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Device Modeling Report




COMPONENTS : PHOTOCOUPLER
PART NUMBER : TLP521-1
MANUFACTURER : TOSHIBA
REMARK : SAMPLE B




               Bee Technologies Inc.


All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
DIODE MODEL
  Pspice model
                                         Model description
   Parameter
        IS         Saturation Current
        N          Emission Coefficient
       RS          Series Resistance
       IKF         High-injection Knee Current
      CJO          Zero-bias Junction Capacitance
        M          Junction Grading Coefficient
        VJ         Junction Potential
      ISR          Recombination Current Saturation Value
       BV          Reverse Breakdown Voltage(a positive value)
      IBV          Reverse Breakdown Current(a positive value)
        TT         Transit Time

BIPOLAR JUNCTION TRANSISTOR MODEL
  Pspice model
                                Model description
   parameter
       NR      Reverse Emission Coefficient
       RB      Base Resistance
       RC      Series Collector Resistance
      CJE      Zero-bias Emitter-Base Junction Capacitance
      CJC      Zero-bias Collector-Base Junction Capacitance
       TF      Forward Transit Time
       TR      Reverse Transit Time

VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS)


E<Name><(+)Node><(-)Node>VALUE={Expression}

E<Name><(+)Node><(-)Node>TABLE={Expression}




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS)


E<Name><(+)Node><(-)Node>VALUE={Expression}


CURRENT CONTROLLED MODEL(W)
 Pspice model
                                Model description
  parameter
     IOFF     Controlling current to Off state
      ION     Controlling current to On state
    ROFF      Off Resistance
     RON      On Resistance




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Input Device Forward Current Characteristics




                                                       Measurement
                                                       Simulation




Input Device Junction Capacitance Characteristics




                                                      Measurement
                                                      Simulation




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Input Device Reverse Recovery Characteristics




                                                   Measurement




trj=120n(s)
trb=288n(s)
Conditions:Ifwd=Irev=0.04(A),Rl=50



                                                        Example




                             Relation between trj and trb



              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
LED IV Curve Characteristics

Evaluation Circuit




                                      U1
                                      A         C
                         I1                                                V1
                                                                     1.6
            0mAdc
                                      K         E
                                     TLP521_1




                     0                                                     0




Simulation result




                                                        Simulation




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Comparison Table

                                     Vfwd(V)
     Ifwd(A)                                                          % Error
                      Measurement             Simulation

     0.0001                  0.92              0.927116                0.773

     0.0002                  0.96              0.961572                0.164

     0.0005                  1.01                1.0076                -0.238

      0.001                  1.05                1.0427                -0.695

      0.002                  1.09                1.0785                -1.055

      0.005                 1.125                1.1283                0.293

      0.01                  1.165                1.1697                0.403

      0.02                   1.21                1.2182                0.678

      0.05                   1.31                1.3060                -0.305




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Transistor Saturation Characteristics

Evaluation Circuit




                                            U1
                                            A          C
                         I1
                                                                           I2
            8mAdc
                                            K          E               2.4mAdc
                                            TLP521_1




                     0                                                 0



Simulation result




                               Simulation




Comparison Table

                              Measurement              Simulation          % Error
       Vce (sat)                  0.4 V                0.398543 V           -0.364
               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
CTR(Current Transfer Ratio) Characteristics

Evaluation Circuit


                       V2                                    V3


                            0Vdc                                  0Vdc




                                         U1
                                                                           V1
                  I1                     A          C               5Vdc

               5mAdc
                                         K          E
                                         TLP521_1




              0                                                            0




Simulation result




                            Simulation




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Rise Curve     Table

                                      CTR(%)
      If(mA)                                                           % Error
                       Measurement             Simulation

        0.5                    28                 28.318                1.136

         1                     42                 40.843                -2.755

         2                     55                 53.148                -3.367

         5                     71                 69.132                -2.631

        10                     82                 81.123                -1.070

        20                     93                 93.045                0.048

        30                    100                100.126                0.126




Fall Curve Table

                                      CTR(%)
      If(mA)                                                           % Error
                       Measurement             Simulation

        30                    100                100.126                0.126

        40                     98                 96.124                -1.914

        50                     95                 93.015                -2.089

        60                     90                 90.472                0.524




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Switching Time Characteristics

