The document discusses Waveline metrology systems for measuring surface roughness, contour, and topography. It describes their portable, mobile, and stationary systems that can perform automated and manual measurements in production and metrology labs. The systems provide precise measurement data through tactile and optical probes to evaluate surfaces and dimensions in manufacturing.

1. Waveline – Roughness and Contour Metrology
Mobile and stationary systems for
efficient, automatable measurements
in the metrology lab or in production.

2. 2
Industrial Metrology
Tactile roughness measurement
–– Roughness parameters
–– Core roughness parameters
–– Profile parameters
–– Waviness parameters
–– Motif parameters
–– JIS parameters
–– Topography evaluation
–– Dominant waviness
–– Twist parameters
Tactile contour measurement
–– Angle
–– Radius
–– Distance
–– Parallelism
–– Crowning
–– Gothic arcs
–– Edge geometries
–– Line profile
–– Threads
–– Diameter
Optical surface inspection
–– Crosshatch angle
–– Area of blowholes
–– Radius
–– Laser honing structures
Your partner for
measuring solutions
The Light & Production Division of Jenoptik is a global
specialist in the optimization of manufacturing processes.
Our many years of experience and know-how in the field of
industrial measurement technology and optical inspection,
modern laser-based material processing and highly flexible
robot-based automation enable us to develop tailor-made
manufacturing solutions for our customers in automotive,
aerospace, healthcare and other manufacturing industries.
As an experienced and reliable partner for high-precision,
tactile and non-tactile production metrology, we support
you with our global sales and services network.
Depending on the requirements, our tactile, pneumatic
and optical measuring systems take on a wide range of
tasks for the inspection of surface and form as well as the
determination of dimensions, throughout every phase of
the production process including final inspection or in the
metrology lab. Our systems provide you with precise
measured data within the shortest time frames.
Waveline measuring systems offer you extensive evaluation possibilities for surface measurement. Our product
range consists of mobile surface measuring instruments, stationary measuring systems for manual and automated
roughness, contour, topography or twist measurement, combined systems for roughness and contour measure-
ments, as well as measuring instruments for cylinder bores. We also offer measuring stations tailored to meeting
your specific measuring requirements.
Please scan for detailed
Waveline information
Mobile roughness measurement Stationary roughness & contour measurement Surface inspection

3. 3
Waveline W5
Waveline W5. Portable, reliable
roughness measurement
System features
–– Portable and battery-supplied
–– Compact and light in design
–– Easy, intuitive handling with click wheel
and graphical user interface
–– No calibration necessary
–– Easily exchangeable probes
–– USB port with Windows-compatible data
format and battery charging function
–– Features Bluetooth® technology for wireless
data transfer and printing
–– Battery capacity for up to 800 measurements
–– Storage capacity for 5 measuring programs
with measuring conditions
–– Optional printer P5 with Bluetooth® technology for
documentation of the measurement results on the spot
–– Tolerance evaluation at a glance for immediate
assessment of the measurement results
–– Precise workpiece support, even on small shafts
–– Measurement in all possible measuring positions,
including on perpendicular surfaces and overhead
Model Probe Parameters Printer Traverse probing Profile/material ratio Tolerance Statistics Measuring programs Roughness standard
W5 with skid 23 optional no no yes no 5 optional
Mobile measurement in production
Precise workpiece support
Exchangeable probes
Tolerance evaluation at a glance Waveline W5 with optional printer Waveline P5

