NanoScope provides world-class nano-surgery and analysis services using focused ion beam (FIB), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) to shorten development cycles. With over 20 years of experience supporting semiconductor applications, NanoScope offers fast turnaround, high success rates, and unique capabilities like live microscopy over the web.
SIVACON S4 Presentation - R.A. Engineering partnered with SiemensImran Butt
An introductory presentation of SIVACON S4 Type-Tested Assemblies (Make: Siemens) under the banner of R.A. Engineering (Pvt.) Ltd. This brief presentation will describe the salient features and technical specification of Type-Tested Panels which are being designed and assembled by R.A. Engineering at its facility.
Developing a New Affordable DC Motor Laboratory Kit for an Existing Undergrad...Rebecca Reck
This is a paper presentation from the 2015 American Control Conference (ACC) invited session on Controls Education. The full paper can be found here: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7171159.
The Basics of Automotive Ethernet Webinar Slidedeckteledynelecroy
Evolving from the BroadR-Reach standard, Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future.
This session will focus on the fundamentals of the Automotive Ethernet ecosystem. It will include a brief history and evolution of the standard, and an overview of benefits of the new technology and the associated design challenges. We will conclude with an introduction into the test requirements and the analysis tools available to help troubleshoot and qualify designs.
SIVACON S4 Presentation - R.A. Engineering partnered with SiemensImran Butt
An introductory presentation of SIVACON S4 Type-Tested Assemblies (Make: Siemens) under the banner of R.A. Engineering (Pvt.) Ltd. This brief presentation will describe the salient features and technical specification of Type-Tested Panels which are being designed and assembled by R.A. Engineering at its facility.
Developing a New Affordable DC Motor Laboratory Kit for an Existing Undergrad...Rebecca Reck
This is a paper presentation from the 2015 American Control Conference (ACC) invited session on Controls Education. The full paper can be found here: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7171159.
The Basics of Automotive Ethernet Webinar Slidedeckteledynelecroy
Evolving from the BroadR-Reach standard, Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future.
This session will focus on the fundamentals of the Automotive Ethernet ecosystem. It will include a brief history and evolution of the standard, and an overview of benefits of the new technology and the associated design challenges. We will conclude with an introduction into the test requirements and the analysis tools available to help troubleshoot and qualify designs.
'Coaching for High Performance'
We are delighted to share our National Conference 2015 Brochure with you! Take a peek at our speakers and do sign up for this inspiring event.
A Skeptic's Guide to Branding (RefreshPDX 2/16)Zoe Landon
For many technically-minded people, "branding" and other business terms are a sort of taboo subject. Something looked at with disdain, or at minimum, skepticism.
However, a strong personal brand can make a developer's career smoother. So, I've tried to explain the concepts in a way that skeptical techies - like myself - can understand.
Inspection, Testing and Commissioning of Electrical Switchboards, Circuit Bre...Living Online
THE WORKSHOP:
Whether you are designing, specifying, installing, testing or commissioning electrical equipment from small to large commercial and industrial installations, you need to have a thorough understanding of switchboards, switchgear, circuit breakers and associated protective relays.
The overall focus of this workshop is on electrical inspection, testing and commissioning and will commence with a detailed examination of switchgear (and circuit breakers). Circuit breakers are critical components in electrical distribution systems and their operation significantly affects the overall operation of the system. Protection relays are then discussed. These are used in power systems to maximise continuity of supply and are found in both small and large power systems from generation, through transmission, distribution and utilisation of power in plant, industrial and commercial equipment.
We cover commissioning and periodic inspection of cables and their various failure modes and how to detect these faults. The often neglected topic of switchboards will be detailed next, followed by the interesting topic of interfacing to the control system (either PLC’s or other control devices).
Case studies and practical sessions are used throughout to illustrate key practical principles.