Evaluation Circuit

                                  V2


                                       0Vdc




                                                                                   R1
                                                U1
                                                                                    1.9k
                                                A          C
            I1 = 0
            I2 = 16m         I1
            TD = 10u
            TR = 10n                            K          E
            TF = 10n                                                           V1
                                                TLP521_1
            PW = 20u                                                    5Vdc
            PER = 500u




                         0                                                     0




Simulation result




                                                                    Simulation




Comparison Table
VCC=5V,IF=16mA,RL=1.9k                   Measurement          Simulation               % Error
          Ts (us)                             15                 15.05                   0.333
         Toff (us)                            25                 25.18                   0.720

                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

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SPICE MODEL of TLP521-1 SAMPLE B in SPICE PARK

  • 1. Device Modeling Report COMPONENTS : PHOTOCOUPLER PART NUMBER : TLP521-1 MANUFACTURER : TOSHIBA REMARK : SAMPLE B Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time BIPOLAR JUNCTION TRANSISTOR MODEL Pspice model Model description parameter NR Reverse Emission Coefficient RB Base Resistance RC Series Collector Resistance CJE Zero-bias Emitter-Base Junction Capacitance CJC Zero-bias Collector-Base Junction Capacitance TF Forward Transit Time TR Reverse Transit Time VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS) E<Name><(+)Node><(-)Node>VALUE={Expression} E<Name><(+)Node><(-)Node>TABLE={Expression} All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 3. VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS) E<Name><(+)Node><(-)Node>VALUE={Expression} CURRENT CONTROLLED MODEL(W) Pspice model Model description parameter IOFF Controlling current to Off state ION Controlling current to On state ROFF Off Resistance RON On Resistance All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 4. Input Device Forward Current Characteristics Measurement Simulation Input Device Junction Capacitance Characteristics Measurement Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 5. Input Device Reverse Recovery Characteristics Measurement trj=120n(s) trb=288n(s) Conditions:Ifwd=Irev=0.04(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 6. LED IV Curve Characteristics Evaluation Circuit U1 A C I1 V1 1.6 0mAdc K E TLP521_1 0 0 Simulation result Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 7. Comparison Table Vfwd(V) Ifwd(A) % Error Measurement Simulation 0.0001 0.92 0.927116 0.773 0.0002 0.96 0.961572 0.164 0.0005 1.01 1.0076 -0.238 0.001 1.05 1.0427 -0.695 0.002 1.09 1.0785 -1.055 0.005 1.125 1.1283 0.293 0.01 1.165 1.1697 0.403 0.02 1.21 1.2182 0.678 0.05 1.31 1.3060 -0.305 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 8. Transistor Saturation Characteristics Evaluation Circuit U1 A C I1 I2 8mAdc K E 2.4mAdc TLP521_1 0 0 Simulation result Simulation Comparison Table Measurement Simulation % Error Vce (sat) 0.4 V 0.398543 V -0.364 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 9. CTR(Current Transfer Ratio) Characteristics Evaluation Circuit V2 V3 0Vdc 0Vdc U1 V1 I1 A C 5Vdc 5mAdc K E TLP521_1 0 0 Simulation result Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 10. Rise Curve Table CTR(%) If(mA) % Error Measurement Simulation 0.5 28 28.318 1.136 1 42 40.843 -2.755 2 55 53.148 -3.367 5 71 69.132 -2.631 10 82 81.123 -1.070 20 93 93.045 0.048 30 100 100.126 0.126 Fall Curve Table CTR(%) If(mA) % Error Measurement Simulation 30 100 100.126 0.126 40 98 96.124 -1.914 50 95 93.015 -2.089 60 90 90.472 0.524 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 11. Switching Time Characteristics Evaluation Circuit V2 0Vdc R1 U1 1.9k A C I1 = 0 I2 = 16m I1 TD = 10u TR = 10n K E TF = 10n V1 TLP521_1 PW = 20u 5Vdc PER = 500u 0 0 Simulation result Simulation Comparison Table VCC=5V,IF=16mA,RL=1.9k Measurement Simulation % Error Ts (us) 15 15.05 0.333 Toff (us) 25 25.18 0.720 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005