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Environmental Test Summary
(AEC-Q200)
Product Name: AEC-Q200 Version Chip Resistors
Part Name : NQ07 Series
Approved: William Zhao
Checked : Liu Aiping
Prepared : Cai WenLin
File NO. : T-2017-03-1
Edition : 1
Date
Page
: 2017.03.29
: 10
厚声国际贸易(昆山)有限公司
UNIROYAL ELECTRONICS GLOBAL CO., LTD.
88 Longteng Road, Economic & Technical Development Zone,
Kunshan City, Jiangsu, China
TEL: +86 755 61880368
Email: able.lee@allchips.com
2017
No.* S.S.** Test Item
NQ07 ±1%
Result
Low Middle High
1 30 Pre-and Post-Stress Electrical Test 9.1Ω 75KΩ 910KΩ PASS
3 77 High Temperature Exposure(Storage) 9.1Ω 75KΩ 910KΩ 13Ω
4 77 Temperature Cycling 9.1Ω 75KΩ 910KΩ 13Ω
7 77 Biased Humidity 9.1Ω 75KΩ 910KΩ 13Ω
8 77 Operational life 9.1Ω 75KΩ 910KΩ 13Ω
9 77 External Visual 9.1Ω 75KΩ 910KΩ 13Ω
10 30 Physical Dimension 9.1Ω 75KΩ 910KΩ 13Ω
11 30 Terminal Strength(Leaded) 9.1Ω 75KΩ 910KΩ 13Ω
12 5 Resistance to Solvent 9.1Ω 75KΩ 910KΩ 13Ω
13 30 Mechanical Shock 9.1Ω 75KΩ 910KΩ 13Ω
14 30 Vibration 9.1Ω 75KΩ 910KΩ 13Ω
15 30 Resistance to Soldering Heat 9.1Ω 75KΩ 910KΩ 13Ω
17 15 ESD 9.1Ω 75KΩ 910KΩ 13Ω
18 15 Solderability 9.1Ω 75KΩ 910KΩ 13Ω
19 30 Electrical Characterization 9.1Ω 75KΩ 910KΩ 13Ω
20 30 Flammability 9.1Ω 75KΩ 910KΩ 13Ω
21 30 Board Flex 9.1Ω 75KΩ 910KΩ 13Ω
22 30 Terminal Strength(SMD) 9.1Ω 75KΩ 910KΩ 13Ω
24 30 Flame Retardance 9.1Ω 75KΩ 910KΩ 13Ω
# 30 Sulfuration test 9.1Ω 75KΩ 910KΩ 13Ω
AEC-Q200 Environmental Test Summary
1
2
3
DESCRIPTION
 This is the reliability test report of AEC-Q200 version chip resistors - NQ07 ±1% series resistor
manufactured by UNIOHM.
 Test items follow the standard of AEC-Q200 REV D June 1, 2010.
RELIABILITY TEST RESULT SUMMARY
REMARK:
*: The No. of test items is based on the AEC-Q200 REV D June 1, 2010 TABLE 7, more details in Appendix A.
**: S.S. means sample size. It is based on the AEC-Q200 REV D June 1, 2010 TABLE 1, more details in Appendix B.
#: Added test item: Sulfuration test
CONCLUSION
Based on tests result, NQ07 ±1% Series products meet AEC-Q200 REV D June 1, 2010, and meet
Specification Standard.
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page1,Pages 10
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.08% 0.49% 0.14% PASS
75KΩ ±(1.0%+0.1Ω) -0.07% 0.42% 0.12% PASS
910KΩ ±(1.0%+0.1Ω) -0.09% 0.50% 0.15% PASS
4 Test Results
4.1 Item 1: Pre-and Post-Stress Electrical Test
Ref. Standards: User Spec.
Procedure:
Permanent resistance change after the application of a potential of 2.5 times RCWV or Max. Overload
Voltage whichever less for 5 seconds.
