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COMPONENTS OF
OPTICAL
COMMUNICATION
SYSTEMS-RECEIVERS AND
AMPLIFIERS
Optical Receiver
The task of an optical receiver is to perform the Optical to
Electronic (OE) conversion of its input signal
In optical receivers, we will discuss:
1. The process of photodetection,
2. The parameters of a Photodetector (PD) and
3. The design of a commonly used PD termed as the PIN
photodiode
Photodetection
Photodetectors are made of semiconductor materials
When light falls on a semiconductor material, photons are
absorbed by the electrons in the valence band of the
semiconductor
These electrons in the valence band gain energy from the
absorbed photon and thus move to the conduction band of the
semiconductor material
Therefore an electron-hole pair is formed, which on the
application of an external potential, gives rise to the flow of
electric current, referred to as photocurrent
Photodetection
Photodetection
The process of photo-detection is shown in the stylized
illustration of the Figure
An electron absorbs a single photon to move into the
conduction band
In order for the electron transition to occur, the energy of the
incident photon should be equal to the energy difference
between the valence and conduction band
Photodetection
The simplest form of a PD is based on a combination of p-type
and n-type materials forming a p-n junction
When light falls on this type of a reverse-biased p-n junction,
electron-hole pairs are generated that flow in the opposite
direction due to the voltage applied
The width of the p-n junction determines the amount of current
flow
Photodetector Parameters
We now discuss some of the PD parameters, namely:
1. Responsivity,
2. Quantum efficiency and
3. Bandwidth
The responsivity R of a PD is defined as the ratio of the
photocurrent Ip generated, to the optical power Pin incident on
the PD, which is formulated as:
Photodetector Parameters
The quantum efficiency 𝜂 of a PD is a measure of how
efficiently the PD converts the incident light into electric current
It is the ratio of the rate of electron generation to the rate of
photon incidence on the PD
The rate of electron generation is given by the ratio of the
current flow to the charge of an electron
The rate of photon incidence is given by the ratio of the total
incident power to the energy absorbed when an electron jumps
from a lower energy level to a higher level
Photodetector Parameters
Hence the quantum efficiency can be expressed as:
Here q is the electron charge,
h is Plank’s constant and
f is the frequency of the incident photon
Photodetector Parameters
The bandwidth of a PD determines how promptly it responds to
changes in the incident light
The bandwidth in turn depends upon the rise time Tr
Tr is defined as the time it takes for the current to rise from 10%
to 90% of its final value for a step change in the power of the
incident light
For a p-n junction based PD, the rise time is dependent both
upon the RC time constant and on the transit time of the PD
Photodetector Parameters
The capacitance C of a p-n junction based PD is determined by
the length Ld of the depletion region which separates oppositely
charged electrons and holes
Photodetector Parameters
The transit time is the time required for an electron to travel
from one end of the PD to the other
Mathematically, the rise time Tr of a PD can be written as:
Where 𝜏𝑡𝑟 and 𝜏𝑅𝐶 denote the transit time and RC time
constant of the PD
The values of 𝜏𝑡𝑟 and 𝜏𝑅𝐶 are dependent upon the design of
the PD
Photodetector Parameters
Due to the analogy between the PD and RC circuit, the
bandwidth of the PD can be expressed in a way similar to that
of the RC circuit as:
Above Equation implies that the bandwidth of a PD can be
increased both by reducing the RC time constant and by the
transit time of the PD
Photodetector Parameters
The reduction in transit time can be achieved by reducing the
length LPD of the PD
The transit time is related to LPD by:
Here vd is the velocity of the electrons drifting across the length
Ld of the depletion region
Photodetector Parameters
A reduction in the length of the PD would reduce the surface
area on which the light falls
Therefore, the rate of electron generation will decrease
This in turn will reduce the responsivity and efficiency of the PD
This implies that there is a trade-off between the bandwidth and
responsivity of a PD
PIN Photodiode
We now discuss the most common type of PD called the PIN
photodiode
Apart from the drift of electrons across the depletion region, the
photocurrent can also be generated through diffusion of
electrons and holes
As mentioned earlier, the drift current is generated due to light
falling on the depletion region of the PD
Diffusion current is generated by the light falling on the n-type
and p-type materials in the PD
PIN Photodiode
The electrons and holes generated in p-type and n-type
materials respectively, have to diffuse towards the depletion
region boundary, before they can drift to the opposite sides
This diffusion of electrons and holes is a slow process and
hence delays the response of the PD to a sudden change in the
intensity of the incident light
In order to reduce the diffusion current, the length of the p-type
and n-type materials can be decreased, hence making the drift
current dominant over the diffusion current
PIN Photodiode
This can be achieved by inserting an intrinsic semiconductor
material between the n-type and p-type materials
PIN Photodiode
This will increase the length of the depletion region, while
decreasing the length of n-type and p-type regions
Due to the particular structure of the PD, it is generally called
PIN photodiode
Where P, I and N stands for the p-type, intrinsic and n-type
materials, respectively

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8. lecture=13 14 photodetection pin diode

  • 2.