4. 4
Waveline W10
Waveline W10. Flexible, precise roughness
measurement without boundaries
System features
–– Mobile and battery-supplied, with cable-free traverse unit
–– Usable as stationary instrument
–– Measurement of all common roughness parameters
according to international standards
–– Modern, intuitive operation via color touchscreen
–– Integrated rest and barrel jack for secure storage and
continuous operational readiness of the traverse unit
–– Immediate verification of the measuring system via the
integrated roughness standard
–– Easy changing of the skid probes
–– Wireless data transfer via Bluetooth® interface
–– Integrated printer for documentation of the
measurement results on the spot
–– Storage capacity for 7 measuring programs
–– Measuring program specifically for verification of the
measuring instrument with predefined nominal values
–– 90° tilting of the probe for measurements in grooves
and incisions or between collars
–– Transverse probing without conversion
–– Measurement of small workpieces in overhead position
–– Contact to the workpiece via precisely polished shafts
–– 3-point support on the traverse unit for secure
positioning when measuring perpendicular surfaces
–– Extendable tripod legs for height adjustment
Height adjustment of traverse unitMeasurement in overhead positionIntegrated roughness standardTransverse probing
Waveline W10
Model Probe Parameters Printer Traverse probing Profile/material ratio Tolerance Statistics Measuring programs Roughness standard
W10 with skid 40 integrated yes yes yes yes 7 integrated

5. 5
Waveline W20
Waveline W20. Mobile roughness, waviness
and profile measurement in production
System features
–– Compact and easy to operate
–– Modern, intuitive operation via color touchscreen
–– Function keys for the 4 basic functions
–– Extensive possibilities for tolerance evaluation
–– Clear display of the measurement results
–– Automatic probe positioning to avoid
unnecessary adjustments
–– Skidless probe system for measurement of all
common roughness, waviness and profile parameters
–– Immediate verification of the measuring instrument
thanks to the integrated roughness standard
–– Easily exchangeable probes for skidless measurements
–– 7 measuring programs plus 1 specifically for
verification of the device
–– Integrated start button on the traverse unit for
one-handed user control
–– High-precision linear guide, variable measurement speed
and software assisted alignment of the reference plane
–– Measurement in all positions, also overhead
–– Motorized lowering of the probe for automatic
positioning of the probe tip on the workpiece
–– Suitable for measurement of sealing surfaces
–– Integrated thermal printer for immediate documentation
–– Easy-Paper-Loading function
Integrated thermal printerContext sensitive operationMobile reference plane measurementMotorized lowering of the probe
Waveline W20
Model Probe Parameters Printer Traverse probing Profile/material ratio Tolerance Statistics Measuring programs Roughness standard
W20 skidless 68 integrated no yes yes yes 7 integrated

6. 6
Evovis Mobile
Name Einheit Unterer Grenzwert Oberer Grenzwert Wert Balkenanzeige
Ra m 0,00 1,50 1,01
Rz m 0,00 5,80 5,95
Rmax m 0,00 14,00 7,50
X [mm]0,40 1,20 2,00 2,80 3,60 4,40
Z [ m]
3
2
1
0
-1
-2
-3
-4
Rauheitsprofil
Auswertebedingungen
λc: 0,80 mm
λf: Aus
Xz linear 1
Taststrecke: 4,80 mm
Geschwindig 0,50 mm/s
Name Einheit Unterer Grenzwert Oberer Grenzwert Wert Balkenanzeige
Ra m 0,00 1,50 1,10
Rz m 0,00 5,80 5,58
Rmax m 0,00 14,00 7,14
X [mm]0,40 1,20 2,00 2,80 3,60 4,40
Z [ m]
3
2
1
0
-1
-2
-3
-4
Rauheitsprofil
Auswertebedingungen
λc: 0,80 mm
λf: Aus
Xz linear 1
Taststrecke: 4,80 mm
Geschwindig 0,50 mm/s
Name Einheit Unterer Grenzwert Oberer Grenzwert Wert Balkenanzeige
Ra m 0,00 1,50 1,08
Rz m 0,00 5,80 5,49
Rmax m 0,00 14,00 7,03
X [mm]0,40 1,20 2,00 2,80 3,60 4,40
Z [ m]
3
2
1
0
-1
-2
-3
-4
Rauheitsprofil
Auswertebedingungen
λc: 0,80 mm
λf: Aus
Xz linear 1
Taststrecke: 4,80 mm
Geschwindig 0,50 mm/s
Bemerkung
Kunde
Jenoptik
Auftrag
A-42BE
Prüfer
Schmidt
Werkstück
W32-AC33
Zeichnungsnummer
Z-12344
Seriennummer
S122
Seite 1/103.11.2014 17:09:47 Hommel-Etamic W10 EVOVIS 1.42.0.0
Evovis Mobile. Simple evaluation and
operation of mobile measuring instruments
System features
–– Clear, user-friendly operating structure
–– Remote operation of W5, W10 and W20
–– All common roughness and waviness parameters
in accordance with ISO 4287 and other ISO and
national standards (ASME, DIN, JIS, Motif, etc.)
–– Continuous further development of the software
in line with new standards/changes in standards
–– Individual test plan creation
–– Integrated help with the parameters
–– Wizard for selecting the measuring conditions
–– Import and subsequent processing of profiles
and parameters
–– Open design of the print log
–– Electronic archiving of reports via PDF printout
–– Optional qs-STAT® data export interface
–– Optional evaluation of dominant waviness
according to VDA 2007
The optional Evovis Mobile software is specifically designed for operation with mobile measuring instruments.
In online mode, the mobile measuring instrument is directly controlled by the software and turns into a stationary
measuring station. In offline mode, the locally measured parameters and profile data saved in the measuring
instrument are transferred and evaluated on the PC.
Multiprint log Measurement and evaluation in online mode
Interactive profile analysis