S.S.: 30PCS
Results: PASS
4.2 Item 2: High Temperature Exposure (Storage)
Ref. Standards: MIL-STD-202 Method 108
Procedure:
Condition D(1000hrs.)Steady State T=155℃.
Unpowered Measurement at 24±2 hours after test conclusion.
S.S.: 77PCS
Results: PASS
4.3 Item 3: Temperature Cycling
Ref. Standards: JESD22 Method JA-104
Procedure:
1000 Cycles (-55℃ to +155 ℃) Measurement at 24±2 hours after test. conclusion 30min maximum dwell
time at each temperature extreme. 1min. maximum transition time.
S.S.: 77PCS
Results: PASS
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page2,Pages 10
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.02% 0.42% 0.17% PASS
75KΩ ±(1.0%+0.1Ω) -0.06% 0.40% 0.11% PASS
910KΩ ±(1.0%+0.1Ω) -0.04% 0.39% 0.14% PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.07% 0.41% 0.21% PASS
75KΩ ±(1.0%+0.1Ω) -0.04% 0.38% 0.14% PASS
910KΩ ±(1.0%+0.1Ω) -0.02% 0.42% 0.17% PASS
Type Tol. (%) R value Result
NQ07 ±1
9.1Ω PASS
75KΩ PASS
910KΩ PASS
4.4 Item 4: Biased Humidity
Ref. Standards: MIL-STD-202 Method 103
Procedure:1000 hours 85℃/85%RH.
Note:
Specified condition:10% of operating power.
Measurement at 24±2 hours after test conclusion.
S.S.: 77PCS
Results: PASS
4.5 Item 5: Operational life
Ref. Standards: MIL-STD-202 Method 108
Procedure:
Condition D(1000hrs.)Steady State TA=125℃ at 36% of rated power.
Measurement at 24±2 hours after test conclusion.
S.S.: 77PCS
Results: PASS
4.6 Item 6: External Visual
Ref. Standards: MIL-STD-883 Method 2009
Procedure:
Electrical test not required.
Inspect device construction, marking and workmanship
S.S.: 77PCS
Results: PASS
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page3,Pages 10
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.03% 0.39% 0.25% PASS
75KΩ ±(1.0%+0.1Ω) -0.04% 0.36% 0.12% PASS
910KΩ ±(1.0%+0.1Ω) -0.01% 0.41% 0.13% PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.04% 0.38% 0.25% PASS
75KΩ ±(1.0%+0.1Ω) -0.02% 0.36% 0.12% PASS
910KΩ ±(1.0%+0.1Ω) -0.03% 0.41% 0.14% PASS
Item Tol. (mm) Min. (mm) Max. (mm) Mean(mm) Result
Dimension L 3.10±0.10 3.04 3.12 3.09 PASS
Dimension W 2.60±0.20 2.59 2.69 2.61 PASS
Dimension H 0.55±0.10 0.51 0.61 0.54 PASS
Dimension A 0.50±0.25 0.45 0.62 0.51 PASS
Dimension B 0.50±0.20 0.49 0.59 0.50 PASS
4.7 Item 7: Physical Dimension
Ref. Standards: JESD22 Method JB-100
Procedure: Verify physical dimensions to the applicable device detail specification.
Note:
User(s) and Suppliers Spec.
S.S.: 30PCS
Result: PASS
Electrical test not required.
4.8 Item 8: Resistance to Solvent
Ref. Standards: MIL-STD-202 Method 210
Procedure: /
Note: Add Aqueous wash chemical –OKEM Clean or equivalent. Do not use banned solvents.
