SPICE MODEL of 2SK4122LS (Professional+BDP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: MOSFET (Professional Model)
PART NUMBER: 2SK4122LS
MANUFACTURER: SANYO
REMARK: Body Diode (Professional Model)
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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2. MOSFET MODEL
PSpice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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3. Transconductance Characteristic
Circuit Simulation Result
Comparison table
gfs (s)
Id(A) Error (%)
Measurement Simulation
1 3.350 3.463 3.37
2 4.700 4.825 2.66
5 7.250 7.421 2.36
10 10.000 10.181 1.81
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4. Vgs-Id Characteristic
Circuit Simulation result
25A
20A
15A
10A
5A
0A
0V 3V 6V 9V 12V 15V
I(V3)
V_V1
Evaluation circuit
V3
0Vdc
U1 V2
2SK4122LS
20
V1
0Vdc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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5. Comparison Graph
Circuit Simulation Result
Simulation Result
VGS(V)
ID(A) Error (%)
Measurement Simulation
1 5.600 5.657 1.02
2 5.850 5.899 0.84
5 6.400 6.388 -0.19
10 7.000 6.954 -0.66
20 7.850 7.785 -0.83
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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6. Rds(on) Characteristic
Circuit Simulation result
8.0A
6.0A
4.0A
2.0A
0A
0V 0.51V 1.02V 1.54V 2.05V 2.56V
I(V3)
V_VDS
Evaluation circuit
V3
0Vdc
VDS
U1
2SK4122LS 0Vdc
V1
10
0
Simulation Result
ID = 8A, VGS = 10V Measurement Simulation Error (%)
R DS (on)  0.320 0.319 -0.22
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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7. Gate Charge Characteristic
Circuit Simulation result
10V
8V
6V
4V
2V
0V
0 10n 20n 30n 40n
V(W1:3)
Time*1mA
Evaluation circuit
I2
U1 D2
2SK4122LS Dbreak 15.5
PER = 1000u W1
PW = 600u +
TF = 5n VDD
TR = 5n -
TD = 0 I1 W
I2 = 1m IOFF = 1mA 200
I1 = 0 ION = 0uA
0
Simulation Result
VDD=200V, ID=15.5A
Measurement Simulation Error (%)
VGS=10V
Qgs nC 6.700 6.759 0.88
Qgd nC 24.200 24.355 0.64
Qg nC 38.600 38.234 -0.95
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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8. Capacitance Characteristic
Measurement
Simulation
Simulation Result
Cbd (pF)
VDS (V) Error (%)
Measurement Simulation
5 410.00 411.00 0.24
10 290.00 291.00 0.34
20 205.00 206.00 0.49
30 170.00 169.00 -0.59
40 143.00 144.00 0.70
50 132.00 131.50 -0.38
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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9. Switching Time Characteristic
Circuit Simulation result
12V 240V
1 2
10V 200V
8V 160V
6V 120V
4V 80V
2V 40V
>>
0V 0V
0.6us 0.8us 1.2us 1.6us
1 V(U1:G) 2 V(U1:D)
Time
Evaluation circuit
L2 RL
50nH 25
R1 L1 U1
2SK4122LS
VDD
V1 = 0 30nH 202.5Vdc
V2 = 20 V2 50
TD = 1u
TR = 5n R2
TF = 5n 50
PW = 10u
PER = 20u
0
Simulation Result
ID=8A, VDD=200V
Measurement Simulation Error(%)
VGS=0/10V
td(on) ns 24.000 24.083 0.35
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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10. Output Characteristic
Circuit Simulation result
40A
35A
15 10
30A 55
25A
8
20A
15A
10A
5A
6
0A
VGS=5V
0V 5V 10V 15V 20V 25V 30V
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
U1 V2
2SK4122LS
V1 10
0
0
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11. Forward Current Characteristic
Circuit Simulation Result
100A
10A
1.0A
100mA
10mA
0V 0.4V 0.8V 1.2V 1.6V
I(Vsense)
V_VSD
Evaluation Circuit
Vsense
0Vdc
VSD U1
2SK4122LS
0
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12. Comparison Graph
Circuit Simulation Result
Simulation Result
VSD(V)
IDR(A) %Error
Measurement Simulation
0.01 0.565 0.565 0.02
0.02 0.585 0.585 -0.03
0.05 0.610 0.610 0.05
0.10 0.630 0.630 0.03
0.20 0.650 0.651 0.09
0.50 0.680 0.680 -0.07
1.00 0.705 0.704 -0.09
2.00 0.735 0.735 -0.04
5.00 0.790 0.792 0.23
10.00 0.860 0.858 -0.20
20.00 0.960 0.960 0.04
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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13. Reverse Recovery Characteristics
Circuit Simulation Result
400mA
300mA
200mA
100mA
-0mA
-100mA
-200mA
-300mA
-400mA
10us 12us 14us 16us 18us 20us 22us 24us 26us 28us
I(R1)
Time
Evaluation Circuit
R1
50
V1 = -9.45v V1 U1
V2 = 10.65v D2SK4122LS_P
TD = 0us
TR = 10ns
TF = 10ns
PW = 20us
PER = 50us
0
Compare Measurement vs. Simulation
Measurement Simulation Error (%)
trj ns 880.000 881.323 0.15
trb ns 900.000 900.302 0.03
trr ns 1780.000 1781.625 0.09
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14. Reverse Recovery Characteristic Reference
Measurement
Trj= 880 (ns)
Trb= 900 (ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Example
Relation between trj and trb
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