7. 7
Waveline W800/W900. Modern system concept
for optimum flexibility and precision
Exact fitting measuring systems to
solve your measuring task
–– Two performance classes:
W800 and W900
–– Modular probe systems
–– Modular CNC axes
–– Modular software
modular simple
Owing to a standardized system concept and state-of-the-
art probe systems, the W800/W900 measuring systems
provide optimum flexibility in day-to-day measurement
tasks.
All measuring station configurations are modular in design,
meaning they can easily be expanded at a later date.
Thanks to our W800/W900 systems, you can measure
surfaces in exactly the right way for your individual infra-
structure and your specific measurement requirements.
The measuring systems are easy to use and also offer a
variety of analysis options thanks to the Evovis measure-
ment and evaluation software.
flexible precise
Simple operation, low training
requirements, expandable at any time
–– Simple change of probe systems
and probe arms
–– Automatic recognition of
the probe arms
–– Calibration with a few mouse clicks
or optionally automatically
Flexible for roughness, contour,
topography and twist
–– Compatible with future hardware and
software upgrades
–– Automatable measuring runs
–– Standard interfaces
Probe systems with
highest precision
–– High-resolution probe systems for
smallest tolerances
–– Nanoscan probe system with op-
to-mechanical measuring principle
–– Compensation of the form
deviation of the probe tip
Modular measuring systems

8. 8
Waveline W800
Waveline W800. Modular concept
for 100-percent accuracy of fit
System features
–– Easy-to-use measuring system
–– Modern, high-resolution probe system
–– High measurement quality thanks to stable mechanics
–– Sophisticated probe arm technology
–– Unique traverse unit concept for optimum access
to measuring positions
–– Probe arms with magnetic coupling for fast
and easy probe arm change over
–– All contour probe arms equipped with an RFID chip for
simplified calibration and automatic configuration
–– Quick-change adapter QCA enables quick probe
system changeover with minimum retooling time
and automatic configuration feature
–– Horizontal motion of the probe system occurs via
the traverse unit enclosure, meaning the probe arm
is always in front of the traverse unit
–– Control panel for easy, direct operation of the most
important measuring and control functions as well
as emergency stop function with restart at interrupted
axis position
–– The modular concept enables subsequent expansion
of the measuring system
Model W800R W800C Digiscan W800RC Digiscan W800RC Surfscan W800RC Nanoscan
Traverse unit [mm] 120 or 200 120 or 200 120 or 200 120 or 200 120 or 200
Measuring column [mm] 500 or 800 500 or 800 500 or 800 500 or 800 500 or 800
Granite plate [mm] 700x520 or 1000x520 700x520 or 1000x520 700x520 or 1000x520 700x520 or 1000x520 700x520 or 1000x520
Waveline W812C Digiscan with 500 mm measuring column and 120 mm traverse unit
Quick-change adapter QCA
Probe arms with magnetic coupling
Optimal accessibility of measuring positions

