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Device Modeling Report




COMPONENTS: PHOTOCOUPLER
PART NUMBER: PC817X
MANUFACTURER: SHARP




              Bee Technologies Inc.


All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
DIODE MODEL
  Pspice model
                                          Model description
   Parameter
        IS         Saturation Current
        N          Emission Coefficient
       RS          Series Resistance
       IKF         High-injection Knee Current
      CJO          Zero-bias Junction Capacitance
        M          Junction Grading Coefficient
        VJ         Junction Potential
      ISR          Recombination Current Saturation Value
       BV          Reverse Breakdown Voltage(a positive value)
      IBV          Reverse Breakdown Current(a positive value)
        TT         Transit Time

BIPOLAR JUNCTION TRANSISTOR MODEL
  Pspice model
                                Model description
   parameter
       NR      Reverse Emission Coefficient
       RB      Base Resistance
       RC      Series Collector Resistance
      CJE      Zero-bias Emitter-Base Junction Capacitance
      CJC      Zero-bias Collector-Base Junction Capacitance
       TF      Forward Transit Time
       TR      Reverse Transit Time

VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS)


E<Name><(+)Node><(-)Node>VALUE={Expression}

E<Name><(+)Node><(-)Node>TABLE={Expression}




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS)


E<Name><(+)Node><(-)Node>VALUE={Expression}


CURRENT CONTROLLED MODEL(W)
 Pspice model
                                 Model description
  parameter
     IOFF     Controlling current to Off state
      ION     Controlling current to On state
    ROFF      Off Resistance
     RON      On Resistance




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Input Device Forward Current Characteristics




                                                      Measurement
                                                      Simulation




Input Device Junction Capacitance Characteristics




                                                         Measurement
                                                         Simulation




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Input Device Reverse Recovery Characteristics




                                                   Measurement




trj=224n(s)
trb=262n(s)
Conditions:Ifwd=Irev=0.04(A),Rl=50



                                                        Example




                            Relation between trj and trb

              All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
LED IV Curve Characteristics

Evaluation Circuit




                                           U1
                                       1                4
                                           A        C                            V1
                  I1                                                  3.5Vdc

               50mAdc                  2                3
                                           K        E

                                           PC817X




              0                                                                   0




Simulation result




                                                                  Simulation




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Comparison Table

                                       Vfwd(V)
     Ifwd(A)                                                            % Error
                        Measurement              Simulation

      0.001                 1.065                 1.0656                 0.056

      0.002                   1.1                 1.0992                 -0.073

      0.005                  1.15                 1.1494                 -0.052

      0.01                  1.195                 1.1964                 0.117

      0.02                   1.26                 1.2594                 -0.048

      0.05                   1.39                   1.39                     0




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Transistor Saturation Characteristics

Evaluation Circuit




                                          U3
                                      1                4
                                          A        C
                  I1                                                               I2

               20mAdc                 2                3                         1mAdc
                                          K        E
                                                                    Simulation
                                          PC817X




              0                                                                0




Simulation result




                                                                        Simulation




Comparison Table

                            Measurement                    Simulation              % Error
      Vce(sat) (V)                0.1                      0.100291                 0.291
                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
CTR(Current Transfer Ratio) Characteristics

Evaluation Circuit



                       V2                                        V3


                            0Vdc                                      0Vdc




                                           U1
                                       1                4
                                           A        C
                                                                                 V1
                  I1                                                      5Vdc
                                       2                3
              20mAdc                       K        E

                                           PC817X




                                                             Simulation


              0                                                                  0




Simulation result




                                                            Simulation




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Rise Curve      Table

                                         CTR(%)
       If(mA)                                                              % Error
                          Measurement              Simulation
        0.4                     330                 338.212                    2.488
        0.5                     370                 379.967                    2.694
        0.6                     420                 414.034                -1.420
        0.7                     450                 442.804                -1.599
        0.8                     465                 467.705                    0.582
        1.5                     590                 584.783                -0.884
         2                      650                 638.245                -1.808
        2.5                     680                 679.629                -0.055



Fall Curve Table

                                         CTR(%)
       If(mA)                                                              % Error
                          Measurement              Simulation
        2.5                     680                 679.629                -0.055
         3                      650                 625.668                -3.743
         5                      470                 483.085                    2.784
         7                      375                 389.149                    3.773
         9                      310                 318.984                    2.898
        10                      290                 289.565                -0.150




