Response surface methodology uses graphical and statistical techniques to model and optimize processes influenced by multiple variables. An example is given of using RSM to analyze transistor gain data with respect to emitter drive-in time and emitter dose. RSM is used across various fields to find optimal responses. First and second order models are employed, with first order often used initially to check for curvature before applying a second order model. Contour plots of the first order model of the transistor gain data showed straight lines, indicating no curvature and a satisfactory fit without need for a second order model.