9. 9
Waveline W900
Model W900R W900C Digiscan W900RC Digiscan W900RC Surfscan W900RC Nanoscan
Traverse unit [mm] 120 or 200 120 or 200 120 or 200 120 or 200 120 or 200
Measuring column [mm] 500 or 800 500 or 800 500 or 800 500 or 800 500 or 800
Granite plate [mm] 700x520 or 1000x520 700x520 or 1000x520 700x520 or 1000x520 700x520 or 1000x520 700x520 or 1000x520
Waveline W900. Fast measuring
axes for high-end performance
System features
–– Fast measurement technology
–– Highly flexible, dynamic measurement
–– Excellent measuring accuracy in combination
with Nanoscan probe system
–– Dual operation of two probe systems; a roughness
probe system can also be installed on the front of the
traverse unit; also suitable for optional rotary module
–– Optional motorized tilt unit for precise adjustment of
the tilt angle and automatic alignment of the probe to
the workpiece level
–– Extensive options for automated, CNC-controlled
measurement runs
–– Measuring Z-column with linear scale at a resolution of
0.1 μm for measurement of vertical distances outside
the Z measuring range of the probe; requires probe arm
with double probe tip
–– Additional motorized Y-axis or X-Y-axis combination for
automatic zenith search, topography measurement and
workpiece positioning
–– Optional rotational axis for roughness measurement
on cylindrical workpieces in circumferential and
axial direction
Waveline W920RC with 500 mm measuring column and 200 mm traverse unit
Dual operation of two probe systems
Motorized tilt unit
Additional measuring and positioning axes

10. 10
Probe systems with quick-change adapter QCA.
For optimum configuration of your measuring system
Probe systems with quick-change adapter QCA allow quick and simple system changeovers to accommodate new
measurement tasks and thus guarantee reproducible measurement results.
Surfscan probe system with WCN probe arms: roughness and contour measurement rolled into one
–– Roughness measurement in the measuring range of
8 mm with a resolution of 3 nm
–– Probe arms with magnetic coupling and
electronic detection
–– Optional top/bottom measurement
–– Ultra-precise opto-mechanical probe system
–– Wide measuring range with extremely high resolution
–– Excellent roughness and contour measuring accuracy
in conjunction with W900
Digiscan probe system with TD probe arms: contour measurement
TKU400 probe system with WCN probe arms: roughness measurement
–– Universal roughness probe system
–– Large measuring range
–– Suitable for length and transverse measurements
–– Easily exchangeable probe arms
–– Digital measuring system with high resolution
–– Optional top/bottom measurement
–– Probe arms with magnetic coupling and
electronic detection
–– Extensive range of probe arm solutions
Probe Measuring range Resolution
Probe system TKU400 Digiscan Surfscan Nanoscan TKU400 Digiscan Surfscan Nanoscan
Standard length ±400 µm 60 mm 8 mm 24 mm 1 nm 10 nm 3 nm 0.3 nm
2-fold length ±800 µm _ 16 mm 48 mm 2 nm _ 6 nm 0.6 nm
Nanoscan probe system with WCN probe arms: roughness and contour measurement rolled into one
–– All probe systems equipped with QCA interfaces
–– Automatic setup after probe changeover
–– Probe changeover without tools
–– Precise, repeatable mechanical position
–– Hot-plug-capable
–– Future-proof
Probe systems for Waveline W800/W900

