This document summarizes that all devices in the GAL20V8 datasheet have been discontinued according to multiple Product Change Notifications (PCNs). A table is provided that lists each device part number, its product status as discontinued, and the reference PCN announcing the discontinuation. The original datasheet pages are provided for reference but do not reflect the discontinued product status changes. Customers are advised to contact the manufacturer for available inventory or alternative product options.
Verbatim Gateway is a field-proven, stand-alone alarm monitoring and reporting solution. More reliable than PC-based alarm systems, you can depend on it to perform in mission-critical applications due to its fault tolerance and internal battery backup. Robust yet affordable, Verbatim Gateway monitors operations and notifies personnel of problem conditions — anytime, anywhere — for a one-time cost. No extra service contracts or plug-ins required!
Verbatim Gateway is a field-proven, stand-alone alarm monitoring and reporting solution. More reliable than PC-based alarm systems, you can depend on it to perform in mission-critical applications due to its fault tolerance and internal battery backup. Robust yet affordable, Verbatim Gateway monitors operations and notifies personnel of problem conditions — anytime, anywhere — for a one-time cost. No extra service contracts or plug-ins required!
Busway,
Busway Siemens,
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Busway,
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This PPT is based on the basic concepts of PLC . This will make you understand important concepts of PLC and clear out the doubts about this devices. this is nowdays a popular device and widely used in various applications for automation in different industries and other places etc.
The AT89C2051 is a low-voltage, high-performance CMOS 8-bit microcomputer with
2K bytes of Flash programmable and erasable read-only memory (PEROM). The
device is manufactured using Atmel’s high-density nonvolatile memory technology
and is compatible with the industry-standard MCS-51 instruction set. By combining a
versatile 8-bit CPU with Flash on a monolithic chip, the Atmel AT89C2051 is a powerful
microcomputer which provides a highly-flexible and cost-effective solution to many
embedded control applications.
These devices consist of two independent, high-gain frequency-compensated operational amplifiers designed to operate from a single supply or split
supply over a wide range of voltages.
PowerMate15 is a digital switching solution developed for the transportation market. It provides in one package state of the art digital switching technology and easy to understand user interface for designers with an extensive and sophisticated menu of switching solutions.
Cataloge ge 1.residential components_and_enclosures_dienhathe.com-2_red_line_...Dien Ha The
Khoa Học - Kỹ Thuật & Giải Trí: http://phongvan.org
Tài Liệu Khoa Học Kỹ Thuật: http://tailieukythuat.info
Thiết bị Điện Công Nghiệp - Điện Hạ Thế: http://dienhathe.vn
Siemens ,
Catalog Thiết Bị Điện Siemens , Catalog Thiết Tự Động
Catalog Phụ Kiện Siemens , Catalog Phụ Kiện,
Catalog Siemens , Catalog,
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A Power Point presentation On INDUSTRIAL AUTOMATION...
What is Automation?
As the name suggests ‘Automation’ means to perform automatic operations by means of different kinds of machines.
Automation is the use of control systems and information technologies to reduce the need for human work in the production of goods and services.
It is used to reduce human interference and efforts
Advantages Of PLC:-
Less Wiring.
Wiring between devices and relay contacts are done in the PLC program.
Easier and faster to make changes.
Trouble shooting aids make programming easier and reduce downtime.
Reliable components make these likely to operate for years before failure.
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
The Art of the Pitch: WordPress Relationships and SalesLaura Byrne
Clients don’t know what they don’t know. What web solutions are right for them? How does WordPress come into the picture? How do you make sure you understand scope and timeline? What do you do if sometime changes?
All these questions and more will be explored as we talk about matching clients’ needs with what your agency offers without pulling teeth or pulling your hair out. Practical tips, and strategies for successful relationship building that leads to closing the deal.
Kubernetes & AI - Beauty and the Beast !?! @KCD Istanbul 2024Tobias Schneck
As AI technology is pushing into IT I was wondering myself, as an “infrastructure container kubernetes guy”, how get this fancy AI technology get managed from an infrastructure operational view? Is it possible to apply our lovely cloud native principals as well? What benefit’s both technologies could bring to each other?
Let me take this questions and provide you a short journey through existing deployment models and use cases for AI software. On practical examples, we discuss what cloud/on-premise strategy we may need for applying it to our own infrastructure to get it to work from an enterprise perspective. I want to give an overview about infrastructure requirements and technologies, what could be beneficial or limiting your AI use cases in an enterprise environment. An interactive Demo will give you some insides, what approaches I got already working for real.
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
JMeter webinar - integration with InfluxDB and GrafanaRTTS
Watch this recorded webinar about real-time monitoring of application performance. See how to integrate Apache JMeter, the open-source leader in performance testing, with InfluxDB, the open-source time-series database, and Grafana, the open-source analytics and visualization application.
In this webinar, we will review the benefits of leveraging InfluxDB and Grafana when executing load tests and demonstrate how these tools are used to visualize performance metrics.
Length: 30 minutes
Session Overview
-------------------------------------------
During this webinar, we will cover the following topics while demonstrating the integrations of JMeter, InfluxDB and Grafana:
- What out-of-the-box solutions are available for real-time monitoring JMeter tests?
- What are the benefits of integrating InfluxDB and Grafana into the load testing stack?
- Which features are provided by Grafana?
- Demonstration of InfluxDB and Grafana using a practice web application
To view the webinar recording, go to:
https://www.rttsweb.com/jmeter-integration-webinar
Essentials of Automations: Optimizing FME Workflows with ParametersSafe Software
Are you looking to streamline your workflows and boost your projects’ efficiency? Do you find yourself searching for ways to add flexibility and control over your FME workflows? If so, you’re in the right place.
Join us for an insightful dive into the world of FME parameters, a critical element in optimizing workflow efficiency. This webinar marks the beginning of our three-part “Essentials of Automation” series. This first webinar is designed to equip you with the knowledge and skills to utilize parameters effectively: enhancing the flexibility, maintainability, and user control of your FME projects.
Here’s what you’ll gain:
- Essentials of FME Parameters: Understand the pivotal role of parameters, including Reader/Writer, Transformer, User, and FME Flow categories. Discover how they are the key to unlocking automation and optimization within your workflows.