S.S.: 5PCS
Results: PASS
4.9 Item 9: Mechanical Shocked
Ref. Standards: MIL-STD-202 Method 213
Procedure: Method 213. Condition C Half sine. 100g, duration 6ms, velocity 12.3 ft./s100Hz
S.S.: 30PCS
Results: PASS
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page4,Pages 10
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.06% 0.42% 0.19% PASS
75KΩ ±(1.0%+0.1Ω) -0.03% 0.39% 0.10% PASS
910KΩ ±(1.0%+0.1Ω) -0.01% 0.35% 0.15% PASS
Type Tol. (%) R value Spec. Result
NQ07 ±1
9.1Ω Marking no smear PASS
75KΩ Marking no smear PASS
910KΩ Marking no smear PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.05Ω) -0.03% 0.39% 0.12% PASS
75KΩ ±(1.0%+0.05Ω) -0.01% 0.40% 0.15% PASS
910KΩ ±(1.0%+0.05Ω) -0.02% 0.34% 0.11% PASS
4.10 Item 10: Vibration
Ref. Standards: MIL-STD-202 Method 204
Procedure:5g’s for 20 mins.,12 cycle each 3 orientations.
Note:
Use 8 “X5” PCB,031 “thick 7 secure points on one long side and 2 secure points at corners of opposite
sides .Parts mounted within 2” from any secure points. Test from 10-2000Hz.
S.S.: 30PCS
Results: PASS
4.11 Item 11: Resistance to Soldering Heat
Ref. Standards: MIL-STD-202 Method 210
Procedure: Condition B No per-heat of samples.
Note: Single Wave Solder-Procedure 2
S.S.: 30PCS
Results: PASS
4.12 Item: ESD
Ref. Standards: AEC-Q200-002
Procedure: NQ07:4KV
S.S.: 15PCS
Results: PASS
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page5,Pages 10
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.05% 0.46% 0.20% PASS
75KΩ ±(1.0%+0.1Ω) -0.01% 0.37% 0.14% PASS
910KΩ ±(1.0%+0.1Ω) -0.07% 0.44% 0.11% PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.1Ω) -0.06% 0.37% 0.17% PASS
75KΩ ±(1.0%+0.1Ω) -0.02% 0.32% 0.10% PASS
910KΩ ±(1.0%+0.1Ω) -0.03% 0.41% 0.19% PASS
Type Tol.(%) R value Min.(%) Max.(%) Avg.(%) Std (%) Result
NQ07 ±1
9.1Ω -0.08% 0.14% 0.027% 0.05% PASS
75KΩ -0.10% 0.11% 0.025% 0.05% PASS
910KΩ -0.05% 0.15% 0.032% 0.06% PASS
4.13 Item 13: Solderability
Ref. Standards: J-STD-002
Procedure:
For SMD resistors. Electrical test not required. Magnification 50X. Conditions:
a) Method B 4hrs at 155℃ dry heat, the dip in bath with 245℃,5s.
b) N/A
c) Method D: at 260℃, 60s.
S.S.: Each condition 15 PCS
Results: PASS
4.14 Item 14: Electrical Characterization (Resistance)
Ref. Standards: IEC 60115-1 4.5
Procedure:
Parametrically test per lot and sample size, requirements, summary to show Min, Max, Mean and Standard
deviation at room as well as Min and Max operating temperatures 15℃~35℃.
S.S.: 30 PCS
Results: PASS
4.15 Item 15: Flammability
Ref. Standards: UL-94
Procedure: V-1 is acceptable. Electrical test not required.
S.S.: 30PCS
Results: PASS
4.16 Item 16: Board Flex
Ref. Standards: AEC Q200-005
Procedure: 60 sec minimum holding time. AEC standard: 2/90mm 60s, actual: 3/90mm 60s
S.S.: 30PCS
Results: PASS
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page6,Pages 10
Type Tol. (%) R value Spec. Result
NQ07 ±1
9.1Ω / PASS
75KΩ / PASS
910KΩ / PASS
Type Tol. (%) R value Spec. Result
NQ07 ±1
9.1Ω ≧95% Coverage PASS
75KΩ ≧95% Coverage PASS
910KΩ ≧95% Coverage PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(1.0%+0.05Ω) -0.04% 0.38% 0.12% PASS
75KΩ ±(1.0%+0.05Ω) -0.01% 0.35% 0.11% PASS
910KΩ ±(1.0%+0.05Ω) -0.03% 0.40% 0.17% PASS
Type Tol. (%) R value Spec. Result
NQ07 ±1
9.1Ω No flame PASS
75KΩ No flame PASS
910KΩ No flame PASS
4.17 Item 17: Terminal strength (SMD)
Ref. Standards: AEC Q200-006
Procedure: Force of 1.8kg for 60 seconds.
