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All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 1 -
COMPONENTS:
DIODE/ GENERAL PURPOSE RECTIFIER/ STANDARD
PART NUMBER: 1SS412
MANUFACTURER: TOSHIBA
Device Modeling Report
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 2 -
SPICE MODEL
Circuit Configuration
*$
* PART NUMBER: 1SS412
* MANUFACTURER: TOSHIBA
* All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
.SUBCKT 1SS412 1 2 3
D1 1 3 D1SS412
D2 3 2 D1SS412
.MODEL D1SS412 D
+ IS=18.216E-15
+ N=1.2640
+ RS=.41027
+ IKF=2.6752
+ CJO=2.9583E-12
+ M=.36962
+ VJ=.62677
+ BV=80
+ IBV=100.00E-12
+ TT=260.12E-9
+ ISR=0
.ENDS
*$
(3)
(1)
(2)
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 3 -
DIODE MODEL PARAMETERS
PSpice model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 4 -
V_V1
0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V
I(R1)
10uA
100uA
1.0mA
10mA
100mA
Forward Current Characteristic
Circuit Simulation Result
Evaluation Circuit
U1
1SS412
V1
0Vdc
0
R1
0.01m
R2
100MEG
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 5 -
Comparison Graph
Circuit Simulation Result
Simulation Result
Ifwd (A)
Vfwd (V)
%Error
Measurement Simulation
0.00001 0.655 0.658 0.40
0.00002 0.682 0.680 -0.22
0.00005 0.710 0.710 0.00
0.0001 0.735 0.733 -0.29
0.0002 0.757 0.756 -0.19
0.0005 0.785 0.786 0.08
0.001 0.812 0.809 -0.41
0.002 0.831 0.832 0.09
0.005 0.861 0.863 0.22
0.01 0.889 0.888 -0.15
0.02 0.912 0.914 0.27
0.05 0.957 0.957 0.00
0.1 1.003 1.001 -0.24
0.2 1.064 1.065 0.08
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 6 -
V(N11503)
100mV 1.0V 10V 50V
I(V2)/(80V/1u)
0
1.0p
2.0p
3.0p
3.5p
Capacitance Characteristic
Circuit Simulation Result
Evaluation Circuit
R1
100MEG
U1
1SS412
V2
0Vdc
V1
TD = 0
TF = 50ns
PW = 5us
PER = 10us
V1 = 0
TR = 1u
V2 = 80
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 7 -
Comparison Graph
Circuit Simulation Result
Simulation Result
Vrev (V)
Ct (pF)
%Error
Measurement Simulation
0.1 2.797 2.802 0.16
0.2 2.664 2.670 0.23
0.5 2.387 2.381 -0.26
1 2.094 2.080 -0.69
2 1.767 1.744 -1.32
5 1.280 1.314 2.66
10 1.008 1.039 3.08
20 0.802 0.814 1.50
50 0.603 0.583 -3.32
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 8 -
0
V1TD = 100ns
TF = 9ns
PW = 20us
PER = 50us
V1 = -9V
TR = 10ns
V2 = 11.1V
R1
50
R2
100MEG
U1
1SS412
Time
19.4us 19.8us 20.2us 20.6us 21.0us 21.4us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
Reverse Recovery Characteristic
Circuit Simulation Result
Evaluation Circuit
Compare Measurement vs. Simulation
Measurement Simulation %Error
trj ns 92.00 91.379 -0.67
All Rights Reserved Copyright (C) Bee Technologies Inc. 2008
- 9 -
Reverse Recovery Characteristic Reference
Measurement
Trj =92(ns)
Trb= 220(ns)
Conditions: Ifwd=0.2A,Irev=0.2A, Rl=50
Relation between trj and trb
Example

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1SS412 LTspice Model (Free SPICE Model)

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 1 - COMPONENTS: DIODE/ GENERAL PURPOSE RECTIFIER/ STANDARD PART NUMBER: 1SS412 MANUFACTURER: TOSHIBA Device Modeling Report Bee Technologies Inc.
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 2 - SPICE MODEL Circuit Configuration *$ * PART NUMBER: 1SS412 * MANUFACTURER: TOSHIBA * All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 .SUBCKT 1SS412 1 2 3 D1 1 3 D1SS412 D2 3 2 D1SS412 .MODEL D1SS412 D + IS=18.216E-15 + N=1.2640 + RS=.41027 + IKF=2.6752 + CJO=2.9583E-12 + M=.36962 + VJ=.62677 + BV=80 + IBV=100.00E-12 + TT=260.12E-9 + ISR=0 .ENDS *$ (3) (1) (2)
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 3 - DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 4 - V_V1 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V I(R1) 10uA 100uA 1.0mA 10mA 100mA Forward Current Characteristic Circuit Simulation Result Evaluation Circuit U1 1SS412 V1 0Vdc 0 R1 0.01m R2 100MEG
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 5 - Comparison Graph Circuit Simulation Result Simulation Result Ifwd (A) Vfwd (V) %Error Measurement Simulation 0.00001 0.655 0.658 0.40 0.00002 0.682 0.680 -0.22 0.00005 0.710 0.710 0.00 0.0001 0.735 0.733 -0.29 0.0002 0.757 0.756 -0.19 0.0005 0.785 0.786 0.08 0.001 0.812 0.809 -0.41 0.002 0.831 0.832 0.09 0.005 0.861 0.863 0.22 0.01 0.889 0.888 -0.15 0.02 0.912 0.914 0.27 0.05 0.957 0.957 0.00 0.1 1.003 1.001 -0.24 0.2 1.064 1.065 0.08
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 6 - V(N11503) 100mV 1.0V 10V 50V I(V2)/(80V/1u) 0 1.0p 2.0p 3.0p 3.5p Capacitance Characteristic Circuit Simulation Result Evaluation Circuit R1 100MEG U1 1SS412 V2 0Vdc V1 TD = 0 TF = 50ns PW = 5us PER = 10us V1 = 0 TR = 1u V2 = 80 0
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 7 - Comparison Graph Circuit Simulation Result Simulation Result Vrev (V) Ct (pF) %Error Measurement Simulation 0.1 2.797 2.802 0.16 0.2 2.664 2.670 0.23 0.5 2.387 2.381 -0.26 1 2.094 2.080 -0.69 2 1.767 1.744 -1.32 5 1.280 1.314 2.66 10 1.008 1.039 3.08 20 0.802 0.814 1.50 50 0.603 0.583 -3.32
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 8 - 0 V1TD = 100ns TF = 9ns PW = 20us PER = 50us V1 = -9V TR = 10ns V2 = 11.1V R1 50 R2 100MEG U1 1SS412 Time 19.4us 19.8us 20.2us 20.6us 21.0us 21.4us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA Reverse Recovery Characteristic Circuit Simulation Result Evaluation Circuit Compare Measurement vs. Simulation Measurement Simulation %Error trj ns 92.00 91.379 -0.67
  • 9. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 - 9 - Reverse Recovery Characteristic Reference Measurement Trj =92(ns) Trb= 220(ns) Conditions: Ifwd=0.2A,Irev=0.2A, Rl=50 Relation between trj and trb Example