- Practical Applications in FME Form: Delve into key user parameter types including choice, connections, and file URLs. Allow users to control how a workflow runs, making your workflows more reusable. Learn to import values and deliver the best user experience for your workflows while enhancing accuracy.
- Optimization Strategies in FME Flow: Explore the creation and strategic deployment of parameters in FME Flow, including the use of deployment and geometry parameters, to maximize workflow efficiency.
- Pro Tips for Success: Gain insights on parameterizing connections and leveraging new features like Conditional Visibility for clarity and simplicity.
We’ll wrap up with a glimpse into future webinars, followed by a Q&A session to address your specific questions surrounding this topic.
Don’t miss this opportunity to elevate your FME expertise and drive your projects to new heights of efficiency.
Encryption in Microsoft 365 - ExpertsLive Netherlands 2024Albert Hoitingh
In this session I delve into the encryption technology used in Microsoft 365 and Microsoft Purview. Including the concepts of Customer Key and Double Key Encryption.
LF Energy Webinar: Electrical Grid Modelling and Simulation Through PowSyBl -...DanBrown980551
Do you want to learn how to model and simulate an electrical network from scratch in under an hour?
Then welcome to this PowSyBl workshop, hosted by Rte, the French Transmission System Operator (TSO)!
During the webinar, you will discover the PowSyBl ecosystem as well as handle and study an electrical network through an interactive Python notebook.
PowSyBl is an open source project hosted by LF Energy, which offers a comprehensive set of features for electrical grid modelling and simulation. Among other advanced features, PowSyBl provides:
- A fully editable and extendable library for grid component modelling;
- Visualization tools to display your network;
- Grid simulation tools, such as power flows, security analyses (with or without remedial actions) and sensitivity analyses;
The framework is mostly written in Java, with a Python binding so that Python developers can access PowSyBl functionalities as well.
What you will learn during the webinar:
- For beginners: discover PowSyBl's functionalities through a quick general presentation and the notebook, without needing any expert coding skills;
- For advanced developers: master the skills to efficiently apply PowSyBl functionalities to your real-world scenarios.
Software Delivery At the Speed of AI: Inflectra Invests In AI-Powered QualityInflectra
In this insightful webinar, Inflectra explores how artificial intelligence (AI) is transforming software development and testing. Discover how AI-powered tools are revolutionizing every stage of the software development lifecycle (SDLC), from design and prototyping to testing, deployment, and monitoring.
Learn about:
• The Future of Testing: How AI is shifting testing towards verification, analysis, and higher-level skills, while reducing repetitive tasks.
• Test Automation: How AI-powered test case generation, optimization, and self-healing tests are making testing more efficient and effective.
• Visual Testing: Explore the emerging capabilities of AI in visual testing and how it's set to revolutionize UI verification.
• Inflectra's AI Solutions: See demonstrations of Inflectra's cutting-edge AI tools like the ChatGPT plugin and Azure Open AI platform, designed to streamline your testing process.
Whether you're a developer, tester, or QA professional, this webinar will give you valuable insights into how AI is shaping the future of software delivery.
Transcript: Selling digital books in 2024: Insights from industry leaders - T...BookNet Canada
The publishing industry has been selling digital audiobooks and ebooks for over a decade and has found its groove. What’s changed? What has stayed the same? Where do we go from here? Join a group of leading sales peers from across the industry for a conversation about the lessons learned since the popularization of digital books, best practices, digital book supply chain management, and more.
Link to video recording: https://bnctechforum.ca/sessions/selling-digital-books-in-2024-insights-from-industry-leaders/
Presented by BookNet Canada on May 28, 2024, with support from the Department of Canadian Heritage.
Key Trends Shaping the Future of Infrastructure.pdfCheryl Hung
Keynote at DIGIT West Expo, Glasgow on 29 May 2024.
Cheryl Hung, ochery.com
Sr Director, Infrastructure Ecosystem, Arm.
The key trends across hardware, cloud and open-source; exploring how these areas are likely to mature and develop over the short and long-term, and then considering how organisations can position themselves to adapt and thrive.
Key Trends Shaping the Future of Infrastructure.pdf
Gal20 v8datasheet
1. 5555 N.E. Moore Ct. Hillsboro, Oregon 97124-6421 Phone (503) 268-8000 FAX (503) 268-8347
Internet: http://www.latticesemi.com
GAL®
20V8 Device Datasheet
September 2010
All Devices Discontinued!
Product Change Notifications (PCNs) have been issued to discontinue all devices in this
data sheet.
The original datasheet pages have not been modified and do not reflect those changes.
Please refer to the table below for reference PCN and current product status.