S.S.: 30PCS
Results: PASS
4.18 Item 18: Flame Retardance
Ref. Standards: AEC-Q200-001
Procedure:
Only requested, when voltage/power will increase the surface temp to 350℃.Apply voltage from 9V to 32V.
No flame; No explosion.
S.S.: 30PCS
Results: PASS
4.19 Item: Sulfuration test
Ref. Standards: /
Procedure: 500hrs.Soaked in industrial oil with sulfur substance 3.5% contained 105℃±3℃.
S.S.:30PCS
Results: PASS
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page7,Pages 10
Type Tol. (%) R value Spec. Min Max Mean Result
NQ07 ±1
9.1Ω ±(5.0%+0.1Ω) -0.03% 0.38% 0.21% PASS
75KΩ ±(5.0%+0.1Ω) -0.02% 0.32% 0.13% PASS
910KΩ ±(5.0%+0.1Ω) -0.05% 0.31% 0.16% PASS
Type Tol. (%) R value Spec. Result
NQ07 ±1
9.1Ω Not broken PASS
75KΩ Not broken PASS
910KΩ Not broken PASS
Appendix A: Table of Tests and Methods reproduced from AEC-Q200-Rev-D-June 1, 2010
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page8,Pages 10
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page9,Pages 10
Appendix B: Table of Qualification Sample Size Requirements from AEC-Q200-Rev-D-June 1, 2010
NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March,2017
Page10,Pages 10

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Uniohm resistors datasheet AEC-Q200 Version Chip Resistors NQ07 Series - allchips

  • 1. Environmental Test Summary (AEC-Q200) Product Name: AEC-Q200 Version Chip Resistors Part Name : NQ07 Series Approved: William Zhao Checked : Liu Aiping Prepared : Cai WenLin File NO. : T-2017-03-1 Edition : 1 Date Page : 2017.03.29 : 10 厚声国际贸易(昆山)有限公司 UNIROYAL ELECTRONICS GLOBAL CO., LTD. 88 Longteng Road, Economic & Technical Development Zone, Kunshan City, Jiangsu, China TEL: +86 755 61880368 Email: able.lee@allchips.com 2017
  • 2. No.* S.S.** Test Item NQ07 ±1% Result Low Middle High 1 30 Pre-and Post-Stress Electrical Test 9.1Ω 75KΩ 910KΩ PASS 3 77 High Temperature Exposure(Storage) 9.1Ω 75KΩ 910KΩ 13Ω 4 77 Temperature Cycling 9.1Ω 75KΩ 910KΩ 13Ω 7 77 Biased Humidity 9.1Ω 75KΩ 910KΩ 13Ω 8 77 Operational life 9.1Ω 75KΩ 910KΩ 13Ω 9 77 External Visual 9.1Ω 75KΩ 910KΩ 13Ω 10 30 Physical Dimension 9.1Ω 75KΩ 910KΩ 13Ω 11 30 Terminal Strength(Leaded) 9.1Ω 75KΩ 910KΩ 13Ω 12 5 Resistance to Solvent 9.1Ω 75KΩ 910KΩ 13Ω 13 30 Mechanical Shock 9.1Ω 75KΩ 910KΩ 13Ω 14 30 Vibration 9.1Ω 75KΩ 910KΩ 13Ω 15 30 Resistance to Soldering Heat 9.1Ω 75KΩ 910KΩ 13Ω 17 15 ESD 9.1Ω 75KΩ 910KΩ 13Ω 18 15 Solderability 9.1Ω 75KΩ 910KΩ 13Ω 19 30 Electrical Characterization 9.1Ω 75KΩ 910KΩ 13Ω 20 30 Flammability 9.1Ω 75KΩ 910KΩ 13Ω 21 30 Board Flex 9.1Ω 75KΩ 910KΩ 13Ω 22 30 Terminal Strength(SMD) 9.1Ω 75KΩ 910KΩ 13Ω 24 30 Flame Retardance 9.1Ω 75KΩ 910KΩ 13Ω # 30 Sulfuration test 9.1Ω 75KΩ 910KΩ 13Ω AEC-Q200 Environmental Test Summary 1 2 3 DESCRIPTION  This is the reliability test report of AEC-Q200 version chip resistors - NQ07 ±1% series resistor manufactured by UNIOHM.  