3. Introduction
• It is a type of microscope that can be used to
image the arrangement of atoms at the
surface of a sharp metal tip.
• First Field ion microscope (FIM) was invented
by Müller in 1951.
• FIM, provides atomic-resolution imaging of
the surface of a specimen.
• FIM is a projection type microscope.
5. Basic principle
• FIM is differ considerably from those other of
optical and electron microscopy.
• Image is produce by the applying of high
voltage to the specimen with respect to the
channel plate screen.
• Required field strength at the sample surface
measure up to 50v/nm.
• Needle shape of specimen is prepared with
average radius of curvature 10-100nm.
6. • The electric field at the apex of the specimen is of
the order of 1010 V m–1.
