This presentation from AISTech 2018 outlines the following: - XRF Theory - Coating Specification Review - Handheld X-ray Fluorescence (HHXRF) Coating Analysis - Integration/Management of Process Data For more information, visit: https://www.olympus-ims.com/en/innovx-xrf-xrd/

1. Thickness Control During the
Galvanizing Process
Alex Thurston
Olympus Scientific Solutions
Applications Engineering Manager

2. Outline of Presentation
öXRF Theory
öCoating Specification Review
öHandheld X-ray Fluorescence (HHXRF) Coating
Analysis
öIntegration/Management of Process Data

3. XRF Theory
K
L
M

4. HHXRF Detection Range
Mg through Pu detection

5. HHXRF Spectra – Coating Thickness

6. HHXRF Spectral Processing
§ HHXRF takes the generated spectra and applies a
complex mathematical calculation
- Takes into account inter-elemental effects
- Also spectral artifacts
§ Uses single-beam information to compute
thickness results
- Using known absorption criteria, the calculation is
based on peak-height response

7. Specification Review
öWhat are the ranges of zinc (Zn) thicknesses to
consider?

8. Specifications
§ ASTM A653
§ ASTM A879
§ ASTM A123
§ ASTM A153
§ ASTM A767

9. Specifications
§ ASTM A653
oz/ft^2 (per side) Microns
0 0
G30 0.15 6.9
G40 0.2 9.1
G60 0.3 13.7
G90 0.45 20.6
G115 0.58 26.3
G140 0.7 32
G165 0.83 37.7
G185 0.93 42.3
G210 1.05 48

10. HHXRF Coating Analysis
öWhere can HHXRF be effectively applied?

11. Using Spectra with the Beer-Lambert Law
§ Beer-Lambert Law : !" = !$%&'()
IT : the calculated intensity of the X-rays detected
IO : the original intensity of X-rays fluoresced by the
substrate
µ : the mass absorption coefficient
ρ : the density of the material
x : the thickness of the layer

12. Collected Spectra from Iron (Fe), zinc (Zn), and
Zn/Fe

13. Beer-Lambert Law Applied to Zn Coatings
0
10
20
30
40
50
60
70
80
90
100
0 10 20 30 40 50 60 70 80 90
Intensity(%)
Zn thickness (microns)
Zn Ka
absorbed intensity (%)
remaining intensity (%)

14. Specifications
§ ASTM A653
oz/ft^2 (per side) Microns
0 0
G30 0.15 6.9
G40 0.2 9.1
G60 0.3 13.7
G90 0.45 20.6
G115 0.58 26.3
G140 0.7 32
G165 0.83 37.7
G185 0.93 42.3
G210 1.05 48

15. HHXRF Thickness Results
§ Out-of-the-box instrument is accurate with
unknown samples
- Can use a one-point calibration with a
known/verified thickness sample
- Use a sample that is representative of your target
Zn thickness
§ 10.16 µm Zn on Fe standard used for this example

16. HHXRF Thickness Results – 10.16 µm standard
Prior to 1-point Cal After 1-point Cal
20 nanometer
variance with
the standard!

17. Integrated Process Data Capabilities
§ Process data in the form of chemistry results
and/or thickness results are output from the
instrument
§ Olympus Vanta™ HHXRF can be connected via
wireless LAN or Bluetooth®

18. Integrated Process Data Capabilities
§ Bluetooth® is used as an accessory interface
§ Wireless LAN is used to connect to user networks
or hotspots
- Export directly to network folders (per test or batch
exporting options)
- Connect to the Olympus Scientific Cloud

19. Integrated Process Data Capabilities – the
Olympus Scientific Cloud
§ The Olympus Scientific Cloud presents a user’s
data in real time
- Multiple lines of operation can be monitored in
parallel
§ Provides increased user functionality– data can be
analyzed quickly in multiple variations

22. Questions?
öThank you for your time!

23. Olympus is a registered trademark, and Vanta is a trademark of Olympus Corporation.
The Bluetooth® word mark and logos are registered trademarks owned by Bluetooth
SIG, Inc. and any use of such marks by Olympus Corporation is under license.