Infrared Thermal Image of Stage 1, XD010-42S-D4F
7. XD010-42S-D4F Reliability
Qualification Report
XI. Junction Temperature Determination (con’t)
The results for the 2nd stage, running at maximum operational current of 1001 mA, a
device voltage of 28V, and a base plate lead temperature of 90 oC are as follows:
Figure 3: Infrared Thermal Image of Stage 2, XD010-42S-D4F
8. XD010-42S-D4F Reliability
Qualification Report
XII. XeMOS® II Process Qualification
The XeMOS® II process qualification test vehicle uses a 30W die packaged in a ceramic
A191 package using a Au/Si eutectic die attach and wire bonded with aluminum wire.
The cumulative qualification results are summarized in the table below.
(Reference RQR-104230)
Test Description Test Standard/Method Lot # (s) Qty Qty Results*
In Out
High Temperature MIL-STD-750 394063 18 18 Pass
Gate Bias (HTGB) Method 1042.3 3A4555 16 16 Pass
Test Cond. B 372665 16 16 Pass
Gate Bias = 16V
Temp = 175C, Time = 48hrs
High Temperature MIL-STD-750 3A4555 16 16 Pass
Reverse Bias Method 1042.3 372665 16 16 Pass
(HTRB) Test Cond A, M394063 16 16 Pass
Bias Volt. = 48V
Temp = 175C
Time = 160hrs
Temperature JESD22-A110B M394063 13 13 Pass
Humidity, Unbiased paragraph 3.1, row 1 351106 16 16 Pass
500 Hours 372665 19 19 Pass
Temperature JESD22-A110B 372665 13 13 Pass
Humidity Bias paragraph 3.1, row 1 3A4555 13 13 Pass
110C, 85% RH 3C0882 15 15 Pass
Bias=26V PLST0810 5 5 Pass
264 Hours
High Temperature MIL-STD-883, Test Method 372665 8 8 Pass
Operating Life 1005.8, 175+5, -0C, M394063 7 7 Pass
(HTOL) 1000 Hours 3A4760 9 9 Pass
3C0882 22 22 Pass
9. XD010-42S-D4F Reliability
Qualification Report
XII. XeMOS® II Process Qualification (con’t)
Test Description Test Standard/Method Lot # (s) Qty Qty Results*
In Out
Bond Pull Strength MIL-STD-883 Method 2011.7 281701 12 12 Pass
281702 12 12 Pass
351106 12 12 Pass
394063 12 12 Pass
Eutectic Die Attach MIL-STD-883E Method 281701 12 12 Pass
2012.7 281702 12 12 Pass
351106 12 12 Pass
394063 12 12 Pass
Temperature MIL-STD-883 372665 16 16 Pass
Cycling Method 1010.7 3A4555 17 17 Pass
Test Condition C 394063 18 18 Pass
1000 Cycles
*Failure Criteria:
Test Description Symbol Pre Stress Post Stress
Gate to Source Threshold Voltage Vgs(th) 2< Vgs <5 +/-50mV
Drain Source On Resistance Rdson < 300mO +/-15%
Gate Leakage Current Igss <600nA +/-200nA
Drain Source Leakage Current Idss <=1uA +/-500nA
10. XD010-42S-D4F Reliability
Qualification Report
XII. XeMOS® II Process Qualification (con’t) - Electromigration
Item Element/ Stress n/Ea(eV) T 0.1 (hrs) σ Predicted
Structure Conditions / Lifetime
T 50 (hrs) (yrs)
0.1%
EM M2 J=5 mA/um2) 2/0.7 119.587 0.1623 880
T=250C / @T=190C
379.506
11. XD010-42S-D4F Reliability
Qualification Report
XII. XeMOS® II Process Qualification (con’t) - MTTF
The graph below is the MTTF due to metal migration for 4 different drain currents on
10W die based on Black’s Equations and measured data. The geometries of the 4W,
30W and 60W die are the same relative to electromigration failures.
MTTF for XeMOS II 10W Die
1.00E+10
1.00E+09
MTTF(hours)
1.00E+08
1.00E+07
0.5A
1.00E+06
1.0A
1.5A
2.0A
1.00E+05
100 110 120 130 140 150 160 170 180 190 200 210 220
Junction Temp(C)
12. XD010-42S-D4F Reliability
Qualification Report
XII. XeMOS® II Process Qualification (con’t) - FIT
High temperature operating life tests was performed on 10W die at Tj= 180°C with a
sample size of 108 devices for 6624 hours. Total device hours is 715392 dev-hours with
zero failures. An activation energy of 0.5 eV is used.
Tj FIT FIT
60% CL 90% CL
140 °C 371 932
90 °C 54 135
XIII. Package Qualification
The package qualification test is a hybrid chip and wire assembly. The printed circuit
board is connected to a tin/copper base plate with a eutectic solder attach. The lid is
attached to the PCB with a B stage epoxy.
Temperature Cycling
Test Conditions Temperature Range -55°C to 125°C, 10 min dwell, 1 minute transition,
100 cycles
Number of 10 Test MIL-STD-883E Results PASS
Devices Under Standard Method 1010.7
Test
Lead Integrity (Tension)
Number of 5 Test MIL-STD-883E Results PASS
Devices Under Standard Method 1010.7
Test Condition A
Lead Integrity (Bending Stress)
Number of 5 Test MIL-STD-883E Results PASS
Devices Under Standard Method 1010.7
Test Condition A
Mechanical Shock
Number of 10 Test MIL-STD-883E Results PASS
Devices Under Standard Method 2002.4
Test Condition B