The document discusses moiré patterns that can form in graphene-hexagonal boron nitride devices. It notes that atomic force microscopy is commonly used to characterize these patterns due to the insulating nature of hexagonal boron nitride. The document then introduces Park Systems' SmartScan Auto Mode for atomic force microscopy, which aims to minimize user input needed for parameter optimization and preserves tip sharpness for non-contact imaging of moiré patterns in these devices.