This workshop covers key elements in a practical and project focused way. Many people assume (wrongly) that inspecting, testing and commissioning is a fairly straightforward process and is simply a rubber stamp confirmation of a so-called outstanding design. Our experience in the field demonstrates quite the opposite; where the litany of problems ranges from design and installation errors to equipment manufacturing defects. It is best that these problems are identified and corrected before the inevitable downtime comes in an operational installation where many thousands of dollars are lost in correcting the faults. The situation today is made more challenging by the heightened safety requirements and interfacing to low powered electronic control and monitoring devices (such as PLC’s) using software that has to also be verified.
Who we Proserv, what we do and why we are different. Learn more about our capabilities, expertise, services and compelling solutions approach to solving client challenges.
ERTMS Solutions is specialized in the development of innovative products for the railway signalling world, and for a majority of them compatible with the European railway signalization standard ERTMS/ETCS.
Reduce Test Automation Execution Time by 80%TechWell
Software testers and quality assurance engineers are often pressured to cut testing time to ensure on-time product releases. Usually this means running fewer test cycles with the risk of worse software quality. As companies embrace a continuous integration (CI) that require frequent build and test cycles, the pressure to speed up automated testing is intense. Tanay Nagjee shows how you can cut the time to run an automated test suite by 80%—for example, from two hours to under 25 minutes. Find out how Tayay’s team broke down their test suites into bite-sized test that could be executed in parallel. Leveraging a cluster of computing horsepower (either on on-premise physical machines or in the cloud), you can refactor large test suites to execute in a fraction of the time it takes now. With real example data and a live demonstration, Tanay outlines a three-step approach to achieve these results within different test frameworks.
ENGIE Laborelec KSA General Presentation- Zain.pptxASAD723
Any complaint must be provided in writing within the month that follows the performance of the services. After this period the invoice is deemed accepted without any reservation.
Invoiced amounts not paid by the Client within the time specified in paragraph “Payment conditions”, shall be subject to a late interest applicable rate of 10%, without notification or notice, and with a minimum of 75 Euros.
In the event of non-payment of invoices, even after 10 days after a written notice has been delivered to the Client, the agreement may be terminated by the Consultant by registered letter. Termination of the agreement shall not relieve the Client from the obligation to pay for services already carried out by the Consultant in accordance with the terms of the present agreement, without prejudice to recourse to other legal remedies available to the Consultant.
Warranty
The Consultant shall be responsible for and bear the costs arising out of the correction of any defects in the Services which are notified to the Consultant within the warranty period. The Client shall – in such event – grant to the Consultant a reasonable period of time for remedial action. Any other warranty obligations of the Consultant shall be excluded.
The warranty period shall be 12 months and shall commence with the respective acceptance or deemed acceptance of the relevant Services in accordance with Clause 3.
Confidentiality
Any exchange of information between the Parties is and shall remain confidential:
o This is applicable to this offer document which is the Consultant’s property and furnished in confidence solely for evaluating the merits of this proposal and no other direct or indirect use like disclosing the content to other Parties.
o Furthermore The Consultant undertakes to perform the services entrusted to it in accordance with the norms of the state of the art and to treat confidentially all information from the Client which the Consultant has knowledge of.
o The Consultant remains sole and exclusive owner of all patentable or non-patentable information, know-how, data, processes, methods and software used for, in relation with or generated prior to or during the performance of the services including the final report.
o The Consultant grants to the Client a non-exclusive, non-transferable, right to use for itself the result of the services that are the subject in this agreement, namely delivered in final report, performed by the Consultant to the Client.
Liability
Without prejudice to any mandatory legal provisions, the following limitations of the Consultant's liability shall apply with respect to the services:
• The liability of the Consultant shall be limited to the direct property damage incurred by the Client as a result of wilful misconduct or gross negligence of the Consultant.
• In the event that the Consultant uses subcontractors to perform the services, the Consultant’s liability shall never exceed the liability incurred by the subcontractor vis-à-vi
SP Denmark is an accredited third party test laboratory within EMC, climatic and mechanical testing.