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Switching Time Characteristics

Evaluation Circuit

                                  V2


                                       0Vdc



                                                                                         R1
                                                                                          100
                                                   U1
                                               1                4
                                                   A        C
                             I1

            TD = 0                             2                3
            TF = 10n                               K        E                        V1
            PW = 20u                                                             2
                                                   PC817X
            PER = 500u
            I1 = 0
            I2 = 20m
            TR = 10n




                         0                                                           0




Simulation result




                                                                          Simulation




Comparison Table
       Vce=2V,RL=100                     Measurement               Simulation             % Error
            ts (us)                           0.48                   0.479116              -0.184
            tf (us)                            6.8                    6.8535                0.787

                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

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SPICE MODEL of PC817X in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: PHOTOCOUPLER PART NUMBER: PC817X MANUFACTURER: SHARP Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time BIPOLAR JUNCTION TRANSISTOR MODEL Pspice model Model description parameter NR Reverse Emission Coefficient RB Base Resistance RC Series Collector Resistance CJE Zero-bias Emitter-Base Junction Capacitance CJC Zero-bias Collector-Base Junction Capacitance TF Forward Transit Time TR Reverse Transit Time VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS) E<Name><(+)Node><(-)Node>VALUE={Expression} E<Name><(+)Node><(-)Node>TABLE={Expression} All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 3. VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS) E<Name><(+)Node><(-)Node>VALUE={Expression} CURRENT CONTROLLED MODEL(W) Pspice model Model description parameter IOFF Controlling current to Off state ION Controlling current to On state ROFF Off Resistance RON On Resistance All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 4. Input Device Forward Current Characteristics Measurement Simulation Input Device Junction Capacitance Characteristics Measurement Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 5. Input Device Reverse Recovery Characteristics Measurement trj=224n(s) trb=262n(s) Conditions:Ifwd=Irev=0.04(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 6. LED IV Curve Characteristics Evaluation Circuit U1 1 4 A C V1 I1 3.5Vdc 50mAdc 2 3 K E PC817X 0 0 Simulation result Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 7. Comparison Table Vfwd(V) Ifwd(A) % Error Measurement Simulation 0.001 1.065 1.0656 0.056 0.002 1.1 1.0992 -0.073 0.005 1.15 1.1494 -0.052 0.01 1.195 1.1964 0.117 0.02 1.26 1.2594 -0.048 0.05 1.39 1.39 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 8. Transistor Saturation Characteristics Evaluation Circuit U3 1 4 A C I1 I2 20mAdc 2 3 1mAdc K E Simulation PC817X 0 0 Simulation result Simulation Comparison Table Measurement Simulation % Error Vce(sat) (V) 0.1 0.100291 0.291 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 9. CTR(Current Transfer Ratio) Characteristics Evaluation Circuit V2 V3 0Vdc 0Vdc U1 1 4 A C V1 I1 5Vdc 2 3 20mAdc K E PC817X Simulation 0 0 Simulation result Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 10. Rise Curve Table CTR(%) If(mA) % Error Measurement Simulation 0.4 330 338.212 2.488 0.5 370 379.967 2.694 0.6 420 414.034 -1.420 0.7 450 442.804 -1.599 0.8 465 467.705 0.582 1.5 590 584.783 -0.884 2 650 638.245 -1.808 2.5 680 679.629 -0.055 Fall Curve Table CTR(%) If(mA) % Error Measurement Simulation 2.5 680 679.629 -0.055 3 650 625.668 -3.743 5 470 483.085 2.784 7 375 389.149 3.773 9 310 318.984 2.898 10 290 289.565 -0.150 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 11. Switching Time Characteristics Evaluation Circuit V2 0Vdc R1 100 U1 1 4 A C I1 TD = 0 2 3 TF = 10n K E V1 PW = 20u 2 PC817X PER = 500u I1 = 0 I2 = 20m TR = 10n 0 0 Simulation result Simulation Comparison Table Vce=2V,RL=100 Measurement Simulation % Error ts (us) 0.48 0.479116 -0.184 tf (us) 6.8 6.8535 0.787 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004