Opm anotest ymp30-s_932-531_en

ANOTEST® YMP30-S
Operator‘s Manual
Coating Thickness Material Analysis Microhardness Material Testing

ANOTEST® YMP30-S
Sealing quality test instrument for anodic oxide coatings.
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© 2015 by Helmut Fischer GmbH Institut für Elektronik und Messtechnik,
Germany.
This operator’s manual remains the copyrighted property of Helmut Fischer
GmbH. All rights reserved. This manual may not be reproduced by any means
(print, photocopy, microfilm or any other method) in full or in part, or
processed, multiplied or distributed to third parties by electronic means without
the written consent of Helmut Fischer GmbH.
Subject to correction and technical changes.
ANOTEST® is a registered trade mark of the Helmut Fischer GmbH Institut für
Elektronik und Messtechnik in Germany and/or other countries.
Note: The fact, that the trademark characters ® and ™ may be missing does
not indicate that such names are free trademarks.
Document Order Number 932-531
Issue 10-2015
Instrument manufacturer:
Helmut Fischer GmbH Phone: +49 (0) 70 31 3 03 - 0
Institut für Elektronik und Messtechnik Fax: +49 (0) 70 31 3 03 - 710
Industriestraße 21 www.helmut-fischer.com
D-71069 Sindelfingen mail@helmut-fischer.de
Quality Assurance System of the Helmut Fischer GmbH
DIN EN ISO/IEC
17025
Calibration lab accredited for certified mass per unit area
standards
DIN EN ISO
9001:2008
Management system certified by DNV GL - Business Assur-
ance

Operator’s Manual ANOTEST® (2.1 - 06/06) i
1 Information about additional options for
operating the ANOTEST® YMP30-S . . . . . . . . . . . . .1
2 Technical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
2.1 Examples for “Information regarding the measuring
range” . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
2.2 Measuring Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
3 Control Elements and
Instrument Technology . . . . . . . . . . . . . . . . . . . . . . . . .7
3.1 Particular Technical Properties of the
ANOTEST® YMP30-S Instrument . . . . . . . . . . . . . . . .7
4 Measuring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
4.1 Preparing the specimen . . . . . . . . . . . . . . . . . . . . . . .11
4.2 Part 1 of the Measurement:
Checking instrument settings . . . . . . . . . . . . . . . . . . .12
4.3 Part 2 of the Measurement: Performing the
Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
4.4 Notes Regarding the Measurement . . . . . . . . . . . . . .14
4.5 Evaluating the Measurement Results . . . . . . . . . . . . .14
5 Testing the accuracy using an electrical
reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
6 Normalization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
7 Corrective calibration . . . . . . . . . . . . . . . . . . . . . . . . . .18
7.1 When to calibrate? . . . . . . . . . . . . . . . . . . . . . . . . . . .18
7.2 Function of a corrective calibration . . . . . . . . . . . . . . .18
7.3 Performing a corrective calibration . . . . . . . . . . . . . . .18
7.4 Selecting the calibration standards . . . . . . . . . . . . . . .18
8 Measuring principle . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
8.1 About the need for aluminum surface protection . . . .23
8.2 Measurement method to test the after-treatment /

ii Operator’s Manual ANOTEST® (2.1 - 06/06)
sealing quality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
8.3 Application-specific computation of the admittance . 26
8.4 Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
8.5 Evaluating the results . . . . . . . . . . . . . . . . . . . . . . . . 27
9 Nomograms, Tables, Characteristics . . . . . . . . . . 29
10 Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10.1 Regulations, legal information . . . . . . . . . . . . . . . . . 34
10.2 Disposal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.3 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
11 Additional technical information . . . . . . . . . . . . . . 35
11.1 Anodizing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
EC Declaration of Conformity

Operator’s Manual ANOTEST® (2.1 - 06/06) Page 1
1 Information about additional options
for operating the ANOTEST® YMP30-S
For details, please refer to the separate operators manual
“DELTASCOPE® MP30, ISOSCOPE® MP30 and DUALSCOPE® MP40
No. 902-583”
IMPORTANT NOTE
Chapters and topics in the aforementioned operators manual 902-583 that are
not mentioned in the list below do NOT apply to the ANOTEST® YMP30-S
in technical regard!
Chapter Heading Page
3.2 Functions of the keys of the control panel 11
3.3 LCD Display 14
5 Applications 25
5.1 Selecting applications 25
5.2 Setting up applications 27
5.4 Overwriting applications 29
5.6 Deleting applications 32
5.7 List of set up applications 33
5.8 Assigning application names 35
5.9 Application-specific settings 36
7.11 Documentation of the measurement using the
printer
71
7.13 Erroneous measurements 73
8 Evaluation 84
8.1 Evaluation of the current block 85
8.3 Evaluation of the current application 91
Data export, data import and remote control of
the instrument
Appendix
11 Start-up, maintenance and cleaning
11.1 Start-up

Operator’s Manual ANOTEST® (2.1 - 06/06)
11.2 Voltage supply
11.3 Warrany
12 Instrument configuration
12.1 Measurement accept signal
12.4 Setting the date and time
12.6 Service functions / configuration programs
12.9 Protocol of the instrument configuration
13 Trouble shooting and messages
17 Technical terms and equation characters 191

2 Technical data
Model designation ANOTEST® YMP30-S
Intended use Sealing quality test instrument for anodic oxide
coatings of aluminum and aluminum alloys 1)
Standards for the
measurement method
DIN EN ISO 12373-5
Aluminum and aluminum alloys - Anodizing
Part 5: Testing the quality of sealed anodic
oxide coatings by measuring admittance, and
ASTM B 457-67
Display of result Admittance (Y) in microsiemens [ µS ]
Trueness 2) 1 % (of reading) + 0.5 µS
Repeatability precision 2) 0.5 % (of reading) + 0.3 µS
Measuring ranges 3):
Measuring cell ø 6 mm 4) 14 - 1880 µS
Measuring cell ø 13 mm 5) 3 - 400 µS = nominal measuring range
Measuring cell ø 26 mm 4) 0.75 - 100 µS
Adjustable meas. area 20 mm² - 600 mm²
Reference meas. area 133 mm² = nominal measuring area
Coating thickness range 3 µm - 100 µm adjustable
Reference coating
thickness
20 µm
Measurement frequency 1 kHz ± 0.0001 Hz
Reference temperature 6) 25°C
Temperature range 6) 10°C to 35°C selectable
Operator guidance /
display
8 languages selectable
Units of measure: metric only
Power supply Battery 9V6LR61 or
optional: NiCd rechargeable battery
Dimensions (L x W x H) 160 mm x 80 mm x 30 mm
Mass 240 g (incl. battery, without probe)
Permitted environmental
temperature during
operation 7)
5°C ... 45°C

Information regarding the index numbers in the technical data
1) This test method is not suitable for certain aluminum alloys that exceed
certain quantity portion limits of alloy materials (e.g., Si, Mn, Mg). They
are also not suitable for impregnated (cold-sealed) work pieces or work
pieces that have been dyed anodically. For more information, please
consult the current test instructions of your quality mark organization or of
your company.
2) The sought-after magnitude for “trueness” or “repeatability precision” is
always determined by adding the percentage components and the fixed
value, as follows:
“Percentage component of display” + “Fixed value“ = Sought magnitude
Example (Trueness): LCD display: “10 µS”
-> “Percentage value of display”: 1 % of 10 µS = 0.1 µS
-> “Fixed value”: 0.5 µS
Sought magnitude of the trueness: 0.6 µS
3) Information regarding the measuring range
The measuring range changes depending on the correction of the vari-
ables test area, temperature or thickness. Cf. examples on the following
page.
4) The measuring cells with diameters of 6 mm (measurement area
28.3 mm²) and ø 26 mm (measurement area 530.9 mm²) do not permit
measurements conforming to standard due to the measurement area
being too small or too large, respectively.
5) This is the standard measuring cell with an area of 133 mm² according to
DIN EN ISO 12373-5
Permitted storage
temperature 7)
5°C ... 60°C
Permitted rel. humidity 30 % ... 90 % (non-condensing)
Interface for remote data
transfer
RS232 interface for the documentation of the
measurement data using a printer or PC
9-pin micro-T-plug
Memory capacity max. 10,000 measurements
Applications max. 100 applications
Test solution (Electrolyte) aqueous potassium sulfate solution (35 g/l)
Order number - instrument 603-800

6) This is the standard measuring cell with an area of 133 mm² according to
DIN EN ISO 12373-5
6) “Reference temperature” and “Temperature range specimen”
refer to the temperature of the specimen.
7) The temperature information refers to the instrument surroundings,
not to the temperature of the specimen surface.
2.1 Examples for “Information regarding the measuring range”
Equations
Equation (1) Y1 = Ym * (133 / A)
Equation (2) Y2 = Y1 * f1
Equation (3) Y3 = Y2 * ( e / 20)
Additional information to equations 1 to 3
Cf. Chapter 8.3 ‘Application-specific computation of the admittance’,
page 26.
2.2 Measuring Cells
Three self-adhesive foam rubber rings, of different sizes, so-called “measur-
ing cells” are available (with diameters of 6 mm, 13 mm and 26 mm)
See 10 ‘Accessories’, page 33.
Reference
quantity
Nominal
meas. range
Actual
quantity
Corrected
meas. range
According
to equation
133 mm² 3 µS - 400 µS 50 mm² 8 µS - 1064 µS (1)
25°C 3 µS - 400 µS 15°C 3.6 µS - 480 µS (2)
20 µm 3 µS - 400 µS 10 µm 1.5 µS - 200 µS (3)
Standard measuring cell with
diameter 13 mm

