3. Introduction
Only concept which proved wrong theoretical study
on the limit of silicon in high voltage devices.
The relation in power MOSFET without superjunction
is [1]
The idea of a superjunction has been used to
improve this relationship from super-linear to linear
[2].
5.2
BVRon
5. Superjunction concept
The drift region of superjunction device is formed of
multiple, alternate n and p semiconductor stripes.
p pillar does not contribute to on-state conduction in
the on-state.
Cross-sectional area of the drift region is halved,
Ron will be doubled for the super-junction but with
increased doping Ron reduces significantly.
Poisson’s equation for 1D electric field
In a superjunction device, electric field is 2D
E
x
Ex
y
E
x
E yx
y
E
x
E yx
6. Since the widths of the p and the n pillars are very small
as compared with the height, the horizontal depletion
takes place at a relatively low drain voltage.
n and the p pillars will be completely depleted well
before the breakdown voltage is reached.
Due to the full depletion of the p and the n pillars, they
should not create a maximum electric field for
breakdown, Ec (critical field), at the vertical junction.
Designer’s freedom
Doping profile of n region
Design and pitch of p columns
7. In normal Si VDMOSFET In superjunction Si VDMOSFET
Flat electric field profile instead of a triangular one as in a VDMOS transistor[3].
8. Limitation
Difficulty of fabrication process. Higher aspect ratio
of pillars requires large number of steps and higher
costs.
9. Conclusion and Future work
Semi SJVDMOSFET is an option in which a bottom
assist layer is provided, so there can be some
relaxation in aspect ratio.
Charge sheet super junction in which say p- pillars in
SJVDMOSFET is replaced by negative charge sheet.
Al2O3 or SiO2 can be used as charge sheets.
Tunable charge compensation technique can be
implemented using YFET concepts.
Fabrication of SJVDMOS on wide gap
semiconductors like SiC, GaN is a research focal
point.
10. Reference
1. Silicon Carbide Power devices, B Jayant Baliga.
2. Jian Chen, Weifeng Sun, Long Zhang, Jing Zhu and Yanzhang Lin, “A Review of Superjunction
Vertical Diffused MOSFET”, IETE Technical review, Vol29, Issue1, Jan-Feb 2012.
3. Pravin N. Kondekar and Hawn-Sool Oh, “Analysis of the Breakdown Voltage, the On-
Resistance, and the Charge Imbalance of a Super-Junction Power MOSFET”, Journal of the
Korean Physical Society, Vol. 44, No. 6, June 2004, pp. 1565-1570.
4. Dr. Gerald Deboy & Dr. Florin Udrea, “Superjunction devices & technologies – Benefits and
Limitations of a revolutionary step in power electronics”, EPE 2007