Test items follow the standard of AEC-Q200 REV D June 1, 2010. RELIABILITY TEST RESULT SUMMARY REMARK: *: The No. of test items is based on the AEC-Q200 REV D June 1, 2010 TABLE 7, more details in Appendix A. **: S.S. means sample size. It is based on the AEC-Q200 REV D June 1, 2010 TABLE 1, more details in Appendix B. #: Added test item: Sulfuration test CONCLUSION Based on tests result, NQ07 ±1% Series products meet AEC-Q200 REV D June 1, 2010, and meet Specification Standard. NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page1,Pages 10
  • 3. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.08% 0.49% 0.14% PASS 75KΩ ±(1.0%+0.1Ω) -0.07% 0.42% 0.12% PASS 910KΩ ±(1.0%+0.1Ω) -0.09% 0.50% 0.15% PASS 4 Test Results 4.1 Item 1: Pre-and Post-Stress Electrical Test Ref. Standards: User Spec. Procedure: Permanent resistance change after the application of a potential of 2.5 times RCWV or Max. Overload Voltage whichever less for 5 seconds. S.S.: 30PCS Results: PASS 4.2 Item 2: High Temperature Exposure (Storage) Ref. Standards: MIL-STD-202 Method 108 Procedure: Condition D(1000hrs.)Steady State T=155℃. Unpowered Measurement at 24±2 hours after test conclusion. S.S.: 77PCS Results: PASS 4.3 Item 3: Temperature Cycling Ref. Standards: JESD22 Method JA-104 Procedure: 1000 Cycles (-55℃ to +155 ℃) Measurement at 24±2 hours after test. conclusion 30min maximum dwell time at each temperature extreme. 1min. maximum transition time. S.S.: 77PCS Results: PASS NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page2,Pages 10
  • 4. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.02% 0.42% 0.17% PASS 75KΩ ±(1.0%+0.1Ω) -0.06% 0.40% 0.11% PASS 910KΩ ±(1.0%+0.1Ω) -0.04% 0.39% 0.14% PASS Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.07% 0.41% 0.21% PASS 75KΩ ±(1.0%+0.1Ω) -0.04% 0.38% 0.14% PASS 910KΩ ±(1.0%+0.1Ω) -0.02% 0.42% 0.17% PASS
  • 5. Type Tol. (%) R value Result NQ07 ±1 9.1Ω PASS 75KΩ PASS 910KΩ PASS 4.4 Item 4: Biased Humidity Ref. Standards: MIL-STD-202 Method 103 Procedure:1000 hours 85℃/85%RH. Note: Specified condition:10% of operating power. Measurement at 24±2 hours after test conclusion. S.S.: 77PCS Results: PASS 4.5 Item 5: Operational life Ref. Standards: MIL-STD-202 Method 108 Procedure: Condition D(1000hrs.)Steady State TA=125℃ at 36% of rated power. Measurement at 24±2 hours after test conclusion. S.S.: 77PCS Results: PASS 4.6 Item 6: External Visual Ref. Standards: MIL-STD-883 Method 2009 Procedure: Electrical test not required. Inspect device construction, marking and workmanship S.S.: 77PCS Results: PASS NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page3,Pages 10