3 Control Elements and
Instrument Technology
3.1 Particular Technical Properties of the
ANOTEST® YMP30-S Instrument
The following situation may arise:
A new measuring result flashes on the LCD display and a double acoustic
signal sounds
The ANOTEST® YMP30-S instrument warns the user in this manner that the
admittance is greater than 15 uS.
The default setting for the warning limit is 15 µS.
1) Socket of the
RS232 interface
2) Anode plug
with ground cable
3) Meas. probe
4) Measuring cell
5) Connection
terminal, connected
with the anode plug,
or ground cable
connected to the
ANOTEST instrument

You can change this setting (in the service functions ZERO).
If you set the value to a (very) large number, no warning occurs by flashing.
How to change the settings of the warning limit:
1. Press the ENTER key 10x
The text “157” appears on the LCD display.
2. Press the key 2x
The text “159” appears on the LCD display.
3. Press the ENTER key 1x
The text “FREE” appears on the LCD display.
This indicates that the instrument is in the service parameter setting
mode.
4. Press the ZERO key 1x
The text “Warning limit” and a number (as a rule, the default setting
15.0) appear on the LCD display.
5. You can change the setting to a different value using the or key.
Confirm the value with ENTER.
6. To exit the service parameter setting mode and return to measuring mode
press the DEL key 2x.
Ready. The instrument is again ready to make measurements.
Message “Reading above measuring range”.
This message appears on the display for readings above 400 µS when using
the standard measuring cell with a 13 mm diameter
“Reading above measuring range”
You may also print the message with your printer.
Such out-of-range measurements are not saved.
The measurement magnitude that triggers this display message for the mea-
suring cell types ø 6 mm and ø 26 mm is adjusted accordingly.
Maintenance of the connection terminal
The contact tips of this connection terminal (= the small screw clamp) must
not be rounded or damaged, otherwise it will not be able to penetrate the an-
odic coating. If necessary, re-sharpen the tip!

Technical differences from other instruments of the
HELMUT FISCHER MP instrument series
The service parameters of the ANOTEST® YMP30-S offer no options for set-
ting “specification limits”, “fixed block limits”, “i single readings” and “out-
lier monitoring”
Master calibration
Contrary to other Fischer instruments of the MP series, the master calibration
is not stored in the probe but in the instrument.
The master calibration is performed by service personnel authorized by
Fischer and is of no practical significance for the user.
Operation using the active RS232 interface
If the instrument is connected to a PC via an RS232 interface, the measure-
ment may be influenced by electrical interferences (EMC influence).
Remedy:
Separate the RS232 port from other electronic devices (e.g., a computer)
while making measurements (pull the plug).
Do not bend the probe cable!
This might lead to a break in the line.
The bending radius of the probe cable and of the ground cable should always
be greater than 50 mm!
Sonden-
anschluss-
leitung
R >= 50 mm!

4 Measuring
Plug in the probe cable in the instrument
Plug in the ground cable in the instrument
Image1 : Measuring system with ANOTEST® YMP30-S and accessories
4.1 Preparing the specimen
Recommended methods for cleaning the test area:
Degrease the test area using benzine.
If preservation agents containing silicon are to be removed, use a paste of ap-
prox. 5 percent in weight of Aerosil in benzine.
First, connect the ground wire to the part to be tested in a manner that pro-
vides for a good electrical connection to the ANOTEST®.
Then carefully stick the electrolyte cell onto the test location.
Measure the temperature of the specimen with a seprate thermometer
with an accuracy of 0.1 °C
Fill in the electrolyte in the measuring cell.
The admittance is measured after the counter electrode dips into the measur-
ing cell. The measurement should be accepted no sooner than 2 minutes after
measurement start.

4.2 Part 1 of the Measurement:
Checking instrument settings
Keyboard command Display
Continue with Chapter 4.3 ‘Part 2 of the
Measurement: Performing the Measure-
ment’, page 13
1) Press MENU
Temperature [°C]
Default setting: 25 °C
Measure the temperature with a sep-
arate thermometer and enter it into
the instrument at this point (using the
or key).
2) Press ENTER
Area [mm²]
Default setting: 133 mm²
This applies to the standard measur-
ing cell with a diameter of 13 mm
(Order number 384-002)
(To change, use the or key)
3) Press ENTER
Oxide coating [µm]
Default setting: 20 µm
IMPORTANT: The user measures
the coating thickness using a sepa-
rate coating thickness test instru-
ment and enters the reading from
this menu option.
(To enter, use the or key)
4) Press ENTER
Meas. time [Seconds ]
Default setting: 120 Seconds
The time of 120 sec corresponds to
the standard value according to DIN
EN 12373-5.
Other values may be entered (use
the or key).
5) Press MENU
Exit the Settings menu and return to
the measuring mode.

4.3 Part 2 of the Measurement: Performing the
Measurement
Prerequisites before beginning a measurement:
- Preparations must have been made
- Instrument must be switched on
- Instrument settings according to the current test situation
- Specimen and instrument must be electrically connected with the anode
plug/ground cable.
- An application must be set up and active
- Instrument must be in measurement mode (similar to example below)
Display Sequence
1) Display before the start of the measure-
ment
Probe tip is inserted into the measuring cell
2) Measurement in progress
3) End of the measurement
1) Insert the probe tip into the
electrolyte solution in the measur-
ing cell
The probe tip may touch the surface
of the anodic coating.
The automatic measurement se-
quence starts without any additional
actuation of a key or similar. An
acoustic signal sounds 1x.
2) Measurement in progress
- The countdown of the remaining
measuring time runs (display in sec).
- The current reading is displayed
continuously.
Caution: The probe tip must remain
immersed in the electrolyte while the
measurement is in progress; other-
wise, the automatic measurement
sequence is terminated.
3) End of the measurement
The automatic measurement se-
quence ends at the expiration of the
set measuring time (typically 120 s).
An acoustic signal sounds 1x.
The measurement appears on the
display in the unit Microsiemens
(µS).
To shorten the test use ENTER:
Cf. “Information 1” on the next page.

Information 1 : Shorten a measurement using ENTER while “Step (2)
Measurement is in progress”
The measuring time can be shortened manually at any time during the count-
down by pressing ENTER.
Pressing ENTER corresponds to the command for accepting the measure-
ment.
This can be used during a measurement or a normalization.
Note: If the you decide to shorten the prescribed time, the measurement no
longer conforms to the standard.
4.4 Notes Regarding the Measurement
Preferably, measurements are to be made between one hour and four hours af-
ter sealing and cool-down to room temperature, but never after more than 48
hours.
The reading will change during the initial 30 sec and will approach a constant
limit value after about 2 minutes. For this reason, DIN EN ISO 12373-5 does not
allow reading of measurements after 2 minutes at the earliest.
4.5 Evaluating the Measurement Results
Information about the sealing quality can be deduced from the admittance
reading.
To evaluate the measurement results, please refer to the quality test regula-
tions that are currently applicable in your company.
The quality of the sealed oxide coating is sufficient if the measured admit-
tance (and where applicable, corrected according to equations (1) to (3)) is
less than 15 µS (value based on experience, not on a technical standard!).

5 Testing the accuracy using an electri-
cal reference
The measurement accuracy of the ANOTEST® can be checked using the elec-
trical reference part YDR3 (part number 600-772). This part contains electri-
cal simulations of Y-values (4 so-called standards).
Test procedure:
The test tip and the plug of the ground cable are connected to the socket ter-
minals of the electrical reference instead of to the measuring cell.
Left: ANOTEST® YMP30-S with electrical reference part YDR3
Right: Full front view of the YDR3 with label “for ANOTEST YD8 only“ (previous version
of the instrument). This means, the two bottom socket terminals have no function re-
garding their use in connection with the ANOTEST® YMP30-S.
The following Y-values can be checked:
3 µS, 10 µS, 20 µS and 200 µS .

6 Normalization
This step is used to determine the zero point of the characteristic.
This compensates for potential properties of the instrument such as drift of
the electronics, or similar and reestablishes the original characteristic.
The probe and the ground plug are NOT plugged into the socket terminals of
the electrical reference part YDR3 (optional accessory) during the normaliza-
tion. Thus, this part is not absolutely necessary for the normalization.

Normalization
Display Sequence
Display in measuring mode prior to calling
the normalization mode. The application to
be calibrated (“Appl.: 1“) has been selected.
Probe and ground plug are NOT plugged into
the socket terminals of the el. reference part
YDR3 during the normalization.
Display at the beginning of the normalization
procedure
(Condition after step 1, ZERO key)
Display during the normalization
Prerequisites:
- Instrument is switched ON and in
measuring mode.
- Probe and ground plug are NOT
plugged into the socket terminals
1) Press ZERO,
to start the normalization of the current
application.
A z appears on the display and
remains on the LCD display during the
normalization.
2) Press FINAL-RES.
(NOT the ENTER key!)
The measurement of the so-called
“air” value starts automatically and the
countdown of the set measuring time
begins to run. The default setting is
120 seconds.
An acoustic signal sounds (1x) when
this time is expired.
The display returns to that of the regu-
lar measuring mode.
FINISHED.
The normalization is finished.
The instrument is again ready to make
measurements.