Product Line Ordering Part Number Product Status Reference PCN
GAL20V8B
GAL20V8B-7LP
Discontinued
PCN#06-07
GAL20V8B-7LP
GAL20V8B-10LP
PCN#09-10
GAL20V8B-10LPN
GAL20V8B-15LP
PCN#13-10
GAL20V8B-15LPN
GAL20V8B-25LP
GAL20V8B-25LPN
GAL20V8B-10LPI
PCN#06-07
GAL20V8B-10LPNI
GAL20V8B-15LPI
PCN#09-10
GAL20V8B-15LPNI
GAL20V8B-25LPI
PCN#13-10
GAL20V8B-25LPNI
GAL20V8B-15QP
GAL20V8B-15QPN
GAL20V8B-25QP
GAL20V8B-25QPN
GAL20V8B-20QPI
PCN#09-10
GAL20V8B-20QPNI
GAL20V8B-25QPI
PCN#13-10
GAL20V8B-25QPNI
GAL20V8B-15LJ
GAL20V8B-15LJN
GAL20V8B-25LJ
GAL20V8B-25LJN
GAL20V8B-15LJI
PCN#06-07
GAL20V8B-15LJNI
GAL20V8B-25LJI
PCN#13-10
GAL20V8B-25LJNI
GAL20V8B-15QJ
GAL20V8B-15QJN
4. 2
Specifications GAL20V8
Industrial Grade Specifications
GAL20V8 Ordering Information
Conventional Packaging
Commercial Grade Specifications
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5 3 4 511 JL5-C8V02LAG 1
CCLPdaeL-82
5.7 7 5 511 8V02LAG C JL7- CCLPdaeL-82
511 PL7-B8V02LAG 1
PIDcitsalPniP-42
01 01 7 511 8V02LAG C JL01- CCLPdaeL-82
511 PL01-B8V02LAG PIDcitsalPniP-42
51 21 01 55 PQ51-B8V02LAG PIDcitsalPniP-42
55 JQ51-B8V02LAG CCLPdaeL-82
09 PL51-B8V02LAG PIDcitsalPniP-42
09 JL51-B8V02LAG CCLPdaeL-82
52 51 21 55 PQ52-B8V02LAG PIDcitsalPniP-42
55 JQ52-B8V02LAG CCLPdaeL-82
09 PL52-B8V02LAG PIDcitsalPniP-42
09 JL52-B8V02LAG CCLPdaeL-82
)sn(dpT )sn(usT )sn(ocT )Am(ccI #gniredrO egakcaP
01 01 7 031 8V02LAG C IJL01- CCLPdaeL-82
031 IPL01-B8V02LAG 1
PIDcitsalPniP-42
031 IJL01-B8V02LAG CCLPdaeL-82
51 21 01 031 IPL51-B8V02LAG PIDcitsalPniP-42
031 IJL51-B8V02LAG CCLPdaeL-82
02 31 11 56 IPQ02-B8V02LAG PIDcitsalPniP-42
56 IJQ02-B8V02LAG CCLPdaeL-82
52 51 21 56 IPQ52-B8V02LAG PIDcitsalPniP-42
56 IJQ52-B8V02LAG CCLPdaeL-82
031 IPL52-B8V02LAG PIDcitsalPniP-42
031 IJL52-B8V02LAG CCLPdaeL-82
1. Discontinued per PCN #06-07. Contact Rochester Electronics for available inventory.
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5. Specifications GAL20V8
3
Part Number Description
Industrial Grade Specifications
Lead-Free Packaging
Commercial Grade Specifications
Blank = Commercial
I = Industrial
Grade
PackagePowerL = Low Power
Q = Quarter Power
Speed (ns)
XXXXXXXX XX X XX X
Device Name
_
P = Plastic DIP
PN = Lead-free Plastic DIP
J = PLCC
JN = Lead-free PLCC
GAL20V8C
GAL20V8B
)sn(dpT )sn(usT )sn(ocT )Am(ccI #gniredrO egakcaP
5 3 4 511 NJL5-C8V02LAG 1
CCLPdaeL-82eerF-daeL
5.7 7 5 511 8V02LAG C NJL7- eerF-daeL CCLPdaeL-82
511 NPL7-B8V02LAG 1
PIDcitsalPniP-42eerF-daeL
01 01 7 511 8V02LAG C NJL01- eerF-daeL CCLPdaeL-82
511 NPL01-B8V02LAG PIDcitsalPniP-42eerF-daeL
51 21 01 55 NJQ51-B8V02LAG CCLPdaeL-82eerF-daeL
55 NPQ51-B8V02LAG PIDcitsalPniP-42eerF-daeL
09 NJL51-B8V02LAG CCLPdaeL-82eerF-daeL
09 NPL51-B8V02LAG PIDcitsalPniP-42eerF-daeL
52 51 21 55 NJQ52-B8V02LAG CCLPdaeL-82eerF-daeL
55 NPQ52-B8V02LAG PIDcitsalPniP-42eerF-daeL
09 NJL52-B8V02LAG eerF-daeL CCLPdaeL-82
09 NPL52-B8V02LAG PIDcitsalPniP-42eerF-daeL
)sn(dpT )sn(usT )sn(ocT )Am(ccI #gniredrO egakcaP
01 01 7 031 8V02LAG C INJL01- PIDcitsalPniP-82eerF-daeL
031 INPL01-B8V02LAG 1
PIDcitsalPniP-42eerF-daeL
51 21 01 031 INJL51-B8V02LAG CCLPdaeL-82eerF-daeL
031 INPL51-B8V02LAG PIDcitsalPniP-42eerF-daeL
02 31 11 56 INJQ02-B8V02LAG CCLPdaeL-82eerF-daeL
56 INPQ02-B8V02LAG PIDcitsalPniP-42eerF-daeL
52 51 21 56 INJQ52-B8V02LAG CCLPdaeL-82eerF-daeL
56 INPQ52-B8V02LAG PIDcitsalPniP-42eerF-daeL
031 INJL52-B8V02LAG CCLPdaeL-82eerF-daeL
031 INPL52-B8V02LAG PIDcitsalPniP-42eerF-daeL
1. Discontinued per PCN #06-07. Contact Rochester Electronics for available inventory.
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Specifications GAL20V8
The following discussion pertains to configuring the output logic
macrocell. It should be noted that actual implementation is accom-
plished by development software/hardware and is completely trans-
parent to the user.
There are three global OLMC configuration modes possible:
simple, complex, and registered. Details of each of these modes
is illustrated in the following pages. Two global bits, SYN andAC0,
control the mode configuration for all macrocells. The XOR bit of
each macrocell controls the polarity of the output in any of the three
modes, while theAC1 bit of each of the macrocells controls the in-
put/output configuration. These two global and 16 individual archi-
tecture bits define all possible configurations in a GAL20V8 . The
information given on these architecture bits is only to give a bet-
ter understanding of the device. Compiler software will transpar-
ently set these architecture bits from the pin definitions, so the user
should not need to directly manipulate these architecture bits.
The following is a list of the PAL architectures that the GAL20V8
can emulate. It also shows the OLMC mode under which the
devices emulate the PAL architecture.
Software compilers support the three different global OLMC modes
as different device types. These device types are listed in the table
below. Most compilers have the ability to automatically select the
device type, generally based on the register usage and output
enable (OE) usage. Register usage on the device forces the soft-
ware to choose the registered mode. All combinatorial outputs with
OE controlled by the product term will force the software to choose
the complex mode. The software will choose the simple mode only
when all outputs are dedicated combinatorial without OE control.