We offers services within physical failure analysis, error tracing and repair of electronics. We have a modern well-equipped material science laboratory as well as electronics analyse and repair equipment. Our employees are specialists and have many years of experience within electronics testing, materials and production.
The cable harness tester has an important role in bringing in the quality and reliability of electrical cable assemblies that are used in many industries, such as aerospace, automotive, defence, and manufacturing. This is one of the most important functions of cable harness assembly as it helps in finding defects, ensuring the connectivity is right, and testing the on-field performance of the harnesses.
There is currently no accepted standard for the measurement or monitoring of RCS Services, even though we believe that this is vital to assure the quality and reliability of such services -and to establish a framework for reliable comparison across implementations.
To this end Ascom has defined a formal definition and implementation strategy to help the Operations team solve a range of challenges, including issues related to EPC, IMS and the Application Server.
We will describe this solution in a number of short articles. This article describes the 1-to-1 Chat test case.
BE Analytic Solutions LLP is the first unique company of excellence offering Reliability ,Availability, Maintainability and Safety (RAMS) as an Engineering Service to customers in India. The company was established in 2010 by a group of eminent scientists and experienced engineers in Bangalore, India. In today’s highly competitive market, product/system Quality and Reliability are among the key differentiators. Many contracts, today, also require delivering RAMS engineering analysis report as a contractual obligation – this is where we can assist you. We offer cost effective turnkey solutions on Reliability Engineering Analysis.
2. www.NanoScopeServices.co.ukNanoScope Copyright 2015
The NanoScope Intro
Depth of knowledge and experience
Career microscopy vendor specialists in FIB (focused ion beam), SEM (Scanning
Electron Microscopy) and TEM (transmission electron microscopy) and support
techniques for Semiconductor applications.
We ran the EU service labs for FEI Company and Micrion Corporation since 1993 and
independently as NanoScope since 2005.
>95% 1st time success rates every year – if it will yield less we’ll tell you BEFORE beam
down. We know what the ‘best’ looks like as we are the engineers the vendors used to
give their training courses.
Bristol based – EU wide and now Israel
Unique Live Microscopy over-the-web capability for cost/time/documentation savings.
Fast turnaround, complex issues with high service are our prime services
An independent European supplier of expert, fast-turn
Nano-Surgery & Advanced Microscopy enabled support services
3. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Who do I call? the options are…
Test House
‘Semi’ mindset/ high
focus/ quick support
Generalists/users/
customers
Easy escalation – in
house or partner
But.
Expensive (you’re in the
building)
Yield?
Technologist
‘Semi’ mindset/ high
focus/ quick support
EXPERT – tools and
techniques
Easy escalation – in
house or partner
Less expensive – you
only get what you
need.
Better yield, shorter
time to result
Better phone book
University
‘Teaching’ mindset
User or even ‘learner’
Limited escalation
possible
Can be inexpensive
Slow (1-2 weeks)
Some ‘older tools’
4. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Shorten your development time and
reduce your risks and your costs
World class results, supplied by the hour – just when you need them
For Chip Designers needing urgent layout/verification design changes
prove your mask change before tape out - “Your 1st Silicon Emergency Service”
For Production Engineers out of spec and in a hurry
Support your SEM with exact site, 3D process metrology in <18 hours - ‘QwikQual’
For Failure Analysts we offer a suite of expert techniques
FIB and Microscopy enabled ‘FA Services’
For High-end materials/contamination/failure issues
our exact-site analysis technique escalation process -‘Right on Target’
For Reliability Engineers reducing costs and meeting compliance
simple cost reduction service -‘Low Cost Pre-Conditioning and MSL level testing’
with a seamless ‘full Reliability menu option’ via our partner to follow
6. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Shortening time to market
Reducing risk
For verifying and localising a problem – electrical debug
Adding probe pads for electrical debug/fault-finding on a new design
For verifying a metal fix
Confirm design revisions after 1st Silicon (1st time right guarantee)
Prove a mask change before committing $$$’s and months to mask
changes.