7 Corrective calibration
7.1 When to calibrate?
We recommend to calibrate every 12 months.
7.2 Function of a corrective calibration
A corrective calibration determines anew the calibration curve (= character-
istic) of the open application and stores it in that application. Through a mea-
surement, the zero point and two additional points are determined (using two
calibration standards).
Note: The master characteristic determined in the factory remains unchanged
in the data memory of the instrument after a corrective calibration.
7.3 Performing a corrective calibration
For corrective calibration, you require:
ANOTEST® instrument with probe and ground cable connected
ready to operate. Cf. Chapter “Start-Up”
The application to be calibrated must be set up already.
Cf. Chapter “Setting Up an Application”
Electrical reference part YDR3
(available as optional accessory; part number 600-772)
Note: Measurement and temperature values in the description of the sequence
are examples only.
7.4 Selecting the calibration standards
Select the following socket terminals for the calibration (instrument-internal
names: “Standard 1” and “Standard 2”):
Standard 1: 3 µS
Standard 2: 200 µS

How to perform a corrective calibration:
Display Sequence
Display in measuring mode prior to calling
the calibration mode. The application to be
calibrated (“Appl.: 1“) has been selected.
Entering the temperature
Entering the area
Entering the oxide coating
Prerequisite:
- Instrument is switched ON and in
measuring mode.
- Probe and ground plug are NOT
plugged into the socket terminals
1) Press CAL to start the corrective
calibration of the current application.
A j appears on the top right and
remains on the LCD display during the
corrective calibration.
2) Enter the current temperature
The temperature setting is always
25° C.
Press the ENTER key to accept the
value.
3) Area [mm²]
Default setting: Keep 133 mm²
This applies to the standard measur-
ing cell with a diameter of 13 mm
value.
4) Oxide coating [µm]
Default setting: keep 20 µm
(thickness)
value.

Display at the beginning of step 5 “Air”
Display with the prompt to provide “Standard
1”.
Socket connection on the electr. reference
part during the measurement of standard 1
Display during the measurement of standard
1
5) Air
This step is used to determine the so-
called zero point of the calibration
curve.
Press the FINAL-RES key.
(Do NOT press ENTER!)
The measurement starts automatical-
ly and the countdown of the set mea-
suring time begins to run. The default
setting is 120 seconds.
For a few seconds, 4 dashes
- - - - appear on the display.
The LCD display will then prompt you
to provide “Standard 1”. This refers to
the first calibration standard (Example:
3.00 µS).
For information about selecting cal-
ibration standards see above.
6) Measuring the calibration stan-
dard “Standard 1”
- Plug the probe into the first socket
terminal of your choice in the left row
“ELECTRODE”.
- Plug the ground plug into the sock-
et terminal with the mark
At the end of the measurement:
Set the nominal value for
“Standard 1” using the arrow key
or (Example: 3.00 µS).
measured value
Display Sequence

Display with the prompt to provide “Standard
2”
Socket connection on the electr. reference
part during the measurement of “Standard 2“
Display after the measurement of “Standard
2“
The prompt to provide “Standard 2”
appears on the LCD display. This re-
fers to the second calibration standard
(Example: 200.00 µS).
- Plug the probe into the respective
socket terminal in the left row
“ELECTRODE” (Example: 200 µS).
- The ground plug is plugged into the
socket marked
At the end of the measurement:
Set the nominal value for
“Standard 2” using the arrow key
or (Example: 200 µS).
nominal value.
FINISHED.
The calibration is finished.
The instrument is again ready to make
measurements.
The new characteristic is calculated
and stored automatically.
Display Sequence

8 Measuring principle
The ANOTEST® YMP30-S is used for the measurement of the quality of an-
odic oxide coatings on aluminum and aluminum alloys. The instrument,
therefore, allows for a fully non-destructive, very simple determination of the
sealing quality.
8.1 About the need for aluminum surface protection
As a non-precious metal, aluminum is subject to corrosion, however, contrary
to iron, it forms together with oxygen a corrosion-resistant oxide coating. Be-
cause of this chemical reaction, under normal circumstances the aluminum
surface remains in a very good condition; this is enhanced by the fact that the
protective oxide coating starts rebuilding when damaged.
For many applications (especially for outside applications) this natural oxide
coating is not sufficient, because, for example, even the smallest inclusions of
heavy metals can prevent a natural oxide coating without gaps, allowing for
corrosion to occur in those areas.
There are essentially two options for preventing corrosion:
1.) Attempting to achieve a perfect oxide film by using high-purity aluminum.
2.) Improving this natural oxide film through suitable measures.
Solution #1 would increase the costs for aluminum production significantly
and is, therefore, ruled out.
ANODIC OXIDATION (in Europe often referred to as eloxal method = elec-
trolytic oxidation of aluminum) has generally established itself as a suitable
solution according to #2. An electrical current is used to release oxygen,
which immediately reacts with the aluminum surface and forms the desired
oxide coating.
Two Japanese researchers, SETOH and MIATA, have discovered through tri-
als and measurements that the oxide coating produced by ANODIC OXIDA-
TION must consist of two entirely different layers. That is to say, at a constant
current density, the bath voltage increases over time only insignificantly
while at the same time the film thickness increases greatly. In the end, this
means that the electrolyte penetrates into the oxide coating, thus making it
electrically conducting, while the main portion of the voltage drop must occur

at another layer. This very thin, electrically insulating film determines the
corrosion behavior. It is known under several designations:
"active layer", "dielectric layer", "compact layer", "barrier layer".
The thickness of the active layer is roughly proportional to the applied bath
voltage. Located above it is the porous and to some degree electrically con-
ducting oxide coating.
8.2 Measurement method to test the after-treatment /
sealing quality
Up until this state, the oxide coating is very sensitive due to its fine pore struc-
ture and its large active surface, making an after-treatment essential. This af-
ter-treatment is known as "sealing".
First, the aluminum components must be cleaned thoroughly. Additionally,
the sealing quality is influenced by the following parameters:
Quality of the oxide coating (determined by the bath temperature,
circulation, current density, impurities)
Sealing time
Temperature of the sealing bath
pH value of the sealing solution
Impurities
Since all the points mentioned above are associated with costs, a measure-
ment method is desired that can test the quality of the anodic coating in gen-
eral and the sealing quality in particular in a simple and nondestructive man-
ner. The admittance measurement method has become a generally accepted
method for this task.
Prior to sealing After sealing

Equivalent circuit diagram according to SETOH and MIATA .
C1/R1 effective impedance of the active coating
C2/R2 effective impedance of the porous main coating
Since both R1 and C2 are highly resistive, the circuit can be simplified to the
following complex impedance (of course, other simplifications apply as
well).
The inverse value of this impedance is the admittance Y = 1 / Z measured by
the ANOTEST® YMP30-S.
The ANOTEST® YMP30-S has been developed specifically for this measure-
ment application. Measurement method and evaluation adhere strictly to the
European standard: EN 12373-5 (replaces DIN 50949).
The measuring cell consists of a rubber ring with a self-adhesive ring surface
and a test area of 133 mm².
The electrolyte to be used is an aqueous potassium sulfate solution (35 g/l).
Preferably, the measurements are to be made 1 to 4 hours after sealing and
cool-down to room temperature, but never after more than 48 hours.
First, connect the ground wire to the part to be tested in a manner that provides
for a good electrical connection to the ANOTEST®. Then carefully stick the
electrolyte cell onto the test location. The admittance is measured after the
counter electrode dips into the measuring cell. The measurement should be
accepted no sooner than 2 minutes after measurement start.

8.3 Application-specific computation of the admit-
tance
The ANOTEST® YMP30-S can compute the application-specific factors:
Formula 1) Y1 = Ym * (133 / A)
Formula 2) Y2 = Y1 * f1
Formula 3) Y3 = Y2 * ( e / 20)
Thus, the ANOTEST® YMP30-S instrument can take the test area, the coat-
ing thickness and the temperature into account, even if these variables do not
correspond to the reference quantities of the standard.
Ym
Measured admittance in microsiemens [ µS ]
This value is corrected for the test area if the area is not 133 mm²
A Test area [square-millimeter]
(= inner area of the measuring cell)
f1
Temperature coefficient (according to DIN EN ISO 12373-5)
This value is temperature-corrected if the temperature is not
25°C
e Thickness of the anodic oxide coating [micrometer]
Y1 Admittance corrected by the test area
Y2 Temperature-compensated admittance
Y3 Admittance corrected by the coating thickness
This value is coating thickness-corrected if the coating thickness
is not 20 µm

8.4 Measurement
The reading will change during the initial 30 sec. and will approach a constant
value after about 2 minutes. For this reason, DIN EN ISO 12373-5 allows read-
ing of measurements after 2 minutes at the earliest.
8.5 Evaluating the results
Information about the sealing quality can be deduced from the admittance
readings.
For an anodic coating with a coating thickness of 20 µm and a sealing time of
60 minutes at about 98° - 100°C in steam or DI water, the Y-value should not
exceed 15 µS.
A slow increase in the reading is not critical as long as the increase is only
l - 2 µS and stops after about 2 - 10 minutes. An increase of 18 7- 25 µS points
to chalking; coatings with values above 25 µS indicate that anodizing and
sealing is insufficient. These basic values apply to the alloys AlMySi 0.5,
AlMg and to pure aluminum. For AlSi 5, a value of about 10 - 20 should be
added. Depending on the source, composition, heat treatment and aluminum
content of the anodizing bath, AlMgSi l shows heavily scattered values that,
as a rule, will be above 15 µS.