  • 6. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.03% 0.39% 0.25% PASS 75KΩ ±(1.0%+0.1Ω) -0.04% 0.36% 0.12% PASS 910KΩ ±(1.0%+0.1Ω) -0.01% 0.41% 0.13% PASS Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.04% 0.38% 0.25% PASS 75KΩ ±(1.0%+0.1Ω) -0.02% 0.36% 0.12% PASS 910KΩ ±(1.0%+0.1Ω) -0.03% 0.41% 0.14% PASS
  • 7. Item Tol. (mm) Min. (mm) Max. (mm) Mean(mm) Result Dimension L 3.10±0.10 3.04 3.12 3.09 PASS Dimension W 2.60±0.20 2.59 2.69 2.61 PASS Dimension H 0.55±0.10 0.51 0.61 0.54 PASS Dimension A 0.50±0.25 0.45 0.62 0.51 PASS Dimension B 0.50±0.20 0.49 0.59 0.50 PASS 4.7 Item 7: Physical Dimension Ref. Standards: JESD22 Method JB-100 Procedure: Verify physical dimensions to the applicable device detail specification. Note: User(s) and Suppliers Spec. S.S.: 30PCS Result: PASS Electrical test not required. 4.8 Item 8: Resistance to Solvent Ref. Standards: MIL-STD-202 Method 210 Procedure: / Note: Add Aqueous wash chemical –OKEM Clean or equivalent. Do not use banned solvents. S.S.: 5PCS Results: PASS 4.9 Item 9: Mechanical Shocked Ref. Standards: MIL-STD-202 Method 213 Procedure: Method 213. Condition C Half sine. 100g, duration 6ms, velocity 12.3 ft./s100Hz S.S.: 30PCS Results: PASS NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page4,Pages 10
  • 8. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.06% 0.42% 0.19% PASS 75KΩ ±(1.0%+0.1Ω) -0.03% 0.39% 0.10% PASS 910KΩ ±(1.0%+0.1Ω) -0.01% 0.35% 0.15% PASS Type Tol. (%) R value Spec. Result NQ07 ±1 9.1Ω Marking no smear PASS 75KΩ Marking no smear PASS 910KΩ Marking no smear PASS
  • 9. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.05Ω) -0.03% 0.39% 0.12% PASS 75KΩ ±(1.0%+0.05Ω) -0.01% 0.40% 0.15% PASS 910KΩ ±(1.0%+0.05Ω) -0.02% 0.34% 0.11% PASS 4.10 Item 10: Vibration Ref. Standards: MIL-STD-202 Method 204 Procedure:5g’s for 20 mins.,12 cycle each 3 orientations. Note: Use 8 “X5” PCB,031 “thick 7 secure points on one long side and 2 secure points at corners of opposite sides .Parts mounted within 2” from any secure points. Test from 10-2000Hz. S.S.: 30PCS Results: PASS 4.11 Item 11: Resistance to Soldering Heat Ref. Standards: MIL-STD-202 Method 210 Procedure: Condition B No per-heat of samples. Note: Single Wave Solder-Procedure 2 S.S.: 30PCS Results: PASS 4.12 Item: ESD Ref. Standards: AEC-Q200-002 Procedure: NQ07:4KV S.S.: 15PCS Results: PASS NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page5,Pages 10
  • 10. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.05% 0.46% 0.20% PASS 75KΩ ±(1.0%+0.1Ω) -0.01% 0.37% 0.14% PASS 910KΩ ±(1.0%+0.1Ω) -0.07% 0.44% 0.11% PASS Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.1Ω) -0.06% 0.37% 0.17% PASS 75KΩ ±(1.0%+0.1Ω) -0.02% 0.32% 0.10% PASS 910KΩ ±(1.0%+0.1Ω) -0.03% 0.41% 0.19% PASS