The different device types listed in the table can be used to override
the automatic device selection by the software. For further details,
refer to the compiler software manuals.
When using compiler software to configure the device, the user
must pay special attention to the following restrictions in each mode.
In registered mode pin 1 and pin 13 (DIP pinout) are permanently
configured as clock and output enable, respectively. These pins
cannot be configured as dedicated inputs in the registered mode.
In complex mode pin 1 and pin 13 become dedicated inputs and
use the feedback paths of pin 22 and pin 15 respectively. Because
of this feedback path usage, pin 22 and pin 15 do not have the
feedback option in this mode.
In simple mode all feedback paths of the output pins are routed
via the adjacent pins. In doing so, the two inner most pins ( pins
18 and 19) will not have the feedback option as these pins are
always configured as dedicated combinatorial output.
Registered Complex Simple Auto Mode Select
ABEL P20V8R P20V8C P20V8AS P20V8
CUPL G20V8MS G20V8MA G20V8AS G20V8
LOG/iC GAL20V8_R GAL20V8_C7 GAL20V8_C8 GAL20V8
OrCAD-PLD "Registered"1
"Complex"1
"Simple"1
GAL20V8A
PLDesigner P20V8R2
P20V8C2
P20V8C2
P20V8A
TANGO-PLD G20V8R G20V8C G20V8AS3
G20V8
1) Used with Configuration keyword.
2) Prior to Version 2.0 support.
3) Supported on Version 1.20 or later.
PAL Architectures GAL20V8
Emulated by GAL20V8 Global OLMC Mode
20R8 Registered
20R6 Registered
20R4 Registered
20RP8 Registered
20RP6 Registered
20RP4 Registered
20L8 Complex
20H8 Complex
20P8 Complex
14L8 Simple
16L6 Simple
18L4 Simple
20L2 Simple
14H8 Simple
16H6 Simple
18H4 Simple
20H2 Simple
14P8 Simple
16P6 Simple
18P4 Simple
20P2 Simple
Output Logic Macrocell (OLMC)
Compiler Support for OLMC
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5
In the Registered mode, macrocells are configured as dedicated
registered outputs or as I/O functions.
Architecture configurations available in this mode are similar to the
common 20R8 and 20RP4 devices with various permutations of
polarity, I/O and register placement.
All registered macrocells share common clock and output enable
control pins. Any macrocell can be configured as registered or I/
O. Up to eight registers or up to eight I/Os are possible in this mode.
Dedicated input or output functions can be implemented as sub-
sets of the I/O function.
Registered outputs have eight product terms per output. I/Os have
seven product terms per output.
The JEDEC fuse numbers, including the User Electronic Signature
(UES) fuses and the Product Term Disable (PTD) fuses, are shown
on the logic diagram on the following page.
Registered Configuration for Registered Mode
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this output configuration.
- Pin 1 controls common CLK for the registered outputs.
- Pin 13 controls common OE for the registered outputs.
- Pin 1 & Pin 13 are permanently configured as CLK &
OE for registered output configuration.
Combinatorial Configuration for Registered Mode
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this output configuration.
- Pin 1 & Pin 13 are permanently configured as CLK &
OE for registered output configuration..
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
D Q
Q
CLK
OE
XOR
XOR
Registered Mode
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7
In the Complex mode, macrocells are configured as output only or
I/O functions.
Architecture configurations available in this mode are similar to the
common 20L8 and 20P8 devices with programmable polarity in
each macrocell.
Up to six I/Os are possible in this mode. Dedicated inputs or outputs
can be implemented as subsets of the I/O function. The two outer
most macrocells (pins 15 & 22) do not have input capability. De-
signs requiring eight I/Os can be implemented in the Registered
mode.
All macrocells have seven product terms per output. One product
term is used for programmable output enable control. Pins 1 and
13 are always available as data inputs into the AND array.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram on the following page.
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
Combinatorial I/O Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1.
- Pin 16 through Pin 21 are configured to this function.
Combinatorial Output Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1.
- Pin 15 and Pin 22 are configured to this function.
XOR
XOR
Complex Mode
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9
Combinatorial Output with Feedback Configuration
for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- All OLMC except pins 18 & 19 can be configured to
this function.
Combinatorial Output Configuration for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- Pins 18 & 19 are permanently configured to this
function.
Dedicated Input Configuration for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this configuration.
- All OLMC except pins 18 & 19 can be configured to
this function.
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
In the Simple mode, pins are configured as dedicated inputs or as
dedicated, always active, combinatorial outputs.
Architecture configurations available in this mode are similar to the
common 14L8 and 16P6 devices with many permutations of ge-
neric output polarity or input choices.
All outputs in the simple mode have a maximum of eight product
terms that can control the logic. In addition, each output has pro-
grammable polarity.
Pins 1 and 13 are always available as data inputs into the AND
array. The “center” two macrocells (pins 18 and 19) cannot be used
in the input configuration.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram on the following page.
Vcc
XOR
Vcc
XOR
Simple Mode
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13. Specifications GAL20V8
11
Specifications GAL20V8C
VIL Input Low Voltage Vss – 0.5 — 0.8 V
VIH Input High Voltage 2.0 — Vcc+1 V
IIL1
Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (MAX.) — — –100 μA
IIH Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC — — 10 μA
VOL Output Low Voltage IOL = MAX. Vin = VIL or VIH — — 0.5 V
VOH Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 — — V
IOL Low Level Output Current — — 16 mA
IOH High Level Output Current — — –3.2 mA
IOS2
Output Short Circuit Current VCC = 5V VOUT = 0.5V TA
= 25°C –30 — –150 mA
Recommended Operating Conditions
Commercial Devices:
Ambient Temperature (TA
) ............................... 0 to 75°C
Supply voltage (VCC
)
with Respect to Ground ..................... +4.75 to +5.25V
Industrial Devices:
Ambient Temperature (TA
) ........................... –40 to 85°C
Supply voltage (VCC
)
with Respect to Ground ..................... +4.50 to +5.50V
SYMBOL PARAMETER CONDITION MIN. TYP.3
MAX. UNITS
COMMERCIAL
ICC Operating Power VIL = 0.5V VIH = 3.0V L -5/-7/-10 — 75 115 mA
Supply Current ftoggle = 15MHz Outputs Open
INDUSTRIAL
ICC Operating Power VIL = 0.5V VIH = 3.0V L-10 — 75 130 mA
Supply Current ftoggle = 15MHz Outputs Open
1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and TA = 25 °C
Absolute Maximum Ratings(1)
Supply voltage VCC
...................................... –0.5 to +7V
Input voltage applied .......................... –2.5 to VCC
+1.0V
Off-state output voltage applied ......... –2.5 to VCC
+1.0V
Storage Temperature ................................ –65 to 150°C
Ambient Temperature with
Power Applied ........................................ –55 to 125°C
1.Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device at
these or at any other conditions above those indicated in the
operational sections of this specification is not implied (while
programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
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14. 12
Specifications GAL20V8Specifications GAL20V8C
-7
MIN. MAX.