  • 3. Optical Receiver The task of an optical receiver is to perform the Optical to Electronic (OE) conversion of its input signal In optical receivers, we will discuss: 1. The process of photodetection, 2. The parameters of a Photodetector (PD) and 3. The design of a commonly used PD termed as the PIN photodiode
  • 4. Photodetection Photodetectors are made of semiconductor materials When light falls on a semiconductor material, photons are absorbed by the electrons in the valence band of the semiconductor These electrons in the valence band gain energy from the absorbed photon and thus move to the conduction band of the semiconductor material Therefore an electron-hole pair is formed, which on the application of an external potential, gives rise to the flow of electric current, referred to as photocurrent
  • 6. Photodetection The process of photo-detection is shown in the stylized illustration of the Figure An electron absorbs a single photon to move into the conduction band In order for the electron transition to occur, the energy of the incident photon should be equal to the energy difference between the valence and conduction band
  • 7. Photodetection The simplest form of a PD is based on a combination of p-type and n-type materials forming a p-n junction When light falls on this type of a reverse-biased p-n junction, electron-hole pairs are generated that flow in the opposite direction due to the voltage applied The width of the p-n junction determines the amount of current flow
  • 8. Photodetector Parameters We now discuss some of the PD parameters, namely: 1. Responsivity, 2. Quantum efficiency and 3. Bandwidth The responsivity R of a PD is defined as the ratio of the photocurrent Ip generated, to the optical power Pin incident on the PD, which is formulated as:
  • 9. Photodetector Parameters The quantum efficiency 𝜂 of a PD is a measure of how efficiently the PD converts the incident light into electric current It is the ratio of the rate of electron generation to the rate of photon incidence on the PD The rate of electron generation is given by the ratio of the current flow to the charge of an electron The rate of photon incidence is given by the ratio of the total incident power to the energy absorbed when an electron jumps from a lower energy level to a higher level
  • 10. Photodetector Parameters Hence the quantum efficiency can be expressed as: Here q is the electron charge, h is Plank’s constant and f is the frequency of the incident photon
  • 11. Photodetector Parameters The bandwidth of a PD determines how promptly it responds to changes in the incident light The bandwidth in turn depends upon the rise time Tr Tr is defined as the time it takes for the current to rise from 10% to 90% of its final value for a step change in the power of the incident light For a p-n junction based PD, the rise time is dependent both upon the RC time constant and on the transit time of the PD
  • 12. Photodetector Parameters The capacitance C of a p-n junction based PD is determined by the length Ld of the depletion region which separates oppositely charged electrons and holes
  • 13. Photodetector Parameters The transit time is the time required for an electron to travel from one end of the PD to the other Mathematically, the rise time Tr of a PD can be written as: Where 𝜏𝑡𝑟 and 𝜏𝑅𝐶 denote the transit time and RC time constant of the PD The values of 𝜏𝑡𝑟 and 𝜏𝑅𝐶 are dependent upon the design of the PD
  • 14. Photodetector Parameters Due to the analogy between the PD and RC circuit, the bandwidth of the PD can be expressed in a way similar to that of the RC circuit as: Above Equation implies that the bandwidth of a PD can be increased both by reducing the RC time constant and by the transit time of the PD
  • 15. Photodetector Parameters The reduction in transit time can be achieved by reducing the length LPD of the PD The transit time is related to LPD by: Here vd is the velocity of the electrons drifting across the length Ld of the depletion region
  • 16. Photodetector Parameters A reduction in the length of the PD would reduce the surface area on which the light falls Therefore, the rate of electron generation will decrease This in turn will reduce the responsivity and efficiency of the PD This implies that there is a trade-off between the bandwidth and responsivity of a PD
  • 17. PIN Photodiode We now discuss the most common type of PD called the PIN photodiode Apart from the drift of electrons across the depletion region, the photocurrent can also be generated through diffusion of electrons and holes As mentioned earlier, the drift current is generated due to light falling on the depletion region of the PD Diffusion current is generated by the light falling on the n-type and p-type materials in the PD
  • 18. PIN Photodiode The electrons and holes generated in p-type and n-type materials respectively, have to diffuse towards the depletion region boundary, before they can drift to the opposite sides This diffusion of electrons and holes is a slow process and hence delays the response of the PD to a sudden change in the intensity of the incident light In order to reduce the diffusion current, the length of the p-type and n-type materials can be decreased, hence making the drift current dominant over the diffusion current
  • 19. PIN Photodiode This can be achieved by inserting an intrinsic semiconductor material between the n-type and p-type materials
  • 20. PIN Photodiode This will increase the length of the depletion region, while decreasing the length of n-type and p-type regions Due to the particular structure of the PD, it is generally called PIN photodiode Where P, I and N stands for the p-type, intrinsic and n-type materials, respectively