  • 11. Type Tol.(%) R value Min.(%) Max.(%) Avg.(%) Std (%) Result NQ07 ±1 9.1Ω -0.08% 0.14% 0.027% 0.05% PASS 75KΩ -0.10% 0.11% 0.025% 0.05% PASS 910KΩ -0.05% 0.15% 0.032% 0.06% PASS 4.13 Item 13: Solderability Ref. Standards: J-STD-002 Procedure: For SMD resistors. Electrical test not required. Magnification 50X. Conditions: a) Method B 4hrs at 155℃ dry heat, the dip in bath with 245℃,5s. b) N/A c) Method D: at 260℃, 60s. S.S.: Each condition 15 PCS Results: PASS 4.14 Item 14: Electrical Characterization (Resistance) Ref. Standards: IEC 60115-1 4.5 Procedure: Parametrically test per lot and sample size, requirements, summary to show Min, Max, Mean and Standard deviation at room as well as Min and Max operating temperatures 15℃~35℃. S.S.: 30 PCS Results: PASS 4.15 Item 15: Flammability Ref. Standards: UL-94 Procedure: V-1 is acceptable. Electrical test not required. S.S.: 30PCS Results: PASS 4.16 Item 16: Board Flex Ref. Standards: AEC Q200-005 Procedure: 60 sec minimum holding time. AEC standard: 2/90mm 60s, actual: 3/90mm 60s S.S.: 30PCS Results: PASS NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page6,Pages 10
  • 12. Type Tol. (%) R value Spec. Result NQ07 ±1 9.1Ω / PASS 75KΩ / PASS 910KΩ / PASS Type Tol. (%) R value Spec. Result NQ07 ±1 9.1Ω ≧95% Coverage PASS 75KΩ ≧95% Coverage PASS 910KΩ ≧95% Coverage PASS Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(1.0%+0.05Ω) -0.04% 0.38% 0.12% PASS 75KΩ ±(1.0%+0.05Ω) -0.01% 0.35% 0.11% PASS 910KΩ ±(1.0%+0.05Ω) -0.03% 0.40% 0.17% PASS
  • 13. Type Tol. (%) R value Spec. Result NQ07 ±1 9.1Ω No flame PASS 75KΩ No flame PASS 910KΩ No flame PASS 4.17 Item 17: Terminal strength (SMD) Ref. Standards: AEC Q200-006 Procedure: Force of 1.8kg for 60 seconds. S.S.: 30PCS Results: PASS 4.18 Item 18: Flame Retardance Ref. Standards: AEC-Q200-001 Procedure: Only requested, when voltage/power will increase the surface temp to 350℃.Apply voltage from 9V to 32V. No flame; No explosion. S.S.: 30PCS Results: PASS 4.19 Item: Sulfuration test Ref. Standards: / Procedure: 500hrs.Soaked in industrial oil with sulfur substance 3.5% contained 105℃±3℃. S.S.:30PCS Results: PASS NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page7,Pages 10
  • 14. Type Tol. (%) R value Spec. Min Max Mean Result NQ07 ±1 9.1Ω ±(5.0%+0.1Ω) -0.03% 0.38% 0.21% PASS 75KΩ ±(5.0%+0.1Ω) -0.02% 0.32% 0.13% PASS 910KΩ ±(5.0%+0.1Ω) -0.05% 0.31% 0.16% PASS Type Tol. (%) R value Spec. Result NQ07 ±1 9.1Ω Not broken PASS 75KΩ Not broken PASS 910KΩ Not broken PASS
  • 15. Appendix A: Table of Tests and Methods reproduced from AEC-Q200-Rev-D-June 1, 2010 NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page8,Pages 10
  • 16. NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page9,Pages 10
  • 17. Appendix B: Table of Qualification Sample Size Requirements from AEC-Q200-Rev-D-June 1, 2010 NQ07 Series AEC-Q200 REV D June 1, 2010 Qualified 29th March,2017 Page10,Pages 10