-10
MIN. MAX.
tpd A Input or I/O to 8 outputs switching 1 5 3 7.5 3 10 ns
Comb. Output 1 output switching — — — 7 — — ns
tco A Clock to Output Delay 1 4 2 5 2 7 ns
tcf2
— Clock to Feedback Delay — 3 — 3 — 6 ns
tsu — Setup Time, Input or Feedback before Clock↑ 3 — 5 — 7.5 — ns
th — Hold Time, Input or Feedback after Clock↑ 0 — 0 — 0 — ns
A Maximum Clock Frequency with 142.8 — 100 — 66.7 — MHz
External Feedback, 1/(tsu + tco)
fmax3
A Maximum Clock Frequency with 166 — 125 — 71.4 — MHz
Internal Feedback, 1/(tsu + tcf)
A Maximum Clock Frequency with 166 — 125 — 83.3 — MHz
No Feedback
twh — Clock Pulse Duration, High 3 — 4 — 6 — ns
twl — Clock Pulse Duration, Low 3 — 4 — 6 — ns
ten B Input or I/O to Output Enabled 1 6 3 9 3 10 ns
B OE to Output Enabled 1 6 2 6 2 10 ns
tdis C Input or I/O to Output Disabled 1 5 2 9 2 10 ns
C OE to Output Disabled 1 5 1.5 6 1.5 10 ns
UNITSPARAMETER
TEST
COND1
.
DESCRIPTION
COM/INDCOMCOM
-5
MIN. MAX.
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section. Characterized initially and after any design or process changes that may affect these
parameters.
SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS
CI
Input Capacitance 8 pF VCC
= 5.0V, VI
= 2.0V
CI/O
I/O Capacitance 8 pF VCC
= 5.0V, VI/O
= 2.0V
*Characterized but not 100% tested
AC Switching Characteristics
Over Recommended Operating Conditions
Capacitance (TA = 25°C, f = 1.0 MHz)
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15. Specifications GAL20V8
13
Specifications GAL20V8B
INDUSTRIAL
ICC Operating Power VIL = 0.5V VIH = 3.0V L -10/-15/-25 — 75 130 mA
Supply Current ftoggle = 15MHz Outputs Open Q -20/-25 — 45 65 mA
COMMERCIAL
ICC Operating Power VIL = 0.5V VIH = 3.0V L -7/-10 — 75 115 mA
Supply Current ftoggle = 15MHz Outputs Open L -15/-25 — 75 90 mA
Q -15/-25 — 45 55 mA
Recommended Operating Conditions
Commercial Devices:
Ambient Temperature (TA
) ............................... 0 to 75°C
Supply voltage (VCC
)
with Respect to Ground ..................... +4.75 to +5.25V
Industrial Devices:
Ambient Temperature (TA
) ........................... –40 to 85°C
Supply voltage (VCC
)
with Respect to Ground ..................... +4.50 to +5.50V
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL PARAMETER CONDITION MIN. TYP.3
MAX. UNITS
VIL Input Low Voltage Vss – 0.5 — 0.8 V
VIH Input High Voltage 2.0 — Vcc+1 V
IIL1
Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (MAX.) — — –100 μA
IIH Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC — — 10 μA
VOL Output Low Voltage IOL = MAX. Vin = VIL or VIH — — 0.5 V
VOH Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 — — V
IOL Low Level Output Current — — 24 mA
IOH High Level Output Current — — –3.2 mA
IOS2
Output Short Circuit Current VCC = 5V VOUT = 0.5V TA
= 25°C –30 — –150 mA
1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and TA = 25 °C
Absolute Maximum Ratings(1)
Supply voltage VCC
...................................... –0.5 to +7V
Input voltage applied .......................... –2.5 to VCC
+1.0V
Off-state output voltage applied ......... –2.5 to VCC
+1.0V
Storage Temperature ................................ –65 to 150°C
Ambient Temperature with
Power Applied ........................................ –55 to 125°C
1.Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device at
these or at any other conditions above those indicated in the
operational sections of this specification is not implied (while
programming, follow the programming specifications).
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16. 14
Specifications GAL20V8Specifications GAL20V8B
tpd A Input or I/O to 8 outputs switching 3 7.5 3 10 3 15 3 20 3 25 ns
Comb. Output 1 output switching — 7 — — — — — — — — ns
tco A Clock to Output Delay 2 5 2 7 2 10 2 11 2 12 ns
tcf2
— Clock to Feedback Delay — 3 — 6 — 8 — 9 — 10 ns
tsu — Setup Time, Input or Fdbk before Clk↑ 7 — 10 — 12 — 13 — 15 — ns
th — Hold Time, Input or Fdbk after Clk↑ 0 — 0 — 0 — 0 — 0 — ns
A Maximum Clock Frequency with 83.3 — 58.8 — 45.5 — 41.6 — 37 — MHz
External Feedback, 1/(tsu + tco)
fmax3
A Maximum Clock Frequency with 100 — 62.5 — 50 — 45.4 — 40 — MHz
Internal Feedback, 1/(tsu + tcf)
A Maximum Clock Frequency with 100 — 62.5 — 62.5 — 50 — 41.7 — MHz
No Feedback
twh — Clock Pulse Duration, High 5 — 8 — 8 — 10 — 12 — ns
twl — Clock Pulse Duration, Low 5 — 8 — 8 — 10 — 12 — ns
ten B Input or I/O to Output Enabled 3 9 3 10 — 15 — 18 — 25 ns
B OE to Output Enabled 2 6 2 10 — 15 — 18 — 20 ns
tdis C Input or I/O to Output Disabled 2 9 2 10 — 15 — 18 — 25 ns
C OE to Output Disabled 1.5 6 1.5 10 — 15 — 18 — 20 ns
UNITS
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section.