9 Nomograms, Tables, Characteristics
----- projected profile ----- actual profile
TE 00768: Admittance of thin coatings under
standard anodizing conditions
Individual variations of the standard conditions
TE 00968: Effect of the anodizing and sealing conditions on the
admittance Y

Coating thicknesses = 20 µm
TE 01868: Dependence of the admittance Y on the anodizing conditions at
similar sealing conditions
Coating thicknesses = 20 µm Sealing time in steam at 108°C
TE 01968: Dependence of the admittance Y on the sealing time
Anodizing
conditions

Electrolyte temperature
Current density [ A / dm² ] Sealing times o 1 min/µm 4 min/µm
TE 00369: Decrease of the initial values of the admittance Y after 30 days
of room storage

Conversion table of the admittance to the standard coating thickness of
20 µm referenced to a material temperature of about 20°C
Computation according to the bibliography in the operators manual ANOTEST YMP30-S, Helmut Fischer GmbH+Co.KG

10 Accessories
Order information
Item Order No.
Instrument incl. accessories
ANOTEST® YMP30-S 603-800
Optional accessories
ELECTRICAL REFERENCE YDR3 600-772
SUPPORT PLATFORM FOR 600-025
THE PORTABLE INSTRUMENT
INTERFACE 602-341
CONNECTION SET MP
SOFTWARE PC-DATEX 602-465
SOFTWARE PC-DATACC 603-028
PRINTER FMP3040 602-890
CARRYING BOX MP 602-891
CARRYING CASE 602-120
MP0D/30/40
Spare parts
Measuring cable YMP30-S 603-855
Ground cable ANOTEST 600-767
Screw clamp, stainless steel 600-766
BOTTLE TEST SOLUTION 600-768
VE MEASURING CELLS ø 6 mm 600-769

10.1 Regulations, legal information
10.2 Disposal
This symbol means:
Do not dispose of this product with household waste!
Please follow the guidelines in your area concerning proper disposal of used
electrical equipment and electronic accessories, or ask your authorized dealer
for the respective information.
Recycling of this product helps maintain natural resources and prevents po-
tential negative effects on the environment and health that could be caused by
wrong handling.
10.3 Trademarks
ANOTEST® is a registered trademark of Helmut Fischer GmbH+Co.KG,
Sindelfingen.
Windows® is a registered trademark of the Microsoft Corporation.

11 Additional technical information
11.1 Anodizing
Anodic oxidation is an electrolytic method for producing protective oxide
coatings on metals. During the electrolysis in a suitable solution (preferred
are sulfuric, oxalic or chromic acid), an oxide coating (typically with a thick-
ness of 10 – 25 µm) forms on the surface of the anodically switched metal
parts and can be dyed using inorganic materials or organic dyes and can be
sealed in an after-treatment step. The primary purpose of the coating is to pro-
tect the metals from corrosion and abrasion (hard anodizing) but also to serve
as electrical insulation or as a decorative coating. After impregnation with
light-sensitive silver compounds, photographic images and drawings can be
applied as well (e.g., to create scales or signs).
Anodic oxidation is possible with various metals, however, currently it has
technical relevance only for light metals. Anodic oxidation is of particular im-
portance for aluminum and Al alloys. Anodized aluminum is used extensively
in architecture (house facades, doors, window frames), in the automotive in-
dustry, in container construction and for equipment components.
The anodizing steps can be divided into
Pretreatment (cleaning, etching, polishing, pickling)
Anodizing (various methods)
After-treatment (dying, sealing, cold sealing).
What is anodizing?
Anodic oxidation is an electrochemical process that converts the surface of
the aluminum to aluminum oxide. The oxide coating is connected directly to
the aluminum and the coating thickness can be selected within a certain range.
Why anodize?
Anodizing permanently protects the aluminum.
Anodizing makes the aluminum easy to clean.
Anodizing improves and maintains the decorative appearance.

HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK
www.helmut-fischer.de mail@helmut-fischer.de
Coating Thickness Material Analysis Microhardness Material Testing
EC DECLARATION OF CONFORMITY
The manufacturer herewith declare for the product ANOTEST® YMP30-S, sealing quality
tester for anodic oxide coatings on aluminium:
The product corresponds to the following directives and standards/acts:
Further applied standards and regulations:
This declaration will become invalid, in case of customer‘s own changes that have not been
approved by the manufacturer.
Manufacturer: HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK
Industriestraße 21
D-71069 Sindelfingen
Representative: Mr. Bernhard Scherzinger, Chief Engineer, Quality
Sindelfingen, the 8. October 2015
LVD - Low Voltage Directive 2014/35/EC EN 61010-1
EMC Directive 2014/30/EC EN 55011
Product Safety Directive 2001/95/EC Product Safety Act (ProdSG)
BGV A3 §5, paragraph 4 of accident prevention regulations "Electrical systems
and equipment"
EMC EN 61000-4-2
EN 61000-4-3
EN 61000-4-4
EN 50082-2
(Signature)

A
accessories 33
accuracy of the ANOTEST® 15
active layer 24
Additional literature 2
Admittance 3
after-treatment 24
ANODIC OXIDATION 23
Applications 1
application-specific factors 26
Application-specific settings 1
Assigning application names 1
B
barrier layer 24
C
calibration standards 18
Cleaning 2
cleaning the test area 11
compact layer 24
configuration programs 2
Connecting a computer 2
Connecting a printer 2
control panel 1
Conversion table of the admittance
32
corrective calibration 18
D
Data export 1
data import 1
Deleting applications 1
dielectric layer 24
Dimensions 3
disposal 34
Documentation of the measurement
using the printer 1
E
Electrolyte 4
electrolytic oxidation of aluminum
23
eloxal method 23
Equivalent circuit diagram 25
Erroneous measurements 1
Evaluation 1
Evaluation of the current application
1
Evaluation of the current block 1
F
frequency 3
G
ground cable 11
H
humidity 4
I
Instrument configuration 2
Intended use 3
K
keys 1
L
languages 3
LCD Display 1
List of set up applications 1
M
Master calibration 9
Meas. time 12
Measurement accept signal 2
Measuring 12
Measuring cell 3
measuring cells 5

Measuring ranges 3
Memory capacity 4
N
nominal measuring area 3
nominal measuring range 3
normalization 16
O
Order number 4
Output format for the measure-
ments 1
Overwriting applications 1
Oxide coating 12
P
pH value 24
potassium sulfate solution 4
Power supply 3
printer 2
probe cable 11
Probe connection and probe repla-
cement 2
Protocol of the instrument configu-
ration 2
R
Reference temperature 3
remote control of the instrument 1
Repeatability precision 3
RS232 interface commands 2
S
Sales and repair offices 2
sealing 24
Sealing time 24
Selecting applications 1
Service functions 2
Setting the date and time 2
Setting up applications 1
Spare parts 33
Standards 2
Start-up 2
Start-up, maintenance and cleaning
2
Statistics and coating thickness
measurement 2
T
Technical terms and equation cha-
racters 2
Temperature range 3
Test solution 4
trademarks 34
Transferring the measurement data
to a computer 1
Trouble shooting and messages 2
Trueness 3
V
Voltage supply 2
W
warning limit 8
Warranty 2
Y
Y = 1 / Z 25
YDR3 15
Z
zero point of the characteristic 16

Operators Manual
ISOSCOPE®
MP30E-R
ISOSCOPE®
MP30E-S
DELTASCOPE®
MP30E-R
DELTASCOPE®
MP30-S-Ni
DELTASCOPE®
MP30E-S
DUALSCOPE®
MP40E-R
DUALSCOPE®
MP40E-S
Coating Thickness Material TestingMicrohardnessMaterial Analysis

Handheld Instruments Series MPxxE
Instruments for coating thickness measurements.
On our home page www.helmut-fischer.com you will find the addresses of our
sole agencies and subsidiary companies around the globe.
© 2008 by Helmut Fischer GmbH, Sindelfingen, Germany
This manual remains the copyrighted property of Helmut Fischer GmbH Institut
für Elektronik und Messtechnik. All rights reserved. This manual may not be re-
produced (print, photocopy, microfilm or any other method) in full or in part, or
processed, multiplied or distributed to third parties by electronic means without
the written consent of the Helmut Fischer GmbH Institut für Elektronik und
Messtechnik.
Subject to correction and technical changes.
DELTASCOPE® , ISOSCOPE® and DUALSCOPE® are registered trade marks
of the Helmut Fischer GmbH Institut für Elektronik und Messtechnik in Germany
and/or other countries.
Note: The fact, that the trademark characters ® and ™ may be missing does not
indicate that such names are free trademarks.
Document order number
902-583
Version
5.2
Issue date
08/2008
Instrument manufacturer:
Helmut Fischer GmbH Phone: +49 7031 303-0
Institut für Elektronik und Messtechnik Fax: +49 7031 303-710
Industriestraße 21 www.helmut-fischer.com
D-71069 Sindelfingen mail@helmut-fischer.de
Quality Assurance System of the Helmut Fischer GmbH
DIN ISO 17025 Calibration lab with DKD accreditation according to
DIN ISO 17025 in the corresponding valid version for cer-
tified mass per unit area standards
ISO 9001 Certified according to ISO 9001 in the corresponding valid
version, German Lloyd Certification

