1) The document describes 4 digital logic elements to be implemented: a) a gated RS latch structurally, b) a negative edge-triggered JK flip-flop behaviorally, c) a negative edge-triggered D flip-flop with asynchronous reset and synchronous enable behaviorally, and d) a positive edge-triggered D flip-flop structurally using a master-slave configuration of D latches. 2) It then describes a testbench that should instantiate and test the 4 elements in parallel by driving their outputs. The testbench should use two clocks - a slow clock and a fast clock, and an 8-bit counter driven by the fast clock to control the test cases.