-25
MIN. MAX.
-20
MIN. MAX.
-15
MIN. MAX.
-10
MIN. MAX.
PARAM. DESCRIPTIONTEST
COND1
.
-7
MIN. MAX.
SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS
CI
Input Capacitance 8 pF VCC
= 5.0V, VI
= 2.0V
CI/O
I/O Capacitance 8 pF VCC
= 5.0V, VI/O
= 2.0V
*Characterized but not 100% tested.
COM COM / IND COM / IND IND COM / IND
AC Switching Characteristics
Over Recommended Operating Conditions
Capacitance (TA = 25°C, f = 1.0 MHz)
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17. Specifications GAL20V8
15
Registered OutputCombinatorial Output
OE to Output Enable/DisableInput or I/O to Output Enable/Disable
fmax with Feedback
Clock Width
COMBINATIONAL
OUTPUT
VALID INPUT
INPUT or
I/O FEEDBACK
tpd
CLK
(w/o fb)
1/fmax
twltwh
INPUT or
I/O FEEDBACK
REGISTERED
OUTPUT
CLK
VALID INPUT
(external fdbk)
tsu
tco
th
1/fmax
OE
REGISTERED
OUTPUT
tentdis
CLK
REGISTERED
FEEDBACK
tcf tsu
1/fmax (internal fdbk)
COMBINATIONAL
OUTPUT
INPUT or
I/O FEEDBACK
tentdis
Switching Waveforms
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18. 16
Specifications GAL20V8
fmax with Internal Feedback 1/(tsu+tcf)
Note: tcf is a calculated value, derived by subtracting tsu from
the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The
value of tcf is used primarily when calculating the delay from
clocking a register to a combinatorial output (through registered
feedback), as shown above. For example, the timing from clock
to a combinatorial output is equal to tcf + tpd.
fmax with No Feedback
Note: fmax with no feedback may be less than 1/(twh + twl). This
is to allow for a clock duty cycle of other than 50%.
GAL20V8C Output Load Conditions (see figure)
Test Condition R1 R2 CL
A 200Ω 200Ω 50pF
B Active High ∞ 200Ω 50pF
Active Low 200Ω 200Ω 50pF
C Active High ∞ 200Ω 5pF
Active Low 200Ω 200Ω 5pF
TEST POINT
C *L
FROM OUTPUT (O/Q)
UNDER TEST
+5V
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
R2
R1
GAL20V8B Output Load Conditions (see figure)
Test Condition R1 R2 CL
A 200Ω 390Ω 50pF
B Active High ∞ 390Ω 50pF
Active Low 200Ω 390Ω 50pF
C Active High ∞ 390Ω 5pF
Active Low 200Ω 390Ω 5pF
CLK
REGISTER
LOGIC
ARRAY
tcf
tpd
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback is calculated from measured
tsu and tco.
REGISTER
LOGIC
ARRAY
tcotsu
CL K
Input Pulse Levels GND to 3.0V
Input Rise and GAL20V8B 2 – 3ns 10% – 90%
Fall Times GAL20V8C 1.5ns 10% – 90%
Input Timing Reference Levels 1.5V
Output Timing Reference Levels 1.5V
Output Load See Figure
3-state levels are measured 0.5V from steady-state active
level.
REGISTER
LOGIC
ARRAY
CLK
tsu + th
fmax Descriptions
Switching Test Conditions
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19. Specifications GAL20V8
17
1 . 0 2 . 0 3 . 0 4 . 0 5 . 0
- 6 0
0
- 2 0
- 4 0
0
Input Voltage (Volts)
InputCurrent(uA)
Electronic Signature
An electronic signature is provided in every GAL20V8 device. It
contains 64 bits of reprogrammable memory that can contain user
defined data. Some uses include user ID codes, revision numbers,
or inventory control. The signature data is always available to the
user independent of the state of the security cell.
NOTE: The electronic signature is included in checksum calcula-
tions. Changing the electronic signature will alter the checksum.
Security Cell
A security cell is provided in the GAL20V8 devices to prevent un-
authorized copying of the array patterns. Once programmed, this
cell prevents further read access to the functional bits in the device.
This cell can only be erased by re-programming the device, so the
original configuration can never be examined once this cell is pro-
grammed. The Electronic Signature is always available to the user,
regardless of the state of this control cell.
Latch-Up Protection
GAL20V8 devices are designed with an on-board charge pump
to negatively bias the substrate. The negative bias minimizes the
potential of latch-up caused by negative input undershoots. Ad-
ditionally, outputs are designed with n-channel pull-ups instead of
the traditional p-channel pull-ups in order to eliminate latch-up due
to output overshoots.
Device Programming
GAL devices are programmed using a Lattice Semiconductor-
approved Logic Programmer, available from a number of manu-
facturers. Complete programming of the device takes only a few
seconds. Erasing of the device is transparent to the user, and is
done automatically as part of the programming cycle.
Typical Input Pull-up Characteristic
Output Register Preload
When testing state machine designs, all possible states and state
transitions must be verified in the design, not just those required
in the normal machine operations. This is because, in system
operation, certain events occur that may throw the logic into an
illegal state (power-up, line voltage glitches, brown-outs, etc.). To
test a design for proper treatment of these conditions, a way must
be provided to break the feedback paths, and force any desired (i.e.,
illegal) state into the registers. Then the machine can be sequenced
and the outputs tested for correct next state conditions.
GAL20V8 devices include circuitry that allows each registered
output to be synchronously set either high or low. Thus, any present
state condition can be forced for test sequencing. If necessary,
approved GAL programmers capable of executing text vectors
perform output register preload automatically.
