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MIPI High Speed Serial Technologies:
Debug & Conformance Testing
Challenges and Solutions
David Yang
Application Engineering Manager
Tektronix
©	2017	MIPI	Alliance,	Inc.
Speaker
2
David Yang
Tektronix
©	2017	MIPI	Alliance,	Inc.
Agenda
• MIPI	D-PHYSM Overview	of	signal	characteristics		
• Measurement/Probing	Challenges
• MIPI	C-PHYSM Overview	of	signal	characteristics		
• MIPI	C-PHYSM Clock	recovery	&	Switching	Jitter
• Stress	signal	generation	for	Receiver	Testing
• Q/A
3
Tektronix
©	2017	MIPI	Alliance,	Inc.
MIPI	D-PHY	:	Signal	Characteristics	Overview	
• Detection	of	LP-HS	transition	and	timing	measurements	on	that	
transition
• Dynamic	switching	of	terminations	between	LP	and	HS	mode
• Measurements	on	clock	and	data	lanes	verify	voltage	and	timing	
parameters,	separate	LP	from	HS	bits
• D-PHY	v2.0	onwards	included	eye	diagram	and	jitter	measurements
4
Tektronix
©	2017	MIPI	Alliance,	Inc.
Probing	without	losing	signal	fidelity
• High	speed	mode,	Low	power	mode
– High	impedance	to	50ohm	bus
• Access	to	tight	test	locations
5
Tektronix
©	2017	MIPI	Alliance,	Inc.
Probe	lead	length	effects
Length	of the	lead Rise	time
Adapter	with	full	length	wire 227ps	46%	Overshoot
Adapter	with	half	length	wire 126ps	48%	Overshoot
Adapter	with	quarter	length	wire 59ps	43%	Overshoot
Adapter	with	no	wire 52ps	40%	Overshoot
6
Tektronix
Probe +
Standard Adapter with full length wire
©	2017	MIPI	Alliance,	Inc.
Probe	impedance
7
Tektronix
©	2017	MIPI	Alliance,	Inc.
Measurement	to	be	immune	to	instrument	noise
• MIPI	D-PHY:	LP	Slew	rate	measurement	limit	of	150	mV/ns
– 50mV	sliding	vertical	window,	and	average	of	all	the	edges
• A	LPF	filter	to	limit	the	high	frequency	noise
8
Tektronix
0 200 400 600 800 1000 1200 1400 1600 1800 2000
0
50
100
150
200
250
300
DP Fall
mV/ns
index
Instantaneous	Slew	Rate
©	2017	MIPI	Alliance,	Inc.
Debugging	using	Jitter	extrapolation
• MIPI	D-PHY	Tx HS	Eye	Diagram	
• Analysis	of	Continuous(Recommended) or	Burst	Data
• Analysis	duration	
– (1)	Sufficient	to	analysis	at	BER	1E-6 (Prorated	Mask)	-
– (2)	Desirable	to	analysis	at	BER	1E-12
• Sophisticated	extrapolation	software	
9
Tektronix
©	2017	MIPI	Alliance,	Inc.
MIPI	C-PHY	:	Signal	Characteristics	Overview	
• 1st	triggered	edge	recovered	from	A,	B,	and	C	wires
• Eye	mask	placement	for	optimal	eye	opening
• Rise/fall	times		are	different	for	different	transitions	
• Derive	three	differential	signal		from	3	wire	signal	
• All	the	three	eye	diagram	to	be	tested	(VAB,VBC,VCA)
10
Tektronix
©	2017	MIPI	Alliance,	Inc.
Switching	Jitter	and	RT/FT
11
• Switching	Jitter	varies	with	number	of	Transition	at	the	cross	over.
• Data	Jitter	is	92psec,	clock	jitter	is	61psec.		Increment	in		clock	
jitter	is	not	the	same	reflected	in	data,	but	increased	by	3	folds	
(means	15	psec on	clock	increases	data	jitter	by	about	40	psec)
Clock	Jitter
Tektronix
©	2017	MIPI	Alliance,	Inc.
Switching	Jitter	based	on	Transition	Type
12
Tektronix
©	2017	MIPI	Alliance,	Inc.
• Tektronix
13
Unit	Interval	Analysis	of	stressed	signal
Transition	
Type
Min(psec) Max(psec) Mean(psec)
Single 266.74 507.7 383.84
Double 323.23 559.83 418.29
Triple 302.4 508.41 393.99
Transition Type Min(psec) Max(psec) Mean(psec)
Double 55.95 178.48 111.9
Triple 5.193 158.2 55.6
Time	difference	of			transition	∆t	
Tektronix
©	2017	MIPI	Alliance,	Inc.
