Mohamed Hafed, Ph.D., chief executive officer at Introspect Technology, summarizes the fundamental requirements for quality assurance and testing methods for high-speed interfaces including MIPI D-PHY℠, C-PHY℠ and M-PHY®. The presentation includes practical examples of test cell design, test program development and multi-site screening techniques.

1. Mohamed Hafed
Introspect Technology
New Trends in the High-
Volume Manufacturing Test
of MIPI-Based Devices

2. © 2019 MIPI Alliance, Inc. 2
Agenda
• Introduction
• Hardware Requirements for MIPI Testing in Production
• Protocol Requirements for MIPI Testing in Production
• System-Oriented Testing & Case Studies

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Typical Device Classes

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Golden
Device
Methodology
ATE or Bench
Instrument
Add-On
(e.g. Scope)
Test Methodology Spectrum
Reduce Cost / Increase Quality
Test Module
Test Methodology Spectrum
Achieve Instrument Grade

5. © 2019 MIPI Alliance, Inc. 5
Test Methodology Spectrum – On-Board Channel Card

6. Hardware Requirements

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Low-Power (LP) and High-Speed (HS) Signaling
*LVCMOS = Low-Voltage Complementary Metal Oxide Semiconductor Logic

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Switching Challenges on ATE
Integrated Driver Conventional Switch-Based Solution
With Hi-Z loadWith Hi-Z load
Switch timing & charge
injection cause poor
timing control
Challenges exist because
of receiver switchable
termination as well
Proper D-PHY
LP/HS transition
Proper C-PHY LP/HS
transition

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Multi-Level HS Drivers and Comparators

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Equalization Waveforms
D-PHY C-PHY

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Bidirectional Bus Control

12. Protocol Requirements

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Packet Based Communication

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DUT Configuration Through the MIPI Bus

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Functional Testing on ATE

16. System-Oriented Testing
and Case Studies

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Microcontroller CSI-2 Input Test

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Microcontroller CSI-2 Input Test

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DDIC* with Integrated Device Response Checking
*DDIC = Display Driver IC

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Image Sensor Test
Low-Speed ATE with
Image Processor
Illuminator
DUT
Module used as a fast
capture tool

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Summary
• Increasing requirements have emerged for at-speed testing
of MIPI-based devices
• System-like solutions are being developed by manufacturers
of microcontrollers, image sensors, display drivers, and
storage devices
• Hardware and protocol requirements for enabling the test of
such solutions have been described in this presentation

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• https://introspect.ca/
– Total solutions for most high-speed interface technologies
• https://introspect.ca/products-solutions/high-volume-
manufacturing-test/
– Solutions for at-speed testing during mass production
• https://introspect.ca/products-solutions/mipi-camera-and-
imaging/
– Image sensor test and validation solutions
• https://introspect.ca/products-solutions/mipi-display-and-touch/
– Display test and validation solutions
https://introspect.ca
ADDITIONAL RESOURCES