Input Buffers
GAL20V8 devices are designed with TTL level compatible input
buffers. These buffers have a characteristically high impedance,
and present a much lighter load to the driving logic than bipolar TTL
devices.
The GAL20V8 input and I/O pins have built-in active pull-ups. As
a result, unused inputs and I/O's will float to a TTL "high" (logical
"1"). Lattice Semiconductor recommends that all unused inputs
and tri-stated I/O pins be connected to another active input, VCC,
or Ground. Doing this will tend to improve noise immunity and re-
duce ICC for the device.
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20. 18
Specifications GAL20V8
Typ. Vref = 3.2V
Typical Output
Typ. Vref = 3.2V
Typical Input
Vcc
PIN
Vcc Vref
Active Pull-up
Circuit
ESD
Protection
Circuit
ESD
Protection
Circuit
Vcc
PIN
Vcc
PIN
VrefTri-State
Control
Active Pull-up
Circuit
Feedback
(To Input Buffer)
PIN
Feedback
Data
Output
Circuitry within the GAL20V8 provides a reset signal to all registers
during power-up. All internal registers will have their Q outputs set
low after a specified time (tpr, 1μs MAX). As a result, the state on
the registered output pins (if they are enabled) will always be high
on power-up, regardless of the programmed polarity of the output
pins. This feature can greatly simplify state machine design by pro-
viding a known state on power-up. Because of the asynchronous
nature of system power-up, some conditions must be met to provide
Vcc
CLK
INTERNAL REGISTER
Q - OUTPUT
FEEDBACK/EXTERNAL
OUTPUT REGISTER
Vcc (min.)
tpr
Internal Register
Reset to Logic "0"
Device Pin
Reset to Logic "1"
twl
tsu
a valid power-up reset of the device. First, the VCC rise must be
monotonic. Second, the clock input must be at static TTL level as
shown in the diagram during power up. The registers will reset
within a maximum of tpr time.As in normal system operation, avoid
clocking the device until all input and feedback path setup times
have been met. The clock must also meet the minimum pulse width
requirements.
Power-Up Reset
Input/Output Equivalent Schematics
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21. Specifications GAL20V8
19
Delta Tpd vs # of Outputs
Switching
Number of Outputs Switching
DeltaTpd(ns)
-1
-0.75
-0.5
-0.25
0
1 2 3 4 5 6 7 8
RISE
FALL
Delta Tco vs # of Outputs
Switching
Number of Outputs Switching
DeltaTco(ns)
-1
-0.75
-0.5
-0.25
0
1 2 3 4 5 6 7 8
RISE
FALL
Delta Tpd vs Output Loading
Output Loading (pF)
DeltaTpd(ns)
-2
0
2
4
6
8
0 50 100 150 200 250 300
RISE
FALL
Delta Tco vs Output Loading
Output Loading (pF)
DeltaTco(ns)
-2
0
2
4
6
8
0 50 100 150 200 250 300
RISE
FALL
Normalized Tpd vs Vcc
Supply Voltage (V)
NormalizedTpd
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
PT H->L
PT L->H
Normalized Tco vs Vcc
Supply Voltage (V)
NormalizedTco
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
RISE
FALL
Normalized Tsu vs Vcc
Supply Voltage (V)
NormalizedTsu
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
PT H->L
PT L->H
Normalized Tpd vs Temp
Temperature (deg. C)
NormalizedTpd
0.7
0.8
0.9
1
1.1
1.2
1.3
-55
-25
0
25
50
75
100
125
PT H->L
PT L->H
Normalized Tco vs Temp
Temperature (deg. C)
NormalizedTco
0.7
0.8
0.9
1
1.1
1.2
1.3
-55
-25
0
25
50
75
100
125
RISE
FALL
Normalized Tsu vs Temp
Temperature (deg. C)
NormalizedTsu
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
-55
-25
0
25
50
75
100
125
PT H->L
PT L->H
GAL20V8C: Typical AC and DC Characteristic Diagrams
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22. 20
Specifications GAL20V8
Vol vs Iol
Iol (mA)
Vol(V)
0
0.5
1
1.5
2
0.00 20.00 40.00 60.00 80.00
Voh vs Ioh
Ioh(mA)
Voh(V)
0
1
2
3
4
5
0.00 10.00 20.00 30.00 40.00 50.00
Voh vs Ioh
Ioh(mA)
Voh(V)
3.25
3.5
3.75
4
4.25
0.00 1.00 2.00 3.00 4.00
Normalized Icc vs Vcc
Supply Voltage (V)
NormalizedIcc
0.80
0.90
1.00
1.10
1.20
4.50 4.75 5.00 5.25 5.50
Normalized Icc vs Temp
Temperature (deg. C)
NormalizedIcc
0.8
0.9
1
1.1
1.2
1.3
-55 -25 0 25 50 75 100 125
Normalized Icc vs Freq.