Go for small lots - for board/customer tests while waiting for new silicon
Even 10’s of devices – missed a ship date? how about sending 20 devices
now?
What’s the yield going to be? After 20 years of circuit edit we offer a yield
prediction and a confidence interval. Get the right answer for the right budget
in the right time.
Below 28nm’s mask costs are likely to > double – ‘dual patterning’ or ‘triple
patterning’ – EUV will not be ready for 2 years (min)
7. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Shortening time to market
Unique capabilities available
WL-CSP & RDL through-edit capability
Ultra-low /long copper track deposition
CSAM and
X-ray
microscopy
Check the package
De-cap and
Die checks
Check +
improve
the fix
Do the
FIX
(versions?)
Re-pass,
Encapsulate
or Globtop
Open the package
Check and
follow up
Rapid
Redo?
-till result
Close the package
“Your 1st Silicon Emergency Service”
Do the best fix No failures
9. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Rapid process qualification data
Unique location 3D process metrology data for accelerating
process ‘ramp up’ or for customer qualifications.
Its got to be
• FAST
• Independent
• From the right location
• Correct (Accurate)
• Referenced to traceable standards
• Reasonably priced
How do I do that?
• BEFORE – Sign up to our ‘QwikQual’ service (agreed PO limits, NDA’s etc)
• TODAY
– FIRST Ship the sample to us to arrive at NanoScope just after 8am – not before (or before 5pm
for next day work) 2 sections max. Call us for taxi or bike courier contacts
– SECOND – Email us your sectioning job instructions (guidelines on website) and telephone us
to advise that there is a project arriving. (dedicated number)
• TOMORROW
– We run the job before ‘start of day’
– results emailed to you before 10AM
• AFTERWARDS
– PO – draw down to agreed limit
• You can watch on the web with ‘LiveFIB’ if you want.
11. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Advanced microscopy as standard
Ext Visual examination (optical) ☑
Build a test socket board ☑
Electrical testing (Basic) ☑
Xray package analysis ☑
CSAM Analysis ☑
Decapsulation (inc.Cu w/laser, polyimide, MEMS Gels) ☑
Internal Optical inspection ☑
Anti-counterfeit check (Partnered with ELTEK) ☑
FIB/SEM internal inspection ☑
Adding FIB probe pads (electrical debug) ☑
FIB Sectioning and imaging (w/wo iterative slicing) ☑
Process Metrology (inc.SI/SE imaging) ☑
SEM EDS studies ☑
FIBxTEM Sectioning and extraction ☑
TEM imaging analysis (TEM/STEM) – BF/DF ☑
TEM Xray or EELS or EFTEM elemental analysis ☑
Report ☑
Each analysis can be specified for 3
levels of detail, depending on time-line
and budget.
Basic – an initial investigation to check
specifically defined elements are in
order.
Intermediate – more in depth
investigation checking the specifics of
the product in line with the
specifications stated.
Detailed – a more involved
investigation to identify the route
cause of a specific problem.
We are happy to offer cost-free initial
consultancy to select your optimised
work flow.
13. www.NanoScopeServices.co.ukNanoScope Copyright 2015
NanoScope now offers 3, economical, turn-key reliability
services for our Semiconductor clients
MSL Evaluation
This identifies the classification level of non-hermetically sealed surface mounted solid state devices, which
may be sensitive to moisture induced stress. The basic test sequence is shown below The test is performed
to IPC/JEDEC Standard J-STD-020D.1
• Initial Visual Inspection
• 1st Acoustical Microscope (CSAM)
• Initial Bake – 24 hrs @ 125°C
• Moisture Soak – Temp/Humidity at required level
• Reflow (IR bake) X3 @260°c
• Final Visual Inspection
• 2nd Acoustical Microscope (CSAM)
• Optional written report
Device Pre-conditioning
This exposes a batch of devices to the upper limit of the MSL level specified prior to that batch undergoing
reliability testing. Pre-conditioning may use only steps 3, 4, and 5 only. The accelerated equivalent tests
are also available. Pre-conditioning is performed to JEDEC Standard JESD22-A113
High Temperature Storage
HTS is used to test for thermally activated failure mechanisms of solid state devices. The test is
performed to JESD22-A103 standard.