Switching	Jitter	with	stress	signal	can	affect	the	clock	
recovery	
• Tektronix
14
Clock	Recovery	works	fine	as	long	as		unit	
interval	variance	due	to	switching	jitter	less	than	
0.5UI,	If	not		then	clock	recovery	will	lock	the	
data	either	early		or	late	arrival	data	and	results	
in	Mask	violation.	
Clock	transition	is	missed	because	of	an	ISI	
coupled	with	switching	jitter
How	the	clock	is	missed?
We	assume	that	jitter	is	less	than	0.5UI.	The	
difference	between	early	occurrence	and	late	
occurrence	of	the	transition	of	the	differential	
signal	can	be	less	than	0.5UI.	
Recovered	Clock	before	
recovery	improvement
Recovered	Clock	after	
recovery	improvement
Tektronix
©	2017	MIPI	Alliance,	Inc.
Receiver	Testing
• Philosophy
– Stimulus	calibration	based	on	parameter
– Stimulus	fed	to	the	Rx	
– Check	for	error	free	reception		
• Equipment
– Waveform	Generator
• Data	and	clock	lanes
– Oscilloscope	for	Calibration
– Choice	based	on	MIPI	D-PHY/C-PHY	spec	versions
• Observables
– Bit	errors	detected
15
Tektronix
©	2017	MIPI	Alliance,	Inc.
MIPI	C-PHY	Receiver	Test	:	Signal	Generation
• Monotonic	signal	generation
• C-PHY	Encoding	– bits,	symbols,	wire	states
• Pseudo	Random	test	patterns	PRBS9/11/18
• Stressors
– rise/fall	time,	duty	cycle	distortion	(DCD),	ISI,	
• Differential	and	Common	mode	voltage	control
• RX	Test	scenarios
– Sequencing	different	waveforms	created	using	LP,	HS	and	LP-HS	Mode
– Defining	various	start	up	sequences	by	varying	different	parameters	
like	jitter	,	length	of	sequences	and	looping	these	sequences
– Fine	granularity	and	control	of	various	parameters	like	pre-amble,	
sync,	post-amble
– Ability	to	create	waveforms	for	LP	Only,	HS	only	and	LP-HS	transition
Tektronix
©	2017	MIPI	Alliance,	Inc.
Rx	test	parameter	precision,	flexibility	&	range	
17
D-PHY
C-PHY
Tektronix
©	2017	MIPI	Alliance,	Inc.
Multilevel	Signal:	Duty	Cycle	Distortion	
§ C-PHY	receiver	stress	with	Duty	Cycle	Distortion
18
1	UI
0.9	UI
1.1	UI
10% 10%
§ A	symbol	interval,	all	the	lines	would	have	the	
same	DCD(∆),	but	this	would	change	with	every	
symbol
Tektronix
©	2017	MIPI	Alliance,	Inc.
Link	Analysis
• Maximize	Margins		- Compensate	for	margin	loss	due	to	test	fixtures
• Remove	Reflections
• Open	Closed	Eyes	- Apply	receiver	equalization	to	compensate	for	channel	loss	before	
analysis	
• Compliance	Test	- require	de-embedding,	channel	embedding,	and	equalization
19
Signal
Acquired
Embed the
Compliance
Channel
Closed Eye due to
the Channel
Apply the Optimized
CTLE + DFE
Open Eye for
Measurements
Tektronix
©	2017	MIPI	Alliance,	Inc. 21
Tektronix
©	2017	MIPI	Alliance,	Inc.
Backup
22
Tektronix
©	2017	MIPI	Alliance,	Inc.
D-PHY	Rx	Jitter	Tolerance
• RT/FT	Control
• Insertion	Loss
• De-Emphasis
• Periodic	Jitter	&	VOD	Control
• Static	Skew
• DC	common	Mode
• SSC
23
• Tektronix Tektronix
©	2017	MIPI	Alliance,	Inc.
D-PHY	Tx Test:	Spread	Spectrum	clocking	
• SSC	Testing
– Modulation	Rate	=	30KHz	(min)
– Measure	over	=>2	SSC	cycles
– Device	Test	Modes/options
• HS	data	length	>	66	µsec
• HS	data	‘101010…’	
24
Tektronix
Jitter,	Noise	and	Eye	Diagram	Analysis
MPI DevCon Hsinchu City 2017: MIPI High Speed Serial Technologies: Debug & Conformance Testing Challenges and Solutions

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