Operators manual hand-held instrument MP30/40 Page 2
1.1 Symbols and styles used................................................................. 5
1.2 Abbreviations.................................................................................. 6
1.3 General Note.................................................................................. 6
1.4 Trademarks.................................................................................... 6
2 Introduction to the instrument.................................................................. 7
2.1 Intended use................................................................................... 7
2.2 Requirements on the operating personnel........................................ 7
2.3 Power supply.................................................................................. 7
2.4 Environmental conditions for operation and storage of instrument and
accessories.......................................................................................... 7
3 Instrument and accessories description .............................................. 9
3.1 Measurement application capabilities and test methods ................... 9
3.2 Keypad functions ...........................................................................11
3.3 Display ..........................................................................................14
3.4 Probes...........................................................................................15
3.5 Calibration standards.....................................................................18
4 Switching the Instrument ON and OFF...................................................20
4.1 Switching the instrument ON..........................................................20
4.2 Test method of the connected probe...............................................23
4.3 Switching the instrument OFF ........................................................24
5 Applications ..........................................................................................25
5.1 Selecting the desired application ....................................................25
5.2 Creating an application ..................................................................27
5.3 Creating an application with a dual probe........................................29
5.4 Overwriting an application..............................................................29
5.5 Overwriting an application with a dual probe ..................................32
5.6 Deleting an application...................................................................32
5.7 List of existing applications.............................................................33
5.8 Assigning application names..........................................................35
5.9 Application-specific settings ...........................................................36
5.9.1 Specification limits monitoring.................................................37
5.9.2 Display resolution...................................................................39
5.9.3 Automatic block formation and block size................................40
5.9.4 “Mean reading” mode .............................................................45
5.9.5 Outlier rejection......................................................................46
5.9.6 Display modes........................................................................48
5.9.7 Dual method...........................................................................50
5.10 Linking the applications................................................................51
5.10.1 Enabling or disabling the linking mode...................................54
5.10.2 Linking mode at dual probes .................................................54
6 Standard and matrix measuring mode....................................................55
6.1 Changing the measuring mode.......................................................55
6.2 Standard measuring mode.............................................................55
6.3 Matrix measuring mode..................................................................56

6.4 Changing blocks............................................................................58
6.5 Assigning block names ..................................................................58
7 Measurement........................................................................................60
7.1 Preparations for measurement .......................................................60
7.2 Making a measurement..................................................................60
7.3 Measurement accept .....................................................................64
7.4 Measurements with external start enabled......................................64
7.5 Acoustic signals after measurement accept ......................65
7.6 Display of the test method used when measuring with dual probes.66
7.7 Measurement with specification limits monitoring enabled ..............66
7.8 Measurement with fixed block size .................................................68
7.9 Measurement with ”Mean Reading” mode enabled.........................69
7.10 Measurement with outlier rejection enabled ..................................70
7.11 Recording the measurements with a printer ..................................71
7.12 Printing measurements later.........................................................71
7.13 Erroneous measurements............................................................73
7.13.1 Deleting single erroneous measurements..............................73
7.13.2 Deleting all measurements of an open block..........................73
7.13.3 Deleting all measurements of the current application ............73
7.13.4 Overwriting single erroneous measurements later..................73
7.13.5 Measurement with ”continuous” display mode .......................75
7.13.6 Turning the ”continuous” display on and off ...........................76
7.13.7 Measurement with ”continuous” display mode enabled ..........76
7.13.8 Analog display......................................................................77
7.13.9 Measurement with ”Continuous” display using dual probes ....79
7.13.10 Measurement with standard or matrix measuring mode
enabled ..........................................................................................79
7.13.11 Measurement with standard measuring mode enabled.........80
7.13.12 Measurement with matrix measuring mode enabled............80
7.14 Transferring measurements to a computer and remote control of the
Instrument...........................................................................................82
7.15 Output format of the measurement data string ..............................82
7.16 Transferring the measurements to an external computer ...............82
8 Evaluation.............................................................................................84
8.1 Evaluation of the current block (block result)...................................85
8.2 Recording the block result with a printer .........................................88
8.3 Evaluation of the current application (final result) ............................91
8.4 Recording the final result with a printer ...........................................96
9 Normalization and corrective calibration...............................................100
9.1 Hints for normalization and corrective calibration...........................100
9.1.1 Normalization and corrective calibration with dual probes ......101
9.2 Reference Measurement..............................................................102
9.3 Normalization ..............................................................................102
9.3.1 Performing a normalization...................................................103
9.3.2 Recording a normalization with a printer................................104

9.4 Corrective calibration ...................................................................105
9.4.1 Corrective calibration............................................................106
9.4.2 Deleting the corrective calibration..........................................109
9.4.3 Recording the corrective calibration with a printer..................111
9.5 Calibration on the coating.............................................................112
9.5.1 How to calibrate on the coating.............................................112
9.5.2 Recording the calibration on the coating................................115
9.6 Master calibration ........................................................................116
9.6.1 Determination of calibration standards for master calibration..116
10 Technical Data..................................................................................122
10.1 Measurement application capabilities..........................................122
10.2 Technical data ...........................................................................123
10.3 RS232 interface.........................................................................124
10.3.1 Factory settings..................................................................124
11 Start-up, maintenance and cleaning...................................................125
11.1 Instrument start-up.....................................................................125
11.2 Power supply.............................................................................125
11.3 Connecting or replacing a probe.................................................127
11.4 Opening the instrument or the accessories .................................129
11.5 Handling the probes...................................................................129
11.6 Handling, storing and transporting the calibration standards.......130
11.7 Warranty....................................................................................130
12 Instrument configuration ....................................................................131
12.1 Acoustic measurement accept signal..........................................131
12.2 Enabling the measurement accept signal....................................131
12.3 Disabling the measurement accept signal...................................131
12.4 Setting the date and time............................................................132
12.5 Restricted operating mode .........................................................134
12.5.1 Enabling and disabling the restricted operating mode ..........135
12.6 Configuration programs..............................................................135
12.6.1 Configuration program FINAL-RES ....................................137
12.6.2 Configuration program BLOCK-RES (histogram mode and
block result mode).........................................................................138
12.6.3 Configuration program ZERO (unit of measurement, date
format, time, date, language, display mode, measurement accept,
external start mode and delay) ......................................................139
12.6.4 Configuration program CAL (master calibration) .................143
12.6.5 Configuration program  (re-initialization)...........................143
12.6.6 Configuration Program  (parameter RS232 interface) ......144
12.6.7 Configuration program APPL No (application linking mode and
measuring mode)..........................................................................146
12.6.8 Configuration program PRINT (Printer)................................148
12.6.9 Record of the instrument status...........................................150
13 Errors................................................................................................152
14 Display Messages .............................................................................155

1 Conventions
1.1 Symbols and styles used
The following symbols and styles are used in this operator manual:
Indicates safety remarks and warnings of possible
damage to the instrument or the accessories or
danger to the operating personnel

Indicates particularly important information and notes
·
Indicates listings
01
Indicates a measurement, which has to be performed
as next action (perform the measurement with the
probe connected! The axial single tip probe is used
only as symbol for all probes, which can be
connected!)
ENTER Refers to instrument keys
ON/OFF +ENTER Refers to instrument keys, which have to be pressed
immediately one after the other (do not keep both keys
pressed!)

  
   
Simplified representation of the display with all
elements relevant for the current action
 
Style used for those prompt lines on the display, which
are displayed alternately with the lines appearing
above them
 
Styles used for operating notes appearing in the
prompt lines on the display
 

Style used for error messages and warnings
appearing in the display
 
Style used for text appearing on a printout.

”7 Measurement” Cross reference to a chapter of this operator manual
Seite 3 Cross reference to a page of this operator manual
Histogramm Cross reference to an additional term, that is also
explained in chapter ”11 Glossary of Terms and
Symbols”
/ 1 / Cross reference to additional literature, listed in
chapter ”12 Additional Literature” (from page 87)
1.2 Abbreviations
The following abbreviations are used in this operator manual:
Abbreviation Explanation
CR Carriage Return (ASCII character)
CuBe Copper-Beryllium
Fe ferromagnetic
LF Line Feed (ASCII character)
NC electrically nonconductive
NF nonferromagnetic
SM substrate material (= uncoated measuring object)
Table 1.1: Abbrevations used
1.3 General Note
Illustrations of displays in this manual are examples only. Actual coating
thickness measurement data, the prompt lines in the display (e. g. the
number of the selected application, the number of measurements stored in a
particular application) or the results of an evaluation depend on your
individual application. It is possible that different numbers appear in the
display. This is not an indication of any malfunction.
1.4 Trademarks
DELTASCOPE
®
, ISOSCOPE
®
and DUALSCOPE
®
are registered
trademarks of Helmut Fischer GmbH.
All names of the products mentioned in this manual are marks of the
respective companies. The fact that the trademark characters ®
or ™
are missing does not indicate that the names are free trademarks.

2 Introduction to the instrument
2.1 Intended use
The instruments DELTASCOPE
®
MP30E, ISOSCOPE
®
MP30E and
DUALSCOPE
®
MP40E are used for coating thickness measurement only.
Only accessories recommended or used by Fischer (e.g. AC power supply,
probes, printer) may be connected to the instrument.
2.2 Requirements on the operating personnel
The instruments should be operated by suitably qualified personnel only!
Knowledge about configuration, operation and programming of the computer
as well as of the software used, is necessary to connect the instrument to a
computer. Refer to the corresponding operator manuals if necessary.
2.3 Power supply
To prevent damage to the instruments or wrong
measurement results due to wrong A/C line voltage,
connect the instruments to a power outlet only with the
AC power supply supplied by Fischer.
The A/C line voltage must agree with the A/C line voltage
rating on the serial number plate of the AC power supply.
2.4 Environmental conditions for operation
and storage of instrument and
accessories
The instruments DELTASCOPE
®
MP30E, ISOSCOPE
®
MP30E and
DUALSCOPE
®
MP4E0 are designed to meet and comply with all
requirements as set forth in the ordinance about electromagnetic
compatibility of instruments. The measured coating thicknesses are not
influenced by the highest level of interference as stated in the guideline EN
50082-1 (which refers to EN 61000-4-2, ENi61000-4-3 and EN 61000-4-4.

