This document summarizes Chi-Yu Jen's work experience. It outlines roles at TSMC from 2003-2007 as a Product Engineer and Integrated Engineer. It also discusses research conducted at ASU ALT Lab from 2009-2010 on dye sensitized solar cells and an internship at Amkor from 2009 to present involving thermal testing. Coursework covering topics like photovoltaics, fuel cells, and reliability is listed. The document concludes by noting skills that could contribute to a new job assignment, such as data acquisition, analysis, and failure analysis abilities.
LED, BGA, and QFN assembly and inspection case studiesBill Cardoso
In this tutorial we cover the manufacturing of the most challenging surface mount parts to assemble and inspect today: LEDs, BGAs, and QFNs. The tutorial focuses on the pitfalls of manufacturing and inspecting PCBs with these devices. Presentations will provide content to solve many of the technical challenges encountered by luminaire integrators and contract manufacturers. This tutorial is targeted at manufacturing, process, and quality personnel responsible for designing, implementing and/or controlling the surface mount device application and inspection process. Those personnel responsible for training operators and technicians to perform assembly inspection or control the manufacturing process would also benefit from this tutorial.
We will use a library of assemblies inspected at Creative Electron’s Advanced Solutions Lab to provide attendees with real life examples of assembly issues. Attendees are welcome to send their own assemblies to Creative Electron prior to the webtorial so that the material can be used during training.
Topics Covered:
How LED material handling and storage impact assembly performance
LED x-ray inspection: How voids cost you money
Case study: How lack of quality killed a successful LED company
Process design for BGA and QFN assembly and rework
BGA and QFN x-ray inspection: How to see what often goes wrong
X-Ray as a tool for quality process design and control
- All x-ray images taken with TruView X-Ray Inspection systems.
New NDT technology for assessment of concrete defects and faultsDavid Corbett
This presentation describes three different technologies that are used for imaging concrete structures and how they complement each other to provide a complete assessment.
LED, BGA, and QFN assembly and inspection case studiesBill Cardoso
In this tutorial we cover the manufacturing of the most challenging surface mount parts to assemble and inspect today: LEDs, BGAs, and QFNs. The tutorial focuses on the pitfalls of manufacturing and inspecting PCBs with these devices. Presentations will provide content to solve many of the technical challenges encountered by luminaire integrators and contract manufacturers. This tutorial is targeted at manufacturing, process, and quality personnel responsible for designing, implementing and/or controlling the surface mount device application and inspection process. Those personnel responsible for training operators and technicians to perform assembly inspection or control the manufacturing process would also benefit from this tutorial.
We will use a library of assemblies inspected at Creative Electron’s Advanced Solutions Lab to provide attendees with real life examples of assembly issues. Attendees are welcome to send their own assemblies to Creative Electron prior to the webtorial so that the material can be used during training.
Topics Covered:
How LED material handling and storage impact assembly performance
LED x-ray inspection: How voids cost you money
Case study: How lack of quality killed a successful LED company
Process design for BGA and QFN assembly and rework
BGA and QFN x-ray inspection: How to see what often goes wrong
X-Ray as a tool for quality process design and control
- All x-ray images taken with TruView X-Ray Inspection systems.
New NDT technology for assessment of concrete defects and faultsDavid Corbett
This presentation describes three different technologies that are used for imaging concrete structures and how they complement each other to provide a complete assessment.
Cybersecurity: le aziende italiane possono dirsi al sicuro?InfoCert S.p.A.
Le aziende italiane possono davvero dirsi al sicuro dai rischi provenienti dalla rete? Ad oggi solo il 20% si è attrezzata per contrastarli mentre la maggioranza è ancora in ritardo.
In this deck from the HPC User Forum at Argonne, Andrew Siegel from Argonne presents: ECP Application Development.
"The Exascale Computing Project is accelerating delivery of a capable exascale computing ecosystem for breakthroughs in scientific discovery, energy assurance, economic competitiveness, and national security. ECP is chartered with accelerating delivery of a capable exascale computing ecosystem to provide breakthrough modeling and simulation solutions to address the most critical challenges in scientific discovery, energy assurance, economic competitiveness, and national security. This role goes far beyond the limited scope of a physical computing system. ECP’s work encompasses the development of an entire exascale ecosystem: applications, system software, hardware technologies and architectures, along with critical workforce development."
