The Angstrom Advanced ADX-2500 X-ray Diffraction Instrument is designed for microstructure measurement and research investigations. It can analyze the structure of single crystals, powders, and amorphous materials. The instrument precisely measures diffraction angles and has a stable X-ray generator to provide accurate analysis, including phase analysis, crystallite size determination, and residual stress analysis. It incorporates high-quality hardware and software for various analytical techniques.

1. Angstrom Advanced ADX-2500 X-ray Diffraction Instrument
Introduction
ADX-2500 X-ray Diffraction Instrument is designed for application in the
microstructure measurement, testing and in-depth research investigations. With
different accessories and the corresponding control and calculating software,ADX-
2500 is a diffraction system according to the practical requirements in many fields.
ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single
crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the
following: phase qualitative analysis and quantitative analysis (RIR, Internal
standard calibration, External standard calibration, Additive criterion), pattern
indexing, unit cell determination and refinement, crystallite size and strain
determination, profile fitting and structure refinement, residual stress determination,
texture analysis(ODF expresses three-dimensional pole figure), crystallinity
estimate from peak areas, thin film analysis and others.
Features
 Perfect incorporation of the
hardware and software, allows
ADX-2500 to perform
different types of analysis for
researchers from various fields;
 High precision of the
diffraction angle measurement
allows ADX-2500 to obtain the
more accurate data;
 Higher stability of the X-ray

2. generator control system
provides excellent
measurement accuracy;
 Simple and effective design
makes ADX-2500 convenient
for operation and user friendly.
Software
General diffraction data processing: automatic peak search, manual peak search,
integral intensity, separation of Kα1, α2, background remove, pattern smoothing
and magnifying, multiple plot, three-dimensional plot and simulation of XRD
pattern.
 Profile fitting and overlapped peeks separation
With the help of Pseudo-Voigt or Pearson-VII function, the
overlapped peeks could be separated to determine the parameters of
the peaks and calculate the crystallinity, crystallite size and strain.
 Qualitative Analysis
The data processing software has the search and match function on
the base of whole profile and diffraction angle. The profile matching
procedure employs the designed mode to do the qualitative analysis
by reducing the search range from major, minor, to micro phase
without indicating the diffraction angle. The diffraction angle
matching procedure is based on the peaks position and intensity and
usually used for the qualitative analysis of the data with large angle
error.
 Quantitative Analysis
After the phase composition is determined, the content of each phase
could be calculated with the help of RIR or/and the Rietveld
refinement (Quantitative Analysis without criterion).
 Plot and Export
The data processing software is operated with Windows interface.
The preparing exported pattern could be labeled, zoomed in, zoomed
out and also copied and pasted.
Parts and Specifications
X-ray
Generator
Control mode 1kV/step, 1mA/step
controlled by PC

3. Rated output power 4 kW
Tube voltage 10-60 kV
Tube current 5-80 mA
X-ray tube Cu, Fe, Co, Cr, Mo et al
(2.4 kW)
Focus dimension: 1×10
mm2
or 0.4×10 mm2
Stability ≤ 0.01%
Goniometer Goniometer thetaθ/thetaθ
Diffraction circle
semi-diameter
225mm
Scan range of 2θ -6°-160°
Continuous scanning
rate
0.06°-50°/min
Setting speed of angle 1500°/min
Scan mode θ-2θ linkage, θ,2θ one
way: continuous or step
scanning
One way repeatability
of 2θ
≤ 0.001°
Minimal stepping
angle
0.001°
Precision of 2θ ≤ 0.02°
Record Unit Counter PC or SC
Maximal CPS 5×106
CPS
Proportion counter
energy spectrum
resolution
≤ 25%(PC),
≤ 55%(SC)
Detectable high
voltage
1500-2100 V continuous
tune
High voltage of the differential or integral,

4. counter automatic PHA, dead time
emendation
System detector
stability
≤ 0.01%
Integrated
performance
Dispersion dosage ≤ 1μSv/h
Integrated stability of
the system
≤ 0.5%
Dimension 1000 × 800 × 1600 mm
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