This document describes a new gridding technique for high density microarray images. [1] The technique uses the intensity projection profile of the most suitable subimage to locate subarrays and individual spots without any user input parameters. [2] It is capable of processing images with irregular spots, varying surface intensity, and over 50% contamination. [3] The key steps are preprocessing the image, then using horizontal and vertical intensity projection profiles of the preprocessed image to estimate global parameters for locating subarrays, and local parameters for locating individual spots within each subarray.