Watch the video: https://wp.me/p3RLHQ-kSL
Learn more: https://www.exascaleproject.org
and
http://hpcuserforum.com
Sign up for our insideHPC Newsletter: http://insidehpc.com/newsletter
Challenges in Assessing Single Event Upset Impact on Processor SystemsWojciech Koszek
Abstract—This paper presents a test methodology developed at Xilinx for real-time soft-error rate testing as well as the software framework in which Device-Under-Test (DUT) and controlling computer are both synchronized with the proton beam controls and run experiments automatically in a predictable manner. The method presented has been successfully used for Zynq®-7000 All Programmable SoC testing at the UC Davis Crocker Nuclear Lab. Presented are the issues and challenges encountered during design and implementation of the framework, as well as lessons learned from the in-house experiments and bootstrapping tests performed with Thorium Foil. The method presented has helped Xilinx to deliver high-quality experimental data and to optimize time spent in the testing facility.
Keywords—Error detection, soft error, architectural vulnerability, statistical error, confidence level, beam facility control
Cybersecurity: le aziende italiane possono dirsi al sicuro?InfoCert S.p.A.
Le aziende italiane possono davvero dirsi al sicuro dai rischi provenienti dalla rete? Ad oggi solo il 20% si è attrezzata per contrastarli mentre la maggioranza è ancora in ritardo.
In this deck from the HPC User Forum at Argonne, Andrew Siegel from Argonne presents: ECP Application Development.
"The Exascale Computing Project is accelerating delivery of a capable exascale computing ecosystem for breakthroughs in scientific discovery, energy assurance, economic competitiveness, and national security. ECP is chartered with accelerating delivery of a capable exascale computing ecosystem to provide breakthrough modeling and simulation solutions to address the most critical challenges in scientific discovery, energy assurance, economic competitiveness, and national security. This role goes far beyond the limited scope of a physical computing system. ECP’s work encompasses the development of an entire exascale ecosystem: applications, system software, hardware technologies and architectures, along with critical workforce development."
Watch the video: https://wp.me/p3RLHQ-kSL
Learn more: https://www.exascaleproject.org
and
http://hpcuserforum.com
Sign up for our insideHPC Newsletter: http://insidehpc.com/newsletter
Challenges in Assessing Single Event Upset Impact on Processor SystemsWojciech Koszek
Abstract—This paper presents a test methodology developed at Xilinx for real-time soft-error rate testing as well as the software framework in which Device-Under-Test (DUT) and controlling computer are both synchronized with the proton beam controls and run experiments automatically in a predictable manner. The method presented has been successfully used for Zynq®-7000 All Programmable SoC testing at the UC Davis Crocker Nuclear Lab. Presented are the issues and challenges encountered during design and implementation of the framework, as well as lessons learned from the in-house experiments and bootstrapping tests performed with Thorium Foil. The method presented has helped Xilinx to deliver high-quality experimental data and to optimize time spent in the testing facility.
Keywords—Error detection, soft error, architectural vulnerability, statistical error, confidence level, beam facility control
The Pueblo Chemical Agent-Destruction Pilot Plant (PCAPP) will safely destroy 2,611 tons of mustard agent in mortar rounds and artillery projectiles stored at the U.S. Army Pueblo Chemical Depot (PCD).
Neutralization followed by biotreatment is the technology selected by the Department of Defense to destroy the Pueblo chemical weapons stockpile.
The Program Manager, Assembled Chemical Weapons Alternatives (ACWA), headquartered at Aberdeen Proving Ground, Maryland, is responsible for managing all aspects of the safe and environmentally sound destruction of the chemical weapons stockpiles in Colorado and Kentucky.
The Bechtel Pueblo Team (BPT) is a partnership of Bechtel National, Inc., URS, Parsons, and Battelle Memorial Institute. The BPT functions as the systems contractor selected to design, build, systemize, pilot test, operate, and close the PCAPP.
On July 10th Innovate UK and the KTN held a business innovation day to showcase 30 of the Innovate UK projects that are currently active in the area of Additive Manufacturing. The presentations and pitches made on the day are now available to download. Topic 4 focuses on Inspection Systems.