In particular, the instrument is effectively shielded from electromagnetic
fields (e.g. motors, power lines, etc.).
Instrument and accessories are designed for use at temperatures between
5 and 45°C (41 ... 113°F). The equipment may be stored at temperatures
between 5 and 60°C (41 ... 140°F).
Temperatures behind windows (e.g. in cars) in direct
sunshine rise easily above 60 °C (140°F).
To avoid damage to the instrument or the accessories by
heat, do not keep or store the instrument or the
accessories in such places.
Because of danger of short circuits instrument and
accessories (in particular the AC power supply) must not
come in direct contact with fluids!
Instrument and accessories may be operated, kept and
stored only in places where the environmental relative
humidity is between 30 and 90 % (non-condensing).
Instrument and accessories are not acid resistant!
Make sure to avoid direct contact of acid or acid solutions
with the instrument or the accessories.
Instrument and accessories must not be operated in an
explosive atmosphere!
Instrument and accessories are to be protected from
static charge!
Electric discharges may delete internally stored data or
damage internal components.

3 Instrument and accessories
description
The functions and the operation of the instruments described in below table
is identical. The instruments only differ in the test method used, therefore in
the measurement application capability and the probes which can be used
for measurement (see tables below).
3.1 Measurement application capabilities
and test methods
Instrument model Thickness
measurement of
Test method
DELTASCOPE
®
MP30E
Nonferromagnetic
or nonconductive
coatings on steel
or iron
Magnetic induction test method
according to DIN EN ISO 2178,
ASTM B499 or BS 5411/11
ISOSCOPE
®
MP30E Nonconductive
coatings on non-
ferromagnetic
substrates
Eddy current test method
ASTM B244 or BS 5411/3
DUALSCOPE
®
MP40E
Nonferromagnetic
or nonconductive
coatings in steel
or iron
Nonconductive
coatings on non-
ferromagnetic
substrates
Magnetic induction test method
Eddy current test method
Table 3.1 Measurement application capability and test method

3.2 Front and rear view
The marked or displayed instrument model is the only difference between
the front view of the instrument models DELTASCOPE
®
MP30E,
ISOSCOPE
®
MP30E and DUALSCOPE
®
MP40E. The rear view of these
instruments is identical.
Figure 3.1: Front view of the
DUALSCOPE®
MP40E
Figure 3.2: Rear view

3.2 Keypad functions
The white and grey rectangles of the keypad are the actual membrane keys.
Pressing and releasing a key produces a slight click.
Pressing the text above the key instead of the key membrane will not actuate
the key function.
The overview on the following pages contains a brief description of the
individual keypad functions:
Key Function
DEL Delete the last measurement;
pressing DEL repeatedly: delete the measurements
of the current block one after the other;
during normalization:
1x DEL -delete the last measurement,
2x DEL -delete the measurement series taken on
substrate material;
during calibration:
1x DEL -delete the last measurement,
2x DEL -delete the measurement series taken on the
current calibration standard,
pressing DEL repeatedly -delete the measurement
series taken on the previous calibration standards
FINAL-RES Call-up final result; pressing FINAL-RES repeatedly:
display in sequence the parameters of the final result
(mean value, standard deviation, ...);
followed by ENTER: end the display of the final result
(return to measurement) without deleting the stored
values (the current measurement block will be
closed);
followed by DEL: delete the stored values of the
current application and end the display of the final
result (return to measurement);
during normalization and calibration: enabling and
disabling the ”continuous” display mode (display the
normalized probe output signal of the measurement,
measurements will not be stored and not be used for
calibration or normalization purposes), or with
enabled external start: initiate a measurement
BLOCK-RES Call-up block result; pressing BLOCK-RES
repeatedly: display in sequence the parameters of
the block result (mean value, standard deviation, ...);

followed by : end the display of the block result
(return to measurement) without closing the current
measurement block (current measurement series
can be continued);
followed by : display the block result of the
previous measurement block (pressing  repeatedly
will display all block results of the current
application);
followed by PRINT: print the displayed block result;
followed by MENU: display the single readings of the
evaluated measurement block (pressing s repeatedly
will display all single readings), pressing MENU
again will terminate displaying the single readings;
followed by DEL: delete the measurements of the
last open measurement block and end the display of
the block result (return to measurement);
followed by ENTER: end the display of the block
result (return to measurement) and close the current
measurement block
ON/OFF Switch the instrument on and off;
ON/OFF + : switch the instrument on and enable
the acoustic measurement accept signal (with the
instrument switched off before);
ON/OFF +
switch the instrument on and disable the acoustic
measurement accept signal (with the instrument swit-
ched off before);
ON/OFF + DEL: switch the instrument on and enable
the restricted operating mode (with the instrument
switched off before);
ON/OFF + ENTER: switch the instrument on and
disable the restricted operating mode (with the
instrument switched off before);
ON/OFF + PRINT: switch the instrument on and print
the instrument status record (with the instrument
switched off before);
ON/OFF + ZERO: switch the instrument on and set
time and date (with the instrument switched off
before)
ZERO Call-up the normalization
CAL Call-up the corrective calibration; followed by CAL:
cancel the corrective calibration;
CAL + DEL: delete the corrective calibration of the
current application;

CAL + ZERO: call-up the calibration on coating (only
possible with magnetic induction probes or the
magnetic induction channel of dual probes!);
CAL + APPL No: call-up the master calibration
 Change the displayed numerical values or
parameters during application selection, calibration,
or parameter entry (if  is pressed for more than 3
seconds, the display will change faster);
with enabled external start: initiate a measurement
 Enabling and disabling the ”continuous” display
mode;
Change the displayed numerical values or
parameters during application selection, calibration,
or parameter entry (if  is pressed for more than 3
seconds, the display will change faster)
APPL No Selecting the desired application;
followed by DEL: delete the selected application;
followed by PRINT: print the list of all previously
created applications
MENU Display and change the application specific settings
(by pressing ENTER repeatedly, specification limits,
display resolution, block size and number of single
readings (which have to be taken before the actual
measurement is computed as mean value of these
single readings), as well as outlier rejection can be
displayed in sequence and changed by pressing 
or ); followed by MENU: stop the display of the
application specific settings and return to
measurement;
MENU + DEL + MENU: disable specification limits
monitoring and return to measurement;
MENU + ( or ) + MENU: enable specification
limits
monitoring and return to measurement;
MENU + PRINT: print or display the instrument
status record
PRINT Print the values stored in the current application
(with block results) or
transfer them to the connected computer
ENTER Confirm the input;
10x ENTER: call-up the configuration programs

3.3 Display
The display consists of multiple segments and symbols.
At power-up with ON/OFF, briefly all segments and symbols will appear
simultaneously. Additional explanations: chapter ”4.1 Switching the
instrument ON” on page 5)
Figure 3.3: Display (Example)
Display element Explanation
g Fischer trademark
z Indicates that a normalization is performed (on
uncoated measuring object (= substrate material))
 NF/Fe Indicates that measurements using the magnetic
induction test method are performed
 NC/NF Indicates that measurements using the Eddy current
test method are performed
j Indicates that a calibration is performed
b Bell: indicates that specification limits monitoring is
enabled
e Padlock: indicates that the restricted operating mode
has been enabled, i.e. the keys ZERO, CAL and
MENU are not active, it is not possible to call-up the
configuration programs or to delete applications
p Arrow-circle: indicates that the ”continuous” display
mode has been enabled resulting in continuous
display of the measuring with placed probe
 Arrow upwards: indicates that the upper specification
limit has been violated
 Arrow downwards: indicates that the lower
specification limit has been violated

 Both arrows together: indicates that the displayed
measurement value has been recognized as outlier
-8.8.8.8 Number elements to display the measurement
values, error messages and warnings
Unit of measurement of the display value
s Battery (flashing): indicates that the battery has to be
changed or recharged, because of low battery
voltage
c Hour glass: indicates that the instrument is busy
v Chain: indicates that all applications, created with the
very same probe, are linked, i.e. the same
normalization or corrective calibration is used for the
measurements performed in those applications
t Wrench: indicates that the configuration programs
have been called-up (the parameters of the individual
configuration programs can be changed now)
m Sheets: indicates that the matrix measuring mode is
enabled
k Key: indicates that the measurement block is closed
 

Prompt lines containing notes to guide the use
[]: instrument model
[]: instrument software version
20 40–––– : analog display with limits
<= / = >: Lower / upper analog display limit has been
violated
3.4 Probes
All probes, which can be connected to the DELTASCOPE
®
MP30E,
ISOSCOPE®
MP30E or DUALSCOPE®
MP40E, are equipped with a
memory chip in the probe connector. The description E... (e.g.: for ED10)
indicates the use of the memory chip (E stands EEPROM). The EEPROM
stores all probe-specific information (e. g. probe type, manufacturing code,
test method and the coefficients of the master calibration).

When switching the instrument ON, the instrument reads and processes the
information of the connected probe automatically; the instrument
”recognizes” the probe.
Figure 3.4: Probe Connector of ED10 Probe
Correct coating thickness measurements can be performed only if a suitable
probe is used for the measurement application (see table 3.2).
Explanantion  Probe is suitable for measurement
Probe DELTASCOPEâ
MP30E
ISOSCOPEâ
MP30E
DUALSCOPEâ
MP40E
Magnetic
induction
 - 
Eddy current
Probes
-  
Dual probes - - 
Table 3.2: Probes suited for measurement
The magnetic induction and Eddy current test method are combined in dual
probes. Nonferromagnetic or nonconductive coatings on iron or steel as well
as nonconductive coatings on nonferromagnetic substrates can be
measured with dual probes. The correct test method is selected
automatically when placing the probe on the measuring object.
Dual probes are suited only for coating thickness measurement with the
DUALSCOPE
®
MP40.
Several different probe types are available for measurements on objects
having complex shapes and different surface structures. Special probe types
with different measuring ranges are available for the following applications:

· extremely rough surfaces
· extremely soft or hard surfaces
· wet or acid-covered surfaces
· extremely thick or thin coatings
· hot surfaces
· coatings inside of pipes
For information on the available probes, or advise regarding probes best
suited to your applications, please refer to the brochure ”Probes and
Measurement Fixtures - Application Specific Probes - The key to successful
coating measurement”. This brochure is available from Fischer or your
nearest Fischer sales representative.

