ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

1. Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument
Introduction
ADX-2700 θ-θ Powder X-ray Diffraction Instrumentis multi-function diffractometer with exceptional analysis speed,
reliabilityand reproducibility.The ADX2700 is a diffraction instrumentdesigned for the challenges ofmodern
materials research.ADX2700 can analyze powders,liquids,thin films,nanomaterials and manyother different
materials.The ADX2700 can be used for many different applications:Academic,Pharmaceuticals,Chemical &
Petrochemical,Material Research,Thin Film Metrology, Nano technology, Food & Cosmetics,Forensics,Mining &
Minerals,Metals, Plastics & Polymers,etc.
Features
Computed tomography,High-resolution X-ray diffraction, High throughputscreening,In-plane diffraction,Crystallite
size and micro-strain analysis,Micro-diffraction,Non-ambientdiffraction,Pair distribution function analysis,Phase
identification,Phase quantification,Reflectivity analysis,Residual stress analysis,
Crystallography,Texture analysis,Transmission,Thin film analysis.
ADX-DWZ Combination ofEulerian cradle for stress and texture investigations,Thin film and Quantity Analysis
attachmentwith control and analysis software with alignment-free feature. ADCX sample changer is compactand
rugged.Integrated spinning improves particle statistics in polycrystalline sample measurements.
Accessories

2. AHTK 1000 high temperature attachment
Automated variable temperature stage for X-ray diffraction measurements ofmaterials atelevated temperatures
(room temperature-1200°C).The stage maybe operated in vacuum. The sample is heated radiantlyfor reduced heat
gradients within the sample.Automated z translation within the stage assures precise sample positioning even in the
presence ofthermal expansion ofthe sample.
ALTK-450 Variable temperature attachment
Automated variable temperature stage for X-ray diffraction measurements ofcrystal structure (-193°C-450°C).The
stage can be operated under liquid nitrogen cooling conditions.
Software
General diffraction data processing:automatic peak search,manual peak search,integral intensity,separation of
Kα1,α2, background remove,pattern smoothing and magnifying,mulriple plot,three-dimensional plotand simulation
of XRD pattern.
 Qualitative Analysis:The data processing software has the search and match function on the base of whole
profile and diffraction angle.The whole profile matching procedure employs the designed mode to do the
qualitative analysis by reducing the search range from major,minor,to micro phase withoutindicating the
diffraction angle.The diffraction angle matching procedure is based on the peaks position and intensityand
usuallyused for the qualitative analysis ofthe data with large angle error.
 Quantitative Analysis: After the phase composition is determined,the contentof each phase could be
calculated with the help of RIR or/and the Rietveld refinement(Quantitative Analysis withoutcriterion)
 Plot and Export: The data processing software is operated within the Windows interface.The preparing
exported pattern could be labeled,zoomed in, zoomed out and also copied and pasted.
 Phase identification,structure analysis,Thin film analysis,stress investigation,Texture analysis are all
available

3. Parts and Specifications