Current Status of Solar Photovoltaic Technology Platforms, Manufacturing Issu...Tuong Do
Speaker: Dr. Steven S. Hegedus, Institute of Energy Conversion, University of Delaware
In his talk, Dr. Hegedus, a 30-year solar cell research veteran, provides an overview of the existing status of today's solar technology platforms and manufacturing issues, as well as provide viewers with his perspective looking 3 to 5 years into the future. He discusses cadmium telluride (CdTe) and copper indium gallium selenide (CIGS) thin-film technology. He also provides up-to-date results for advanced crystalline silicon (c-Si) high efficiency cell technology concepts such as the amorphous/c-Si heterojunction, all-back-contact cells, selective emitters and laser-fired contacts. Finally, he briefly describes his lab's current work on addressing critical issues in CIGS and c-Si cell technology.
Dr. Hegedus has been a member of the research staff at IEC at the University of Delaware, the world's oldest photovoltaic research laboratory, since 1982. He co-edited the 1st and 2nd editions of the "Handbook of Photovoltaic Science and Engineering" (Wiley 2003, 2011) and is a co-editor of the journal "Progress in Photovoltaics."
Thursday, Sept. 27, 1 p.m. EDT
Source: http://www.photonics.com/Webinar.aspx?WebinarID=24
4. F12 Product Engineer (2003/9-2006/9)
Daily Work
Yield enhancement
Electrical failure analysis HP93000
Physical failure analysis EMMI, Lavis, SEM, FIB
Correlation WAT parameter, Inline data
Design rule check of digital IC.
Project (Texas Instruments)
Compared the leakage current under the same saturation
current level.
Action: Heavy S/D dosage, thinner gate oxide.
4 CHIH-YU JEN
5. F12 Product Engineer (2003/9-2006/9)
HP93000
EFA
EMMI Layout Trace
Cross Team
Discussion
Low Yield PFA
SEM FIB
Correlation
5 CHIH-YU JEN
6. F14 Integrated Engineer (2006/9-2007/11)
Daily Work
Taped out N90 products
Created Testline
Created WAT test program
Analyzed split condition experiment.
Project
Intel : Key WAT parameter < 1 sigma.
MTK : Completed the super hot run schedule (22 days).
6 CHIH-YU JEN
7. F14 Integrated Engineer (2006/9-2007/11)
GDS Wafer Fab out
Create Testline
Tape out Create WAT program
Lot handling
Cross Team
Discussion
Issue
7 CHIH-YU JEN
9. Research – Dye Sensitized Solar Cell
To develop and optimize standard fabrication
procedure (SFP) for cell efficiency enhancement.
Incorporate Multi-Walled Carbon Nanotubes to
improve cell efficiency.
6 cm2 1 cm2 0.25 cm2
9 CHIH-YU JEN
10. Research – Dye Sensitized Solar Cell
Test : Solar simulator + EIS instrument
10 CHIH-YU JEN
11. Efficiency Enhancement
The cell efficiency enhanced over 235%.
4.45%
1.88%
V0.9 V1.0 V1.1 V1.2 V1.3 V1.4 V1.5
11 CHIH-YU JEN
13. Graduate Research Intern
Daily Work
Developed data acquisition programs using Labview.
Measurements using cross-sectioning analysis.
Organized test data and summarized results.
Theta-jc, Theta-ja.
Project
Design and Development of cold plate hardware for
running thermal tests.
Characterization of thermal interface materials on high
power electronic packages.
13 CHIH-YU JEN
17. Courses List
Applied Photovoltaics
2009/Spring Automotive and Stationary FCS
Material Characterization & Device Testing
2009/Summer Power Conditioning
Batteries Portable Electronics
2009/Fall Evaluation Photovoltaic & FCS
Statistical Process Control
IC Packaging
2010/Spring Applied Project
Reliability and Standards
Technical Understanding
C013/N90 Semiconductor Fabrication Process
Automatic Control Theory
17 CHIH-YU JEN
18. Course Work
Applied Photovoltaics
PV module measurement under different testing conditions.
Automotive and Stationary FCS
Proton exchange membrane fuel cell fabrication.
Material characterization & device testing
Resistance measurement using four point probe technology
Evaluation Photovoltaic & FCS
Residential PV system design
Applied Project
Enhance DSSC efficiency using MWCNTs
18 CHIH-YU JEN
20. Contribution to New Job Assignment
Data acquisition system using Labview programming
Research ability
Data Analysis through SPC chart
Physical Failure Analysis
Electrical Failure Analysis
Cross team communication
20 CHIH-YU JEN