Metrology probe tester equipment instrument

1. JEOL JBX-6300FS
Electron Beam
Lithography
System
$1,000,000.00
Panalytical X’Pert
Pro
$78,000.00
Electroglas
4090u+ Wafer
Probe
$75,000.00
Electroglas 4085x
wafer prober
$55,000.00
CDE ResMap 178 ,
ResMap Four
Point Probe,
$45,500.00
KLA Tencor
Surfscan 4500
$45,000.00
HP 4062UX
Process Control
System
$45,000.00
Electroglas 2001X
Wafer Probe
$38,000.00
Nanoline CD
Measurement
Nanometrics
Critical Dimension
Computer
$35,000.00
Nanometrics
50/51 NanoLine IV
Critical Dimension
Measurement
$35,000.00
Dektak model 3
Surface Stylus
Profiler
$35,000.00
Electroglas 2001X
Inker / Probe
Station with
Navitar- Motorized
Zoom Control Box
$25,000.00
Japan SANWA
LC361C Wafer
P b With MU 6
MP2020
Wentworth Labs
W f P b U
Tencor M-gage
200 Kla Tencor
M F T
Nanometrics 210
Nanospec AFT
Fil Thi k
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Metrology Probe Tester

2. AWgage-150 Non-
Contact
Thickness/Resista
nce
$18,000.00
Electroglas 1034
Prober (EG
1034XA, EG 1034X-
6A)
$15,000.00
MiMir UV Ultra
Violet Curing
System
$13,500.00
KLA-Tencor
Prometrix
SpectraMap SM-
300 W/ Wafer
Handler C2C
$12,500.00
KLA-Tencor
Prometrix Film
Thickness Probe
W/ FT-650,
Cognex 3100
Vision System
$12,500.00
Gaertner Scientific
L117
$12,500.00
Rudolph Research
AutoEL
$12,500.00
Boc Edwards
Spectron 5000
Helium Leak
Detector Vacuum
Pump 18 1.5
$12,000.00
Olympus MX50A-
F With Nikon DN
100, Digital Net
Camera
$12,000.00
Electroglas 2001X
Wafer Probe EG
2010 Wafer prober
$12,000.00
Electroglas Model
3001X EG 3001X
Wafer Probe
$9,800.00
Tencor M-gage
300 Thin Film
Thickness
Measurement
$9,500.00
Sloan Dektak II
Profilometer
$9,500.00
Emscope SC-650
Series
$5,500.00
Olympus BHM
$4,500.00
Probe With MU-6
Olympus
Microscope SZ40
SZ CHI , 5000V
$25,000.00
Wafer Probe , Up
To 8 Inch W/
Temptronic
TP0315B-1 Chiller
$25,000.00
Mgage For 2 To 5
Inch Metal Thin
$19,999.00
Film Thickness
Measurement
$18,000.00