Atomic Force Microscope is a powerful and versatile microscope used in nanoscience and nanotechnology to study and manipulate matter at the atomic and molecular scale. It features an integrated design that combines the scan head and sample stage, ensuring robust anti-vibration performance. The scan resolution of the X and Y axis is 0.2nm while the Z axis comprises 0.05 nm offering exceptional resolution, precision, and the ability to study a wide range of physical and chemical interactions.

1. Atomic Force Microscope
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Overview
Atomic Force Microscope is a powerful and versatile
microscope used in nanoscience and nanotechnology to

2. study and manipulate matter at the atomic and
molecular scale. It features an integrated design that
combines the scan head and sample stage, ensuring
robust anti-vibration performance. The scan resolution
of the X and Y axis is 0.2nm while the Z axis comprises
0.05 nm offering exceptional resolution, precision, and
the ability to study a wide range of physical and
chemical interactions.
Specifications :
Operation Modes Contact mode, friction mode,
Tapping Mode, MFM, EFM
Scan Angle Random angle
Scan Range X/Y axis: 20×20 µm, Z axis: 2.5µm

3. Optical System/
Magnification Of
CCD
Magnification: 4x, Resolution: 2.5
µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample Size Ø≤ 90 mm, H≤ 20 mm
Sample
Movement
0 to 20 mm
Pulse Width of
Approaching
Motor
10 ± 2 ms
Scan Rate 0.6 Hz to 4.34 Hz

4. Scanning Control XY: 18-bit D/A & double;16-bit
A/D multiple channels
simultaneously
Types Of
Sampling Pixel
256×256, 512×512
Feedback Type DSP digital feedback
Feedback
Sampling Rate
64 kHz
PC Connections USB 2.0
Windows
Software
Compatible with Windows
98/2000/XP/7/8

5. Instrument
Dimension
415 × 410 × 545 mm
Net Weight 40 kg
Gross Weight 50 kg
Features :
​ - Accommodates a wide range of sample sizes,
making it versatile for various fields
​ - Equipped with a precision laser detection system,
simplifying the adjustment of the laser beam for
easy and straightforward operation
​ - Integrated with probe alignment device for
precise adjustments and alignment
​ - Electronics are modular, facilitating
straightforward maintenance and component
replacement

6. ​ - Spring-based vibration isolation is employed to
ensure stable and reliable operation
​ - Delivers exceptionally accurate results, making it
suitable for precise measurements and analyses
​ - Enhanced with an optical observation system
allowing users to easily verify the positions of both
the tip and the sample
Applications :
It is particularly well-suited for biochemistry, enabling
high-quality imaging of tissues, cells, and cellular
components. Additionally, it offers excellent
performance in nanotechnology, chemistry, and physics,
it provides exceptional capabilities for imaging surface
metal elements.
Software Features :
Selectable two-pixel sizes: 256×256 and 512×512 for
sampling

7. Execute scan area move and cut functions to select
specific areas of interest for sampling
The system begins the scanning process at random
angles to ensure comprehensive data collection
Adjust the laser spot detection system in real time for
precision and accuracy
Select and configure various color-scanning images
using a palette
Perform linear average and offset calibration in real time
to ensure accurate sample profiling
The system supports scanner sensitivity calibration and
electronic controller auto-calibration
Process and analyze sample images offline for in-depth
examination and post-processing
​ Labmate Scientific
​ Email: info@labmate.com | Website:
www.labmate.com