3.5 Calibration standards
For calibration purposes, the calibration standards (in form of foils or shims
having various thicknesses) are placed on the uncoated measuring object to
simulate the coating to be measured.
Every probe type has a probe-specific set of calibration standards for the
master calibration (master foils) and a set of probe-specific calibration
standards for the corrective calibration (corrective foils), which have been
prepared specifically for this probe type. The probe-specific calibration
standards and additional calibration standards are available on request from
your local supplier or Helmut Fischer GmbH
The thickness of the calibration standards (calibration foils) is measured by
Fischer with a mechanical indicator gauge. The mechanical indicator gauge
was verified with gauge blocks, which were certified according to
international standards. The indicated tolerance refers only to the area within
the circle.
Figure 3.5:
Calibration Foil (Example)
Figure 3.6:
Master Foil (Example)
Only CuBe foils should be used at thicknesses below 30 µm (1.2 mils) for
the calibration of magnetic induction probes or the magnetic induction
channel of dual probes. CuBe foils are not subject to the fairly high
indentation error of plastic foils.
CuBe foils can be used only with the magnetic induction test method,
because Copper Beryllium is a conductive material. For this reason, CuBe
foils are to be used only to calibrate magnetic induction probes or the
magnetic induction channel of dual probes.

When measuring the thickness of foils having the same thickness, but of
different materials (e.g. a 12 µm CuBe foil and a 12 µm plastic foil), on a
rough surface, the thicknesses measured on the two foils may differ greatly.
This difference is caused by the greater hardness of the CuBe foil.
(The hard CuBe foil lies on the peaks of the rough surface, whereas the
smooth plastic foils are pressed into the rough surface by the pressure of the
probe tip.)
For this reason, the same foil material should be used for test
measurements, which was used for calibration!

4 Switching the Instrument ON and
OFF
4.1 Switching the instrument ON
Keys Detail of Display Explanation
ON/OFF Press the ON / OFF key to switch the
instrument on. An acoustic signal will
sound.
The instruments performs an
automatic power-up self test. All
display elements appear briefly (see
”3.3 Display” on page 14).
Following that, the sand clock appears
briefly.
Following the power-up self test, the
application used last with the
connected probe will be called.
The instrument is ready to measure.
The last measurement of the last open
block will be displayed.
test method of the currently connected
probe
[ mm ] or [ mils ] or [ mm ]: unit of
measurement of the displayed value
[Appl:]: number of the current
application
[Thickn.]: coating thickness
measurement (see “Display Modes”)
[Blck:]: number of the current block
[n=]: number of single readings stored
in the current block

Switching the Instrument ON:
To avoid erroneous measurements, keep the probe tip(s) at least 50 mm (2")
away from any metal object when switching the instrument ON!
The minimum distance is probe-specific.
Guideline: Five times the upper limit of the measurement range; i.e. for a
probe with a measurement range of 0 to 5 mm (0 to 200 mils) a
minimum distance of 1" is necessary.
After switching the instrument ON, the following displays can appear as an
alternative to the display shown above:
Detail of display Explanation (display after switching the
instrument ON)
After switching the instrument ON, no measurement
will appear, since the last non-closed block contains
no measurements.
If [Storage mode do not store] or [Storage mode
delete at off] was selected in the configuration
program FINAL-RES, no measurement will be
displayed after switching the instrument on (because
the measurements have not been saved or have
been deleted when the instrument was switched off).
(Selecting the storage mode: see “12.6.1
Configuration Program FINAL-RES” on page 137)
 
A name (in this case: [Sheet 990721/22] ) has been
assigned to the current application. (see ”5.8
Assigning Application Names” on page 35)
The name appears in the prompt lines of the display,
if an application name has been assigned. If
necessary, the name appears alternating with the
application number.
Specification limits monitoring has been enabled in
the current application. (see ”5.9.1 Specification
Limits Monitoring” on page 37; see ”7.7
Measurement with Specification Limits Monitoring
Enabled” on page 66)
Automatic block formation has been enabled in the
current application
(see ”5.9.3 Automatic Block Formation and Block
Size” on page 40;

see ”7.8 Measurement with Fixed Block Size” on
page 68).
[n=]: number of single readings stored in the current
block; the fixed block size appears after the slash
”Mean reading” mode has been enabled in the
current application (see ”5.7.4 ”Mean Reading"
Mode"; see ”7.2.7 Measurement with ”Mean
Reading" Mode Enabled").
[i=]: number of single readings taken with ”mean
reading” Mode enabled; the number of single
readings to be averaged appears after the slash
”Continuous” display mode has been enabled in the
current application (see ”7.5 Measurement with
”Continuous" Display Mode Enabled").
”Continuous” display mode and analog display mode
have been enabled in the current application (see
”7.5 Measurement with ”Continuous" Display Mode";
Enabling Analog Display Mode: see ”12.4.7
Configuration Program APPLNo”).
[10 50]: Analog Display Limits
Matrix Measuring Mode is enabled (see”7.6.2
Measurement with Matrix Measuring Mode Enabled”;
Enabling Matrix Measurement Mode: see ”12.4.7
Configuration Program APPL No”)
 
Matrix Measuring Mode is enabled (see ”7.6.2
Measurement with Matrix Measuring Mode Enabled”;
Enabling Matrix Measurement Mode: see ”12.4.7
Configuration Program APPLiNo”).
Additionally, a name (in this case: [Sheet 990721]
and [Rear side]) has been assigned to the current
application and the current block.(see ”5.6 Assigning
Application Names”; see ”6.3.2 Assigning Block
Names”)
The name appears in the prompt lines of the display,
if an application or block name has been assigned. If
necessary, the name appears alternating with the
application- or block number.

This errors message appears briefly when switching

   the instrument on in the following cases: no probe is
connected to the instrument; the probe is not
connected correctly; the connected probe is
defective. Measurements are not possible without a
probe connected. (Connecting a probe: see ”11.3
Connecting or Replacing a Probe”)
 
 
The current application has not yet been created.
An application has to be created with the connected
probe to be able to perform coating thickness
measurements (see ”5.2 Creating an Application”).
4.2 Test method of the connected probe
After switching the instrument ON, the test method of the currently
connected probe will be displayed. Additionally, the dual method set for the
current application will be displayed for dual probes.
Explanations regarding the dual method: see ”5.7.7 Dual Method”; selecting
the dual method: see ”12.4.7 Configuration Program APPL No”.
Display Explanation
[■NF/Fe] Magnetic induction probe connected
[□NC/NF] Eddy current probe connected
[NF/Fe NC/NF] Dual probe connected and dual method [both]
selected
(i. e. both test methods can be used to measure in
the current application)
[■NF/Fe NC/NF] Dual probe connected and dual method [NF/Fe]
selected
(i.e. only the magnetic induction test method can be
used to measure in the current application)
[NF/Fe □NC/NF] Dual probe connected and dual method [NC/NF]
selected
(i. e. only the Eddy current test method can be used
to measure in the current application)
If [■NF/Fe], [□NC/NF] or [NF/Fe NC/NF] flashes, no application has been
created with the connected probe. Measurements are not possible with

flashing display.
An application has to be created with the connected probe so that coating
thickness measurements can be performed.(Creating an application: see
”5.2 Creating an Application”).
4.3 Switching the instrument OFF
The instrument will switch itself off automatically if no measurement is taken
and no key is pressed for approximately three minutes.
However, if the auto switch-off mode has been disabled in the configuration
programs, the instrument will not switch itself off automatically.
Disable the auto switch-off mode: see
”12.4.1 Configuration Program FINAL-RES”
To switch the instrument off manually simply press the ON/OFF key.
The display will go blank.

5 Applications
You can create up to 100 different applications.
Up to 10,000 measurements can be stored in these applications.
The measurements can be combined into up to 1,000 blocks.
An application contains:
- single readings,
- application specific settings and
- coefficients determined during normalization and corrective calibration
(used for fitting the master calibration curve stored in the memory chip of the
probe connector to the current measurement application)
5.1 Selecting the desired application
A probe has to be connected and an application has to be selected which
was created with the connected probe so that measurements can be
performed.
If [■NF/Fe], [□NC/NF] or [NF/Fe NC/NF] flashes after switching the
instrument on or after selecting an application, no application has been
created with the connected probe. Measurements are not possible with
flashing display.
If no application has been created with the connected probe, these are the
choices:
· Create a new application with the connected probe (see ”5.2 Creating an
Application”)
· Overwrite an existing application with the connected probe (see ”5.3
Overwriting an Existing Application”)
· Connect a probe, an application has been created with already (see
”11.3 Connecting or Replacing a Probe”)

Selecting an Application (with the instrument switched on):
Keys Detail of Display Explanation
APPL No


 

 
Press APPL No to start the
application selection.
application
[n=]: number of the measurements
stored in the current application
[Select: ENTER]: press ENTER to
select the current application
[EGAB1.3]: type of the probe, which
was used to create the current
application
[missing]: current application was
created with another probe type
[wrong]: current application was
created with a probe of the same type
but with a different serial number
 
or:

   
 
 
Select the desired application using
the arrow keys.
[Not opened]: application has not yet
been created (see ”5.2 Creating an
Application”)
[Open: ENTER]: press ENTER to
create the application
ENTER Confirm the selected application with
ENTER.
The selected application will be called.
The last measurement of the last
open block will be displayed. The
instrument is ready to measure.
(Further explanations concerning the
display: see ”3.1.4 Display”; see ”4.1
Switching the Instrument ON”)

