Material Characterization Testing, Unit-IV
Subject Name: OML751 Testing of Materials
Topics: Material Characterization Testing [Optical microscopy, Electron microscopy-SEM, TEM. Diffraction techniques, Spectroscopy techniques. Electrical and Magnetic techniques.
B.E. Mechanical Engineering
Final Year, VII Semester, Open Elective Subject
[As per Anna University R-2017]
3. UNIT-IV : MATERIAL CHARACTERIZATION TESTING
Macroscopic and Microscopic observations,
Optical and Electron microscopy (SEM and TEM) –
Principles, Types, Advantages and Limitations,
Applications.
Diffraction techniques,
Spectroscopic Techniques,
Electrical and Magnetic Techniques –
Principles, Types, Advantages and Limitations,
Applications.
3https://www.slideshare.net/ThirumalValavan2/
101. Ion Milling
• Ion milling uses a beam of energetic ions to bombard specimen surfaces in
order to reduce the thickness by knocking atoms out of a specimen.
• The specimen does not need to be electrically conductive for ion milling. Thus,
the technique is suitable for metal, ceramics and other materials, as long as
they are thermally stable.
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111. Resolution - TEM
• TEMs can produce images with resolution down to 0.2nm.
• This resolution is smaller that the size of most atoms and therefore shows the true
structural arrangement of atoms in the sample material.
111https://www.slideshare.net/ThirumalValavan2/