Frequency (MHz)NormalizedIcc
0.80
0.90
1.00
1.10
1.20
1.30
1.40
1.50
0 25 50 75 100
Delta Icc vs Vin (1 input)
Vin (V)
DeltaIcc(mA)
0
2
4
6
8
10
0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00
Input Clamp (Vik)
Vik (V)
Iik(mA)
0
5
10
15
20
25
30
35
40
45
-2.00 -1.50 -1.00 -0.50 0.00
GAL20V8C: Typical AC and DC Characteristic Diagrams
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23. Specifications GAL20V8
21
Normalized Tpd vs Vcc
Supply Voltage (V)
NormalizedTpd
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
PT H->L
PT L->H
Normalized Tco vs Vcc
Supply Voltage (V)
NormalizedTco
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
RISE
FALL
Normalized Tsu vs Vcc
Supply Voltage (V)
NormalizedTsu
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
PT H->L
PT L->H
Normalized Tpd vs Temp
Temperature (deg. C)
NormalizedTpd
0.7
0.8
0.9
1
1.1
1.2
1.3
-55
-25
0
25
50
75
100
125
PT H->L
PT L->H
Normalized Tco vs Temp
Temperature (deg. C)
NormalizedTco
0.7
0.8
0.9
1
1.1
1.2
1.3
-55
-25
0
25
50
75
100
125
RISE
FALL
Normalized Tsu vs Temp
Temperature (deg. C)
NormalizedTsu
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
-55
-25
0
25
50
75
100
125
PT H->L
PT L->H
Delta Tpd vs # of Outputs
Switching
Number of Outputs Switching
DeltaTpd(ns)
-2
-1.5
-1
-0.5
0
1 2 3 4 5 6 7 8
RISE
FALL
Delta Tco vs # of Outputs
Switching
Number of Outputs Switching
DeltaTco(ns)
-2
-1.5
-1
-0.5
0
1 2 3 4 5 6 7 8
RISE
FALL
Delta Tpd vs Output Loading
Output Loading (pF)
DeltaTpd(ns)
-2
0
2
4
6
8
10
0 50 100 150 200 250 300
RISE
FALL
Delta Tco vs Output Loading
Output Loading (pF)
DeltaTco(ns)
-2
0
2
4
6
8
10
0 50 100 150 200 250 300
RISE
FALL
GAL20V8B-7/-10: Typical AC and DC Characteristic Diagrams
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24. 22
Specifications GAL20V8
Vol vs Iol
Iol (mA)
Vol(V)
0
0.25
0.5
0.75
1
0.00 20.00 40.00 60.00 80.00 100.00
Voh vs Ioh
Ioh(mA)
Voh(V)
0
1
2
3
4
5
0.00 10.00 20.00 30.00 40.00 50.00 60.00
Voh vs Ioh
Ioh(mA)
Voh(V)
3.5
3.75
4
4.25
4.5
0.00 1.00 2.00 3.00 4.00
Normalized Icc vs Vcc
Supply Voltage (V)
NormalizedIcc
0.80
0.90
1.00
1.10
1.20
4.50 4.75 5.00 5.25 5.50
Normalized Icc vs Temp
Temperature (deg. C)
NormalizedIcc
0.8
0.9
1
1.1
1.2
-55 -25 0 25 50 75 100 125
Normalized Icc vs Freq.
Frequency (MHz)NormalizedIcc
0.80
0.90
1.00
1.10
1.20
1.30
0 25 50 75 100
Delta Icc vs Vin (1 input)
Vin (V)
DeltaIcc(mA)
0
2
4
6
8
10
0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00
Input Clamp (Vik)
Vik (V)
Iik(mA)
0
10
20
30
40
50
60
70
80
90
100
-2.00 -1.50 -1.00 -0.50 0.00
GAL20V8B-7/-10: Typical AC and DC Characteristic Diagrams
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25. Specifications GAL20V8
23
Normalized Tpd vs Vcc
Supply Voltage (V)
NormalizedTpd
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
PT H->L
PT L->H
Normalized Tco vs Vcc
Supply Voltage (V)
NormalizedTco
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
RISE
FALL
Normalized Tsu vs Vcc
Supply Voltage (V)
NormalizedTsu
0.8
0.9
1
1.1
1.2
4.50 4.75 5.00 5.25 5.50
PT H->L
PT L->H
Normalized Tpd vs Temp
Temperature (deg. C)
NormalizedTpd
0.7
0.8
0.9
1
1.1
1.2
1.3
-55 -25 0 25 50 75 100 125
PT H->L
PT L->H
Normalized Tco vs Temp
Temperature (deg. C)
NormalizedTco
0.7
0.8
0.9
1
1.1
1.2
1.3
-55 -25 0 25 50 75 100 125
RISE
FALL
Normalized Tsu vs Temp
Temperature (deg. C)
NormalizedTsu
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
-55 -25 0 25 50 75 100 125
PT H->L
PT L->H
Delta Tpd vs # of Outputs
Switching
Number of Outputs Switching
DeltaTpd(ns)
-2
-1.5
-1
-0.5
0
1 2 3 4 5 6 7 8
RISE
FALL
Delta Tco vs # of Outputs
Switching
Number of Outputs Switching
DeltaTco(ns)
-2
-1.5
-1
-0.5
0
1 2 3 4 5 6 7 8
RISE
FALL
Delta Tpd vs Output Loading
Output Loading (pF)
DeltaTpd(ns)
-4
-2
0
2
4
6
8
10
0 50 100 150 200 250 300
RISE
FALL
Delta Tco vs Output Loading
Output Loading (pF)
DeltaTco(ns)
-4
-2
0
2
4
6
8
10
0 50 100 150 200 250 300
RISE
FALL
GAL20V8B-15/-25: Typical AC and DC Characteristic Diagrams
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26. 24
Specifications GAL20V8
Vol vs Iol
Iol (mA)
Vol(V)
0
0.5
1
1.5
2
0.00 20.00 40.00 60.00 80.00 100.00
Voh vs Ioh
Ioh(mA)
Voh(V)
0
1
2
3
4
5
0.00 10.00 20.00 30.00 40.00 50.00 60.00
Voh vs Ioh
Ioh(mA)
Voh(V)
3.25
3.5
3.75
4
4.25
0.00 1.00 2.00 3.00 4.00
Normalized Icc vs Vcc
Supply Voltage (V)
NormalizedIcc
0.80
0.90
1.00
1.10
1.20
4.50 4.75 5.00 5.25 5.50
Normalized Icc vs Temp
Temperature (deg. C)
NormalizedIcc
0.8
0.9
1
1.1
1.2
-55 -25 0 25 50 75 100 125
Normalized Icc vs Freq.
Frequency (MHz)
NormalizedIcc
0.80
0.90
1.00
1.10
1.20
1.30
1.40
0 25 50 75 100
Delta Icc vs Vin (1 input)
Vin (V)
DeltaIcc(mA)
0
2
4
6
8
10
12
0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00
Input Clamp (Vik)
Vik (V)
Iik(mA)
0
10
20
30
40
50
60
70
80
90
100
-2.00 -1.50 -1.00 -0.50 0.00
GAL20V8B-15/-25: Typical AC and DC Characteristic Diagrams
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27. Specifications GAL20V8
25
Revision History
Date Version Change Summary
- 20v8_06 Previous Lattice release.
August 2006 20v8_07 Updated for lead-free package options.
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