If [missing] or [wrong] is displayed in the prompt lines during selection of an
application, the selected application has not been created with the
connected probe. These are the choices:
· Select an application which has been created with the connected probe
· Overwrite the selected application with the connected probe (see ”5.3
Overwriting an Existing Application”)
· Create a new application with the connected probe (see ”5.2 Creating an
Application”)
5.2 Creating an application
An application has to be created and a probe has to be connected so that
measurements can be stored in this application.
When creating an application with the linking mode enabled (indicated by
v in the display), the instrument checks automatically, if one or more
applications have been created with the connected probe.If at least one
application has been created with the connected probe, no normalization is
necessary when creating an application. The normalization and corrective
calibration of the application(s) previously created with this probe is used in
this case.
With the restricted operating mode enabled (indicated by e in the display),
only applications already created can be selected, i. e. new applications
cannot be created (see ”12.3 Restricted Operating Mode”).
Creating an application (with the instrument switched on):
Keys /
Actions
Detail of Display Explanation
APPL No


 


 
Press APPL No to start the application
selection.
application
application


 
Select an application, which has not
been created yet (indicated by [Not
opened]) using the arrow keys.
[Not opened]: application has not been
created yet
[Open: ENTER]: press ENTER to
create the application
ENTER Start creating of an application by
pressing ENTER.
The sign appears and remains in the
display as long as the normalization is
performed.
[Base]: measurements have to be
performed on the uncoated measuring
object (substrate material)
[Cancel: ENTER]: press ENTER to
cancel the normalization
 
Perform the normalization.
(Explanations about normalization:
see ”9 Normalization”).
ENTER Confirm and end the normalization
with ENTER.
The application will be created and
called automatically. The instrument is
ready to measure. (Further
explanations concerning the display:
see ”3.1.4 Display”; see ”4.1 Switching
the Instrument ON”)

5.3 Creating an application with a dual probe
Creating an application with a dual probe will prepare the application only for
one test method.
To prepare the instrument for measurements with the other test method, the
application has to be normalized for the other test method as well.
5.4 Overwriting an application
An existing application can be overwritten by connecting a different probe
and performing a normalization with this probe, if it is no longer needed.
When overwriting an application with the linking mode enabled (indicated by
special sign in the display), the normalizations of all applications linked to the
current application will also be overwritten automatically.
the key ZERO is not active, i. e. applications cannot be overwritten.
(see ”12.3 Restricted Operating Mode”)
Overwriting an application (with the instrument switched on):
Keys /
Actions
Detail of Display Explanation
APPL No


 

 
Press APPL No to start the application
selection.
application
application

 Select the application to be overwritten
using the arrow keys.
ENTER Confirm the selection with ENTER.
ZERO
or:
(if the connected
probe is not
identical with the
probe, the
application was
created with)
Start a normalization by pressing
ZERO to overwrite the current
application. The sp sign appears and
remains in the display as long as the
normalization is performed.
[ New probe ?]: the connected probe is
not identical with the probe, the
application was created with (test
method in the uppermost line in the
display is flashing)
[Yes: DEL No: ENTER]: press DEL to
perform a normalization with the
connected probe (stored normalization
will be overwritten); press ENTER to
cancel the normalization (stored
normalization will remain unchanged)
[EGAB1.3]: type of the connected
probe
DEL
or:
Confirm overwriting of the existing
application with DEL
(necessary only if [New probe ? Yes:
DEL No: ENTER] appeared in the
display before).
[Delete measure ? Yes: DEL No:
ENTER]: press DEL to delete the
measurements, press ENTER to keep

(if
  
appeared in the
display before and
measurements are
stored in the
application to be
overwritten)
the measurements (with the
DUALSCOPE® MP40E keeping of the
measurements is possible only if the
test method of the connected probe is
the same as the test method of the
probe the application was created
with)
DEL Confirm the deleting of the
measurements with DEL (necessary
only if [Delete measure? Yes: DEL
No:ENTER] appeared in the display
before).
Perform the normalization
(see ”9 Normalization”).
ENTER Confirm and end the normalization
with ENTER.
The existing application will be
overwritten.
Further explanations concerning the
Switching the Instrument ON”)

5.5 Overwriting an application with a
dual probe
Overwriting an application with a dual probe will prepare the application only
for one test method.
To prepare the instrument for measurements with the other test method, the
application has to be normalized for the other test method as well.
5.6 Deleting an application
With the restricted operating mode enabled (indicated by special sign in the
display), the key DEL is not active, i. e. applications cannot be deleted! (see
”12.3 Restricted Operating Mode”)
How to delete an application (with the instrument switched on):
Keys Detail of the
Display
Explanation
APPL No


 

 
Press APPL No to start the
application selection.
application
[n=]: number of measurements stored
in the current application
application
 Select the application to be deleted
using the arrow keys.

DEL Delete the selected application with
DEL.
[Delete appl. ? Yes: DEL No: ENTER]:
press DEL to delete the application,
keep the application with ENTER
DEL
 
Confirm the deletion with DEL.
The selected application will be
deleted. Another application can be
selected now or a new application can
created.
5.7 List of existing applications
Keys Explanation
APPL No Press APPL No to start the application selection
(with the instrument switched on and a probe
connected).
PRINT Print the list of existing applications by pressing
PRINT.
With a printer connected and switched on, the list of
existing applications will be printed (see figure 5.1).
Another application can be selected now or a new
application can created.
ENTER Confirm the selected application with ENTER.
The selected application will be called.
The last measurement of the last open block will be
displayed.
If no measurements are stored in this block, no
measurement will be displayed.

Printing a list of existing applications:
Figure 5.1: List of Existing Applications (Example)
Explanations for Figure 5.1:
FISCHER
DUALSCOPE
®
MP40
Manufacturer and instrument model
28.08.99 Current date
1, 2, 3, 4 (1.
column)
Application number
Sheet 990721...
(2. column)
Application name (is displayed only if a name has
been assigned (see ”5.6 Assigning Application
Names”))
ETA3.3, ED10, ...
(2. column)
short name of the probe this application was created
with
NC/NF, Dual, ...
(3. column)
test method of the probe this application was created
with
23.08.99, ...
(4. column)
creation date of the last closed block of this
application
(if no date appears the application contains no closed
block!)
n= (5. column) number of measurements stored in this application

5.8 Assigning application names
A customer-specific name can be assigned to each application.
The name can consist of up to 16 ASCII characters.
These are the choices for assigning application names:
· Using the optional MPNAME software (the software is available from
Fischer or your nearest Fischer sales representative)
· Sending the command ”SAN” via the RS232 interface (see ”11.3 RS232
Interface Commands”)
Additionally, when measuring with matrix measuring mode enabled, a name
can be assigned to each block (see ”6.3.2 Assigning Block Names”).
The name appears in the prompt lines of the display, if an application name
has been assigned. If necessary, the name appears alternating with the
application number.
On print-outs the application or block names are displayed instead of
application or block number.

5.9 Application-specific settings
The following settings are valid only for the current application, i. e. they are
application-specific:
· settings made with the MENU key
· display mode (see ”5.7.6 Display Modes”)
· dual method (see ”5.7.7 Dual Method”, or ”12.4.7 Configuration Program
APPL No”)
After pressing the key MENU the following application-specific settings can
be changed:
· specification limits monitoring
· display resolution
· automatic block formation and block size
· number of single readings, which have to be taken before the actual
measurement is computed as mean value of these single readings
· outlier rejection
The procedure after pressing the key MENU may be terminated at any time
by pressing MENU again.
During the procedure after pressing the key MENU the record of the
instrument status can be printed or displayed at any time by pressing the key
PRINT (see ”12.5 Record of the Instrument Status”).
the key MENU is not active, i. e. the application-specific settings cannot be
changed! (see ”12.3 Restricted Operating Mode”)

5.9.1 Specification limits monitoring
With specification limits monitoring enabled, it is possible to check quickly
and easily whether the measurements are within a preset specification
range. (see ”7.2.5 Measurement with Specification Limits Monitoring
Enabled”)
Enabling or disabling specification limits monitoring:
Keys /
Actions
Detail of the
Display
Explanation
MENU Press MENU to start the setting
procedure. If specification limits
monitoring is enabled, the lower
specification limit set for this
application appears as shown in the
next step.
[No spec. limits]: specification limits
monitoring is disabled
[Selection: {}]: press either arrow key
to enable specification limits
monitoring

  
Enable specification limits monitoring
by pressing either arrow key
(necessary only if specification limits
monitoring has not been enabled yet).
[Lower sp. limit]: lower specification
limit is displayed
[OK: ENTER]: press ENTER to
confirm the setting of the lower
specification limit
[no limits: DEL]: press DEL to disable
specification limits monitoring
Perform a
measurement
or

  
Perform a measurement on a coating
having a thickness similar to the
specification limit to be set. Use the
arrow keys to set the measured
thickness to the limit to be entered.
Alternatively, the specification limit

can be set using only the arrow keys,
i. e. without measurement.
ENTER
  
Confirm the setting of the lower
specification limit with ENTER.
Proceed for setting the upper
specification limit in the same manner
as for the lower specification limit.
MENU Confirm the setting of the upper
specification limit with MENU.
Specification limits monitoring is
enabled.
As long as specification limits
monitoring is enabled, b appears in
the display.
Further explanations concerning the
Switching the Instrument ON”.
If the upper and the lower specification limit have been entered in reverse,
the instrument will automatically use the smaller value as lower specification
limit and the larger value as upper specification limit.

Opm anotest ymp30-s_932-531_en

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