NanoScope acquired the MSL, Pre-con and HTS equipment from UNISEM Europe when it closed at the end
of 2013, and we are supported by the long-term experience of our ex-Unisem colleagues in delivering
these services.
Reliability
Services Pricing
MSL eval <25 devices
Price from ₤2,250
Device pre-conditioning
<250 devices
Price from ₤1,000
High Temp Storage
<250 devices
Price from ₤300
(MSL Eval and Pre-Con lots
may be combined)
14. www.NanoScopeServices.co.ukNanoScope Copyright 2015
INTRODUCING our advanced reliability testing partner
For a full turnkey service with even better savings, we have teamed up with
our close neighbour and collaborator RELTECH Ltd to offer a complete
portfolio of follow-on reliability tests.
Device Qualification Tests
High Temperature Operating Life (HTOL) JESD22-A108/JESD85
Early Life Failure Rate (ELFR) JESD22-A108/JESD74
Low Temperature Operating Life (LTOL) JESD22-A108
Non-Hermetic Package Qualification Tests
Temperature Humidity Bias (THB) JESD22-A101
Biased Highly Accelerated Temperature & Humidity Stress (HAST) JESD22-A110
Unbiased HAST (UHAST) JESD22-A118
Temperature Cycling (TC) JESD22-A104
All projects are completed to JEDEC Standard JESD47.
For customers booking MSL, HTS or Pre-con services with NanoScope who would like to
try Reltech, we can offer you a total solution at a preferential rate, with seamless transfer
of your pre-conditioned parts directly to Reltech and return shipping directly to you.
16. www.NanoScopeServices.co.ukNanoScope Copyright 2015
Enabled by FIB
FIB enables the ability to apply escalating
sequence of techniques to a unique single feature
by selectively modifying the sample format.
Put simply – we start cheap and go up stepwise
on a single feature until we have resolved the issue
On the surface
Various imaging
techniques (SIM,
SEM, TEM, AFM)
metrology and
analysis (EDS)
FIB X Sectioning
On a site
specific cross
section
FIB TEM Sectioning
and extraction
On a site
specific TEM
section
+ Diffraction, EELS
EDS etc
18. www.NanoScopeServices.co.ukNanoScope Copyright 2015
And our ‘LiveFIB’ video conferencing, now with Optical
microscopy as well
like having your own FIB instrument or Optical
microscope and operator.
see your sample imaged live at your desk.
real time consultancy (for you) and supervision
(from you).
instant visualisation of sample issues.
time and cost savings in job preparation, and
reduced travel.
comfortable and easy - can
be done from your home
or office (you just need a
web connection).
secure and safe.
better control.
send your samples today,
watch your fix
tomorrow.
OK – Services understood… what else?
19. www.NanoScopeServices.co.ukNanoScope Copyright 2015
OK – Services understood… what else?
Depth of knowledge
MEMS, Compound semiconductors, Materials Science, Nano-Research, Nano-
Lithography, Nano-prototyping.
Continued development
Patent pending new process for TEM section polishing technique
Patent # 1411434.2 presented at MMC2014
New products
We are also developing advanced microscopy hardware
New ex-situ TEM section extraction solution launched
New ‘Ease of Use’ - shorter time to result through partnership working
Support relationship building – customer advantage
New ideas here – all input welcome
Tell us what you need – some ideas on the sheet
MEMS failure analysis
Catalytic materials
and layers