The document describes the technique of component swap analysis to identify the root causes of issues in complex systems. It involves systematically disassembling representative good and bad devices into their components, recombining the components in different configurations, and testing the recombined devices to evaluate the influence of each component and interactions on device performance. The goal is to prioritize the components and factors that most significantly impact the problem for further investigation using techniques like variable analysis or design of experiments.

1. By info@stefan-moser.com
You want to technically
investigate the causes of
complaints?
But ... Can‘t find a starting
point because of too many
factors?

2. By info@stefan-moser.com
The techniques of Shainin focus
systematically on different system
perspectives.
Problem
Formulation
10-30 Input factors
Pairwise
comparison
Components
swap
Scatter cards
analysis / multi
vari cards
Variable
influence
analysis
Full factorial
Experiments
Process
comparison
analysis
Scatter diagram
Robustness analysis/
Tolerances
Design of
Experiments
Verification
Optimization
Ishikawa Mind map
6-12
Inputs
<= 6
Inputs
<=4
Inputs
Define
/
Identify
/
rioritize

3. By info@stefan-moser.com
Shainin's components swap help you
encircle the error at the system
group level!
Problem
Formulation
10-30 Input factors
Pairwise
comparison
Components
swap
Scatter cards
analysis / multi
vari cards
Variable
influence
analysis
Full factorial
Experiments
Process
comparison
analysis
Scatter diagram
Robustness analysis/
Tolerances
Design of
Experiments
Verification
Optimization
Ishikawa
Mind map
6-12
Inputs
<= 6
Inputs
<=4
Inputs
Define
/
Identify
/
Prioritize

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First make sure good and bad
devices / products are measurable
and significant distinguishable!
Step 1: Basic check of the spreading widths
d d d d d
d
D
d
Poor Performance Good performance
d

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“Component Swap” only works if
devices are systematically
subdividable.
Step 2: Subdivision of the assemblies
Structure analysis
Analysis of functions
Analysis of errors
Module 1.1
Module 1.1.1
Module 1.0
Function 1.1
Function
1.1.1
Function 1.0
Error 1.1
Error 1.1.1
Error 1.0
Module 1.1.2
Function
1.1.2
Error 1.1.2

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Decomposition of representative
"good" and "bad" devices into their
assemblies.
Step 3: Disassemble the devices good / bad

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Recombination of the device parts
with subsequent inspection using an
easy plan.
Step 4: Recombination and testing
Starting situation
Component A
Component B
Replaced component Composition of the devices

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Always check that the recombined devices
have not changed when restoring the
initial state (good/bad).
Step 5: Recombination and testing

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Evaluation of the combinations and
identification of the parts with the
greatest influence!
Step 6: Recombination and testing

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Check also the influence of
interactions, this are the tricky
ones …
Step 7: Check the Interactions

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Now it should be easier to
concentrate on the factors with
significant influence
Step 8: Set priorities

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Focus on the significant parts / factors to
investigate them further, e.g., using
Shainin variable analysis or DoE.
Problem
Formulation
10-30 Input factors
Pairwise
comparison
Components
swap
Scatter cards
analysis / multi
vari cards
Variable
influence
analysis
Full factorial
Experiments
Process
comparison
analysis
Scatter diagram
Robustness analysis/
Tolerances
Design of
Experiments
Verification
Optimization
Ishikawa
Mind map
6-12
Inputs
<= 6
Inputs
<=4
Inputs
Define
/
Identify
/
Prioritize

13. By info@stefan-moser.com
Want to know more about
QBD/DFSS/DoE methods?
www.stefan-moser.com
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