11. 11
Evovis
Evovis. Evaluation software for roughness and
contour measurement with W800/W900
Evovis, the measurement and evaluation software for roughness and contour measurement, offers a standardized
user interface with easy-to-understand control logic and extensive support functions for designing individual
measurement applications. Its applications range from simple measurements of a single characteristic to fully
automated measurement applications within the Industry 4.0 environment.
System features
–– Measuring station control with live display
–– Automatic system configuration when changing
the probe system or probe arm
–– Individual design of test plans & print forms
–– Extensive statistical functions
–– Interactive analysis and evaluation functions
–– All globally standardized surface parameters
for primary, roughness and waviness profiles
–– Professional contour evaluation with evaluation of
geometric dimensions, tolerance of profiles and
extensive functions to evaluate profile form deviations
–– Simple definition of automated measuring and
evaluation processes
Options
qs-STAT® (Q-DAS ASCII transfer format)
AQDEF-certified statistics export interface.
CNC Professional
Programming of complex, automated measuring processes:
Axis controllers, electronic workpiece identification, simpli-
fied user interface and automated data export.
Dominant waviness
Calculation of dominant waviness according to VDA 2007.
TwistLive®
Twist evaluation in accordance with the Daimler standard,
with additional quick twist test and live display.
Other company-specific surface parameters are available on request.
Measuring station control Calibration assistant
Profile analysis of surface roughness Contour evaluation

12. 12
Waveline POU & Waveslide
POU (Point-of-Use) measuring devices are used for roughness measurement on large workpieces and come
with a workpiece-specific design. They are ideal for manual SPC control of roughness features in all stages of
the production process and deliver safe and repeatable positioning of the measuring devices.
POU und Waveslide. Manual and semi-
automatic measuring devices and stations
–– Secure and accurate positioning of the
traverse unit on the workpiece
–– Repeatable measurement results due
to template positioning
–– Skidded or skidless probe systems
–– Ideal for workpieces such as engine blocks,
cylinder heads, valve bodies or housings, as
well as crank shafts, cam shafts and connecting rods
Waveslide measuring stations are individually tailored to suit specific measurement tasks. They are based on
proven system components and provide reliable, semi-automatic measurements in the manufacturing environ-
ment. The measuring systems are extremely robust and operate with high precision. The workpiece is positioned
manually via guided air slides and the measuring process is fully automated.
–– Simple, manual positioning of the workpiece
via air slides
–– For medium to large cubic or shaft-type workpieces
–– Manual operation
–– For roughness and contour measuring tasks
Measurement in bores Measurement on shafts Measurement on plane surfaces
Waveslide measuring station with air slides
for manual workpiece positioning

13. 13
Waveline Wavemove
Wavemove measuring stations allow individual, CNC-controlled, fully automated roughness and contour measurements
to be performed directly on the production line. They are enhanced with CNC axes and workpiece fixtures specific to the
part, enabling them to perform complex measuring tasks on cubic workpieces or shafts in a fully automated process.
Wavemove. Individual, fully automated measuring
systems for measurements on the production line
–– Automated surface measurements for
workpiece-specific applications
–– High degree of automation
–– Robust measuring stations suitable for production
–– Transfer of the measurement results to programs
such as qs-STAT®
–– Flexible system concept for a wide range of applications
–– Simple measurement program creation
–– Up to eight independent CNC axes
operating simultaneously
–– Workpiece carrier with automatic identification
of the workpiece
–– Extensive safety equipment
–– Advanced technology for a high degree of reliability
The probe is swiveled by 90° for roughness measurements on pin bearings Automated calibration of the measuring system via integrated standards
Fully automated Wavemove measuring
station with workpiece-specific fixing
device and light curtain

