Uniohm resistors datasheet AEC-Q200 Version Chip Resistors NQ03 Series, Environmental Test Summary of AEC-Q200

1. Environmental Test Summary
(AEC-Q200)
Product Name: AEC-Q200 Version Chip Resistors
Part Name : NQ10 Series
Approved: William Zhao
Checked : Liu Aiping
Prepared : Cai WenLin
File NO. : T-2017-03-1
Edition : 1
Date
Page
: 2017.03.29
: 10
厚声国际贸易（昆山）有限公司
UNIROYAL ELECTRONICS GLOBAL CO., LTD.
88 Longteng Road, Economic & Technical Development Zone,
Kunshan City, Jiangsu, China
TEL: +86 755 61880368
Email: able.lee@allchips.com
2017

2. No.* S.S.** Test Item
NQ10 ±1%
Result
Low Middle High
1 30 Pre-and Post-Stress Electrical Test 22Ω 100KΩ 1.5MΩ PASS
3 77 High Temperature Exposure(Storage) 22Ω 100KΩ 1.5MΩ PASS
4 77 Temperature Cycling 22Ω 100KΩ 1.5MΩ PASS
7 77 Biased Humidity 22Ω 100KΩ 1.5MΩ PASS
8 77 Operational life 22Ω 100KΩ 1.5MΩ PASS
9 77 External Visual 22Ω 100KΩ 1.5MΩ PASS
10 30 Physical Dimension 22Ω 100KΩ 1.5MΩ PASS
11 30 Terminal Strength(Leaded) 22Ω 100KΩ 1.5MΩ NA
12 5 Resistance to Solvent 22Ω 100KΩ 1.5MΩ PASS
13 30 Mechanical Shock 22Ω 100KΩ 1.5MΩ PASS
14 30 Vibration 22Ω 100KΩ 1.5MΩ PASS
15 30 Resistance to Soldering Heat 22Ω 100KΩ 1.5MΩ PASS
17 15 ESD 22Ω 100KΩ 1.5MΩ PASS
18 15 Solderability 22Ω 100KΩ 1.5MΩ PASS
19 30 Electrical Characterization 22Ω 100KΩ 1.5MΩ PASS
20 30 Flammability 22Ω 100KΩ 1.5MΩ PASS
21 30 Board Flex 22Ω 100KΩ 1.5MΩ PASS
22 30 Terminal Strength(SMD) 22Ω 100KΩ 1.5MΩ PASS
24 30 Flame Retardance 22Ω 100KΩ 1.5MΩ PASS
# 30 Sulfuration test 22Ω 100KΩ 1.5MΩ PASS
AEC-Q200 Environmental Test Summary
1
2
3
DESCRIPTION
 This is the reliability test report of AEC-Q200 version chip resistors – NQ10 ±1% series resistor
manufactured by UNIOHM.
 Test items follow the standard of AEC-Q200 REV D June 1, 2010.
RELIABILITY TEST RESULT SUMMARY
REMARK:
*: The No. of test items is based on the AEC-Q200 REV D June 1, 2010 TABLE 7, more details in Appendix A.
**: S.S. means sample size. It is based on the AEC-Q200 REV D June 1, 2010 TABLE 1, more details in Appendix B.
#: Added test item: Sulfuration test
CONCLUSION
Based on tests result, NQ10 ±1% Series products meet AEC-Q200 REV D June 1, 2010, and meet
Specification Standard.
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page1,Pages 10

3. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.06% 0.28% 0.16% PASS
100KΩ ±（1.0%+0.1Ω） -0.02% 0.31% 0.11% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.06% 0.28% 0.12% PASS
4 Test Results
4.1 Item 1: Pre-and Post-Stress Electrical Test
Ref. Standards: User Spec.
Procedure:
Permanent resistance change after the application of a potential of 2.5 times RCWV or Max. Overload
Voltage whichever less for 5 seconds.
S.S.: 30PCS
Results: PASS
4.2 Item 2: High Temperature Exposure (Storage)
Ref. Standards: MIL-STD-202 Method 108
Procedure:
Condition D（1000hrs.）Steady State T=155℃.
Unpowered Measurement at 24±2 hours after test conclusion.
S.S.: 77PCS
Results: PASS
4.3 Item 3: Temperature Cycling
Ref. Standards: JESD22 Method JA-104
Procedure:
1000 Cycles (-55℃ to +155 ℃) Measurement at 24±2 hours after test. conclusion 30min maximum dwell
time at each temperature extreme. 1min. maximum transition time.
S.S.: 77PCS
Results: PASS
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page2,Pages 10

4. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） 0.05% 0.07% 0.03% PASS
100KΩ ±（1.0%+0.1Ω） 0.00% 0.03% 0.01% PASS
1.5MΩ ±（1.0%+0.1Ω） 0.03% 0.12% 0.06% PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.02% 0.35% 0.20% PASS
100KΩ ±（1.0%+0.1Ω） -0.01% 0.32% 0.14% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.03% 0.30% 0.17% PASS

5. Type Tol. (%) R value Result
NQ10 ±1
22Ω PASS
100KΩ PASS
1.5MΩ PASS
4.4 Item 4: Biased Humidity
Ref. Standards: MIL-STD-202 Method 103
Procedure:1000 hours 85℃/85%RH.
Note:
Specified condition:10% of operating power.
Measurement at 24±2 hours after test conclusion.
S.S.: 77PCS
Results: PASS
4.5 Item 5: Operational life
Ref. Standards: MIL-STD-202 Method 108
Procedure:
Condition D（1000hrs.）Steady State TA=125℃ at 36% of rated power.
Measurement at 24±2 hours after test conclusion.
S.S.: 77PCS
Results: PASS
4.6 Item 6: External Visual
Ref. Standards: MIL-STD-883 Method 2009
Procedure:
Electrical test not required.
Inspect device construction, marking and workmanship
S.S.: 77PCS
Results: PASS
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page3,Pages 10

6. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.02% 0.23% 0.13% PASS
100KΩ ±（1.0%+0.1Ω） -0.05% 0.19% 0.11% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.06% 0.20% 0.14% PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.08% 0.22% 0.14% PASS
100KΩ ±（1.0%+0.1Ω） -0.03% 0.17% 0.11% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.02% 0.23% 0.19% PASS

7. Item Tol. (mm) Min. (mm) Max. (mm) Mean(mm) Result
Dimension L 5.00±0.10 4.92 5.06 5.01 PASS
Dimension W 2.50±0.20 2.47 2.62 2.50 PASS
Dimension H 0.55±0.10 0.52 0.59 0.54 PASS
Dimension A 0.60±0.25 0.54 0.70 0.61 PASS
Dimension B 0.50±0.20 0.45 0.62 0.49 PASS
4.7 Item 7: Physical Dimension
Ref. Standards: JESD22 Method JB-100
Procedure: Verify physical dimensions to the applicable device detail specification.
Note:
User(s) and Suppliers Spec.
S.S.: 30PCS
Result: PASS
Electrical test not required.
4.8 Item 8: Resistance to Solvent
Ref. Standards: MIL-STD-202 Method 210
Procedure: /
Note: Add Aqueous wash chemical –OKEM Clean or equivalent. Do not use banned solvents.
S.S.: 5PCS
Results: PASS
4.9 Item 9: Mechanical Shocked
Ref. Standards: MIL-STD-202 Method 213
Procedure: Method 213. Condition C Half sine. 100g, duration 6ms, velocity 12.3 ft./s100Hz
S.S.: 30PCS
Results: PASS
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page4,Pages 10

8. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.02% 0.35% 0.14% PASS
100KΩ ±（1.0%+0.1Ω） -0.01% 0.22% 0.08% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.05% 0.31% 0.12% PASS
Type Tol. (%) R value Spec. Result
NQ10 ±1
22Ω Marking no smear PASS
100KΩ Marking no smear PASS
1.5MΩ Marking no smear PASS

9. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.05Ω） -0.04% 0.32% 0.12% PASS
100KΩ ±（1.0%+0.05Ω） -0.01% 0.27% 0.10% PASS
1.5MΩ ±（1.0%+0.05Ω） -0.08% 0.30% 0.17% PASS
4.10 Item 10: Vibration
Ref. Standards: MIL-STD-202 Method 204
Procedure:5g’s for 20 mins.,12 cycle each 3 orientations.
Note:
Use 8 “X5” PCB，031 “thick 7 secure points on one long side and 2 secure points at corners of opposite
sides .Parts mounted within 2” from any secure points. Test from 10-2000Hz.
S.S.: 30PCS
Results: PASS
4.11 Item 11: Resistance to Soldering Heat
Ref. Standards: MIL-STD-202 Method 210
Procedure: Condition B No per-heat of samples.
Note: Single Wave Solder-Procedure 2
S.S.: 30PCS
Results: PASS
4.12 Item: ESD
Ref. Standards: AEC-Q200-002
Procedure: NQ10:4KV
S.S.: 15PCS
Results: PASS
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page5,Pages 10

10. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.02% 0.33% 0.17% PASS
100KΩ ±（1.0%+0.1Ω） -0.01% 0.34% 0.13% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.04% 0.31% 0.14% PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±（1.0%+0.1Ω） -0.02% 0.34% 0.13% PASS
100KΩ ±（1.0%+0.1Ω） -0.01% 0.32% 0.17% PASS
1.5MΩ ±（1.0%+0.1Ω） -0.03% 0.35% 0.11% PASS

11. Type Tol.(%) R value Min.(%) Max.(%) Avg.(%) Std (%) Result
NQ10 ±1
22Ω -0.15% 0.18% 0.022% 0.07% PASS
100KΩ -0.12% 0.15% 0.023% 0.06% PASS
1.5MΩ -0.05% 0.10% 0.012% 0.05% PASS
4.13 Item 13: Solderability
Ref. Standards: J-STD-002
Procedure:
For SMD resistors. Electrical test not required. Magnification 50X. Conditions:
a) Method B 4hrs at 155℃ dry heat, the dip in bath with 245℃,5s.
b) N/A
c) Method D: at 260℃, 60s.
S.S.: Each condition 15 PCS
Results: PASS
4.14 Item 14: Electrical Characterization (Resistance)
Ref. Standards: IEC 60115-1 4.5
Procedure:
Parametrically test per lot and sample size, requirements, summary to show Min, Max, Mean and Standard
deviation at room as well as Min and Max operating temperatures 15℃~35℃.
S.S.: 30 PCS
Results: PASS
4.15 Item 15: Flammability
Ref. Standards: UL-94
Procedure: V-1 is acceptable. Electrical test not required.
S.S.: 30PCS
Results: PASS
4.16 Item 16: Board Flex
Ref. Standards: AEC Q200-005
Procedure: 60 sec minimum holding time. AEC standard: 2/90mm 60s, actual: 3/90mm 60s
S.S.: 30PCS
Results: PASS
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page6,Pages 10

12. Type Tol. (%) R value Spec. Result
NQ10 ±1
22Ω / PASS
100KΩ / PASS
1.5MΩ / PASS
Type Tol. (%) R value Spec. Result
NQ10 ±1
22Ω ≧95% Coverage PASS
100KΩ ≧95% Coverage PASS
1.5MΩ ≧95% Coverage PASS
Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±(1.0%+0.05Ω) -0.07% 0.25% 0.17% PASS
100KΩ ±(1.0%+0.05Ω) -0.03% 0.34% 0.15% PASS
1.5MΩ ±(1.0%+0.05Ω) -0.07% 0.32% 0.20% PASS

13. Type Tol. (%) R value Spec. Result
NQ10 ±1
22Ω No flame PASS
100KΩ No flame PASS
1.5MΩ No flame PASS
4.17 Item 17: Terminal strength (SMD)
Ref. Standards: AEC Q200-006
Procedure: Force of 1.8kg for 60 seconds.
S.S.: 30PCS
Results: PASS
4.18 Item 18: Flame Retardance
Ref. Standards: AEC-Q200-001
Procedure:
Only requested, when voltage/power will increase the surface temp to 350℃.Apply voltage from 9V to 32V.
No flame; No explosion.
S.S.: 30PCS
Results: PASS
4.19 Item: Sulfuration test
Ref. Standards: /
Procedure: 500hrs.Soaked in industrial oil with sulfur substance 3.5% contained 105℃±3℃.
S.S.:30PCS
Results: PASS
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page7,Pages 10

14. Type Tol. (%) R value Spec. Min Max Mean Result
NQ10 ±1
22Ω ±(5.0%+0.1Ω) -0.04% 0.34% 0.16% PASS
100KΩ ±(5.0%+0.1Ω) -0.03% 0.32% 0.13% PASS
1.5MΩ ±(5.0%+0.1Ω) -0.01% 0.29% 0.11% PASS
Type Tol. (%) R value Spec. Result
NQ10 ±1
22Ω Not broken PASS
100KΩ Not broken PASS
1.5MΩ Not broken PASS

15. Appendix A: Table of Tests and Methods reproduced from AEC-Q200-Rev-D-June 1, 2010
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page8,Pages 10

16. NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page9,Pages 10

17. Appendix B: Table of Qualification Sample Size Requirements from AEC-Q200-Rev-D-June 1, 2010
NQ10 Series AEC-Q200 REV D June 1, 2010 Qualified
29th March，2017
Page10,Pages 10