14. 14
Waveline Toposcan
Waveline Toposcan. Surface inspection
system for cylinder bores
System features
–– Fast, precise and reliable testing of finely
machined surfaces of cylinder bores
–– For motor production as well as development and test
–– Compact measuring probe for optical testing of surface
structure characteristics and tactile measurement of
surface roughness
–– Mobile use thanks to its light weight
–– Ergonomic design for comfortable operation
–– Easy adaptation to different bore diameters
–– High optical zoom, up to 210 times for finest structures
–– For cylinder bores from 60 mm diameter
–– All important functions, such as motorized axial
positioning, zoom and focus setting as well as lighting
regulation, are carried out using the computer
–– Manual radial probe positioning
–– Immediate display of the cylinder bore surface
on the computer screen
–– Complete evaluation of the cylinder surface thanks
to optical inspection and roughness measurement
at any position
–– Basic model for optical testing and advanced model
for additional tactile roughness measurement
–– Mobile workstation for easy transport in the
production environment
Model Diameter* Measurement
height
Scan/measuring
mode
Roughness
measurement
Tabletop
model
Workstation
model
Toposcan O150 or O210 60 – 110 mm 150 or 210 mm yes no yes yes
Toposcan OR150 or OR210 60 – 110 mm 150 or 210 mm yes yes yes yes
* Further diameters on demand
Toposcan OR150 with lighting unit and roughness probe
Mobile workstation for flexible use in productionWaveline Toposcan OR150 with workstation

15. 15
Kunde
Demo 2014
Messsystem
HOMMEL-ETAMIC toposcan
Seriennummer
88 150 10 201
Auftrag
Demo 2014
Vielen Dank fuer Ihr Interesse an unserem HOMMEL-ETAMIC toposcan
Test Plan
demo 2014.rpg
Werkstuek
4 Zyl Motorblock
Werkstueck Nr.
4711
Bediener
Gayko
SW-Version
7.60
Date
Time
Ergebnisse Rauheit Ergebnisse Optik Ergebnisse
Lasertaschen
Las O ---.-- mm
Las U ---.-- mm
T-L ---.-- mm
T-AH ---.-- mm
T-AV ---.-- mm
T-V ---.-- mm
T-Br ---.-- µm
Winkel 47.40Grad
Radius 1.97 mm
Abstand 1.20 mm
Fläche 0.63µm²/U
Toleranzfeld Honwinkel---.--
Rz 7.92 µm
Mr1 6.4 %
Mr2 79.3 %
CV(70.0 %) 0.55681µm³/µm²
Rpk 0.52 µm
Rk 2.03 µm
Rvk 3.23 µm
HOMMEL-ETAMIC
TURBO WAVE V7.60
Messbedingungen
Taster :
Messbereich :
Taststrecke :
Lc / Ls:
T1E
80 µm
4.80 mm
300
R- Profil ausgerichtet Filter ISO 11562 Lc = 0.800 mm
Taster T1E Lt = 4.80 mm Vt = 0.50 mm/s 4.80
[µm]
10.0
0.0
-10.0
Materialanteil R-Profil
[µm]
0.0
11.0
0% 20% 40% 60% 80% 100%
Winkel 47.40Grad Radius 1.97 mm Abstand 1.20 mm Fläche 0.63µm²/U
JENOPTIK
Industrial Metrology GmbH
Mr. Hendrik GAYKO
Alte Tuttlinger Strasse 20
D-78056 VS-Schwenningen
Germany
Tel +49 (0)7720 602 580
Fax +49 (0)7720 602 123
web: www.jenoptik.com
Messbedingungen
02.04.2014
15:47
Schmidt
Topowin
Topowin. User-friendly control and
evaluation software for Toposcan
The user-friendly Topowin software can be operated intuitively and offers a standardized interface for optical
surface inspection and roughness measurement.
System features
–– Clear, well-arranged user interface
–– Optical inspection with zoom microscope
–– High optical zoom, 30 to 210 times
–– Imaging of a plateau-honed surface
–– Display of finest structures of new surfaces
–– High inspection rates and user-independent results
thanks to automated measuring runs
–– Immediate display of the roughness profile and
the results of the preset characteristics
–– Local correlation of optical inspection and
tactile roughness measurement
–– Continuous development of the software
in regards to new standards
–– Compact and informative documentation in
one report as a printout or a PDF file
–– Optional qs-STAT® data export interface for
the exchange of quality information
–– Optional measurement and evaluation of laser-
structured surfaces; determination of geometric
dimensions of the laser pocket structures
–– Automated runs: optional CNC control for automatic
positioning at preselected inspection heights
Main window, crosshatch angle Roughness measurement with immediate profile display
Determination of laser pocket structuresLogging

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